DK1466166T3 - Fremgangsmåde til udförelse af pulverdiffraktionsanalyse - Google Patents
Fremgangsmåde til udförelse af pulverdiffraktionsanalyseInfo
- Publication number
- DK1466166T3 DK1466166T3 DK03702460T DK03702460T DK1466166T3 DK 1466166 T3 DK1466166 T3 DK 1466166T3 DK 03702460 T DK03702460 T DK 03702460T DK 03702460 T DK03702460 T DK 03702460T DK 1466166 T3 DK1466166 T3 DK 1466166T3
- Authority
- DK
- Denmark
- Prior art keywords
- sample
- powder
- radiation
- detecting
- radiation beam
- Prior art date
Links
- 239000000843 powder Substances 0.000 title abstract 11
- 238000000034 method Methods 0.000 title abstract 3
- 238000002050 diffraction method Methods 0.000 title abstract 2
- 230000005855 radiation Effects 0.000 abstract 8
- 238000001514 detection method Methods 0.000 abstract 2
- 230000000694 effects Effects 0.000 abstract 2
- 230000001678 irradiating effect Effects 0.000 abstract 2
- 239000002245 particle Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US34789102P | 2002-01-15 | 2002-01-15 | |
| EP02075149A EP1327877A1 (en) | 2002-01-15 | 2002-01-15 | Method for successively performing powder diffraction analysis on a plurality of samples |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DK1466166T3 true DK1466166T3 (da) | 2006-10-09 |
Family
ID=26077587
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK03702460T DK1466166T3 (da) | 2002-01-15 | 2003-01-15 | Fremgangsmåde til udförelse af pulverdiffraktionsanalyse |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7702071B2 (da) |
| EP (1) | EP1466166B2 (da) |
| AT (1) | ATE329254T1 (da) |
| AU (1) | AU2003205621A1 (da) |
| DE (1) | DE60305875T3 (da) |
| DK (1) | DK1466166T3 (da) |
| ES (1) | ES2266772T3 (da) |
| WO (1) | WO2003060497A1 (da) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2849029B1 (fr) | 2002-12-20 | 2005-03-18 | Lafon Labor | Procede de preparation et formes cristallines des enantiomeres optiques du modafinil. |
| DE10317678A1 (de) * | 2003-04-17 | 2004-11-18 | Bruker Axs Gmbh | Röntgen-optisches System zum kombinatorischen Screening einer Probenbibliothek |
| CN100485373C (zh) | 2004-07-14 | 2009-05-06 | 西南技术工程研究所 | 短波长x射线衍射测量装置和方法 |
| US7597852B2 (en) | 2004-09-03 | 2009-10-06 | Symyx Solutions, Inc. | Substrate for sample analyses |
| EP1720007B1 (en) | 2005-05-02 | 2011-10-05 | F. Hoffmann-La Roche Ltd. | Method and apparatus for X-ray diffraction analysis |
| EP1720006A1 (en) | 2005-05-02 | 2006-11-08 | F. Hoffmann-La Roche Ag | Method and apparatus for x-ray diffraction analysis |
| KR20100041509A (ko) * | 2008-10-14 | 2010-04-22 | 한국표준과학연구원 | 격자상수 측정용 표준시료 홀더 및 이를 이용한 정량 분석 방법 |
| NL2002196C2 (en) * | 2008-11-11 | 2010-05-17 | Avantium Int Bv | SAMPLE ANALYZES APPARATUS AND A METHOD OR ANALYZING A SAMPLE. |
| US9939393B2 (en) * | 2015-09-28 | 2018-04-10 | United Technologies Corporation | Detection of crystallographic properties in aerospace components |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1598413A1 (de) | 1966-01-20 | 1970-04-23 | Exxon Research Engineering Co | Vorrichtung zur Anfertigung verzerrungsfreier Roentgenbeugungsbilder |
