CA2010263A1 - Methode et appareil de controle de la qualite de produits manufactures - Google Patents

Methode et appareil de controle de la qualite de produits manufactures

Info

Publication number
CA2010263A1
CA2010263A1 CA 2010263 CA2010263A CA2010263A1 CA 2010263 A1 CA2010263 A1 CA 2010263A1 CA 2010263 CA2010263 CA 2010263 CA 2010263 A CA2010263 A CA 2010263A CA 2010263 A1 CA2010263 A1 CA 2010263A1
Authority
CA
Canada
Prior art keywords
article
signal
peaks
physical feature
sensing means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA 2010263
Other languages
English (en)
Inventor
Hajime Itoh
Atsuo Itow
Yoshihiro Inoue
Hiroshi Ishizaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Metal Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Metal Corp filed Critical Mitsubishi Metal Corp
Priority to CA 2010263 priority Critical patent/CA2010263A1/fr
Publication of CA2010263A1 publication Critical patent/CA2010263A1/fr
Abandoned legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CA 2010263 1990-02-16 1990-02-16 Methode et appareil de controle de la qualite de produits manufactures Abandoned CA2010263A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA 2010263 CA2010263A1 (fr) 1990-02-16 1990-02-16 Methode et appareil de controle de la qualite de produits manufactures

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA 2010263 CA2010263A1 (fr) 1990-02-16 1990-02-16 Methode et appareil de controle de la qualite de produits manufactures

Publications (1)

Publication Number Publication Date
CA2010263A1 true CA2010263A1 (fr) 1991-08-16

Family

ID=4144316

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2010263 Abandoned CA2010263A1 (fr) 1990-02-16 1990-02-16 Methode et appareil de controle de la qualite de produits manufactures

Country Status (1)

Country Link
CA (1) CA2010263A1 (fr)

Similar Documents

Publication Publication Date Title
EP0483966B1 (fr) Procédé et appareil pour l'inspection d'un article transparent ou translucide telle qu'une bouteille
EP0952443B2 (fr) Appareil de détection de défauts au goulot et à la partie finie d'une bouteille moulée
US4026414A (en) Apparatus for testing tops of containers for damage
EP0595261B1 (fr) Méthode pour l'inspection de la présence de matières étrangères dans un corps solide
US4958223A (en) Inspection of container finish
US20060244959A1 (en) Inspecting apparatus and method for foreign matter
JPH01313741A (ja) ディスク表面検査方法及び装置
EP0763727B1 (fr) Appareil de détection de défauts au goulot et à la partie finie d'une bouteille moulée
GB2133538A (en) Optical detection of radial reflective defects in containers
CN110174067B (zh) 检验生化分析仪码盘中心偏移的方法及系统
JPH0989805A (ja) 自己診断機能を有する容器の検査装置
US6911653B2 (en) Inspecting method and apparatus for foreign matter
US7317524B2 (en) Method and device for detecting surface defects on the neck ring of a transparent or translucent container of revolution
JP3908858B2 (ja) ガラス壜口部のびり検査装置
US8873031B2 (en) Method and apparatus for inspecting surface of a disk
US5085515A (en) Method and apparatus for inspecting quality of manufactured articles
CA2010263A1 (fr) Methode et appareil de controle de la qualite de produits manufactures
JP2000055814A (ja) 粒状物品位判別方法及び該方法による装置
PH26987A (en) Inspection of container finish
GB1284442A (en) Method and electro-optical system for inspecting bodies such as tiles
US6507394B1 (en) Method and apparatus for inspecting the surface of a semiconductor device
JP3601298B2 (ja) 欠陥検査装置および欠陥検査方法
JPH05180621A (ja) 瓶口天面シールの検査装置
JPH04213007A (ja) 円形物体の形状測定方法及びこの方法を用いた形状測定装置
JPH03226696A (ja) 核燃料ペレットの周面検査装置

Legal Events

Date Code Title Description
EEER Examination request
FZDE Dead