BE1005213A3 - Apparaat voor het testen van optische vezel door optische heterodyne techniek te gebruiken. - Google Patents

Apparaat voor het testen van optische vezel door optische heterodyne techniek te gebruiken. Download PDF

Info

Publication number: BE1005213A3
Authority: BE; Belgium
Prior art keywords: light beam; signal; optical fiber; polarized; electrical signal
Prior art date: 1990-09-28

Application number

BE9100894A

Other languages

English (en)

Dutch (nl)

Original Assignee

Ando Electric

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1990-09-28

Filing date

1991-09-26

Publication date

1993-05-25

1991-09-26 Application filed by Ando Electric filed Critical Ando Electric

1993-05-25 Application granted granted Critical

1993-05-25 Publication of BE1005213A3 publication Critical patent/BE1005213A3/nl

Links

239000013307 optical fiber Substances 0.000 title claims abstract description 26
238000012360 testing method Methods 0.000 title claims abstract description 10
230000003287 optical effect Effects 0.000 claims abstract description 27
238000012937 correction Methods 0.000 claims abstract description 12
230000001427 coherent effect Effects 0.000 claims abstract description 9
239000000835 fiber Substances 0.000 claims abstract description 8
230000008878 coupling Effects 0.000 claims abstract description 6
238000010168 coupling process Methods 0.000 claims abstract description 6
238000005859 coupling reaction Methods 0.000 claims abstract description 6
238000012545 processing Methods 0.000 claims description 13
238000001816 cooling Methods 0.000 claims 1
238000001514 detection method Methods 0.000 description 8
238000005259 measurement Methods 0.000 description 4
238000010586 diagram Methods 0.000 description 3
238000000034 method Methods 0.000 description 3
230000005540 biological transmission Effects 0.000 description 2
238000006243 chemical reaction Methods 0.000 description 2
238000012986 modification Methods 0.000 description 2
230000004048 modification Effects 0.000 description 2
230000015572 biosynthetic process Effects 0.000 description 1
238000010276 construction Methods 0.000 description 1
230000007547 defect Effects 0.000 description 1
230000000694 effects Effects 0.000 description 1
230000002068 genetic effect Effects 0.000 description 1
238000012946 outsourcing Methods 0.000 description 1
230000003252 repetitive effect Effects 0.000 description 1
235000013580 sausages Nutrition 0.000 description 1
229910000679 solder Inorganic materials 0.000 description 1
238000003786 synthesis reaction Methods 0.000 description 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3181—Reflectometers dealing with polarisation

Landscapes

Physics & Mathematics (AREA)
Optics & Photonics (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
General Physics & Mathematics (AREA)
Testing Of Optical Devices Or Fibers (AREA)
Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Tests Of Electronic Circuits (AREA)

BE9100894A 1990-09-28 1991-09-26 Apparaat voor het testen van optische vezel door optische heterodyne techniek te gebruiken. BE1005213A3 (nl)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP26024790A JPH04138331A (ja)	1990-09-28	1990-09-28	ヘテロダイン受光を用いた光パルス試験器

Publications (1)

Publication Number	Publication Date
BE1005213A3 true BE1005213A3 (nl)	1993-05-25

Family

ID=17345399

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
BE9100894A BE1005213A3 (nl)	1990-09-28	1991-09-26	Apparaat voor het testen van optische vezel door optische heterodyne techniek te gebruiken.

Country Status (3)

Country	Link
JP (1)	JPH04138331A (ja)
BE (1)	BE1005213A3 (ja)
GB (1)	GB2248990B (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP3122293B2 (ja) *	1993-10-29	2001-01-09	安藤電気株式会社	Ｏｔｄｒ測定装置
JP2001281102A (ja) *	2000-03-30	2001-10-10	Ando Electric Co Ltd	光ファイバの特性測定装置及び特性測定方法
US6563590B2 (en) *	2001-02-16	2003-05-13	Corning Incorporated	System and method for measurement of the state of polarization over wavelength
CN109143263B (zh) *	2018-07-05	2022-11-01	夏和娣	一种混合型测风激光雷达
KR20210007648A (ko)	2019-07-12	2021-01-20	엘지전자 주식회사	냉장고

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS63313030A (ja) *	1987-06-15	1988-12-21	Yokogawa Electric Corp	光ファイバ試験装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
GB2165118B (en) *	1984-09-29	1988-01-20	Plessey Co Plc	Otdr for sensing distortions in optical fibres
GB2215549B (en) *	1988-03-08	1992-02-12	Stc Plc	Sensor

