BRPI0600875A - método e sistema de inspeção empregando a análise multifrequencial da fase - Google Patents

método e sistema de inspeção empregando a análise multifrequencial da fase

Info

Publication number
BRPI0600875A
BRPI0600875A BRPI0600875-5A BRPI0600875A BRPI0600875A BR PI0600875 A BRPI0600875 A BR PI0600875A BR PI0600875 A BRPI0600875 A BR PI0600875A BR PI0600875 A BRPI0600875 A BR PI0600875A
Authority
BR
Brazil
Prior art keywords
frequency
probe
phase analysis
signals
inspection method
Prior art date
Application number
BRPI0600875-5A
Other languages
English (en)
Inventor
Changting Wang
William Stewart Mcknight
Ui Won Suh
Serkan Ertekin
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of BRPI0600875A publication Critical patent/BRPI0600875A/pt
Publication of BRPI0600875B1 publication Critical patent/BRPI0600875B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9073—Recording measured data
    • G01N27/9086—Calibrating of recording device

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

"MéTODO E SISTEMA DE INSPEçãO EMPREGANDO A ANáLISE MULTIFREQUENCIAL DA FASE". é descrito um método para inspecionar uma peça. O método compreende aplicar um certo número de sinas multifrequenciais de excitação a uma sonda (12) para gerar um certo número de sinais multifrequenciais de resposta para a peça (18) que está sendo inspecionada. O método ainda compreende realizar uma análise multifrequencial de fase nos sinais multifrequenciais de resposta para inspecionar abaixo da superfície da peça (18). é descrito um sistema de inspeção (10), o qual compreende uma sonda (12) por corrente parasitária (EC) configurada para induzir correntes parasitárias em uma peça (18). O sistema (10) ainda inclui um instrumento por corrente parasitária (14) acoplado à sonda EC por corrente parasitária (12), e configurado para aplicar sinas multifrequenciais de excitação na sonda ES (12) de modo a gerar uma pluralidade de sinais multifrequenciais de resposta. O sistema (10) ainda inclui um processador (16) configurado para analisar os sinais multifrequenciais de resposta do instrumento EC (14) através da realização de uma análise multifrequencial da fase, para inspecionar abaixo da superfície da peça (18).
BRPI0600875-5A 2005-03-09 2006-03-08 Method and inspection system employing phase multifrequential analysis BRPI0600875B1 (pt)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US66003205P 2005-03-09 2005-03-09
US60/660,032 2005-03-09
US11/210,119 2005-08-22
US11/210,119 US7206706B2 (en) 2005-03-09 2005-08-22 Inspection method and system using multifrequency phase analysis

Publications (2)

Publication Number Publication Date
BRPI0600875A true BRPI0600875A (pt) 2006-11-07
BRPI0600875B1 BRPI0600875B1 (pt) 2017-11-14

Family

ID=36371043

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0600875-5A BRPI0600875B1 (pt) 2005-03-09 2006-03-08 Method and inspection system employing phase multifrequential analysis

Country Status (7)

Country Link
US (1) US7206706B2 (pt)
EP (1) EP1701157B1 (pt)
JP (1) JP4837399B2 (pt)
CN (1) CN1841060B (pt)
BR (1) BRPI0600875B1 (pt)
CA (1) CA2537531C (pt)
SG (1) SG126066A1 (pt)

