EP0155890A2 - Bildwandlerröhre mit Spaltenabtastung - Google Patents

Bildwandlerröhre mit Spaltenabtastung Download PDF

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Publication number
EP0155890A2
EP0155890A2 EP85400461A EP85400461A EP0155890A2 EP 0155890 A2 EP0155890 A2 EP 0155890A2 EP 85400461 A EP85400461 A EP 85400461A EP 85400461 A EP85400461 A EP 85400461A EP 0155890 A2 EP0155890 A2 EP 0155890A2
Authority
EP
European Patent Office
Prior art keywords
deflection
screen
slit
plane
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP85400461A
Other languages
English (en)
French (fr)
Other versions
EP0155890A3 (en
EP0155890B1 (de
Inventor
Claude Cavailler
Gérard Clement
Noel Fleurot
Alain Girard
Charles Loty
Jean Pierre Roux
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of EP0155890A2 publication Critical patent/EP0155890A2/de
Publication of EP0155890A3 publication Critical patent/EP0155890A3/fr
Application granted granted Critical
Publication of EP0155890B1 publication Critical patent/EP0155890B1/de
Expired legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J31/00—Cathode ray tubes; Electron beam tubes
    • H01J31/08—Cathode ray tubes; Electron beam tubes having a screen on or from which an image or pattern is formed, picked up, converted, or stored
    • H01J31/50—Image-conversion or image-amplification tubes, i.e. having optical, X-ray, or analogous input, and optical output
    • H01J31/501—Image-conversion or image-amplification tubes, i.e. having optical, X-ray, or analogous input, and optical output with an electrostatic electron optic system
    • H01J31/502—Image-conversion or image-amplification tubes, i.e. having optical, X-ray, or analogous input, and optical output with an electrostatic electron optic system with means to interrupt the beam, e.g. shutter for high speed photography

