EP1865306A4 - Optische messvorrichtung - Google Patents

Optische messvorrichtung

Info

Publication number
EP1865306A4
EP1865306A4 EP06730883A EP06730883A EP1865306A4 EP 1865306 A4 EP1865306 A4 EP 1865306A4 EP 06730883 A EP06730883 A EP 06730883A EP 06730883 A EP06730883 A EP 06730883A EP 1865306 A4 EP1865306 A4 EP 1865306A4
Authority
EP
European Patent Office
Prior art keywords
measuring apparatus
optical measuring
optical
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP06730883A
Other languages
English (en)
French (fr)
Other versions
EP1865306A1 (de
EP1865306B1 (de
Inventor
Yoshiyuki Mitani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=37073516&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=EP1865306(A4) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Olympus Corp filed Critical Olympus Corp
Publication of EP1865306A1 publication Critical patent/EP1865306A1/de
Publication of EP1865306A4 publication Critical patent/EP1865306A4/de
Application granted granted Critical
Publication of EP1865306B1 publication Critical patent/EP1865306B1/de
Anticipated expiration legal-status Critical
Revoked legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0044—Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
EP06730883.3A 2005-04-01 2006-03-31 Optische messvorrichtung Revoked EP1865306B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005106530A JP4800655B2 (ja) 2005-04-01 2005-04-01 光測定装置
PCT/JP2006/306935 WO2006106966A1 (ja) 2005-04-01 2006-03-31 光測定装置

Publications (3)

Publication Number Publication Date
EP1865306A1 EP1865306A1 (de) 2007-12-12
EP1865306A4 true EP1865306A4 (de) 2013-01-09
EP1865306B1 EP1865306B1 (de) 2017-02-01

Family

ID=37073516

Family Applications (1)

Application Number Title Priority Date Filing Date
EP06730883.3A Revoked EP1865306B1 (de) 2005-04-01 2006-03-31 Optische messvorrichtung

Country Status (4)

Country Link
US (1) US7534987B2 (de)
EP (1) EP1865306B1 (de)
JP (1) JP4800655B2 (de)
WO (1) WO2006106966A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009016635A2 (en) * 2007-08-01 2009-02-05 Medingo Ltd. Detachable portable infusion device
EP2706346A4 (de) * 2011-04-13 2014-11-19 Olympus Corp Photoanalysevorrichtung mit erkennung einzelner lichtemittierender teilchen, photoanalyseverfahren und computerprogramm zur photoanalyse
CN102621121B (zh) * 2012-04-24 2014-01-01 福建师范大学 生物组织内源性成分的多模式多光子显微成像装置
EP2876482A4 (de) * 2012-07-19 2016-04-13 Nikon Corp Optisches element, optische vorrichtung, messvorrichtung und screening-vorrichtung
US20150293336A1 (en) * 2012-10-30 2015-10-15 Adam E. Cohen Spatial Filter Enhanced Spinning Disk Confocal Microscope
EP4220139B1 (de) * 2015-02-06 2025-05-28 Life Technologies Corporation Systeme und verfahren zur beurteilung biologischer proben

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19922593A1 (de) * 1998-05-18 1999-11-25 Olympus Optical Co Bilderfassungsvorrichtung
JP2000249925A (ja) * 1999-03-04 2000-09-14 Olympus Optical Co Ltd 共焦点レーザ顕微鏡の調整方法及びその装置
GB2351556A (en) * 1999-06-26 2001-01-03 Cambridge Imaging Ltd Improved assay analysis
US20030156323A1 (en) * 2001-11-28 2003-08-21 Overbeck James W. Scanning microscopy, fluorescence detection, and laser beam positioning
US20040051051A1 (en) * 2000-12-14 2004-03-18 Olympus Optical Co., Ltd. Fluorescence analysis apparatus and fluorescence analysis method
EP1906172A1 (de) * 2005-07-15 2008-04-02 Olympus Corporation Lichtmessgerät

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3219503C2 (de) 1982-05-25 1985-08-08 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Vorrichtung zum selbsttätigen Fokussieren auf in optischen Geräten zu betrachtende Objekte
DE3503175C1 (de) 1985-01-31 1986-04-30 C. Reichert Optische Werke Ag, Wien Mikroskop-Photometer
US5612818A (en) * 1993-09-08 1997-03-18 Nikon Corporation Confocal microscope
JPH0792392A (ja) * 1993-09-27 1995-04-07 Nikon Corp 走査型光学顕微鏡
JP3076715B2 (ja) 1994-03-03 2000-08-14 浜松ホトニクス株式会社 共焦点走査型顕微鏡
JP3458002B2 (ja) * 1994-07-06 2003-10-20 オリンパス光学工業株式会社 共焦点顕微鏡
DE19758744C2 (de) 1997-01-27 2003-08-07 Zeiss Carl Jena Gmbh Laser-Scanning-Mikroskop
JPH11202212A (ja) * 1998-01-13 1999-07-30 Nikon Corp 顕微鏡
DE10038528A1 (de) 2000-08-08 2002-02-21 Zeiss Carl Jena Gmbh Verfahren und Anordnung zur Erhöhung der spektralen und räumlichen Detektorauflösung
JP2002168784A (ja) * 2000-11-29 2002-06-14 Fuji Photo Film Co Ltd 共焦点スキャナのピンホール位置調整・位置決め方法および装置
DE10150934A1 (de) 2001-10-09 2003-04-10 Zeiss Carl Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten Erfassung von Proben
DE10245170A1 (de) 2002-09-26 2004-04-01 Leica Microsystems Wetzlar Gmbh Vorrichtung und Verfahren um positionieren eines optischen Bauteils
JP2004245979A (ja) * 2003-02-12 2004-09-02 Keyence Corp 蛍光顕微鏡
DE10323921A1 (de) 2003-05-22 2004-12-16 Carl Zeiss Jena Gmbh Einstellbares Pinhole, insbesondere für ein Laser-Scanning-Mikroskop
JP2004354347A (ja) * 2003-05-30 2004-12-16 Olympus Corp 蛍光測定装置
JP4762593B2 (ja) * 2005-04-05 2011-08-31 オリンパス株式会社 外部レーザ導入装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19922593A1 (de) * 1998-05-18 1999-11-25 Olympus Optical Co Bilderfassungsvorrichtung
JP2000249925A (ja) * 1999-03-04 2000-09-14 Olympus Optical Co Ltd 共焦点レーザ顕微鏡の調整方法及びその装置
GB2351556A (en) * 1999-06-26 2001-01-03 Cambridge Imaging Ltd Improved assay analysis
US20040051051A1 (en) * 2000-12-14 2004-03-18 Olympus Optical Co., Ltd. Fluorescence analysis apparatus and fluorescence analysis method
US20030156323A1 (en) * 2001-11-28 2003-08-21 Overbeck James W. Scanning microscopy, fluorescence detection, and laser beam positioning
EP1906172A1 (de) * 2005-07-15 2008-04-02 Olympus Corporation Lichtmessgerät

Also Published As

Publication number Publication date
JP2006284448A (ja) 2006-10-19
WO2006106966A1 (ja) 2006-10-12
JP4800655B2 (ja) 2011-10-26
EP1865306A1 (de) 2007-12-12
EP1865306B1 (de) 2017-02-01
US20080258041A1 (en) 2008-10-23
US7534987B2 (en) 2009-05-19

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