CN209589870U - 图像捕捉系统和具有图像捕捉系统的质量检测站 - Google Patents

图像捕捉系统和具有图像捕捉系统的质量检测站 Download PDF

Info

Publication number
CN209589870U
CN209589870U CN201790000885.2U CN201790000885U CN209589870U CN 209589870 U CN209589870 U CN 209589870U CN 201790000885 U CN201790000885 U CN 201790000885U CN 209589870 U CN209589870 U CN 209589870U
Authority
CN
China
Prior art keywords
image capture
capture system
field illuminator
illuminator
camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201790000885.2U
Other languages
English (en)
Chinese (zh)
Inventor
M·理查德
F·皮劳德
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bobst Mex SA
Original Assignee
Bobst Mex SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bobst Mex SA filed Critical Bobst Mex SA
Application granted granted Critical
Publication of CN209589870U publication Critical patent/CN209589870U/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G01N2021/8825—Separate detection of dark field and bright field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8917—Paper, also ondulated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201790000885.2U 2016-05-30 2017-05-17 图像捕捉系统和具有图像捕捉系统的质量检测站 Active CN209589870U (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE202016102851.5 2016-05-30
DE202016102851.5U DE202016102851U1 (de) 2016-05-30 2016-05-30 Bildaufnahmesystem und Qualitätskontrollstation mit Bildaufnahmesystem
PCT/EP2017/025133 WO2017207114A1 (en) 2016-05-30 2017-05-17 Image capturing system and quality inspection system with image capturing system

Publications (1)

Publication Number Publication Date
CN209589870U true CN209589870U (zh) 2019-11-05

Family

ID=56852912

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201790000885.2U Active CN209589870U (zh) 2016-05-30 2017-05-17 图像捕捉系统和具有图像捕捉系统的质量检测站

Country Status (9)

Country Link
CN (1) CN209589870U (cs)
AT (1) AT16584U1 (cs)
CZ (1) CZ32481U1 (cs)
DE (1) DE202016102851U1 (cs)
ES (1) ES1224499Y (cs)
PL (1) PL127953U1 (cs)
SK (1) SK9053Y1 (cs)
TR (1) TR201817920U4 (cs)
WO (1) WO2017207114A1 (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118670274A (zh) * 2024-08-22 2024-09-20 山东泓邦工具有限公司 一种五金工具生产尺寸检测装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022113313A1 (de) 2022-05-25 2023-11-30 Mb Automation Gmbh & Co. Kg Vorrichtung und verfahren zum sensorbasierten inspizieren eines objekts
DE102024116943A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur Inspektion einer Oberfläche eines eine Beschichtung auf einem Trägersubstrat aufweisenden Produktes, Inspektionssystem mit einer solchen Vorrichtung sowie Maschine
DE102024116942A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur automatischen optischen Inspektion eines entlang einer Transportstrecke bewegten bahnförmigen oder bogenförmigen mindestens eine Beschichtung aufweisenden Produktes
DE102024116944A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur Inspektion einer Oberfläche eines eine Beschichtung auf einem Trägersubstrat aufweisenden Produktes, Inspektionssystem mit einer solchen Vorrichtung sowie Maschine
WO2025261964A1 (de) 2024-06-17 2025-12-26 Koenig & Bauer Ag Vorrichtung zur inspektion einer oberfläche eines eine beschichtung auf einem trägersubstrat aufweisenden produktes, inspektionssystem mit einer solchen vorrichtung sowie maschine

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
JP3686329B2 (ja) * 2000-08-22 2005-08-24 シーシーエス株式会社 表面検査用照明装置及び表面検査装置
US20050122509A1 (en) * 2002-07-18 2005-06-09 Leica Microsystems Semiconductor Gmbh Apparatus for wafer inspection
DE102004004761A1 (de) * 2004-01-30 2005-09-08 Leica Microsystems Semiconductor Gmbh Vorrichtung und Verfahren zur Inspektion eines Wafers
DE102007007828B4 (de) * 2007-02-16 2011-02-24 Bst International Gmbh Verfahren und Vorrichtung zum Beleuchten eines Druckbildes auf einer Materialbahn
JP5806808B2 (ja) * 2010-08-18 2015-11-10 倉敷紡績株式会社 撮像光学検査装置
DE102011113670A1 (de) * 2011-09-20 2013-03-21 Schott Ag Beleuchtungsvorrichtung, Inspektionsvorrichtung und Inspektionsverfahren für die optische Prüfung eines Objekts

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118670274A (zh) * 2024-08-22 2024-09-20 山东泓邦工具有限公司 一种五金工具生产尺寸检测装置

Also Published As

Publication number Publication date
WO2017207114A1 (en) 2017-12-07
PL127953U1 (pl) 2019-07-29
ES1224499Y (es) 2019-04-26
SK9053Y1 (sk) 2021-02-24
AT16584U1 (de) 2020-02-15
TR201817920U4 (tr) 2021-05-21
SK501342018U1 (sk) 2020-11-03
DE202016102851U1 (de) 2016-08-11
CZ32481U1 (cs) 2019-01-22
ES1224499U (es) 2019-02-06

Similar Documents

Publication Publication Date Title
CN209589870U (zh) 图像捕捉系统和具有图像捕捉系统的质量检测站
ES2894869T3 (es) Sistema de inspección de superficies y método de inspección de superficies
EP3465171B1 (en) Surface inspection system and inspection method
JPWO2020059426A5 (cs)
KR101274164B1 (ko) 필름 검사장치
TWI786522B (zh) 表面檢查裝置、表面檢查方法、鋼材製造方法、鋼材品質管理方法以及鋼材製造設備
JP2007147433A (ja) セラミック板の欠陥検出方法と装置
JP3176803U (ja) 検査用照明装置
BR112018071487B1 (pt) Sistema de captura de imagem e método para determinação da posição de uma estrutura gravada em um elemento laminado
CA3021911C (en) Quality control station for a sheet element processing machine and illumination unit for the quality control station
US9156246B2 (en) Method and device for the quality inspection and testing of flat printed products
JP6498477B2 (ja) ニス検査装置およびニス検査方法
KR101714625B1 (ko) 슬릿조명을 구비한 비젼검사시스템 및 비젼검사방법
CN102878959A (zh) 用于面形的印刷品的质量检验的方法和装置
JP6875243B2 (ja) 板状体の検査装置
JP2010223598A (ja) シート状物の欠陥検査装置
JP2015145817A (ja) 光学検査装置、及び製函装置
JP5012006B2 (ja) 検査ユニット
TWI373614B (cs)
JP4953086B2 (ja) Ｐｔｐシートの検査装置
CN119546458A (zh) 瓦楞纸板设备以及用于监控瓦楞纸板设备的方法
JP2021067622A (ja) 画像検査装置および画像形成装置

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant