SK9053Y1 - Systém zhotovovania snímok a stanica na kontrolu kvality obsahujúca systém zhotovovania snímok - Google Patents

Systém zhotovovania snímok a stanica na kontrolu kvality obsahujúca systém zhotovovania snímok Download PDF

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Publication number
SK9053Y1
SK9053Y1 SK501342018U SK501342018U SK9053Y1 SK 9053 Y1 SK9053 Y1 SK 9053Y1 SK 501342018 U SK501342018 U SK 501342018U SK 501342018 U SK501342018 U SK 501342018U SK 9053 Y1 SK9053 Y1 SK 9053Y1
Authority
SK
Slovakia
Prior art keywords
imaging system
illuminator
field illuminator
camera
respect
Prior art date
Application number
SK501342018U
Other languages
English (en)
Slovak (sk)
Other versions
SK501342018U1 (sk
Inventor
Matthieu Richard
Francis Pilloud
Original Assignee
Bobst Mex Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bobst Mex Sa filed Critical Bobst Mex Sa
Publication of SK501342018U1 publication Critical patent/SK501342018U1/sk
Publication of SK9053Y1 publication Critical patent/SK9053Y1/sk

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8822Dark field detection
    • G01N2021/8825Separate detection of dark field and bright field
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8917Paper, also ondulated
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SK501342018U 2016-05-30 2017-05-17 Systém zhotovovania snímok a stanica na kontrolu kvality obsahujúca systém zhotovovania snímok SK9053Y1 (sk)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DEDE202016102851.5 2016-05-30
DE202016102851.5U DE202016102851U1 (de) 2016-05-30 2016-05-30 Bildaufnahmesystem und Qualitätskontrollstation mit Bildaufnahmesystem

Publications (2)

Publication Number Publication Date
SK501342018U1 SK501342018U1 (sk) 2020-11-03
SK9053Y1 true SK9053Y1 (sk) 2021-02-24

Family

ID=56852912

Family Applications (1)

Application Number Title Priority Date Filing Date
SK501342018U SK9053Y1 (sk) 2016-05-30 2017-05-17 Systém zhotovovania snímok a stanica na kontrolu kvality obsahujúca systém zhotovovania snímok

Country Status (9)

Country Link
CN (1) CN209589870U (cs)
AT (1) AT16584U1 (cs)
CZ (1) CZ32481U1 (cs)
DE (1) DE202016102851U1 (cs)
ES (1) ES1224499Y (cs)
PL (1) PL127953U1 (cs)
SK (1) SK9053Y1 (cs)
TR (1) TR201817920U4 (cs)
WO (1) WO2017207114A1 (cs)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022113313A1 (de) 2022-05-25 2023-11-30 Mb Automation Gmbh & Co. Kg Vorrichtung und verfahren zum sensorbasierten inspizieren eines objekts
DE102024116943A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur Inspektion einer Oberfläche eines eine Beschichtung auf einem Trägersubstrat aufweisenden Produktes, Inspektionssystem mit einer solchen Vorrichtung sowie Maschine
DE102024116942A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur automatischen optischen Inspektion eines entlang einer Transportstrecke bewegten bahnförmigen oder bogenförmigen mindestens eine Beschichtung aufweisenden Produktes
DE102024116944A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur Inspektion einer Oberfläche eines eine Beschichtung auf einem Trägersubstrat aufweisenden Produktes, Inspektionssystem mit einer solchen Vorrichtung sowie Maschine
WO2025261964A1 (de) 2024-06-17 2025-12-26 Koenig & Bauer Ag Vorrichtung zur inspektion einer oberfläche eines eine beschichtung auf einem trägersubstrat aufweisenden produktes, inspektionssystem mit einer solchen vorrichtung sowie maschine
CN118670274B (zh) * 2024-08-22 2024-10-25 山东泓邦工具有限公司 一种五金工具生产尺寸检测装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
JP3686329B2 (ja) * 2000-08-22 2005-08-24 シーシーエス株式会社 表面検査用照明装置及び表面検査装置
US20050122509A1 (en) * 2002-07-18 2005-06-09 Leica Microsystems Semiconductor Gmbh Apparatus for wafer inspection
DE102004004761A1 (de) * 2004-01-30 2005-09-08 Leica Microsystems Semiconductor Gmbh Vorrichtung und Verfahren zur Inspektion eines Wafers
DE102007007828B4 (de) * 2007-02-16 2011-02-24 Bst International Gmbh Verfahren und Vorrichtung zum Beleuchten eines Druckbildes auf einer Materialbahn
JP5806808B2 (ja) * 2010-08-18 2015-11-10 倉敷紡績株式会社 撮像光学検査装置
DE102011113670A1 (de) * 2011-09-20 2013-03-21 Schott Ag Beleuchtungsvorrichtung, Inspektionsvorrichtung und Inspektionsverfahren für die optische Prüfung eines Objekts

Also Published As

Publication number Publication date
WO2017207114A1 (en) 2017-12-07
PL127953U1 (pl) 2019-07-29
CN209589870U (zh) 2019-11-05
ES1224499Y (es) 2019-04-26
AT16584U1 (de) 2020-02-15
TR201817920U4 (tr) 2021-05-21
SK501342018U1 (sk) 2020-11-03
DE202016102851U1 (de) 2016-08-11
CZ32481U1 (cs) 2019-01-22
ES1224499U (es) 2019-02-06

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