BRPI0801976A2 - sistema e mÉtodo para a inspeÇço de fissuras internas - Google Patents
sistema e mÉtodo para a inspeÇço de fissuras internasInfo
- Publication number
- BRPI0801976A2 BRPI0801976A2 BRPI0801976-2A BRPI0801976A BRPI0801976A2 BR PI0801976 A2 BRPI0801976 A2 BR PI0801976A2 BR PI0801976 A BRPI0801976 A BR PI0801976A BR PI0801976 A2 BRPI0801976 A2 BR PI0801976A2
- Authority
- BR
- Brazil
- Prior art keywords
- probe
- inner cavity
- multifrequency
- inspection
- internal cracks
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 7
- 238000007689 inspection Methods 0.000 title abstract 2
- 239000000523 sample Substances 0.000 abstract 4
- 230000005284 excitation Effects 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9013—Arrangements for scanning
- G01N27/902—Arrangements for scanning by moving the sensors
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Sistema e método para a inspeção de fissuras internas. É fornecido um método (60) para a inspeção de cavidades internas (44) em uma peça (12). O método (60) inclui inserir (62) uma sonda (14) dentro da cavidade interna (44). O método também inclui controlar (62) a movimentação da sonda (14) utilizando uma trajetória de varredura definida para movimentar a sonda (14) através de uma região de interesse da cavidade interna (44). O método (60) ainda inclui aplicar (64) sinais de excitação com diversas freqUências na sonda (14) de modo a gerar uma quantidade de sinais de respostas multifrequenciais. Os sinais de excitação multifrequenciais são aplicados (68) ao longo da trajetória de varredura definida dentro do cavidade interna (14). O método (60) também inclui realizar uma análise de fase multifrequencial nos sinais de resposta multifrequenciais de modo a inspecionar a cavidade interna (14).
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/745,122 US20080278151A1 (en) | 2007-05-07 | 2007-05-07 | System and methods for inspecting internal cracks |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BRPI0801976A2 true BRPI0801976A2 (pt) | 2008-12-30 |
Family
ID=39540343
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BRPI0801976-2A BRPI0801976A2 (pt) | 2007-05-07 | 2008-05-06 | sistema e mÉtodo para a inspeÇço de fissuras internas |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20080278151A1 (pt) |
| EP (1) | EP1990637A3 (pt) |
| JP (1) | JP2008275622A (pt) |
| CN (1) | CN101303328A (pt) |
| BR (1) | BRPI0801976A2 (pt) |
| CA (1) | CA2629707A1 (pt) |
| SG (1) | SG147393A1 (pt) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7994780B2 (en) * | 2007-09-14 | 2011-08-09 | General Electric Company | System and method for inspection of parts with an eddy current probe |
| US8395378B2 (en) | 2010-04-29 | 2013-03-12 | General Electric Company | Nondestructive robotic inspection method and system therefor |
| US8409102B2 (en) | 2010-08-31 | 2013-04-02 | General Electric Company | Multi-focus ultrasound system and method |
| US20140207406A1 (en) * | 2013-01-22 | 2014-07-24 | General Electric Company | Self-directed inspection plan |
| US9193402B2 (en) | 2013-11-26 | 2015-11-24 | Elwha Llc | Structural assessment, maintenance, and repair apparatuses and methods |
| US9193068B2 (en) | 2013-11-26 | 2015-11-24 | Elwha Llc | Structural assessment, maintenance, and repair apparatuses and methods |
| US9435766B2 (en) * | 2013-12-05 | 2016-09-06 | General Electric Company | System and method for inspection of components |
| CN103950028A (zh) * | 2014-04-24 | 2014-07-30 | 苏州科曼特自动化科技有限公司 | 工业部件探伤机器人 |
| US10067256B2 (en) | 2015-03-26 | 2018-09-04 | General Electric Company | Proximity probe interchange compensation |
| US10025289B2 (en) | 2015-05-26 | 2018-07-17 | Pratt & Whitney Canada Corp. | System and method for automated part inspection |
| CN109490410B (zh) * | 2018-12-25 | 2020-09-08 | 西安交通大学 | 残余应力作用下的应力腐蚀裂纹多频涡流定量评价方法 |
| CN110514745B (zh) * | 2019-09-02 | 2020-08-21 | 北京理工大学 | 一种基于多频声发射信号的缆索断丝位置确定的方法 |
| US11756006B2 (en) * | 2020-05-07 | 2023-09-12 | Bye UAS LLC | Airport pavement condition assessment methods and apparatuses |
| CN115165369A (zh) * | 2021-04-01 | 2022-10-11 | 中国航发商用航空发动机有限责任公司 | 机器人、故障检测系统和方法 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4203069A (en) * | 1977-12-29 | 1980-05-13 | Electric Power Research Institute, Inc. | Method and apparatus for non-destructively testing electrically conductive elongate cylindrical components using an eddy current producing coil with a rotor to concentrate the magnetic field in a selected area |