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* Cited by examiner, † Cited by third party
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US7206706B2 (en) * 2005-03-09 2007-04-17 General Electric Company Inspection method and system using multifrequency phase analysis
US7518359B2 (en) 2005-03-09 2009-04-14 General Electric Company Inspection of non-planar parts using multifrequency eddy current with phase analysis
US7817845B2 (en) * 2006-12-29 2010-10-19 General Electric Company Multi-frequency image processing for inspecting parts having complex geometric shapes
US20080278151A1 (en) 2007-05-07 2008-11-13 General Electric Company System and methods for inspecting internal cracks
US7994780B2 (en) * 2007-09-14 2011-08-09 General Electric Company System and method for inspection of parts with an eddy current probe
US8269489B2 (en) 2008-11-25 2012-09-18 General Electric Company System and method for eddy current inspection of parts with complex geometries
US8436608B2 (en) * 2009-09-21 2013-05-07 General Electric Company Eddy current inspection system and method
DE102009059092B4 (de) * 2009-12-18 2012-03-01 V & M Deutschland Gmbh Verfahren zur Unterscheidung und Identifikation von Werkstücken aus ferromagnetischem Werkstoff mittels zerstörungsfreier Prüfung
RU2456589C1 (ru) * 2011-03-23 2012-07-20 Закрытое Акционерное Общество "КОНСТАНТА" Способ вихретокового измерения толщины металлических покрытий
US8884614B2 (en) 2011-10-31 2014-11-11 General Electric Company Eddy current array probe
JP5692007B2 (ja) * 2011-11-02 2015-04-01 トヨタ自動車株式会社 溶射皮膜の品質評価方法
DE102012200060A1 (de) * 2012-01-03 2013-07-04 Endress + Hauser Gmbh + Co. Kg Anordnung und Verfahren zur Prüfung einer Schweißnaht mittels Wirbelstromverfahren
US9193068B2 (en) 2013-11-26 2015-11-24 Elwha Llc Structural assessment, maintenance, and repair apparatuses and methods
US9193402B2 (en) 2013-11-26 2015-11-24 Elwha Llc Structural assessment, maintenance, and repair apparatuses and methods
US9435766B2 (en) 2013-12-05 2016-09-06 General Electric Company System and method for inspection of components
CN105095623B (zh) * 2014-05-13 2017-11-17 中国人民解放军总医院 疾病生物标志物的筛选分析方法、平台、服务器及系统
US9726640B2 (en) * 2014-11-21 2017-08-08 Olympus Scientific Solutions Americas Inc. Circuit and method of providing a stable display for eddy current instruments
RU2610350C1 (ru) * 2015-11-03 2017-02-09 Федеральное государственное бюджетное образовательное учреждение высшего образования "Московский государственный университет информационных технологий, радиотехники и электроники" Способ вихретокового контроля
CN106645391A (zh) * 2016-10-10 2017-05-10 南京航空航天大学 一种用于评估碳纤维板缺陷深度的多频涡流检测系统及检测方法
US10260854B2 (en) 2016-12-07 2019-04-16 Probe Technology Services, Inc. Pulsed eddy current casing inspection tool
CN107422029B (zh) * 2017-04-28 2020-11-03 陕西科技大学 一种精确检测金属板缺陷的装置和方法
CN108982652B (zh) * 2018-08-15 2022-05-20 东北大学 一种多频激励场阵列电磁无损检测金属表面裂纹的方法
CN109444255A (zh) * 2018-09-06 2019-03-08 昆明理工大学 一种碳纤维增强复合材料缺陷的诊断方法
CN110702783A (zh) * 2019-11-20 2020-01-17 天津市思维奇检测技术有限公司 一种检测水冷壁管热疲劳裂纹的阵列涡流方法
CN111367179B (zh) * 2020-03-27 2022-05-03 无锡吉兴汽车声学部件科技有限公司 一种声传函建模方法及采用该方法的主动降噪系统
DE102020205857A1 (de) 2020-05-08 2021-11-11 Volkswagen Aktiengesellschaft Prüfsystem, Prüfanlage und Verfahren zur Deckschichtanalyse eines beschichteten Bauteils
US20230408448A1 (en) * 2022-06-20 2023-12-21 Southwest Research Institute Eddy current measurement and analysis for the detection of grinding burns on high strength steel through chrome plating
JP7647711B2 (ja) * 2022-08-30 2025-03-18 横河電機株式会社 磁気パイプセンサ

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JPS5611351A (en) * 1979-07-10 1981-02-04 Hara Denshi Sokki Kk Time division-type multifrequency eddy current
JPS56119845A (en) * 1980-02-26 1981-09-19 Mitsubishi Heavy Ind Ltd Multifrequency eddy current defectoscope
JPS599552A (ja) 1982-07-08 1984-01-18 Sumitomo Metal Ind Ltd 電磁誘導試験装置
US4641092A (en) * 1982-07-08 1987-02-03 Sumitomo Metal Industries, Ltd. Rotary probe apparatus for detecting flaws in a test object
JPS59108955A (ja) 1982-12-13 1984-06-23 Nippon Steel Corp マルチプロ−ブコイルマルチ周波数渦流探傷装置
JPS59163559A (ja) * 1983-03-08 1984-09-14 Nippon Steel Corp 渦流探傷方法
JPS60146149A (ja) * 1984-01-10 1985-08-01 Sumitomo Metal Ind Ltd 渦流探傷法及び装置
JPS6138404A (ja) * 1984-07-30 1986-02-24 Kobe Steel Ltd ライナ−被覆管のライナ−層厚・ジルカロイ厚測定法
JPS62191755A (ja) * 1986-02-18 1987-08-22 Kobe Steel Ltd 電磁誘導試験における信号処理方法
US5610517A (en) * 1995-06-07 1997-03-11 Vanderbilt University Method and apparatus for detecting flaws below the surface of an electrically conductive object
US6037768A (en) * 1997-04-02 2000-03-14 Iowa State University Research Foundation, Inc. Pulsed eddy current inspections and the calibration and display of inspection results
JP4171147B2 (ja) * 1999-11-09 2008-10-22 コスモ石油株式会社 水素脆化判定方法
JP3965472B2 (ja) * 2002-04-26 2007-08-29 株式会社タウ技研 埋設ライン被覆損傷部の特定方法
JP3816071B2 (ja) * 2003-10-17 2006-08-30 神鋼検査サービス株式会社 渦流探傷装置
US7206706B2 (en) * 2005-03-09 2007-04-17 General Electric Company Inspection method and system using multifrequency phase analysis

Also Published As

Publication number Publication date
CA2537531A1 (en) 2006-09-09
EP1701157A1 (en) 2006-09-13
US20060217908A1 (en) 2006-09-28
SG126066A1 (en) 2006-10-30
US7206706B2 (en) 2007-04-17
JP2006250935A (ja) 2006-09-21
BRPI0600875B1 (pt) 2017-11-14
EP1701157B1 (en) 2018-05-16
CN1841060A (zh) 2006-10-04
JP4837399B2 (ja) 2011-12-14
CA2537531C (en) 2016-04-12
CN1841060B (zh) 2012-08-22

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Legal Events

Date Code Title Description
B07A Application suspended after technical examination (opinion) [chapter 7.1 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]
B21F Lapse acc. art. 78, item iv - on non-payment of the annual fees in time

Free format text: REFERENTE A 16A ANUIDADE.

B24J Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12)

Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2661 DE 04-01-2022 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.