1990
- 1990-09-28 JP JP26024790A patent/JPH04138331A/ja active Pending
1991
- 1991-09-26 GB GB9120504A patent/GB2248990B/en not_active Expired - Fee Related
- 1991-09-26 BE BE9100894A patent/BE1005213A3/nl not_active IP Right Cessation

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS63313030A (ja) *	1987-06-15	1988-12-21	Yokogawa Electric Corp	光ファイバ試験装置

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
ECOC 83 23 Oktober 1983, GENEVA, SWITZERLAND bladzijden 177 - 180; S.WRIGHT ET AL: 'High Dynamic Range Coherent Reflectometer for Fault Location' *
ELECTRONICS LETTERS. deel 24, nr. 2, 21 Januari 1988, ENAGE GB bladzijden 120 - 121; T. OKOSHI ET AL: 'Simple Formula for Bit-Error Rate in Optical Heterodyn DPSK' *
JEE JOURNAL OF ELECTRONIC ENGINEERING. deel 26, nr. 267, Maart 1989, TOKYO JP bladzijden 46 - 70; TAKAO OOKA: 'Trends in Optical Communic. Measurem. Technology and Meas. Instruments' *
JOURNAL OF LIGHTWAVE TECHNOLOGY. deel LT-5, nr. 2, Februari 1987, NEW YORK US bladzijden 274 - 276; B. GLANCE: 'Polarization Independant Coherent Optical Receiver' *
JOURNAL OF OPTICAL COMMUNICATIONS deel 10, nr. 4, 1989, bladzijden 149 - 153; P.T. FREDERIKSEN ET AL: 'A Fast Polarization Controller for Coherent Phase Diversity Receivers' *
PATENT ABSTRACTS OF JAPAN vol. 13, no. 152 (P-856)(3500) 13 April 1989 & JP-A-63 313 030 ( YOKOGAWA ELECTRIC CORP. ) 21 December 1988 *

Also Published As

Publication number	Publication date
JPH04138331A (ja)	1992-05-12
GB9120504D0 (en)	1991-11-06
GB2248990B (en)	1994-08-31
GB2248990A (en)	1992-04-22

Similar Documents

Publication	Publication Date	Title
US7873273B2 (en)	2011-01-18	Apparatus for measuring the characteristics of an optical fiber
US6388739B1 (en)	2002-05-14	Self-referencing microdoppler ladar receiver and associated detection method
US20140055770A1 (en)	2014-02-27	Distance measuring methods
CN113383246B (zh)	2024-02-27	一种fmcw激光雷达系统
KR100473923B1 (ko)	2005-03-07	２개의 레이저 광원을 갖는 엘립소미터
CA2337026A1 (en)	2000-08-31	Laser displacement measurement system
DK1068498T3 (da)	2002-10-28	Arrangement og fremgangsmåde til anvendelse af diffusionsbølgespektroskopi til måling af egenskaberne hos multifasesystemer samt ændringer deri
US5767688A (en)	1998-06-16	Electro-optic voltage measurement apparatus
EP1408629B1 (en)	2011-08-03	Optical sampling system for simultaneously monitoring intensity modulation and frequency modulation
BE1005213A3 (nl)	1993-05-25	Apparaat voor het testen van optische vezel door optische heterodyne techniek te gebruiken.
US7242481B2 (en)	2007-07-10	Laser vibrometry with coherent detection
CN112305550A (zh)	2021-02-02	相干探测装置及方法
GB2071905A (en)	1981-09-23	Angular velocity sensor based on a ring laser
EP1031817A2 (en)	2000-08-30	Pseudorandom-bit-sequence modulated fiber-optic gyro
JP2000266852A (ja)	2000-09-29	測距装置
US7016023B2 (en)	2006-03-21	Chromatic dispersion measurement
US7061620B2 (en)	2006-06-13	Method and apparatus for three-dimensional object detection
CN114585942B (zh)	2025-10-10	用于产生激光雷达系统的光脉冲的方法
CN121741696A (zh)	2026-03-27	一种用于光学相控阵的光束空间耦合装置及方法
US5625296A (en)	1997-04-29	Electro-optic voltage measurement apparatus
JPS5866881A (ja)	1983-04-21	光波測量機
JPS63269075A (ja)	1988-11-07	光フアイバ式センサ
JP2552602B2 (ja)	1996-11-13	光ファイバジャイロ
CN115825918B (zh)	2026-03-24	多量子态目标散射特性测量系统及方法
JPH11325815A (ja)	1999-11-26	干渉測長装置

Legal Events

Date

Code

Title

Description

1994-03-31

RE

Patent lapsed

Owner name: ANDO ELECTRIC CO. LTD

Effective date: 19930930