DK2183644T3 - Brøndplade til røntgenfluorescensmålinger - Google Patents
Brøndplade til røntgenfluorescensmålinger Download PDFInfo
- Publication number
- DK2183644T3 DK2183644T3 DK08798006.6T DK08798006T DK2183644T3 DK 2183644 T3 DK2183644 T3 DK 2183644T3 DK 08798006 T DK08798006 T DK 08798006T DK 2183644 T3 DK2183644 T3 DK 2183644T3
- Authority
- DK
- Denmark
- Prior art keywords
- film
- sample
- hole
- plate
- ray fluorescence
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- 229910052714 tellurium Inorganic materials 0.000 description 1
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 1
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- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2202—Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B42/00—Obtaining records using waves other than optical waves; Visualisation of such records by using optical means
- G03B42/02—Obtaining records using waves other than optical waves; Visualisation of such records by using optical means using X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/074—Investigating materials by wave or particle radiation secondary emission activation analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/309—Accessories, mechanical or electrical features support of sample holder
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/64—Specific applications or type of materials multiple-sample chamber, multiplicity of materials
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
- Sampling And Sample Adjustment (AREA)
- Apparatus Associated With Microorganisms And Enzymes (AREA)
Claims (5)
1. Apparat (2) til forberedelse af en eller flere prøver til måling ved hjælp af røntgenfluorescensspektrometri, der omfatter en brøndplade (4), der har i det mindste ét hul (8), der går igennem brøndpladen fra den ene yderside til den anden yderside, en film (6), der overdækker hullet, hvilken film (6) er i det mindste 5 % gennemskinnelig for 2.300 eV røntgenstråler, der er orienteret normalt i forhold til filmen (6), kendetegnet ved, at hullet (8) har en diameter på mindre end 500 mikrometer i i det mindste én dimension parallelt med filmen (6) på det sted, hvor hullet (8) grænser op til filmen (6) og et tværsnitsareal på mindre end 0,005 kvadratcentimeter der, hvor hullet (8) grænser op til filmen (6), og hvor hullets (8) vægge har en RMS-ruhed på mindre end 20 mikrometer.
2. Apparat (2) ifølge krav 1, ved hvilket filmen (6) kan deformeres fra planet, der defineres af den del af hullet (8), der grænser op til filmen (6), hvilken deformation udgør mindst 100 nanometer.
3. Fremgangsmåde til forberedelse af en prøve til måling ved hjælp af røntgenfluorescensspektrometri, der omfatter tilvejebringelse af en opløsning med en koncentration af opløst stof på mindre end ca. 10 mikromolær og et volumen på mellem ca. 2 mikroliter og ca. 2 milliliter, idet opløsningen komcentreres til en prøve med mindre en en femtedel af det oprindelige volumen af opløsningen, og prøven analyseres ved hjælp af røntgenfluorescensspektrometri, kendetegnet ved, at prøven er koncentreret i et hul (8) i et apparat ifølge krav 1.
4. Fremgangsmåde ifølge krav 3, ved hvilken det opløste stof har en total masse på mellem 50 femtogram og 1 mikrogram af et element, der er udvalgt fra listen af phosphor, svovl og kombinationer heraf.
5. Fremgangsmåde ifølge krav 3, ved hvilken brønden har en spidsvinkel på mindre end 45 grader.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US96505207P | 2007-08-16 | 2007-08-16 | |
| PCT/US2008/073359 WO2009023847A1 (en) | 2007-08-16 | 2008-08-15 | Well plate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DK2183644T3 true DK2183644T3 (da) | 2016-08-29 |
Family
ID=40351190
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
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| KR102217403B1 (ko) * | 2019-01-30 | 2021-02-19 | 고려대학교 산학협력단 | 연속 결정학을 위한 메쉬 기반 결정 시료 홀더 |
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2008
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| US20130034205A1 (en) | 2013-02-07 |
| EP2183644B1 (en) | 2016-06-08 |
| US8238515B2 (en) | 2012-08-07 |
| US8873707B2 (en) | 2014-10-28 |
| WO2009023847A1 (en) | 2009-02-19 |
| US20150023467A1 (en) | 2015-01-22 |
| JP6076308B2 (ja) | 2017-02-08 |
| JP2015004692A (ja) | 2015-01-08 |
| EP2183644A1 (en) | 2010-05-12 |
| ES2585345T3 (es) | 2016-10-05 |
| EP2183644A4 (en) | 2012-01-18 |
| US9476846B2 (en) | 2016-10-25 |
| US20170010228A1 (en) | 2017-01-12 |
| US10782253B2 (en) | 2020-09-22 |
| JP5755682B2 (ja) | 2015-07-29 |
| JP5628035B2 (ja) | 2014-11-19 |
| US20090046832A1 (en) | 2009-02-19 |
| JP2010537171A (ja) | 2010-12-02 |
| JP2013224946A (ja) | 2013-10-31 |
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