| US4271393A (en) * | 1978-12-29 | 1981-06-02 | The Boeing Company | Apparatus and method for eddy current detection of subsurface discontinuities in conductive bodies |
| US4495466A (en) * | 1982-04-08 | 1985-01-22 | The United States Of America As Represented By The Secretary Of The Air Force | Eddy current test probe with circumferential Segments and method of testing material surrounding fastener holes |
| SE456532B (sv) * | 1985-10-18 | 1988-10-10 | Asea Ab | Arrangemang for ytavsokning av ett provobjekt |
| JPH06500170A (ja) * | 1990-06-29 | 1994-01-06 | エービービー アムデータ インコーポレイテッド | 渦電流画像システム |
| EP0518635B1 (en) * | 1991-06-11 | 2003-05-21 | Newt Holdings Limited | Probe |
| US5345514A (en) * | 1991-09-16 | 1994-09-06 | General Electric Company | Method for inspecting components having complex geometric shapes |
| US5315234A (en) * | 1992-04-03 | 1994-05-24 | General Electric Company | Eddy current device for inspecting a component having a flexible support with a plural sensor array |
| US5510709A (en) * | 1993-09-27 | 1996-04-23 | General Electric Company | Eddy current surface inspection probe for aircraft fastener inspection, and inspection method |
| US5610517A (en) * | 1995-06-07 | 1997-03-11 | Vanderbilt University | Method and apparatus for detecting flaws below the surface of an electrically conductive object |
| US6420867B1 (en) * | 1997-03-13 | 2002-07-16 | Jentek Sensors, Inc. | Method of detecting widespread fatigue and cracks in a metal structure |
| US6657429B1 (en) * | 1995-08-25 | 2003-12-02 | Jentek Sensors, Inc. | Material condition assessment with spatially periodic field sensors |
| US6037768A (en) * | 1997-04-02 | 2000-03-14 | Iowa State University Research Foundation, Inc. | Pulsed eddy current inspections and the calibration and display of inspection results |
| US5969260A (en) * | 1998-03-30 | 1999-10-19 | Mcdonnell Douglas Corporation | Remotely interrogatable apparatus and method for detecting defects in structural members |
| US20030164700A1 (en) * | 2001-03-19 | 2003-09-04 | Jentek Sensors, Inc. | High resolution hidden damage imaging |
| US6784662B2 (en) * | 2001-03-19 | 2004-08-31 | Jentek Sensors, Inc. | Eddy current sensor arrays having drive windings with extended portions |
| US6907358B2 (en) * | 2003-01-30 | 2005-06-14 | General Electric Company | Eddy current inspection method |
| US6972561B2 (en) * | 2003-02-28 | 2005-12-06 | General Electric Company | Internal eddy current inspection |
| US20050007108A1 (en) * | 2003-07-11 | 2005-01-13 | Teodor Dogaru | Probes and methods for detecting defects in metallic structures |
| US7518359B2 (en) * | 2005-03-09 | 2009-04-14 | General Electric Company | Inspection of non-planar parts using multifrequency eddy current with phase analysis |
| US7206706B2 (en) * | 2005-03-09 | 2007-04-17 | General Electric Company | Inspection method and system using multifrequency phase analysis |
| US7337651B2 (en) | 2005-04-05 | 2008-03-04 | General Electric Company | Method for performing model based scanplan generation of a component under inspection |
-
2007
- 2007-05-07 US US11/745,122 patent/US20080278151A1/en not_active Abandoned
-
2008
- 2008-04-18 SG SG200802992-8A patent/SG147393A1/en unknown
- 2008-04-24 CA CA002629707A patent/CA2629707A1/en not_active Abandoned
- 2008-04-29 EP EP08155344A patent/EP1990637A3/en not_active Withdrawn
- 2008-05-01 JP JP2008119449A patent/JP2008275622A/ja not_active Withdrawn
- 2008-05-06 CN CNA2008100967635A patent/CN101303328A/zh active Pending
- 2008-05-06 BR BRPI0801976-2A patent/BRPI0801976A2/pt not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| US20080278151A1 (en) | 2008-11-13 |
| CA2629707A1 (en) | 2008-11-07 |
| JP2008275622A (ja) | 2008-11-13 |
| SG147393A1 (en) | 2008-11-28 |
| EP1990637A3 (en) | 2012-10-17 |
| CN101303328A (zh) | 2008-11-12 |
| EP1990637A2 (en) | 2008-11-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| B08F | Application fees: application dismissed [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 6A ANUIDADE. |
|
| B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2260 DE 29/04/2014. |