ATE329254T1 - Verfahren zur durchführung einer leistungsbeugungsanalyse - Google Patents
Verfahren zur durchführung einer leistungsbeugungsanalyseInfo
- Publication number
- ATE329254T1 ATE329254T1 AT03702460T AT03702460T ATE329254T1 AT E329254 T1 ATE329254 T1 AT E329254T1 AT 03702460 T AT03702460 T AT 03702460T AT 03702460 T AT03702460 T AT 03702460T AT E329254 T1 ATE329254 T1 AT E329254T1
- Authority
- AT
- Austria
- Prior art keywords
- sample
- powder
- radiation
- detecting
- radiation beam
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 3
- 239000000843 powder Substances 0.000 abstract 10
- 230000005855 radiation Effects 0.000 abstract 8
- 238000001514 detection method Methods 0.000 abstract 2
- 230000000694 effects Effects 0.000 abstract 2
- 230000001678 irradiating effect Effects 0.000 abstract 2
- 238000002050 diffraction method Methods 0.000 abstract 1
- 239000002245 particle Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US34789102P | 2002-01-15 | 2002-01-15 | |
| EP02075149A EP1327877A1 (de) | 2002-01-15 | 2002-01-15 | Verfahren zur sukzessiven Durchführung der Pulverdiffraktionsanalyse an mehreren Proben |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE329254T1 true ATE329254T1 (de) | 2006-06-15 |
Family
ID=26077587
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT03702460T ATE329254T1 (de) | 2002-01-15 | 2003-01-15 | Verfahren zur durchführung einer leistungsbeugungsanalyse |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7702071B2 (de) |
| EP (1) | EP1466166B2 (de) |
| AT (1) | ATE329254T1 (de) |
| AU (1) | AU2003205621A1 (de) |
| DE (1) | DE60305875T3 (de) |
| DK (1) | DK1466166T3 (de) |
| ES (1) | ES2266772T3 (de) |
| WO (1) | WO2003060497A1 (de) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2849029B1 (fr) | 2002-12-20 | 2005-03-18 | Lafon Labor | Procede de preparation et formes cristallines des enantiomeres optiques du modafinil. |
| DE10317678A1 (de) * | 2003-04-17 | 2004-11-18 | Bruker Axs Gmbh | Röntgen-optisches System zum kombinatorischen Screening einer Probenbibliothek |
| CN100485373C (zh) | 2004-07-14 | 2009-05-06 | 西南技术工程研究所 | 短波长x射线衍射测量装置和方法 |
| US7597852B2 (en) | 2004-09-03 | 2009-10-06 | Symyx Solutions, Inc. | Substrate for sample analyses |
| EP1720007B1 (de) | 2005-05-02 | 2011-10-05 | F. Hoffmann-La Roche Ltd. | Methode und Vorrichtung zur Röntgenbeugunsanalyse |
| EP1720006A1 (de) | 2005-05-02 | 2006-11-08 | F. Hoffmann-La Roche Ag | Methode und Vorrichtung zur Röntgenbeugunsanalyse |
| KR20100041509A (ko) * | 2008-10-14 | 2010-04-22 | 한국표준과학연구원 | 격자상수 측정용 표준시료 홀더 및 이를 이용한 정량 분석 방법 |
| NL2002196C2 (en) * | 2008-11-11 | 2010-05-17 | Avantium Int Bv | SAMPLE ANALYZES APPARATUS AND A METHOD OR ANALYZING A SAMPLE. |
| US9939393B2 (en) * | 2015-09-28 | 2018-04-10 | United Technologies Corporation | Detection of crystallographic properties in aerospace components |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1598413A1 (de) * | 1966-01-20 | 1970-04-23 | Exxon Research Engineering Co | Vorrichtung zur Anfertigung verzerrungsfreier Roentgenbeugungsbilder |
| US3527942A (en) * | 1967-11-09 | 1970-09-08 | Atlantic Richfield Co | Automatic sample changer for positioning a plurality of pellets in an x-ray analyzer |
| NL7416557A (en) | 1974-12-19 | 1976-06-22 | Hoogovens Ijmuiden Bv | Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples |
| US4016420A (en) * | 1975-05-30 | 1977-04-05 | Dekanat Prirodovedecke Fakulty University Karlovy | Precession-type x-ray diffraction camera |
| US4199678A (en) * | 1979-01-31 | 1980-04-22 | U.S. Philips Corporation | Asymmetric texture sensitive X-ray powder diffractometer |
| AU534668B2 (en) * | 1980-02-05 | 1984-02-09 | Commonwealth Of Australia, The | Sample mounting for x-ray diffraction camera |
| US5359640A (en) | 1993-08-10 | 1994-10-25 | Siemens Industrial Automation, Inc. | X-ray micro diffractometer sample positioner |
| JP2904055B2 (ja) | 1995-05-30 | 1999-06-14 | 株式会社島津製作所 | Ｘ線回折装置 |
| US6069934A (en) | 1998-04-07 | 2000-05-30 | Osmic, Inc. | X-ray diffractometer with adjustable image distance |
| DE19839472C1 (de) * | 1998-08-29 | 2000-11-02 | Bruker Axs Analytical X Ray Sy | Automatischer Probenwechsler für Röntgen-Diffraktometer |
| EP1149282A2 (de) * | 1998-12-18 | 2001-10-31 | Symyx Technologies, Inc. | Verfahren zur charakterisierung von bibliotheken verschiedener materialien mittels röntgenstrahlen |
| US6507636B1 (en) | 2000-02-10 | 2003-01-14 | Studiengesellschaft Kohle Mbh | Rapid X-ray diffraction screening method of polymorph libraries created in multi-well plates |
