BRPI0801976A2 - sistema e mÉtodo para a inspeÇço de fissuras internas - Google Patents

sistema e mÉtodo para a inspeÇço de fissuras internas

Info

Publication number
BRPI0801976A2
BRPI0801976A2 BRPI0801976-2A BRPI0801976A BRPI0801976A2 BR PI0801976 A2 BRPI0801976 A2 BR PI0801976A2 BR PI0801976 A BRPI0801976 A BR PI0801976A BR PI0801976 A2 BRPI0801976 A2 BR PI0801976A2
Authority
BR
Brazil
Prior art keywords
probe
inner cavity
multifrequency
inspection
internal cracks
Prior art date
Application number
BRPI0801976-2A
Other languages
English (en)
Inventor
Changting Wang
Shridhar Champaknath Nath
Weston Blaine Griffin
Michael Wayne Fields
Darren Lee Hallman
Abdul Rahman Abdall Ai-Khalidy
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of BRPI0801976A2 publication Critical patent/BRPI0801976A2/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013Arrangements for scanning
    • G01N27/902Arrangements for scanning by moving the sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

Sistema e método para a inspeção de fissuras internas. É fornecido um método (60) para a inspeção de cavidades internas (44) em uma peça (12). O método (60) inclui inserir (62) uma sonda (14) dentro da cavidade interna (44). O método também inclui controlar (62) a movimentação da sonda (14) utilizando uma trajetória de varredura definida para movimentar a sonda (14) através de uma região de interesse da cavidade interna (44). O método (60) ainda inclui aplicar (64) sinais de excitação com diversas freqUências na sonda (14) de modo a gerar uma quantidade de sinais de respostas multifrequenciais. Os sinais de excitação multifrequenciais são aplicados (68) ao longo da trajetória de varredura definida dentro do cavidade interna (14). O método (60) também inclui realizar uma análise de fase multifrequencial nos sinais de resposta multifrequenciais de modo a inspecionar a cavidade interna (14).
BRPI0801976-2A 2007-05-07 2008-05-06 sistema e mÉtodo para a inspeÇço de fissuras internas BRPI0801976A2 (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/745,122 US20080278151A1 (en) 2007-05-07 2007-05-07 System and methods for inspecting internal cracks

Publications (1)

Publication Number Publication Date
BRPI0801976A2 true BRPI0801976A2 (pt) 2008-12-30

Family

ID=39540343

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0801976-2A BRPI0801976A2 (pt) 2007-05-07 2008-05-06 sistema e mÉtodo para a inspeÇço de fissuras internas

Country Status (7)

Country Link
US (1) US20080278151A1 (pt)
EP (1) EP1990637A3 (pt)
JP (1) JP2008275622A (pt)
CN (1) CN101303328A (pt)
BR (1) BRPI0801976A2 (pt)
CA (1) CA2629707A1 (pt)
SG (1) SG147393A1 (pt)

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US7994780B2 (en) * 2007-09-14 2011-08-09 General Electric Company System and method for inspection of parts with an eddy current probe
US8395378B2 (en) 2010-04-29 2013-03-12 General Electric Company Nondestructive robotic inspection method and system therefor
US8409102B2 (en) 2010-08-31 2013-04-02 General Electric Company Multi-focus ultrasound system and method
US20140207406A1 (en) * 2013-01-22 2014-07-24 General Electric Company Self-directed inspection plan
US9193402B2 (en) 2013-11-26 2015-11-24 Elwha Llc Structural assessment, maintenance, and repair apparatuses and methods
US9193068B2 (en) 2013-11-26 2015-11-24 Elwha Llc Structural assessment, maintenance, and repair apparatuses and methods
US9435766B2 (en) * 2013-12-05 2016-09-06 General Electric Company System and method for inspection of components
CN103950028A (zh) * 2014-04-24 2014-07-30 苏州科曼特自动化科技有限公司 工业部件探伤机器人
US10067256B2 (en) 2015-03-26 2018-09-04 General Electric Company Proximity probe interchange compensation
US10025289B2 (en) 2015-05-26 2018-07-17 Pratt & Whitney Canada Corp. System and method for automated part inspection
CN109490410B (zh) * 2018-12-25 2020-09-08 西安交通大学 残余应力作用下的应力腐蚀裂纹多频涡流定量评价方法
CN110514745B (zh) * 2019-09-02 2020-08-21 北京理工大学 一种基于多频声发射信号的缆索断丝位置确定的方法
US11756006B2 (en) * 2020-05-07 2023-09-12 Bye UAS LLC Airport pavement condition assessment methods and apparatuses
CN115165369A (zh) * 2021-04-01 2022-10-11 中国航发商用航空发动机有限责任公司 机器人、故障检测系统和方法

Family Cites Families (22)

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US4203069A (en) * 1977-12-29 1980-05-13 Electric Power Research Institute, Inc. Method and apparatus for non-destructively testing electrically conductive elongate cylindrical components using an eddy current producing coil with a rotor to concentrate the magnetic field in a selected area
US4271393A (en) * 1978-12-29 1981-06-02 The Boeing Company Apparatus and method for eddy current detection of subsurface discontinuities in conductive bodies
US4495466A (en) * 1982-04-08 1985-01-22 The United States Of America As Represented By The Secretary Of The Air Force Eddy current test probe with circumferential Segments and method of testing material surrounding fastener holes
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JPH06500170A (ja) * 1990-06-29 1994-01-06 エービービー アムデータ インコーポレイテッド 渦電流画像システム
EP0518635B1 (en) * 1991-06-11 2003-05-21 Newt Holdings Limited Probe
US5345514A (en) * 1991-09-16 1994-09-06 General Electric Company Method for inspecting components having complex geometric shapes
US5315234A (en) * 1992-04-03 1994-05-24 General Electric Company Eddy current device for inspecting a component having a flexible support with a plural sensor array
US5510709A (en) * 1993-09-27 1996-04-23 General Electric Company Eddy current surface inspection probe for aircraft fastener inspection, and inspection method
US5610517A (en) * 1995-06-07 1997-03-11 Vanderbilt University Method and apparatus for detecting flaws below the surface of an electrically conductive object
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Also Published As

Publication number Publication date
US20080278151A1 (en) 2008-11-13
CA2629707A1 (en) 2008-11-07
JP2008275622A (ja) 2008-11-13
SG147393A1 (en) 2008-11-28
EP1990637A3 (en) 2012-10-17
CN101303328A (zh) 2008-11-12
EP1990637A2 (en) 2008-11-12

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Legal Events

Date Code Title Description
B08F Application fees: application dismissed [chapter 8.6 patent gazette]

Free format text: REFERENTE A 6A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2260 DE 29/04/2014.