CA2001682A1 - Transistor en couches minces a fonction de memorisation et methode pour utiliser ce transistor comme element de memoire - Google Patents
Transistor en couches minces a fonction de memorisation et methode pour utiliser ce transistor comme element de memoireInfo
- Publication number
- CA2001682A1 CA2001682A1 CA2001682A CA2001682A CA2001682A1 CA 2001682 A1 CA2001682 A1 CA 2001682A1 CA 2001682 A CA2001682 A CA 2001682A CA 2001682 A CA2001682 A CA 2001682A CA 2001682 A1 CA2001682 A1 CA 2001682A1
- Authority
- CA
- Canada
- Prior art keywords
- thin film
- film transistor
- semiconductor layer
- gate
- memory element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010409 thin film Substances 0.000 title abstract 6
- 230000006386 memory function Effects 0.000 title 1
- 239000004065 semiconductor Substances 0.000 abstract 5
- 239000010408 film Substances 0.000 abstract 4
- 238000009413 insulation Methods 0.000 abstract 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract 2
- 229910052581 Si3N4 Inorganic materials 0.000 abstract 1
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 230000001276 controlling effect Effects 0.000 abstract 1
- 230000005684 electric field Effects 0.000 abstract 1
- 229910052757 nitrogen Inorganic materials 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/69—IGFETs having charge trapping gate insulators, e.g. MNOS transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
- H10D84/645—Combinations of only lateral BJTs
Landscapes
- Thin Film Transistor (AREA)
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (14)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63-270893 | 1988-10-28 | ||
| JP63270893A JPH0831607B2 (ja) | 1988-10-28 | 1988-10-28 | メモリ用薄膜トランジスタ |
| JP63-282596 | 1988-11-10 | ||
| JP63282596A JPH02130837A (ja) | 1988-11-10 | 1988-11-10 | 薄膜トランジスタおよびその製造方法 |
| JP1-78390 | 1989-03-31 | ||
| JP1078390A JPH02260462A (ja) | 1989-03-31 | 1989-03-31 | 薄膜メモリ素子 |
| JP1087009A JPH02266570A (ja) | 1989-04-07 | 1989-04-07 | メモリ用薄膜トランジスタ |
| JP1-87009 | 1989-04-07 | ||
| JP1989043098U JPH02137053U (fr) | 1989-04-14 | 1989-04-14 | |
| JP1-43098 | 1989-04-14 | ||
| JP1989043099U JPH02137054U (fr) | 1989-04-14 | 1989-04-14 | |
| JP1-43099 | 1989-04-14 | ||
| JP1117580A JPH02297972A (ja) | 1989-05-12 | 1989-05-12 | メモリ用薄膜トランジスタおよびそのゲート絶縁膜の形成方法 |
| JP1-117580 | 1989-05-12 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2001682A1 true CA2001682A1 (fr) | 1990-04-28 |
| CA2001682C CA2001682C (fr) | 1994-05-03 |
Family
ID=27564561
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002001682A Expired - Fee Related CA2001682C (fr) | 1988-10-28 | 1989-10-27 | Transistor en couches minces a fonction de memorisation et methode pour utiliser ce transistor comme element de memoire |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0366146B1 (fr) |
| KR (1) | KR930003556B1 (fr) |
| CA (1) | CA2001682C (fr) |
| DE (1) | DE68912071T2 (fr) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3613594B2 (ja) * | 1993-08-19 | 2005-01-26 | 株式会社ルネサステクノロジ | 半導体素子およびこれを用いた半導体記憶装置 |
| JP4538693B2 (ja) * | 1998-01-26 | 2010-09-08 | ソニー株式会社 | メモリ素子およびその製造方法 |
| EP0986107A1 (fr) * | 1998-09-08 | 2000-03-15 | STMicroelectronics S.r.l. | Structure de cellules en matrice pour un dispositif de mémoire électriquement effaçable et programmable |
| KR100730141B1 (ko) * | 2005-08-02 | 2007-06-19 | 삼성에스디아이 주식회사 | 박막 트랜지스터 및 이를 구비한 평판표시장치 |
| CN112909087A (zh) * | 2021-03-08 | 2021-06-04 | 滁州惠科光电科技有限公司 | 一种显示面板、薄膜晶体管及其制备方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4096509A (en) * | 1976-07-22 | 1978-06-20 | The United States Of America As Represented By The Secretary Of The Air Force | MNOS memory transistor having a redeposited silicon nitride gate dielectric |
| US4053917A (en) * | 1976-08-16 | 1977-10-11 | The United States Of America As Represented By The Secretary Of The Air Force | Drain source protected MNOS transistor and method of manufacture |
| US4323910A (en) * | 1977-11-28 | 1982-04-06 | Rca Corporation | MNOS Memory transistor |
| US4876582A (en) * | 1983-05-02 | 1989-10-24 | Ncr Corporation | Crystallized silicon-on-insulator nonvolatile memory device |
| EP0138439B1 (fr) * | 1983-09-28 | 1990-12-19 | Kabushiki Kaisha Toshiba | Dispositif de mémoire semi-conducteur non volatil, électriquement effaçable et programmable ayant deux électrodes de portes |
-
1989
- 1989-10-27 EP EP89120014A patent/EP0366146B1/fr not_active Expired - Lifetime
- 1989-10-27 DE DE89120014T patent/DE68912071T2/de not_active Expired - Fee Related
- 1989-10-27 CA CA002001682A patent/CA2001682C/fr not_active Expired - Fee Related
- 1989-10-28 KR KR1019890015604A patent/KR930003556B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP0366146A2 (fr) | 1990-05-02 |
| EP0366146B1 (fr) | 1994-01-05 |
| KR900007075A (ko) | 1990-05-09 |
| EP0366146A3 (en) | 1990-11-07 |
| CA2001682C (fr) | 1994-05-03 |
| DE68912071T2 (de) | 1994-04-28 |
| KR930003556B1 (ko) | 1993-05-06 |
| DE68912071D1 (de) | 1994-02-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed |