EP2511400A1 - Elektrolytische hartgoldplattierungslösung und plattierungsverfahren damit - Google Patents

Elektrolytische hartgoldplattierungslösung und plattierungsverfahren damit Download PDF

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Publication number
EP2511400A1
EP2511400A1 EP10835855A EP10835855A EP2511400A1 EP 2511400 A1 EP2511400 A1 EP 2511400A1 EP 10835855 A EP10835855 A EP 10835855A EP 10835855 A EP10835855 A EP 10835855A EP 2511400 A1 EP2511400 A1 EP 2511400A1
Authority
EP
European Patent Office
Prior art keywords
gold
plating solution
salt
electrolytic hard
acid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP10835855A
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English (en)
French (fr)
Other versions
EP2511400A4 (de
Inventor
Masato Furukawa
Injoon SON
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Metalor Technologies (Japan) Corp
Original Assignee
Metalor Technologies (Japan) Corp
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Filing date
Publication date
Application filed by Metalor Technologies (Japan) Corp filed Critical Metalor Technologies (Japan) Corp
Publication of EP2511400A1 publication Critical patent/EP2511400A1/de
Publication of EP2511400A4 publication Critical patent/EP2511400A4/de
Withdrawn legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/62Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of gold
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys

Definitions

  • the present invention relates to an electrolytic hard gold plating solution capable of forming a plating film which hardly generates pinholes even when formed in a thin film and which is dense, as well as to a plating method using the plating solution.
  • the present invention relates particularly to an electrolytic hard gold plating solution preferably used for selective plating of electronic parts such as connector and the like, as well as to a plating method using the plating solution.
  • hard gold plating superior in abrasion resistance is applied to a contact member which becomes an electric contact of a connector electrically connecting electronic apparatuses or electronic parts.
  • Contact member for electronic parts is produced generally by the following method. First, nickel plating is applied on a base material (e.g. copper material), whereby a nickel film is formed. Next, hard gold plating is applied on the nickel film, whereby a gold film is formed. In this way, there is obtained a contact member in which a nickel film and a gold film have been formed on a copper material in this order.
  • a base material e.g. copper material
  • a gold film having a large number of pinholes therein has no sufficient protectability for nickel film. Accordingly, it is desired that the gold film has no pinhole.
  • Patent Literature 1 it is described that selective plating is applied to a contact member using a hard gold plating solution containing a lustering agent.
  • This plating solution enables uniform electrodeposition.
  • the lustering agent component is taken into the gold film formed.
  • the additive component such as lustering agent component or the like is taken into the gold film, the gold purity of the gold film is reduced.
  • the contact member comes to have an increased contact resistance or have a reduced corrosion resistance.
  • a task to be achieved by the present invention is to provide an electrolytic hard gold plating solution which is preferably used in selective plating, etc. and which gives no pinhole in the gold film formed even when the film has a thickness of 0.1 ⁇ m or smaller.
  • Another task to be achieved by the present invention is to provide a plating method using such an electrolytic hard gold plating solution.
  • the present inventors made an investigation on thin-film formation of gold film. As a result, it was found that, when the above-mentioned plating solution contains an organic crystal-controlling agent of the present invention, the gold film formed therewith generates no pinhole even when the gold film formed has a thickness of about 0.05 ⁇ m. The present inventors further found that the above-mentioned plating solution can form a gold film of high gold purity. The present inventors completed the present invention based on the above findings.
  • the present invention which has achieved the above task, is as described below.
  • An electrolytic hard gold plating solution comprising at least one member of a gold cyanide and a gold cyanide salt, a water-soluble cobalt salt or a water-soluble nickel salt, an electric conductive salt of organic acid, an aromatic sulfonic acid compound, at least one member selected from the group consisting of a carboxylic acid, an oxycarboxylic acid, and salts thereof, and a nitrogen-containing five-membered heterocyclic compound.
  • a plating method which comprises spraying the electrolytic hard gold plating solution of [1] onto a to-be-plated area of a to-be-plated material to form a gold film on the to-be-plated area.
  • the gold film formed with the electrolytic hard gold plating solution of the present invention generates no pinhole even when the film has a thickness of about 0.05 ⁇ m.
  • the nickel film beneath the gold film is completely covered and protected by the gold film and, therefore, the material plated with the present plating solution has high corrosion resistance. Further, with the present electrolytic hard gold plating solution, the use amount of gold can be made small, resulting in superior economy.
  • a gold cyanide and a gold cyanide salt is compounded as a source of gold. Both of them may be compounded.
  • the gold cyanide salt there are mentioned, for example, gold potassium cyanide, gold sodium cyanide and gold ammonium cyanide. They may be compounded singly or in two or more kinds.
  • the concentration of the gold cyanide and the gold cyanide salt is 0.1 to 20 g/L, preferably 2 to 15 g/L, particularly preferably 3 to 10 g/L in terms of total gold concentration.
  • the cathode current efficiency is low, making it impossible to obtain a gold film of intended thickness.
  • the cathode current efficiency does not increase in proportion to the gold concentration and there is no advantage of using a high gold concentration; further, the drag out of plating solution in plating operation is large, resulting in large waste of plating solution.
  • an aromatic sulfonic acid compound is compounded.
  • the aromatic sulfonic acid compound acts as an organic oxidizing agent.
  • the aromatic sulfonic acid compound there are mentioned, for example, 2-nitrobenzenesulfonic acid, 3-nitrobenzenesulfonic acid, 4-nitrobenzenesulfonic acid, 2,4-dinitrobenzenesulfonic acid, 2-aminobenzenesulfonic acid, 3-aminobenzenesufonic acid, 4-aminobenzenesulfonic acid, and salts thereof.
  • an aromatic sulfonic acid compound having nitro group as a substituent is preferred. They may be compounded singly or in two or more kinds.
  • the electrolytic hard gold plating solution containing such an aromatic sulfonic acid compound raises the oxidation reduction potential of gold uniquely in a low current density range (a current density of lower than 20 A/dm 2 ). As a result, gold deposition is suppressed in a low current density range. Meanwhile, the electrolytic hard gold plating solution containing such an aromatic sulfonic acid compound does not suppress gold deposition in a medium to high current density range (a current density of 20 to 200 A/dm 2 ). As a result, a normal gold film is formed in a medium to high current density range.
  • electrolytic hard gold plating solution of the present invention formation of plating film can be suppressed at an area of to-be-plated material other than the to-be-plated area thereof, by controlling the current density employed.
  • the concentration of the organic oxidizing agent compounded in the present electrolytic hard gold plating solution is 0.1 to 20 g/L, preferably 0.5 to 5 g/L, particularly preferably 1 to 3 g/L.
  • concentration of organic oxidizing agent of lower than 0.1 g/L the effect of suppression of gold deposition in a low current density range is small.
  • concentration of organic oxidizing agent of higher than 20 g/L the effect of suppression of gold deposition in a low current density range is unchanged and high.
  • a carboxylic acid or an oxycarboxylic acid or a salt thereof is compounded. They act as a complexing agent.
  • the carboxylic acid, the oxycarboxylic acid or the salt thereof there are mentioned, for example, formic acid, glycolic acid, lactic acid, oxybenzoic acid, succinic acid, malonic acid, malic acid, tartaric acid, phthalic acid, diglycolic acid, citric acid, and salts thereof.
  • the salt there are preferred alkali metal salts such as sodium salt, potassium salt and the like; alkaline earth metal salts such as calcium salt and the like; and salts of ammonia, amine, etc. They may be compounded singly or in two or more kinds.
  • the concentration of complexing agent is 1 to 100 g/L, preferably 5 to 600 g/L.
  • concentration of complexing agent of lower than 1 g/L, the inorganic impurities dissolving out from the plated material tend to be taken into the gold film formed.
  • the inorganic impurities taken into the gold film reduce the gold purity of the gold film.
  • the gold film has inferior appearance, and the contact member has an increased contact resistance and has lower corrosion resistance.
  • a concentration of complexing agent of higher than 100 g/L no effect corresponding to such a high concentration is obtained, and such a concentration is not economical.
  • a water-soluble cobalt salt or a water-soluble nickel salt is compounded.
  • cobalt salt there are mentioned, for example, cobalt sulfate, cobalt nitrate, cobalt chloride, and basic cobalt carbonate.
  • nickel salt there are mentioned, for example, nickel sulfate, nickel sulfamate, nickel sulfite, and nickel chloride. They may be compounded singly or in two or more kinds.
  • the concentration of cobalt salt or nickel salt is 0.01 to 10 g/L, preferably 0.1 to 1.0 g/L. With a concentration of cobalt salt or nickel salt of lower than 0.01 g/L, the gold film formed has a low hardness. With a concentration of cobalt salt or nickel salt of higher than 10 g/L, no effect corresponding to such a high concentration is obtained, and such a concentration is not economical. By compounding the cobalt salt or the nickel salt in the above concentration, the gold film formed has a hardness of 150 to 200 HV.
  • water-soluble of the cobalt salt or the nickel salt, compounded in the present electrolytic hard gold plating solution refers to such a water solubility that the salt can be dissolved in water in the above-mentioned concentration.
  • an electric conductive salt of organic acid is compounded.
  • the electric conductive salt of organic acid there are mentioned, for example, potassium formate, potassium citrate, potassium phosphate, potassium nitrate, and potassium succinate. They may be compounded singly or in two or more kinds.
  • the concentration of electric conductive salt of organic acid is 10 to 200 g/L, preferably 50 to 100 g/L.
  • concentration of electric conductive salt of organic acid of lower than 10 g/L the gold film formed has inferior appearance and no normal gold film is obtained.
  • concentration of electric conductive salt of organic acid of higher than 200 g/L no effect corresponding to such a high concentration is obtained, and such a concentration is not economical.
  • a nitrogen-containing five-membered heterocyclic compound is compounded.
  • the nitrogen-containing five-membered heterocyclic compound acts as an organic crystal-controlling agent.
  • the present inventor considers as follows.
  • the nitrogen-containing five-membered heterocyclic compound is adsorbed on the gold cyanide ion present in the plating bath, or is adsorbed or forms a complex with the gold ion after ligand disengagement (cyanide ion), in an electric double layer, whereby the growth of gold crystal is controlled and a dense gold film is formed.
  • the nitrogen-containing five-membered heterocyclic compound used in the present invention is not taken into the gold film formed; therefore, the gold film has a high gold purity.
  • nitrogen-containing five-membered heterocyclic compound there are mentioned, for example, imidazole, 2-methylimidazole, pyrazole, 3,5-dimethylpyrazole, 2-imidazoline, 2-pyrrolidone, hydantoin, 5,5-dimethylhydantoin, allantoin, succinic acid imide, DL-pyroglutamic acid, and salt thereof.
  • the concentration of nitrogen-containing five-membered heterocyclic compound is 1 to 50 g/L, preferably 5 to 20 g/L, particularly preferably 8 to 12 g/L.
  • concentration of nitrogen-containing five-membered heterocyclic compound of lower than 1 g/L the effect of crystal controlling is small and no dense gold film is obtained.
  • concentration of nitrogen-containing five-membered heterocyclic compound of higher than 50 g/L no effect corresponding to such a high concentration is obtained, and such a concentration is not economical.
  • the present electrolytic hard gold plating solution is usable in a pH range of 3.0 to 7.0, and is used preferably in a pH range of 4.0 to 5.0.
  • the pH is lower than 4.0, the cathode current efficiency is low, making it difficult to obtain a gold film having an intended thickness.
  • the pH is higher than 5.0, the gold film formed has a reddish appearance, making it difficult to obtain a normal gold film.
  • the pH-adjusting agent there are mentioned, for example, sodium hydroxide, potassium hydroxide, ammonium hydroxide and dilute sulfuric acid.
  • the present electrolytic hard gold plating solution may contain other substances as long as the effect of the present invention is not impaired thereby.
  • the plating with the present electrolytic hard gold plating solution can be conducted by a known plating method.
  • the plating can also be conducted by a selective plating method of using a platinum-made nozzle as an anode and a to-be-plated material as a cathode and spraying the present electrolytic hard gold plating solution from the platinum-made nozzle onto the to-be-plated material.
  • the constitution of the test equipment used and the evaluation method used are as follows.
  • a copper plate of 32 mm x 150 mm x 0.2 mm was prepared. On this copper plate was formed a nickel film in a thickness of 2 ⁇ m, using a nickel sulfamate plating solution, and the resulting plate was used as a sample. On this sample was superimposed a silicon rubber-made masking plate having a square opening of 10 mm x 10 mm, and they were fixed.
  • a plating solution was sent to the injection orifice of plating solution using a pump.
  • the plating solution was injected from the injection orifice onto the opening of the masking plate. Thereby, selective plating was conducted on the sample.
  • a platinum nozzle of 5 mm in diameter was fitted to the injection orifice of plating solution, and this nozzle was used as an anode.
  • the measurement of the thickness of the gold film formed was conducted using a fluorescent X-ray film thickness tester SEA 5120 manufactured by SII.
  • the pinholes generated in the gold film were evaluated by the test method by exposure to nitric acid vapor (JIS H 8620 10.5) which is a porosity test described in Japanese Industrial Standards (JIS). In the porosity test, the sizes and numbers of pinholes in plating layer are measured.
  • JIS H 8620 10.5 a porosity test described in Japanese Industrial Standards (JIS).
  • JIS H 8620 10.5 a porosity test described in Japanese Industrial Standards (JIS).
  • JIS H 8620 10.5 Japanese Industrial Standards
  • a plating solution was prepared using the above composition.
  • the plating solution was adjusted to a pH of 4.2, and selective plating was conducted on a sample at a solution temperature of 55°C and at a current density of 40 A/dm 2 so as to give a gold film thickness of 0.05 ⁇ m.
  • the gold film formed on the sample had a lemon yellow color and uniform and good appearance.
  • the rating number was 9.5-5 and the total corroded area ratio was above 0.02% but 0.05% or below.
  • Each plating solution was prepared according to the formulation shown in Table 1 and, using the solution, selective plating was conducted on each sample in the same manner as in Example 1.
  • the gold film formed on each sample had a lemon yellow color and uniform and good appearance.
  • the results of corrosion test are shown in Table 2.
  • the electrolytic hard gold plating solution of the present invention can form a gold film which is extremely few in pinholes even when the film has a thickness of 0.1 ⁇ m or smaller and which is dense. As a result, the material plated with the present plating solution is superior in corrosion resistance.

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Electroplating And Plating Baths Therefor (AREA)
EP10835855.7A 2009-12-09 2010-11-30 Elektrolytische hartgoldplattierungslösung und plattierungsverfahren damit Withdrawn EP2511400A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009279409A JP2011122192A (ja) 2009-12-09 2009-12-09 電解硬質金めっき液及びこれを用いるめっき方法
PCT/JP2010/071304 WO2011070933A1 (ja) 2009-12-09 2010-11-30 電解硬質金めっき液及びこれを用いるめっき方法

Publications (2)

Publication Number Publication Date
EP2511400A1 true EP2511400A1 (de) 2012-10-17
EP2511400A4 EP2511400A4 (de) 2013-07-24

Family

ID=44145478

Family Applications (1)

Application Number Title Priority Date Filing Date
EP10835855.7A Withdrawn EP2511400A4 (de) 2009-12-09 2010-11-30 Elektrolytische hartgoldplattierungslösung und plattierungsverfahren damit

Country Status (7)

Country Link
EP (1) EP2511400A4 (de)
JP (1) JP2011122192A (de)
KR (1) KR20120120134A (de)
CN (1) CN102695819A (de)
SG (1) SG181529A1 (de)
TW (1) TW201137184A (de)
WO (1) WO2011070933A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5025815B1 (ja) * 2011-08-10 2012-09-12 小島化学薬品株式会社 硬質金めっき液
JP5758361B2 (ja) * 2012-08-31 2015-08-05 日本エレクトロプレイテイング・エンジニヤース株式会社 ノンシアン系金‐パラジウム合金めっき液及びめっき方法
JP5152943B1 (ja) * 2012-09-19 2013-02-27 小島化学薬品株式会社 低遊離シアン金塩の製造方法
JP7219120B2 (ja) * 2019-03-04 2023-02-07 Eeja株式会社 電解金めっき液及びその製造方法、並びに金めっき方法及び金錯体
CN118352327B (zh) * 2024-01-10 2025-07-18 深圳市联合蓝海应用材料科技股份有限公司 替代纯金凸块封装倒装芯片的金银合金凸块及其制备方法

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DE2355581C3 (de) * 1973-11-07 1979-07-12 Deutsche Gold- Und Silber-Scheideanstalt Vormals Roessler, 6000 Frankfurt Galvanisches Glanzgoldbad mit hoher Abscheidungsgeschwindigkeit
GB8501245D0 (en) * 1985-01-18 1985-02-20 Engelhard Corp Gold electroplating bath
JPS637390A (ja) * 1986-06-26 1988-01-13 Nippon Engeruharudo Kk 金−コバルト合金めつき液
DE50013952D1 (de) * 1999-06-17 2007-02-22 Degussa Galvanotechnik Gmbh Saures bad zur galvanischen abscheidung von glänzenden gold- und goldlegierungsschichten und glanzzusatz hierfür
FR2828889B1 (fr) * 2001-08-24 2004-05-07 Engelhard Clal Sas Bain electrolytique pour le depot electrochimique de l'or et de ses alliages
US7128822B2 (en) * 2003-06-04 2006-10-31 Shipley Company, L.L.C. Leveler compounds
JP4320606B2 (ja) * 2004-03-15 2009-08-26 上村工業株式会社 金めっき浴
SG127854A1 (en) * 2005-06-02 2006-12-29 Rohm & Haas Elect Mat Improved gold electrolytes
JP5559455B2 (ja) * 2007-06-29 2014-07-23 日本高純度化学株式会社 電解金めっき液及びそれを用いて得られた金皮膜
JP2009165730A (ja) 2008-01-18 2009-07-30 Kozo Motoki 洗浄用ブラシ
JP5216633B2 (ja) * 2008-03-19 2013-06-19 ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. バックグラウンドめっきを抑制する方法
CN101550571A (zh) * 2008-03-31 2009-10-07 恩伊凯慕凯特股份有限公司 用于部分电镀的含有金的电镀液
WO2009150915A1 (ja) * 2008-06-11 2009-12-17 日本高純度化学株式会社 電解金めっき液及びそれを用いて得られた金皮膜

Also Published As

Publication number Publication date
EP2511400A4 (de) 2013-07-24
JP2011122192A (ja) 2011-06-23
TW201137184A (en) 2011-11-01
CN102695819A (zh) 2012-09-26
KR20120120134A (ko) 2012-11-01
SG181529A1 (en) 2012-07-30
WO2011070933A1 (ja) 2011-06-16

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