CN1044644C - 用于与电路板连接的集成电路的试验系统及方法 - Google Patents

用于与电路板连接的集成电路的试验系统及方法 Download PDF

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Publication number
CN1044644C
CN1044644C CN94192444A CN94192444A CN1044644C CN 1044644 C CN1044644 C CN 1044644C CN 94192444 A CN94192444 A CN 94192444A CN 94192444 A CN94192444 A CN 94192444A CN 1044644 C CN1044644 C CN 1044644C
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CN
China
Prior art keywords
collector
voltage
integrated circuit
terminal
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN94192444A
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English (en)
Chinese (zh)
Other versions
CN1125482A (zh
Inventor
曼弗雷德·布克斯
卡里姆·霍泽尼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ITA INGENIEURBUERO fur TESTAUFGABEN GmbH
Original Assignee
ITA INGENIEURBUERO fur TESTAUFGABEN GmbH
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Publication date
Application filed by ITA INGENIEURBUERO fur TESTAUFGABEN GmbH filed Critical ITA INGENIEURBUERO fur TESTAUFGABEN GmbH
Publication of CN1125482A publication Critical patent/CN1125482A/zh
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Publication of CN1044644C publication Critical patent/CN1044644C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
CN94192444A 1993-06-15 1994-06-11 用于与电路板连接的集成电路的试验系统及方法 Expired - Fee Related CN1044644C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DEP4319710.8 1993-06-15
DE4319710A DE4319710C1 (de) 1993-06-15 1993-06-15 Testverfahren für einen auf einer Platine eingelöteten IC und Testvorrichtung zum Durchführen des Testverfahrens

Publications (2)

Publication Number Publication Date
CN1125482A CN1125482A (zh) 1996-06-26
CN1044644C true CN1044644C (zh) 1999-08-11

Family

ID=6490332

Family Applications (1)

Application Number Title Priority Date Filing Date
CN94192444A Expired - Fee Related CN1044644C (zh) 1993-06-15 1994-06-11 用于与电路板连接的集成电路的试验系统及方法

Country Status (13)

Country Link
US (1) US6188235B1 (2)
EP (1) EP0705439B1 (2)
JP (1) JPH08511345A (2)
KR (1) KR960703232A (2)
CN (1) CN1044644C (2)
AT (1) ATE157776T1 (2)
AU (1) AU686639B2 (2)
CA (1) CA2164415A1 (2)
DE (2) DE4319710C1 (2)
DK (1) DK0705439T3 (2)
ES (1) ES2107236T3 (2)
TW (1) TW249843B (2)
WO (1) WO1994029738A1 (2)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6720774B2 (en) * 2002-07-29 2004-04-13 Sun Microsystems, Inc. Interchangeable fan control board with fault detection
GB2394780B (en) * 2002-10-29 2006-06-14 Ifr Ltd A method of and apparatus for testing for integrated circuit contact defects
KR100565326B1 (ko) * 2004-05-25 2006-03-30 엘지전자 주식회사 이동통신 단말기의 엘씨디 컨넥터 체크 장치
US7279907B2 (en) * 2006-02-28 2007-10-09 Freescale Semiconductor, Inc. Method of testing for power and ground continuity of a semiconductor device
DE102008020667A1 (de) * 2008-04-24 2010-05-20 Continental Automotive Gmbh Verfahren zur Fehlerüberwachung an einem Beleuchtungsausgang eines Kraftfahrzeuges
CN101571570B (zh) * 2008-04-29 2013-05-22 京元电子股份有限公司 集成电路连续性测试方法及集成电路接触电阻的测量方法
CN101825681B (zh) * 2010-04-29 2013-07-31 上海宏力半导体制造有限公司 一种双极型晶体管电流放大系数测量方法
RU173641U1 (ru) * 2017-03-27 2017-09-04 Закрытое акционерное общество "ГРУППА КРЕМНИЙ ЭЛ" Тестовый планарный p-n-p транзистор
CN107424549B (zh) * 2017-09-28 2020-04-17 京东方科技集团股份有限公司 阈值电压漂移的检测方法和装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4779043A (en) * 1987-08-26 1988-10-18 Hewlett-Packard Company Reversed IC test device and method
US5254953A (en) * 1990-12-20 1993-10-19 Hewlett-Packard Company Identification of pin-open faults by capacitive coupling through the integrated circuit package
US5124660A (en) * 1990-12-20 1992-06-23 Hewlett-Packard Company Identification of pin-open faults by capacitive coupling through the integrated circuit package
DE4110551C1 (2) * 1991-03-30 1992-07-23 Ita Ingenieurbuero Fuer Testaufgaben Gmbh, 2000 Hamburg, De
JP3157683B2 (ja) * 1994-08-30 2001-04-16 株式会社 沖マイクロデザイン 半導体集積回路の静止時電流測定法、半導体集積回路

Also Published As

Publication number Publication date
ES2107236T3 (es) 1997-11-16
EP0705439B1 (de) 1997-09-03
KR960703232A (ko) 1996-06-19
EP0705439A1 (de) 1996-04-10
WO1994029738A1 (de) 1994-12-22
US6188235B1 (en) 2001-02-13
ATE157776T1 (de) 1997-09-15
DE59403978D1 (de) 1997-10-09
CA2164415A1 (en) 1994-12-22
JPH08511345A (ja) 1996-11-26
CN1125482A (zh) 1996-06-26
AU686639B2 (en) 1998-02-12
DE4319710C1 (de) 1994-09-29
AU7071594A (en) 1995-01-03
TW249843B (2) 1995-06-21
DK0705439T3 (da) 1998-04-14

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