ATE521085T1 - Verfahren zum herstellen einer halbleiter-auf- isolation-heterostruktur - Google Patents
Verfahren zum herstellen einer halbleiter-auf- isolation-heterostrukturInfo
- Publication number
- ATE521085T1 ATE521085T1 AT06793255T AT06793255T ATE521085T1 AT E521085 T1 ATE521085 T1 AT E521085T1 AT 06793255 T AT06793255 T AT 06793255T AT 06793255 T AT06793255 T AT 06793255T AT E521085 T1 ATE521085 T1 AT E521085T1
- Authority
- AT
- Austria
- Prior art keywords
- heterostructure
- semiconductor
- insulating layer
- active layer
- bonding
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/19—Preparing inhomogeneous wafers
- H10P90/1904—Preparing vertically inhomogeneous wafers
- H10P90/1906—Preparing SOI wafers
- H10P90/1914—Preparing SOI wafers using bonding
- H10P90/1916—Preparing SOI wafers using bonding with separation or delamination along an ion implanted layer, e.g. Smart-cut
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/10—Isolation regions comprising dielectric materials
- H10W10/181—Semiconductor-on-insulator [SOI] isolation regions, e.g. buried oxide regions of SOI wafers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/974—Substrate surface preparation
Landscapes
- Element Separation (AREA)
- Recrystallisation Techniques (AREA)
- Formation Of Insulating Films (AREA)
- Semiconductor Lasers (AREA)
- Bipolar Transistors (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0509168A FR2890489B1 (fr) | 2005-09-08 | 2005-09-08 | Procede de fabrication d'une heterostructure de type semi-conducteur sur isolant |
| PCT/EP2006/066046 WO2007028800A1 (fr) | 2005-09-08 | 2006-09-06 | Procédé de fabrication d'une hétérostructure de type semi-conducteur sur isolant |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE521085T1 true ATE521085T1 (de) | 2011-09-15 |
Family
ID=36593036
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT06793255T ATE521085T1 (de) | 2005-09-08 | 2006-09-06 | Verfahren zum herstellen einer halbleiter-auf- isolation-heterostruktur |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7485551B2 (de) |
| EP (1) | EP1922751B1 (de) |
| JP (1) | JP2009508329A (de) |
| KR (1) | KR100979930B1 (de) |
| CN (1) | CN101258591B (de) |
| AT (1) | ATE521085T1 (de) |
| FR (1) | FR2890489B1 (de) |
| WO (1) | WO2007028800A1 (de) |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008270706A (ja) * | 2007-03-26 | 2008-11-06 | Tokyo Electron Ltd | 窒化珪素膜および不揮発性半導体メモリ装置 |
| FR2919427B1 (fr) * | 2007-07-26 | 2010-12-03 | Soitec Silicon On Insulator | Structure a reservoir de charges. |
| FR2926674B1 (fr) | 2008-01-21 | 2010-03-26 | Soitec Silicon On Insulator | Procede de fabrication d'une structure composite avec couche d'oxyde de collage stable |
| EP2269226A1 (de) * | 2008-03-13 | 2011-01-05 | S.O.I.Tec Silicon on Insulator Technologies | Substrat mit einer geladenen zone in einer isolierten vergrabenen schicht |
| FR2934925B1 (fr) * | 2008-08-06 | 2011-02-25 | Soitec Silicon On Insulator | Procede de fabrication d'une structure comprernant une etape d'implantations d'ions pour stabiliser l'interface de collage. |
| EP2157602A1 (de) * | 2008-08-20 | 2010-02-24 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren zur Herstellung einer Vielzahl von Herstellungs-Wafern |
| JP5470839B2 (ja) * | 2008-12-25 | 2014-04-16 | 株式会社Sumco | 貼り合わせシリコンウェーハの製造方法 |
| US20110089429A1 (en) * | 2009-07-23 | 2011-04-21 | Venkatraman Prabhakar | Systems, methods and materials involving crystallization of substrates using a seed layer, as well as products produced by such processes |
