DE69007764D1 - Packungsmaterial für umgekehrte Phasechromatographie und Verfahren zu dessen Herstellung. - Google Patents

Packungsmaterial für umgekehrte Phasechromatographie und Verfahren zu dessen Herstellung.

Info

Publication number
DE69007764D1
DE69007764D1 DE90124637T DE69007764T DE69007764D1 DE 69007764 D1 DE69007764 D1 DE 69007764D1 DE 90124637 T DE90124637 T DE 90124637T DE 69007764 T DE69007764 T DE 69007764T DE 69007764 D1 DE69007764 D1 DE 69007764D1
Authority
DE
Germany
Prior art keywords
production
reverse phase
packing material
phase chromatography
chromatography
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE90124637T
Other languages
English (en)
Other versions
DE69007764T2 (de
Inventor
Tadao Ohnaka
Katsuo Komiya
Hiroyuki Moriyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tosoh Corp
Original Assignee
Tosoh Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tosoh Corp filed Critical Tosoh Corp
Application granted granted Critical
Publication of DE69007764D1 publication Critical patent/DE69007764D1/de
Publication of DE69007764T2 publication Critical patent/DE69007764T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J20/00—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof
    • B01J20/281—Sorbents specially adapted for preparative, analytical or investigative chromatography
    • B01J20/286—Phases chemically bonded to a substrate, e.g. to silica or to polymers
    • B01J20/287—Non-polar phases; Reversed phases
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D15/00—Separating processes involving the treatment of liquids with solid sorbents; Apparatus therefor
    • B01D15/08—Selective adsorption, e.g. chromatography
    • B01D15/26—Selective adsorption, e.g. chromatography characterised by the separation mechanism
    • B01D15/32—Bonded phase chromatography
    • B01D15/325—Reversed phase
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J20/00—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof
    • B01J20/281—Sorbents specially adapted for preparative, analytical or investigative chromatography
    • B01J20/286—Phases chemically bonded to a substrate, e.g. to silica or to polymers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J20/00—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof
    • B01J20/30—Processes for preparing, regenerating, or reactivating
    • B01J20/32—Impregnating or coating ; Solid sorbent compositions obtained from processes involving impregnating or coating
    • B01J20/3202—Impregnating or coating ; Solid sorbent compositions obtained from processes involving impregnating or coating characterised by the carrier, support or substrate used for impregnation or coating
    • B01J20/3204—Inorganic carriers, supports or substrates
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J20/00—Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof
    • B01J20/30—Processes for preparing, regenerating, or reactivating
    • B01J20/32—Impregnating or coating ; Solid sorbent compositions obtained from processes involving impregnating or coating
    • B01J20/3231—Impregnating or coating ; Solid sorbent compositions obtained from processes involving impregnating or coating characterised by the coating or impregnating layer
    • B01J20/3242—Layers with a functional group, e.g. an affinity material, a ligand, a reactant or a complexing group
    • B01J20/3268—Macromolecular compounds
    • B01J20/3272—Polymers obtained by reactions otherwise than involving only carbon to carbon unsaturated bonds
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J2220/00—Aspects relating to sorbent materials
    • B01J2220/50—Aspects relating to the use of sorbent or filter aid materials
    • B01J2220/54—Sorbents specially adapted for analytical or investigative chromatography
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/29—Coated or structually defined flake, particle, cell, strand, strand portion, rod, filament, macroscopic fiber or mass thereof
    • Y10T428/2982—Particulate matter [e.g., sphere, flake, etc.]
    • Y10T428/2991—Coated
    • Y10T428/2993—Silicic or refractory material containing [e.g., tungsten oxide, glass, cement, etc.]
    • Y10T428/2995—Silane, siloxane or silicone coating
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/31504—Composite [nonstructural laminate]
    • Y10T428/31551—Of polyamidoester [polyurethane, polyisocyanate, polycarbamate, etc.]
    • Y10T428/31609—Particulate metal or metal compound-containing
    • Y10T428/31612—As silicone, silane or siloxane
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/31504—Composite [nonstructural laminate]
    • Y10T428/31652—Of asbestos
    • Y10T428/31663—As siloxane, silicone or silane

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Solid-Sorbent Or Filter-Aiding Compositions (AREA)
DE69007764T 1989-12-18 1990-12-18 Packungsmaterial für umgekehrte Phasechromatographie und Verfahren zu dessen Herstellung. Expired - Fee Related DE69007764T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP32617289 1989-12-18
JP18728290A JP2874297B2 (ja) 1989-12-18 1990-07-17 逆相クロマトグラフィー用充填剤及びその製造方法

Publications (2)

Publication Number Publication Date
DE69007764D1 true DE69007764D1 (de) 1994-05-05
DE69007764T2 DE69007764T2 (de) 1994-11-24

Family

ID=26504254

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69007764T Expired - Fee Related DE69007764T2 (de) 1989-12-18 1990-12-18 Packungsmaterial für umgekehrte Phasechromatographie und Verfahren zu dessen Herstellung.