Definitions

  • the present invention relates to a slit-scanning image converter tube.
  • the slit camera makes it possible to record photographically the variation over time of the light level of an image, in one dimension, of the phenomena to be studied.
  • the image of the phenomenon to be studied is made on a photocathode of a conventional image converter tube comprising, in addition to the photocathode, a control electrode, acceleration electrodes, a focusing electrode, a pair of deflectors and an electroluminescent screen, possibly associated with an electron multiplier device.
  • the number of electrons emitted at each point of the photosensitive layer of the photocathode is proportional to the level of light applied locally.
  • the electrons are accelerated and focused at the location of the phosphor screen for example, where a visible image is produced.
  • the electrons are blocked at the photocathode by a negative potential applied to the control electrode or are deflected by a shutter electrode and then intercepted by another electrode.
  • the image produced on the photocathode is delimited by a narrow slit the image of which is made on the screen, the scrolling of the image of the slit being obtained by applying to the deflectors of the deflection optics a scanning signal.
  • the evolution of the brightness is observed along the scanning axis, as a function of the time of the light phenomenon under examination. According to the axis perpendicular to the scanning axis, that is to say along the largest dimension of the slot, the spatial evolution of the same phenomenon is noted.
  • FIG. 1 a shows the shape of the electron beam in the spatial plane between the photocathode 2 and the screen 4.
  • the image of the slit is obtained by means of a converging lens produced by electrodes 6 and 8, said image being made on the screen 4 or on a wafer of microchannels 10 in an output system comprising an electron multiplier.
  • the converging lens used is a quadrupole lens which has the advantage of not introducing large distortions in the spatial plane, since it is devoid of first order aberrations.
  • the trace of the electron beam in the spatial plane carries the re reference 12.
  • the deflection means of the tube and the shape of the electron beam are shown in the deflection plane.
  • an accelerating electrode 14 Between the photocathode 2 and the screen 4 are successively arranged an accelerating electrode 14, the electrodes 16 and 18 of the quadrupolar lens forming a diverging lens in the deflection plane, a deflection and focusing lens 20 and possibly a microchannel plate 10.
  • the deflection and focusing optics consist of three pairs of plates 22, 24 and 26.
  • This structure made it possible, in the tubes according to the prior art whose length was limited for technological reasons, to physically separate the lens from screen deflection, which helps reduce beam distortion.
  • the corollary of this structure is the impossibility of independently optimizing the focusing and deflection of the beam.
  • An objective of the invention is to decouple the focusing and the deflection of the beam in the deflection plane. This makes it possible in particular to improve, compared with the prior art, the sensitivity of deflection of the beam.
  • the invention proposes to add a converging lens in the deflection plane, upstream of the quadrupole lens in order to limit the width of the beam at the output of said quadrupole lens and thus limit the importance of the intercepted current.
  • the invention is therefore an improvement to known slit-scanning image converter tubes. It allows, while retaining the temporal resolution of these tubes, to improve the spatial resolution.
  • the invention relates to a slit-scanning image converter tube intended to observe rapidly evolving light phenomena by scanning on a screen the image of a slit, said slit collecting on a photocathode the light sent by the luminous phenomenon to be studied, and emitting an electron beam
  • said tube comprising said photocathode, a control electrode, an accelerating electrode and an optical de bending and focusing of the electron beam located between the accelerating electrode and the screen
  • said deflection and focusing optics comprising a first electronic means for making the image of the largest dimension of said slot on the screen and a second electronic means independent of the previous one for focusing and deflecting the beam, in the plane of the screen, in a direction perpendicular to the previous direction, said second electronic means comprising, between the accelerating electrode and the screen, a lens focusing followed by a deflection electrode, said focusing lens making the image of the smallest dimension of the slit on the screen and limiting the width of the beam at the input of the deflection electrode
  • the focusing and deflection optics comprises, between the accelerating electrode and the screen, a planar convergent lens, a quadrupole lens, another planar convergent lens and a deflection electrode .
  • the deflection electrode constitutes a wave propagation line.
  • FIG 2 there is shown an embodiment of a converter tube according to the invention.
  • the light of the beam 32 is concentrated by an optical system (not shown) on the photocathode 2 in a rectangle 34 constituting the electron-emitting slit.
  • the converter tube also includes an accelerating electrode 14, a planar convergent lens 36, a quadrupole lens 38, another planar convergent lens 40, an electrode deflection 42 and a screen 4.
  • the means for closing the tube has not been shown.
  • the image on the screen is taken up by an image intensifier which can be either inside the tube (microchannel pancake) or outside the tube.
  • an image intensifier which can be either inside the tube (microchannel pancake) or outside the tube.
  • an image intensifier in the tube introduces significant background noise. It is therefore preferable to use an external image intensifier such as a matrix of cells with charge transfer devices (in English CCD).
  • the accelerator electrode 14 is connected to a positive voltage source 44; the three pairs of plates of the converging lens 36 are connected to a voltage source 46; the two electrodes 6 and 8 of the quadrupole lens 38 are connected to the same positive voltage supply 48, while the other two facing electrodes 16 and 18 are connected to the same negative voltage supply 50; the three pairs of plates of the convergence lens 40 are connected to a voltage source 52 and the deflection electrode 42 to a voltage source 54.
  • the image of the slit 34 is obtained by virtue of the converging lens produced by the electrodes 6 and 8 of the quadrupole lens, said image being made on the screen 4.
  • the electrode 42 deflects in the direction Oy (time axis) the image of the photocathode on the screen 4.
  • FIG. 3a the shape of the electron beam is shown in the spatial plane between the photocathode 2 and the screen 4.
  • the potential applied by the power supply 48 of FIG. 2 to the electrodes 6 and 8 is such that, in the spatial plane xOz, the image of the slot of the photocathode is produced substantially on the screen 4.
  • the electronic harness is shown at 56.
  • the shape of the electron beam is shown in the deflection plane yOz.
  • the electron beam 58 is accelerated by the accelerating electrode 10, then it is prefocused by the converging planar lens 36 before being made divergent by the electrodes 16 and 18 of the quadrupole lens. It then enters the converging planar lens 40, after having been optionally diaphragmed by a diaphragm 60, to be focused on the screen 4.
  • the current stopped by the diaphragm 60 can be adjusted by means of the pre-focusing lens 36.
  • the beam 58 Downstream of the converging lens 40, the beam 58 passes through the deflection electrode 42 which performs the function of scanning the beam on the screen.
  • this deflection electrode constitutes a wave propagation line.
  • the deflection voltage signal then propagates on the deflection plate (s) at the same speed as the electron beam.
  • FIG. 4a the photocathode 2 and the accelerating electrode 10 are shown, as well as the diagram of the beams coming from the photocathode such as the beams 62 and 64.
  • the point of first convergence is located at 66 and the image of the photocathode given by the accelerating electrode 10 is shown in dotted lines at 68.
  • the position of the point of first convergence 66 of the image of photocathode 68 and the height of the point of first convergence vary as a function of the ratio e / d, where e is the half-width of the slot of the accelerating electrode 10 and d the distance between the photocathode and the accelerating electrode.
  • the photocathode emitting electron beams such as 70, 72 and 74 is shown in the spatial plane, the image 76 of the photocathode given by the accelerating electrode 10 in this plane being located downstream.
  • the quadrupole lens 38 has been shown.
  • This lens is formed according to this embodiment of four equilateral hyperbolic arcs, the opposite arcs 16 and 18 being brought to the potential + V and the arcs 6 and 8 at potential -V.
  • Figure 4b there is shown the same quadrupole lens of length 1 1 side view in section along the plane yOz.
  • the property of convergence of the quadrupole lens 38 is used to make the image of the slot 34 of the photocathode 2 on the screen.
  • the beam coming from photocathode 2 has dimensions which are not negligible compared to the inter-electrode distance 2a. It is therefore in the spatial plane that the aberrations of the quadrupole lens will alter the quality of the image.
  • the height of the slit being for example 1 mm
  • the height of the beam will be small in front of 2a, of the order of a centimeter, and the aberrations negligible.
  • the advantage of the quadrupole lens over the simple converging lens is that it does not introduce large distortions into the spatial plan since it is devoid of first-order aberrations.
  • the shape of the electrodes allowing to realize the quadrupole field is, as we have seen an equilateral hyperbola branch. This form being difficult to machine, it is replaced, in a variant of the invention, by an arc of an osculating circle.
  • FIG 6 there is shown an embodiment of a lens converging in the deflection plane such as lenses 36 and 40.
  • This lens consists of three pairs of plates 78, 80 and 82.
  • the plates 78 and 82 are grounded, and plate 80 has a negative potential.
  • This potential is adjustable and can be adjusted independently for each of the lenses 36 and 40 located on either side of the quadrupole lens 38. This allows, while focusing the beam on the screen, to modify its thickness at the input deflection optics, which conditions the thickness of the trace on the screen.
  • the time resolution can thus be adjusted according to each application.
  • the minimum thickness of the trace on the screen is very significantly smaller than in tubes according to the prior art.
  • FIG. 7 shows an embodiment of the deflection electrode 42.
  • the electrons closer to the negative plates are slowed down, therefore more deviated, so that the crossing of the trajectories is carried out closer than desired to the exit of the deflection plates.
  • the thickness of the trace is proportional to ⁇ / (l 2 .L) where ⁇ is the width of the beam at the input of the deflection optics, 1 2 the length of the deflection plates and L the distance between the entry of the deflection plates and the screen.
  • the thickness of the beam cannot be reduced if it is desired to keep most of the current transported.
  • the length of the plates 1 2 cannot be increased without reducing the bandwidth of the deflection system. It is therefore advantageous to increase the length L within the limits compatible with the length of the tube.
  • the bandwidth of the deflection system is limited by the transit time of the beam electrons between the plates.
  • a divided wave propagation deflector system is used, that is to say a system in which the deflection signal accompanies the beam electrons. This makes it possible to obtain a simple deflector, with high sensitivity, therefore with a low deflection voltage, and with very high bandwidth.
  • the deflection optic 42 shown in FIG. 7 comprises a plate 84 brought to constant potential and a plate 86 forming a zigzag line such that the voltage ramp propagates, in the Oz direction, at the speed of the beam electrons .
  • the set of incoming wires, connectors and zigzag line must be adapted to the impedance and closed on the characteristic impedance. This is achieved by a resistor 87 disposed between the plate 86 and the mass.
  • the adaptation is finally adjusted by means of a counter plate 88 brought to ground potential.
  • the electrons can be blocked in known manner at the photocathode by a negative potential applied to a control electrode disposed between the photocathode and the accelerating electrode.
  • An electrical signal of positive rectangular shape is then superimposed on this negative bias potential to obtain the opening of the tube.
  • This embodiment is not always the most suitable, in particular when the distance between the photocathode and the accelerating electrode is of the order of only a few millimeters and the potential of the accelerating electrode is high, for example greater than 10 kV.
  • FIG. 8 shows another embodiment of a system for closing the electron beam.
  • a first shutter lens 90 has been added between the converging lens 36 and the quadrupole lens 38, and a second shutter lens 92 between the converging lens 40 and the deflection electrode 42.
  • the obturation is achieved by deflection of the electron beam by polarizing one of the electrodes of the lens 90.
  • the impact of the electrons on the lens 92 generates secondary electrons which it would be advisable for them to be able to propagate in the tube. To prevent this, simply confine the elec secondary edges in the space delimited by the lens 92 by applying to said lens a potential greater than the potential of the converging lens 40. A voltage of a few hundred volts is sufficient to ensure shuttering.

Landscapes

  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
EP19850400461 1984-03-16 1985-03-11 Bildwandlerröhre mit Spaltenabtastung Expired EP0155890B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8404095A FR2561441B1 (fr) 1984-03-16 1984-03-16 Tube convertisseur d'image a balayage de fente
FR8404095 1984-03-16

Publications (3)

Publication Number Publication Date
EP0155890A2 true EP0155890A2 (de) 1985-09-25
EP0155890A3 EP0155890A3 (en) 1985-10-23
EP0155890B1 EP0155890B1 (de) 1988-11-17

Family

ID=9302116

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19850400461 Expired EP0155890B1 (de) 1984-03-16 1985-03-11 Bildwandlerröhre mit Spaltenabtastung

Country Status (4)

Country Link
EP (1) EP0155890B1 (de)
JP (1) JPH0824037B2 (de)
DE (1) DE3566327D1 (de)
FR (1) FR2561441B1 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2627294A1 (fr) * 1988-02-17 1989-08-18 Commissariat Energie Atomique Camera electronique ultra rapide a commande numerique, pour l'etude de phenomenes lumineux tres brefs
EP1158787A1 (de) * 2000-05-26 2001-11-28 Thales Vorrichtung und Analyseverfahren von eins oder mehrere Signalen mit grossem Dynamikbereich

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6401600B2 (ja) * 2014-12-18 2018-10-10 浜松ホトニクス株式会社 ストリーク管及びそれを含むストリーク装置
CN107706075B (zh) * 2017-11-09 2023-09-19 中国工程物理研究院激光聚变研究中心 一种多区域探测扫描变像管
CN109459779B (zh) * 2019-01-08 2023-08-18 中国工程物理研究院激光聚变研究中心 一种激光内爆诊断系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1599901A (de) * 1968-12-09 1970-07-20
FR2284978A1 (fr) * 1974-09-13 1976-04-09 Commissariat Energie Atomique Tube convertisseur d'images a balayage de fente
JPS5935344A (ja) * 1982-08-21 1984-02-27 ダニ−ル・ジヨセフ・ブラツドリ− 電子光学的イメージ管

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2627294A1 (fr) * 1988-02-17 1989-08-18 Commissariat Energie Atomique Camera electronique ultra rapide a commande numerique, pour l'etude de phenomenes lumineux tres brefs
EP0329547A1 (de) * 1988-02-17 1989-08-23 Commissariat A L'energie Atomique Numerisch angesteuerte elektronische Hochgeschwindigkeitskamera zum Studium von sehr kurzen Vorgängen
US4945416A (en) * 1988-02-17 1990-07-31 Commissariat A L'energie Atomique Ultra-rapid electronic camera
EP1158787A1 (de) * 2000-05-26 2001-11-28 Thales Vorrichtung und Analyseverfahren von eins oder mehrere Signalen mit grossem Dynamikbereich
FR2809568A1 (fr) * 2000-05-26 2001-11-30 Thomson Csf Dispositif et procede d'analyse d'un ou de plusieurs signaux a grande dynamique

Also Published As

Publication number Publication date
JPH0824037B2 (ja) 1996-03-06
FR2561441A1 (fr) 1985-09-20
EP0155890A3 (en) 1985-10-23
FR2561441B1 (fr) 1986-11-14
EP0155890B1 (de) 1988-11-17
JPS60211749A (ja) 1985-10-24
DE3566327D1 (en) 1988-12-22

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