| EP2599110A4 (de) | 2009-07-28 | 2014-04-23 | Gigasi Solar Inc | Systeme, verfahren und materialien mit kristallisierung von substraten mittels unterschmelzlaserglühen sowie anhand derartiger verfahren hergestellte produkte |
| US8629436B2 (en) * | 2009-08-14 | 2014-01-14 | Gigasi Solar, Inc. | Backside only contact thin-film solar cells and devices, systems and methods of fabricating same, and products produced by processes thereof |
| WO2011096326A1 (ja) * | 2010-02-04 | 2011-08-11 | 富士電機システムズ株式会社 | 半導体素子の製造方法および半導体素子の製造装置 |
| US8288811B2 (en) | 2010-03-22 | 2012-10-16 | Micron Technology, Inc. | Fortification of charge-storing material in high-K dielectric environments and resulting apparatuses |
| US20110306180A1 (en) * | 2010-06-14 | 2011-12-15 | Venkatraman Prabhakar | Systems, Methods and Products Involving Aspects of Laser Irradiation, Cleaving, and/or Bonding Silicon-Containing Material to Substrates |
| FR2968121B1 (fr) * | 2010-11-30 | 2012-12-21 | Soitec Silicon On Insulator | Procede de transfert d'une couche a haute temperature |
| FR2983342B1 (fr) | 2011-11-30 | 2016-05-20 | Soitec Silicon On Insulator | Procede de fabrication d'une heterostructure limitant la formation de defauts et heterostructure ainsi obtenue |
| US8951896B2 (en) | 2013-06-28 | 2015-02-10 | International Business Machines Corporation | High linearity SOI wafer for low-distortion circuit applications |
| FR3007891B1 (fr) * | 2013-06-28 | 2016-11-25 | Soitec Silicon On Insulator | Procede de fabrication d'une structure composite |
| KR102360695B1 (ko) | 2014-01-23 | 2022-02-08 | 글로벌웨이퍼스 씨오., 엘티디. | 고 비저항 soi 웨이퍼 및 그 제조 방법 |
| JP6206786B2 (ja) * | 2014-07-10 | 2017-10-04 | 株式会社サイコックス | 半導体基板および半導体基板の製造方法 |
| US9899499B2 (en) | 2014-09-04 | 2018-02-20 | Sunedison Semiconductor Limited (Uen201334164H) | High resistivity silicon-on-insulator wafer manufacturing method for reducing substrate loss |
| JP6650463B2 (ja) | 2014-11-18 | 2020-02-19 | グローバルウェーハズ カンパニー リミテッドGlobalWafers Co.,Ltd. | 電荷トラップ層を備えた高抵抗率の半導体・オン・インシュレーターウェハーの製造方法 |
| WO2016081367A1 (en) | 2014-11-18 | 2016-05-26 | Sunedison Semiconductor Limited | HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE TRAPPING LAYER FORMED BY He-N2 CO-IMPLANTATION |
| JP6726180B2 (ja) | 2014-11-18 | 2020-07-22 | グローバルウェーハズ カンパニー リミテッドGlobalWafers Co.,Ltd. | 高抵抗率半導体・オン・インシュレータウエハおよび製造方法 |
| EP4120320A1 (de) | 2015-03-03 | 2023-01-18 | GlobalWafers Co., Ltd. | Ladungseinfangende polykristalline siliziumschichten auf siliziumsubstraten mit steuerbarer filmspannung |
| US9881832B2 (en) | 2015-03-17 | 2018-01-30 | Sunedison Semiconductor Limited (Uen201334164H) | Handle substrate for use in manufacture of semiconductor-on-insulator structure and method of manufacturing thereof |
| CN107408532A (zh) | 2015-03-17 | 2017-11-28 | 太阳能爱迪生半导体有限公司 | 用于绝缘体上半导体结构的制造的热稳定电荷捕获层 |
| CN106158639B (zh) * | 2015-04-01 | 2019-01-29 | 中芯国际集成电路制造(上海)有限公司 | 半导体器件的形成方法 |
| CN107873106B (zh) | 2015-06-01 | 2022-03-18 | 环球晶圆股份有限公司 | 制造绝缘体上硅锗的方法 |
| WO2016196060A1 (en) | 2015-06-01 | 2016-12-08 | Sunedison Semiconductor Limited | A method of manufacturing semiconductor-on-insulator |
| JP6749394B2 (ja) | 2015-11-20 | 2020-09-02 | グローバルウェーハズ カンパニー リミテッドGlobalWafers Co.,Ltd. | 滑らかな半導体表面の製造方法 |
| US10622247B2 (en) | 2016-02-19 | 2020-04-14 | Globalwafers Co., Ltd. | Semiconductor on insulator structure comprising a buried high resistivity layer |
| US10468294B2 (en) | 2016-02-19 | 2019-11-05 | Globalwafers Co., Ltd. | High resistivity silicon-on-insulator substrate comprising a charge trapping layer formed on a substrate with a rough surface |
| US9831115B2 (en) | 2016-02-19 | 2017-11-28 | Sunedison Semiconductor Limited (Uen201334164H) | Process flow for manufacturing semiconductor on insulator structures in parallel |
| WO2017155804A1 (en) | 2016-03-07 | 2017-09-14 | Sunedison Semiconductor Limited | Method of manufacturing a semiconductor on insulator structure by a pressurized bond treatment |
| WO2017155806A1 (en) | 2016-03-07 | 2017-09-14 | Sunedison Semiconductor Limited | Semiconductor on insulator structure comprising a plasma oxide layer and method of manufacture thereof |
| EP3758050A1 (de) | 2016-03-07 | 2020-12-30 | GlobalWafers Co., Ltd. | Halbleiter-auf-isolator-struktur mit niedrigtemperatur-fliessfähiger oxidschicht und verfahren zur herstellung davon |
| US11114332B2 (en) | 2016-03-07 | 2021-09-07 | Globalwafers Co., Ltd. | Semiconductor on insulator structure comprising a plasma nitride layer and method of manufacture thereof |
| FR3051785B1 (fr) * | 2016-05-25 | 2025-04-25 | Soitec Silicon On Insulator | Procede de fabrication d'une couche |
| CN111201341B (zh) | 2016-06-08 | 2023-04-04 | 环球晶圆股份有限公司 | 具有经改进的机械强度的高电阻率单晶硅锭及晶片 |
| US10269617B2 (en) | 2016-06-22 | 2019-04-23 | Globalwafers Co., Ltd. | High resistivity silicon-on-insulator substrate comprising an isolation region |
| US20180019169A1 (en) * | 2016-07-12 | 2018-01-18 | QMAT, Inc. | Backing substrate stabilizing donor substrate for implant or reclamation |
| US20180033609A1 (en) * | 2016-07-28 | 2018-02-01 | QMAT, Inc. | Removal of non-cleaved/non-transferred material from donor substrate |
| EP4723861A2 (de) | 2016-10-26 | 2026-04-08 | GlobalWafers Co., Ltd. | Silicium-auf-isolator-substrat mit hohem widerstand und verbesserter ladungseinfangeffizienz |
| CN115714130A (zh) | 2016-12-05 | 2023-02-24 | 环球晶圆股份有限公司 | 高电阻率绝缘体上硅结构及其制造方法 |
| CN106783725B (zh) * | 2016-12-27 | 2019-09-17 | 上海新傲科技股份有限公司 | 带有绝缘埋层的衬底的制备方法 |
| CN106683980B (zh) * | 2016-12-27 | 2019-12-13 | 上海新傲科技股份有限公司 | 带有载流子俘获中心的衬底的制备方法 |
| CN114093764B (zh) | 2016-12-28 | 2025-07-22 | 太阳能爱迪生半导体有限公司 | 单晶硅晶片 |
| SG11201913769RA (en) | 2017-07-14 | 2020-01-30 | Sunedison Semiconductor Ltd | Method of manufacture of a semiconductor on insulator structure |
| JP7160943B2 (ja) | 2018-04-27 | 2022-10-25 | グローバルウェーハズ カンパニー リミテッド | 半導体ドナー基板からの層移転を容易にする光アシスト板状体形成 |
| EP4210092A1 (de) | 2018-06-08 | 2023-07-12 | GlobalWafers Co., Ltd. | Verfahren zur übertragung einer dünnen siliziumschicht |
| CN110880920B (zh) * | 2018-09-06 | 2021-01-19 | 中国科学院上海微系统与信息技术研究所 | 异质薄膜结构的制备方法 |
| FR3091000B1 (fr) | 2018-12-24 | 2020-12-04 | Soitec Silicon On Insulator | Procede de fabrication d’un substrat pour un capteur d’image de type face avant |
| FR3111232B1 (fr) | 2020-06-09 | 2022-05-06 | Soitec Silicon On Insulator | Substrat temporaire demontable compatible avec de tres hautes temperatures et procede de transfert d’une couche utile a partir dudit substrat |
| FR3120983A1 (fr) | 2021-03-18 | 2022-09-23 | Soitec | Substrat de type semi-conducteur sur isolant pour un transistor à effet de champ à capacité négative |
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|---|---|---|---|---|
| JP3217089B2 (ja) * | 1991-08-23 | 2001-10-09 | 富士通株式会社 | Soiウェハおよびその製造方法 |
| JPH05226666A (ja) * | 1992-02-13 | 1993-09-03 | Kawasaki Steel Corp | 半導体装置の製造方法 |
| JPH05259012A (ja) * | 1992-03-10 | 1993-10-08 | Nec Corp | 半導体基板およびその製造方法 |
| JP3192000B2 (ja) * | 1992-08-25 | 2001-07-23 | キヤノン株式会社 | 半導体基板及びその作製方法 |
| JPH0964205A (ja) * | 1995-08-22 | 1997-03-07 | Sony Corp | 窒化シリコン膜の形成方法 |