| US3527942A (en) * | 1967-11-09 | 1970-09-08 | Atlantic Richfield Co | Automatic sample changer for positioning a plurality of pellets in an x-ray analyzer |
| NL7416557A (en) | 1974-12-19 | 1976-06-22 | Hoogovens Ijmuiden Bv | Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples |
| US4016420A (en) * | 1975-05-30 | 1977-04-05 | Dekanat Prirodovedecke Fakulty University Karlovy | Precession-type x-ray diffraction camera |
| US4199678A (en) * | 1979-01-31 | 1980-04-22 | U.S. Philips Corporation | Asymmetric texture sensitive X-ray powder diffractometer |
| AU534668B2 (en) * | 1980-02-05 | 1984-02-09 | Commonwealth Of Australia, The | Sample mounting for x-ray diffraction camera |
| US5359640A (en) * | 1993-08-10 | 1994-10-25 | Siemens Industrial Automation, Inc. | X-ray micro diffractometer sample positioner |
| JP2904055B2 (ja) * | 1995-05-30 | 1999-06-14 | 株式会社島津製作所 | Ｘ線回折装置 |
| US6069934A (en) | 1998-04-07 | 2000-05-30 | Osmic, Inc. | X-ray diffractometer with adjustable image distance |
| DE19839472C1 (de) * | 1998-08-29 | 2000-11-02 | Bruker Axs Analytical X Ray Sy | Automatischer Probenwechsler für Röntgen-Diffraktometer |
| WO2000036405A2 (en) | 1998-12-18 | 2000-06-22 | Symyx Technologies, Inc. | Apparatus and method for characterizing libraries of different materials using x-ray scattering |
| US6507636B1 (en) * | 2000-02-10 | 2003-01-14 | Studiengesellschaft Kohle Mbh | Rapid X-ray diffraction screening method of polymorph libraries created in multi-well plates |
| US6400797B1 (en) * | 2000-06-22 | 2002-06-04 | D'amico Kevin L. | Sample changer for capillary geometry X-ray diffractometers |
| JP2002031609A (ja) * | 2000-07-17 | 2002-01-31 | Philips Japan Ltd | 結晶構造解析方法 |
| CA2424893A1 (en) | 2000-10-19 | 2002-07-25 | Structural Genomix, Inc. | Apparatus and method for identification of crystals by in-situ x-ray diffraction |
| US6882739B2 (en) * | 2001-06-19 | 2005-04-19 | Hypernex, Inc. | Method and apparatus for rapid grain size analysis of polycrystalline materials |
-
2003
- 2003-01-15 WO PCT/EP2003/000451 patent/WO2003060497A1/en not_active Ceased
- 2003-01-15 ES ES03702460T patent/ES2266772T3/es not_active Expired - Lifetime
- 2003-01-15 AT AT03702460T patent/ATE329254T1/de active
- 2003-01-15 DK DK03702460T patent/DK1466166T3/da active
- 2003-01-15 AU AU2003205621A patent/AU2003205621A1/en not_active Abandoned
- 2003-01-15 DE DE60305875T patent/DE60305875T3/de not_active Expired - Lifetime
- 2003-01-15 US US10/485,927 patent/US7702071B2/en not_active Expired - Fee Related
- 2003-01-15 EP EP03702460.1A patent/EP1466166B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| AU2003205621A1 (en) | 2003-07-30 |
| US20050002487A1 (en) | 2005-01-06 |
| ATE329254T1 (de) | 2006-06-15 |
| ES2266772T3 (es) | 2007-03-01 |
| DE60305875T3 (de) | 2013-09-26 |
| EP1466166B2 (en) | 2013-05-01 |
| WO2003060497A1 (en) | 2003-07-24 |
| US7702071B2 (en) | 2010-04-20 |
| EP1466166A1 (en) | 2004-10-13 |
| DE60305875T2 (de) | 2007-06-06 |
| EP1466166B1 (en) | 2006-06-07 |
| DE60305875D1 (de) | 2006-07-20 |
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