| US6400797B1 (en) | 2000-06-22 | 2002-06-04 | D'amico Kevin L. | Sample changer for capillary geometry X-ray diffractometers |
| JP2002031609A (ja) * | 2000-07-17 | 2002-01-31 | Philips Japan Ltd | 結晶構造解析方法 |
| US20020067800A1 (en) * | 2000-10-19 | 2002-06-06 | Janet Newman | Apparatus and method for identification of crystals by in-situ X-ray diffraction |
| US6882739B2 (en) * | 2001-06-19 | 2005-04-19 | Hypernex, Inc. | Method and apparatus for rapid grain size analysis of polycrystalline materials |
-
2003
- 2003-01-15 EP EP03702460.1A patent/EP1466166B2/de not_active Expired - Lifetime
- 2003-01-15 WO PCT/EP2003/000451 patent/WO2003060497A1/en not_active Ceased
- 2003-01-15 US US10/485,927 patent/US7702071B2/en not_active Expired - Fee Related
- 2003-01-15 AT AT03702460T patent/ATE329254T1/de active
- 2003-01-15 AU AU2003205621A patent/AU2003205621A1/en not_active Abandoned
- 2003-01-15 DK DK03702460T patent/DK1466166T3/da active
- 2003-01-15 ES ES03702460T patent/ES2266772T3/es not_active Expired - Lifetime
- 2003-01-15 DE DE60305875T patent/DE60305875T3/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP1466166B2 (de) | 2013-05-01 |
| EP1466166A1 (de) | 2004-10-13 |
| WO2003060497A1 (en) | 2003-07-24 |
| DE60305875T3 (de) | 2013-09-26 |
| DK1466166T3 (da) | 2006-10-09 |
| EP1466166B1 (de) | 2006-06-07 |
| AU2003205621A1 (en) | 2003-07-30 |
| US20050002487A1 (en) | 2005-01-06 |
| ES2266772T3 (es) | 2007-03-01 |
| DE60305875T2 (de) | 2007-06-06 |
| US7702071B2 (en) | 2010-04-20 |
| DE60305875D1 (de) | 2006-07-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ATE390627T1 (de) | Verfahren und vorrichtung zur oberflächenplasmonenmikroskopie | |
| WO2004111624A3 (en) | Method and apparatus for implementing xanes analysis | |
| DE602008004079D1 (de) | Vorrichtung und Verfahren zur Röntgenstrahlfluoreszenz-Analyse einer Mineralprobe | |
| DE602005019552D1 (de) | Eliminierung von cross-talk in einem mehrere quellen umfassenden rückstreuungs-inspektionsportal durch sicherstellen, dass zu einem zeitpunkt jeweils nur eine quelle strahlung emittiert | |
| ATE418729T1 (de) | Verfahren zur charakterisierung von biomolekülen mittels resultat-gesteuerter strategie | |
| ATE548053T1 (de) | Verfahren und vorrichtung zum sporenaufschluss und/oder -nachweis | |
| JP2016015315A5 (ja) | 画像蓄積方法及び走査型顕微鏡 | |
| ATE329254T1 (de) | Verfahren zur durchführung einer leistungsbeugungsanalyse | |
| EP1837883A3 (de) | Röntgenstrahlerzeugungsverfahren und Röntgenstrahlerzeugungsvorrichtung | |
| EP2708870A3 (de) | Vorrichtung und Verfahren zum Wärmemanagement eines Ionenstrahl-Probenpräparats | |
| WO2012149003A3 (en) | Apparatus and method for estimating formation lithology using x-ray flourescence | |
| WO2007061574A3 (en) | Room temperature phosphorescence apparatus and methods | |
| WO2004089056A3 (en) | Exempt source for an x-ray fluorescence device | |
| ES8302910A1 (es) | Metodo y su correspondiente aparato analizador de particulas. | |
| ATE533041T1 (de) | Verfahren zur analyse einer probe und vorrichtung dafür | |
| DE60332323D1 (de) | Verfahren und probeentnahmevorrichtung zur erfassung geringer niveaus eines eigenschafts-/qualitätsmerkmals, das in einem inhomogen verteilten probensubstrat vorliegt | |
| WO2006024819A3 (en) | A method of analysing a sample and apparatus therefor | |
| WO2003031959A3 (en) | Method for performing a transmission diffraction analysis | |
| ATE515688T1 (de) | Verfahren und system zur bestimmung von massedichte und abmessungsmerkmalen eines gegenstands sowie dessen verwendung zur überwachung von kernbrennstoffpellets während deren herstellung | |
| JP2006132945A5 (de) | ||
| SE8503901D0 (sv) | Forfarande och anordning for ytundersokning | |
| DE59813004D1 (de) | Verfahren und Vorrichtung zum analytischen Nachweis von Spuren | |
| ATE403858T1 (de) | Verfahren und system zur physikochemischen analyse mittels lasergepulster ablation | |
| Marengo et al. | Derivatization-targeted analysis of amino compounds from Cardueae species by liquid chromatography tandem mass spectrometry | |
| Rubiolo | Number (to be provided by Organizing Committee) Derivatization-targeted analysis of amino compounds from Cardueae species by liquid chromatography tandem mass spectrometry Arianna Marengo1, 2, Larissa Silva Maciel2, Cecilia Cagliero1, Barbara Sgorbini1, Patrizia |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| UEP | Publication of translation of european patent specification |
Ref document number: 1466166 Country of ref document: EP |