| KR100232886B1 (ko) * | 1996-11-23 | 1999-12-01 | 김영환 | Soi 웨이퍼 제조방법 |
| US6159824A (en) * | 1997-05-12 | 2000-12-12 | Silicon Genesis Corporation | Silicon-on-silicon wafer bonding process using a thin film blister-separation method |
| JP3975634B2 (ja) * | 2000-01-25 | 2007-09-12 | 信越半導体株式会社 | 半導体ウェハの製作法 |
| WO2002084725A1 (en) * | 2001-04-17 | 2002-10-24 | California Institute Of Technology | A method of using a germanium layer transfer to si for photovoltaic applications and heterostructure made thereby |
| US20020187619A1 (en) * | 2001-05-04 | 2002-12-12 | International Business Machines Corporation | Gettering process for bonded SOI wafers |
| US6696352B1 (en) * | 2001-09-11 | 2004-02-24 | Silicon Wafer Technologies, Inc. | Method of manufacture of a multi-layered substrate with a thin single crystalline layer and a versatile sacrificial layer |
| CN1172376C (zh) * | 2001-12-29 | 2004-10-20 | 中国科学院上海微系统与信息技术研究所 | 一种类似绝缘层上硅结构的材料及制备方法 |
| US6979630B2 (en) * | 2002-08-08 | 2005-12-27 | Isonics Corporation | Method and apparatus for transferring a thin layer of semiconductor material |
| JP2004087768A (ja) * | 2002-08-27 | 2004-03-18 | Shin Etsu Handotai Co Ltd | Soiウエーハの製造方法 |
| AU2003270040A1 (en) * | 2002-08-29 | 2004-03-19 | Massachusetts Institute Of Technology | Fabrication method for a monocrystalline semiconductor layer on a substrate |
| FR2845523B1 (fr) * | 2002-10-07 | 2005-10-28 | Procede pour realiser un substrat par transfert d'une plaquette donneuse comportant des especes etrangeres, et plaquette donneuse associee | |
| US7052978B2 (en) * | 2003-08-28 | 2006-05-30 | Intel Corporation | Arrangements incorporating laser-induced cleaving |
| US7625808B2 (en) * | 2003-09-01 | 2009-12-01 | Sumco Corporation | Method for manufacturing bonded wafer |
| US6972247B2 (en) * | 2003-12-05 | 2005-12-06 | International Business Machines Corporation | Method of fabricating strained Si SOI wafers |
| FR2865574B1 (fr) * | 2004-01-26 | 2006-04-07 | Soitec Silicon On Insulator | Procede de fabrication d'un substrat demontable |
| US7919391B2 (en) * | 2004-12-24 | 2011-04-05 | S.O.I.Tec Silicon On Insulator Technologies | Methods for preparing a bonding surface of a semiconductor wafer |
| US7344957B2 (en) * | 2005-01-19 | 2008-03-18 | Texas Instruments Incorporated | SOI wafer with cooling channels and a method of manufacture thereof |
-
2005
- 2005-09-08 FR FR0509168A patent/FR2890489B1/fr not_active Expired - Fee Related
-
2006
- 2006-01-05 US US11/327,015 patent/US7485551B2/en not_active Expired - Fee Related
- 2006-09-06 WO PCT/EP2006/066046 patent/WO2007028800A1/fr not_active Ceased
- 2006-09-06 AT AT06793255T patent/ATE521085T1/de not_active IP Right Cessation
- 2006-09-06 EP EP06793255A patent/EP1922751B1/de not_active Not-in-force
- 2006-09-06 KR KR1020087005289A patent/KR100979930B1/ko not_active Expired - Fee Related
- 2006-09-06 JP JP2008529625A patent/JP2009508329A/ja active Pending
- 2006-09-06 CN CN2006800328950A patent/CN101258591B/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| FR2890489B1 (fr) | 2008-03-07 |
| WO2007028800A1 (fr) | 2007-03-15 |
| US7485551B2 (en) | 2009-02-03 |
| KR100979930B1 (ko) | 2010-09-03 |
| FR2890489A1 (fr) | 2007-03-09 |
| EP1922751A1 (de) | 2008-05-21 |
| JP2009508329A (ja) | 2009-02-26 |
| CN101258591A (zh) | 2008-09-03 |
| CN101258591B (zh) | 2011-04-20 |
| KR20080040759A (ko) | 2008-05-08 |
| EP1922751B1 (de) | 2011-08-17 |
| US20070054466A1 (en) | 2007-03-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |