BRPI1005172A2 - método de analisar fluorescência de raio-x - Google Patents
método de analisar fluorescência de raio-xInfo
- Publication number
- BRPI1005172A2 BRPI1005172A2 BRPI1005172A BRPI1005172A BRPI1005172A2 BR PI1005172 A2 BRPI1005172 A2 BR PI1005172A2 BR PI1005172 A BRPI1005172 A BR PI1005172A BR PI1005172 A BRPI1005172 A BR PI1005172A BR PI1005172 A2 BRPI1005172 A2 BR PI1005172A2
- Authority
- BR
- Brazil
- Prior art keywords
- analyzing
- ray fluorescence
- fluorescence
- ray
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/637—Specific applications or type of materials liquid
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009205822 | 2009-09-07 | ||
| PCT/JP2010/061250 WO2011027613A1 (ja) | 2009-09-07 | 2010-07-01 | 蛍光ｘ線分析方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| BRPI1005172A2 true BRPI1005172A2 (pt) | 2017-04-25 |
| BRPI1005172B1 BRPI1005172B1 (pt) | 2019-09-10 |
| BRPI1005172B8 BRPI1005172B8 (pt) | 2020-09-08 |
Family
ID=43638545
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BRPI1005172A BRPI1005172B8 (pt) | 2009-09-07 | 2010-07-01 | método de analisar fluorescência de raio-x |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8433035B2 (pt) |
| EP (1) | EP2333529B1 (pt) |
| JP (1) | JP4629158B1 (pt) |
| CN (1) | CN102187208B (pt) |
| BR (1) | BRPI1005172B8 (pt) |
| WO (1) | WO2011027613A1 (pt) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8433035B2 (en) | 2009-09-07 | 2013-04-30 | Rigaku Corporation | X-ray fluorescence analyzing method |
| US20110304437A1 (en) * | 2010-06-09 | 2011-12-15 | Plus Location Systems USA LLC | Antenna and Sensor System for Sharply Defined Active Sensing Zones |
| US9164047B2 (en) * | 2010-10-08 | 2015-10-20 | Bruker Axs Gmbh | Apparatus and method for supporting a liquid sample for measuring scattering of electromagnetic radiation |
| JP2013053873A (ja) * | 2011-09-01 | 2013-03-21 | Jeol Ltd | スペクトル表示装置、スペクトル表示方法、およびプログラム |
| DE102012204350B4 (de) * | 2012-03-20 | 2021-12-02 | Siemens Healthcare Gmbh | Verfahren zur Energie-Kalibrierung quantenzählender Röntgendetektoren in einem Dual-Source Computertomographen |
| CN103940836A (zh) * | 2013-01-22 | 2014-07-23 | 中国科学院青海盐湖研究所 | 液体x射线散射样品池 |
| WO2015056305A1 (ja) * | 2013-10-15 | 2015-04-23 | 株式会社島津製作所 | 蛍光ｘ線分析方法及び蛍光ｘ線分析装置 |
| FR3030043B1 (fr) * | 2014-12-12 | 2017-12-22 | Commissariat Energie Atomique | Procede d'etude d'une zone d'un objet pour en determiner une epaisseur massique et une composition en utilisant un faisceau d'electrons et des mesures d'intensite d'un rayonnement x |
| US10018748B2 (en) | 2015-01-16 | 2018-07-10 | Saudi Arabian Oil Company | Inline density and fluorescence spectrometry meter |
| US9784699B2 (en) * | 2015-03-03 | 2017-10-10 | Panalytical B.V. | Quantitative X-ray analysis—matrix thickness correction |
| CN107209132B (zh) * | 2015-08-28 | 2019-06-21 | 株式会社理学 | 荧光x射线分析装置 |
| CN106908466A (zh) * | 2017-03-29 | 2017-06-30 | 中国科学院过程工程研究所 | 一种在线x射线荧光光谱分析系统 |
| US11047814B2 (en) | 2017-08-07 | 2021-06-29 | C. Uyemura & Co., Ltd. | X-ray fluorescence analysis measurement method and X-ray fluorescence analysis measurement device |
| JP6979650B2 (ja) * | 2018-03-13 | 2021-12-15 | 株式会社リガク | 蛍光ｘ線分析方法、蛍光ｘ線分析装置またはプログラム |
| CN110132188B (zh) * | 2019-06-19 | 2020-11-10 | 中国人民解放军空军工程大学 | 一种基于多元素x射线特征光谱综合分析的涂渗层厚度计算方法 |
| JP7302504B2 (ja) * | 2020-02-27 | 2023-07-04 | 株式会社島津製作所 | 蛍光ｘ線分析装置 |
| JP7497058B2 (ja) | 2021-12-01 | 2024-06-10 | 株式会社リガク | 蛍光ｘ線分析装置 |
| EP4276452B1 (en) * | 2022-05-13 | 2024-07-03 | Bruker AXS GmbH | System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5459193A (en) | 1977-10-19 | 1979-05-12 | Mitsubishi Electric Corp | Fluorescent x-ray sulfur analytical apparatus |
| JPS6482749A (en) | 1987-09-24 | 1989-03-28 | Nec Corp | Announcement machine |
| JPH01214748A (ja) | 1988-02-24 | 1989-08-29 | Nippon I T S Kk | 微量試料液用蛍光ｘ線分析方法および装置 |
| JP3059403B2 (ja) * | 1996-07-18 | 2000-07-04 | 理学電機工業株式会社 | Ｘ線分析方法および装置 |
| JP3569734B2 (ja) | 2000-09-04 | 2004-09-29 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| US7298817B2 (en) * | 2003-12-01 | 2007-11-20 | X-Ray Optical Systems, Inc. | Portable and on-line arsenic analyzer for drinking water |
| JP4247559B2 (ja) * | 2005-06-07 | 2009-04-02 | 株式会社リガク | 蛍光ｘ線分析装置およびそれに用いるプログラム |
| JP4262734B2 (ja) * | 2005-09-14 | 2009-05-13 | 株式会社リガク | 蛍光ｘ線分析装置および方法 |
| JP4908119B2 (ja) * | 2005-10-19 | 2012-04-04 | 株式会社リガク | 蛍光ｘ線分析装置 |
| JP3950156B1 (ja) | 2006-04-11 | 2007-07-25 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| EP1978354A1 (en) * | 2007-04-05 | 2008-10-08 | Panalytical B.V. | Wavelength dispersive X-ray Fluorescence Apparatus with energy dispersive detector in the form of a silicon drift detector to improve background supression |
| JP4514772B2 (ja) | 2007-06-01 | 2010-07-28 | 株式会社リガク | 蛍光ｘ線分析装置およびその方法 |
| JP2009205822A (ja) | 2008-02-26 | 2009-09-10 | Panasonic Electric Works Co Ltd | 照明器具 |
| US8433035B2 (en) | 2009-09-07 | 2013-04-30 | Rigaku Corporation | X-ray fluorescence analyzing method |
-
2010
- 2010-07-01 US US13/123,121 patent/US8433035B2/en active Active
- 2010-07-01 JP JP2010150813A patent/JP4629158B1/ja active Active
- 2010-07-01 EP EP10813564.1A patent/EP2333529B1/en active Active
- 2010-07-01 BR BRPI1005172A patent/BRPI1005172B8/pt not_active IP Right Cessation
- 2010-07-01 CN CN2010800029349A patent/CN102187208B/zh active Active
- 2010-07-01 WO PCT/JP2010/061250 patent/WO2011027613A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP2333529A4 (en) | 2011-09-07 |
| CN102187208B (zh) | 2013-12-04 |
| WO2011027613A1 (ja) | 2011-03-10 |
| US8433035B2 (en) | 2013-04-30 |
| JP2011075542A (ja) | 2011-04-14 |
| EP2333529A1 (en) | 2011-06-15 |
| CN102187208A (zh) | 2011-09-14 |
| BRPI1005172B1 (pt) | 2019-09-10 |
| EP2333529B1 (en) | 2013-10-16 |
| US20110243301A1 (en) | 2011-10-06 |
| JP4629158B1 (ja) | 2011-02-09 |
| BRPI1005172B8 (pt) | 2020-09-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| B06F | Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette] | ||
| B06T | Formal requirements before examination [chapter 6.20 patent gazette] | ||
| B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
| B16A | Patent or certificate of addition of invention granted [chapter 16.1 patent gazette] |
Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 01/07/2010, OBSERVADAS AS CONDICOES LEGAIS. (CO) 20 (VINTE) ANOS CONTADOS A PARTIR DE 01/07/2010, OBSERVADAS AS CONDICOES LEGAIS |
|
| B16C | Correction of notification of the grant [chapter 16.3 patent gazette] |
Free format text: REF. RPI 2540 DE 10/09/2019 QUANTO AO RELATORIO DESCRITIVO. |
|
| B21F | Lapse acc. art. 78, item iv - on non-payment of the annual fees in time |
Free format text: REFERENTE A 15A ANUIDADE. |