DD207938A5 - Verfahren zur herstellung von galliumphosphid-einkristallen - Google Patents
Verfahren zur herstellung von galliumphosphid-einkristallen Download PDFInfo
- Publication number
- DD207938A5 DD207938A5 DD82236800A DD23680082A DD207938A5 DD 207938 A5 DD207938 A5 DD 207938A5 DD 82236800 A DD82236800 A DD 82236800A DD 23680082 A DD23680082 A DD 23680082A DD 207938 A5 DD207938 A5 DD 207938A5
- Authority
- DD
- German Democratic Republic
- Prior art keywords
- gallium phosphide
- gap
- liquid
- reduction
- gallium
- Prior art date
Links
- 229910005540 GaP Inorganic materials 0.000 title claims abstract description 92
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 title claims abstract description 31
- 239000013078 crystal Substances 0.000 title claims abstract description 27
- 238000000034 method Methods 0.000 title claims description 32
- 238000002360 preparation method Methods 0.000 title description 3
- 230000009467 reduction Effects 0.000 claims abstract description 46
- 239000007788 liquid Substances 0.000 claims abstract description 40
- 239000000843 powder Substances 0.000 claims abstract description 30
- 239000001257 hydrogen Substances 0.000 claims abstract description 27
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 27
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical class [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 26
- 229910000154 gallium phosphate Inorganic materials 0.000 claims abstract description 19
- LWFNJDOYCSNXDO-UHFFFAOYSA-K gallium;phosphate Chemical compound [Ga+3].[O-]P([O-])([O-])=O LWFNJDOYCSNXDO-UHFFFAOYSA-K 0.000 claims abstract description 19
- 239000008393 encapsulating agent Substances 0.000 claims description 21
- 125000002467 phosphate group Chemical group [H]OP(=O)(O[H])O[*] 0.000 claims description 14
- 238000004519 manufacturing process Methods 0.000 claims description 12
- 229910052810 boron oxide Inorganic materials 0.000 claims 1
- 239000003795 chemical substances by application Substances 0.000 claims 1
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 claims 1
- 238000005538 encapsulation Methods 0.000 claims 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical group OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 abstract description 4
- 239000000463 material Substances 0.000 abstract description 2
- 239000010410 layer Substances 0.000 description 20
- 239000007858 starting material Substances 0.000 description 18
- 238000006243 chemical reaction Methods 0.000 description 16
- 239000007795 chemical reaction product Substances 0.000 description 12
- 238000002844 melting Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 239000002245 particle Substances 0.000 description 6
- 239000002344 surface layer Substances 0.000 description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- 239000012530 fluid Substances 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 239000000155 melt Substances 0.000 description 3
- 238000010309 melting process Methods 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- 238000011946 reduction process Methods 0.000 description 3
- 239000011163 secondary particle Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005056 compaction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 208000014342 histiocytosis-lymphadenopathy plus syndrome Diseases 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000010068 moulding (rubber) Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000001846 repelling effect Effects 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B25/00—Phosphorus; Compounds thereof
- C01B25/08—Other phosphides
- C01B25/082—Other phosphides of boron, aluminium, gallium or indium
- C01B25/087—Other phosphides of boron, aluminium, gallium or indium of gallium or indium
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B27/00—Single-crystal growth under a protective fluid
- C30B27/02—Single-crystal growth under a protective fluid by pulling from a melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP459281A JPS6012320B2 (ja) | 1981-01-17 | 1981-01-17 | GaP単結晶の製造方法 |
| JP56141296A JPS5843581A (ja) | 1981-09-08 | 1981-09-08 | りん化ガリウム多結晶の製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DD207938A5 true DD207938A5 (de) | 1984-03-21 |
Family
ID=26338399
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DD82236800A DD207938A5 (de) | 1981-01-17 | 1982-01-15 | Verfahren zur herstellung von galliumphosphid-einkristallen |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4431476A (fr) |
| EP (1) | EP0056586B1 (fr) |
| DD (1) | DD207938A5 (fr) |
| DE (1) | DE3260469D1 (fr) |
| PL (1) | PL137175B1 (fr) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60251191A (ja) * | 1984-05-25 | 1985-12-11 | Res Dev Corp Of Japan | 高解離圧化合物単結晶成長方法 |
| JPS61222911A (ja) * | 1985-03-28 | 1986-10-03 | Toshiba Corp | 燐化化合物の合成方法 |
| JPS623096A (ja) * | 1985-06-27 | 1987-01-09 | Res Dev Corp Of Japan | 高解離圧化合物半導体単結晶成長方法 |
| US4721539A (en) * | 1986-07-15 | 1988-01-26 | The United States Of America As Represented By The United States Department Of Energy | Large single crystal quaternary alloys of IB-IIIA-SE2 and methods of synthesizing the same |
| US4824520A (en) * | 1987-03-19 | 1989-04-25 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Liquid encapsulated crystal growth |
| US5078830A (en) * | 1989-04-10 | 1992-01-07 | Mitsubishi Metal Corporation | Method for growing single crystal |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3647389A (en) * | 1970-05-11 | 1972-03-07 | Bell Telephone Labor Inc | Method of group iii-v semiconductor crystal growth using getter dried boric oxide encapsulant |
| JPS6024078B2 (ja) * | 1977-09-05 | 1985-06-11 | 株式会社東芝 | 3−5族化合物半導体単結晶の製造装置 |
| JPS6028800B2 (ja) * | 1977-10-17 | 1985-07-06 | 住友電気工業株式会社 | 低欠陥密度りん化ガリウム単結晶 |
| JPS55136109A (en) * | 1979-04-05 | 1980-10-23 | Toshiba Corp | Production of gap |
-
1982
- 1982-01-04 US US06/336,701 patent/US4431476A/en not_active Expired - Lifetime
- 1982-01-07 EP EP82100073A patent/EP0056586B1/fr not_active Expired
- 1982-01-07 DE DE8282100073T patent/DE3260469D1/de not_active Expired
- 1982-01-15 PL PL1982234725A patent/PL137175B1/pl unknown
- 1982-01-15 DD DD82236800A patent/DD207938A5/de unknown
Also Published As
| Publication number | Publication date |
|---|---|
| EP0056586B1 (fr) | 1984-08-01 |
| EP0056586A2 (fr) | 1982-07-28 |
| PL234725A1 (fr) | 1982-09-13 |
| EP0056586A3 (en) | 1982-08-04 |
| PL137175B1 (en) | 1986-05-31 |
| DE3260469D1 (en) | 1984-09-06 |
| US4431476A (en) | 1984-02-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RPV | Change in the person, the name or the address of the representative (searches according to art. 11 and 12 extension act) |