Country Status (4)

Country Link
US (1) US5194333A (de)
EP (1) EP0436179B1 (de)
JP (1) JP2874297B2 (de)
DE (1) DE69007764T2 (de)

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CN1082934C (zh) * 1994-04-11 2002-04-17 宇部日东化成株式会社 交联树脂包覆二氧化硅微粒及其制造方法
DE19531173A1 (de) * 1995-08-24 1997-02-27 Boehringer Mannheim Gmbh Verfahren zum Stabilisieren des Gehalts glykierten Proteins einer Probe auf einem Matrixmaterial
US5667674A (en) * 1996-01-11 1997-09-16 Minnesota Mining And Manufacturing Company Adsorption medium and method of preparing same
DE19648798C2 (de) * 1996-11-26 1998-11-19 Hoechst Ag Verfahren zur Herstellung von organisch modifizierten Aerogelen durch Oberflächenmodifikation des wäßrigen Gels (ohne vorherigen Lösungsmitteltausch) und anschließender Trocknung
US5993653C1 (en) * 1997-08-11 2001-11-06 Phenomenex Composition and column used in hplc
JP2002517585A (ja) * 1998-06-05 2002-06-18 カボット・コーポレーション ナノ多孔質相互浸透有機−無機網目構造
US6686035B2 (en) 1999-02-05 2004-02-03 Waters Investments Limited Porous inorganic/organic hybrid particles for chromatographic separations and process for their preparation
US6303047B1 (en) * 1999-03-22 2001-10-16 Lsi Logic Corporation Low dielectric constant multiple carbon-containing silicon oxide dielectric material for use in integrated circuit structures, and method of making same
US6524974B1 (en) 1999-03-22 2003-02-25 Lsi Logic Corporation Formation of improved low dielectric constant carbon-containing silicon oxide dielectric material by reaction of carbon-containing silane with oxidizing agent in the presence of one or more reaction retardants
US6204192B1 (en) 1999-03-29 2001-03-20 Lsi Logic Corporation Plasma cleaning process for openings formed in at least one low dielectric constant insulation layer over copper metallization in integrated circuit structures
WO2000071246A1 (en) * 1999-05-25 2000-11-30 Dcv, Inc. Silica-based, endcapped chromatographic packing having improved stability under high ph conditions
US6232658B1 (en) 1999-06-30 2001-05-15 Lsi Logic Corporation Process to prevent stress cracking of dielectric films on semiconductor wafers
US6114259A (en) * 1999-07-27 2000-09-05 Lsi Logic Corporation Process for treating exposed surfaces of a low dielectric constant carbon doped silicon oxide dielectric material to protect the material from damage
US6391795B1 (en) 1999-10-22 2002-05-21 Lsi Logic Corporation Low k dielectric composite layer for intergrated circuit structure which provides void-free low k dielectric material between metal lines while mitigating via poisoning
US6423628B1 (en) 1999-10-22 2002-07-23 Lsi Logic Corporation Method of forming integrated circuit structure having low dielectric constant material and having silicon oxynitride caps over closely spaced apart metal lines
US6756674B1 (en) 1999-10-22 2004-06-29 Lsi Logic Corporation Low dielectric constant silicon oxide-based dielectric layer for integrated circuit structures having improved compatibility with via filler materials, and method of making same
US6316354B1 (en) 1999-10-26 2001-11-13 Lsi Logic Corporation Process for removing resist mask of integrated circuit structure which mitigates damage to underlying low dielectric constant silicon oxide dielectric layer
US6147012A (en) * 1999-11-12 2000-11-14 Lsi Logic Corporation Process for forming low k silicon oxide dielectric material while suppressing pressure spiking and inhibiting increase in dielectric constant
US6346490B1 (en) 2000-04-05 2002-02-12 Lsi Logic Corporation Process for treating damaged surfaces of low k carbon doped silicon oxide dielectric material after plasma etching and plasma cleaning steps
US6506678B1 (en) 2000-05-19 2003-01-14 Lsi Logic Corporation Integrated circuit structures having low k porous aluminum oxide dielectric material separating aluminum lines, and method of making same
US6426286B1 (en) 2000-05-19 2002-07-30 Lsi Logic Corporation Interconnection system with lateral barrier layer
US6346488B1 (en) 2000-06-27 2002-02-12 Lsi Logic Corporation Process to provide enhanced resistance to cracking and to further reduce the dielectric constant of a low dielectric constant dielectric film of an integrated circuit structure by implantation with hydrogen ions
US6492731B1 (en) 2000-06-27 2002-12-10 Lsi Logic Corporation Composite low dielectric constant film for integrated circuit structure
US6368979B1 (en) 2000-06-28 2002-04-09 Lsi Logic Corporation Process for forming trenches and vias in layers of low dielectric constant carbon-doped silicon oxide dielectric material of an integrated circuit structure
US6350700B1 (en) 2000-06-28 2002-02-26 Lsi Logic Corporation Process for forming trenches and vias in layers of low dielectric constant carbon-doped silicon oxide dielectric material of an integrated circuit structure
US6489242B1 (en) 2000-09-13 2002-12-03 Lsi Logic Corporation Process for planarization of integrated circuit structure which inhibits cracking of low dielectric constant dielectric material adjacent underlying raised structures
US6391768B1 (en) 2000-10-30 2002-05-21 Lsi Logic Corporation Process for CMP removal of excess trench or via filler metal which inhibits formation of concave regions on oxide surface of integrated circuit structure
US6423630B1 (en) 2000-10-31 2002-07-23 Lsi Logic Corporation Process for forming low K dielectric material between metal lines
US6537923B1 (en) 2000-10-31 2003-03-25 Lsi Logic Corporation Process for forming integrated circuit structure with low dielectric constant material between closely spaced apart metal lines
US6420277B1 (en) 2000-11-01 2002-07-16 Lsi Logic Corporation Process for inhibiting crack formation in low dielectric constant dielectric films of integrated circuit structure
US6528167B2 (en) 2001-01-31 2003-03-04 Waters Investments Limited Porous hybrid particles with organic groups removed from the surface
US6858195B2 (en) 2001-02-23 2005-02-22 Lsi Logic Corporation Process for forming a low dielectric constant fluorine and carbon-containing silicon oxide dielectric material
US6649219B2 (en) 2001-02-23 2003-11-18 Lsi Logic Corporation Process for forming a low dielectric constant fluorine and carbon-containing silicon oxide dielectric material characterized by improved resistance to oxidation
US6572925B2 (en) 2001-02-23 2003-06-03 Lsi Logic Corporation Process for forming a low dielectric constant fluorine and carbon containing silicon oxide dielectric material
US6794044B2 (en) * 2001-03-02 2004-09-21 Selerity Technologies, Inc. Chromatographic packing materials and methods of making and using such packing materials
US6503840B2 (en) 2001-05-02 2003-01-07 Lsi Logic Corporation Process for forming metal-filled openings in low dielectric constant dielectric material while inhibiting via poisoning
US6559048B1 (en) 2001-05-30 2003-05-06 Lsi Logic Corporation Method of making a sloped sidewall via for integrated circuit structure to suppress via poisoning
US6562700B1 (en) 2001-05-31 2003-05-13 Lsi Logic Corporation Process for removal of resist mask over low k carbon-doped silicon oxide dielectric material of an integrated circuit structure, and removal of residues from via etch and resist mask removal
US6583026B1 (en) 2001-05-31 2003-06-24 Lsi Logic Corporation Process for forming a low k carbon-doped silicon oxide dielectric material on an integrated circuit structure
US6566171B1 (en) 2001-06-12 2003-05-20 Lsi Logic Corporation Fuse construction for integrated circuit structure having low dielectric constant dielectric material
US6930056B1 (en) * 2001-06-19 2005-08-16 Lsi Logic Corporation Plasma treatment of low dielectric constant dielectric material to form structures useful in formation of metal interconnects and/or filled vias for integrated circuit structure
US6559033B1 (en) 2001-06-27 2003-05-06 Lsi Logic Corporation Processing for forming integrated circuit structure with low dielectric constant material between closely spaced apart metal lines
US6673721B1 (en) 2001-07-02 2004-01-06 Lsi Logic Corporation Process for removal of photoresist mask used for making vias in low k carbon-doped silicon oxide dielectric material, and for removal of etch residues from formation of vias and removal of photoresist mask
US7250214B2 (en) 2001-08-09 2007-07-31 Waters Investments Limited Porous inorganic/organic hybrid monolith materials for chromatographic separations and process for their preparation
US6723653B1 (en) 2001-08-17 2004-04-20 Lsi Logic Corporation Process for reducing defects in copper-filled vias and/or trenches formed in porous low-k dielectric material
US6881664B2 (en) * 2001-08-28 2005-04-19 Lsi Logic Corporation Process for planarizing upper surface of damascene wiring structure for integrated circuit structures
US6528423B1 (en) 2001-10-26 2003-03-04 Lsi Logic Corporation Process for forming composite of barrier layers of dielectric material to inhibit migration of copper from copper metal interconnect of integrated circuit structure into adjacent layer of low k dielectric material
US6613665B1 (en) 2001-10-26 2003-09-02 Lsi Logic Corporation Process for forming integrated circuit structure comprising layer of low k dielectric material having antireflective properties in an upper surface
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Also Published As

Publication number Publication date
US5194333A (en) 1993-03-16
DE69007764T2 (de) 1994-11-24
EP0436179A1 (de) 1991-07-10
JPH03233354A (ja) 1991-10-17
EP0436179B1 (de) 1994-03-30
JP2874297B2 (ja) 1999-03-24

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee