ES2015776A6 - Metodo de fabricacion de dispositivos semiconductores. - Google Patents
Metodo de fabricacion de dispositivos semiconductores.Info
- Publication number
- ES2015776A6 ES2015776A6 ES8902881A ES8902881A ES2015776A6 ES 2015776 A6 ES2015776 A6 ES 2015776A6 ES 8902881 A ES8902881 A ES 8902881A ES 8902881 A ES8902881 A ES 8902881A ES 2015776 A6 ES2015776 A6 ES 2015776A6
- Authority
- ES
- Spain
- Prior art keywords
- entities
- substrate
- composition
- reaction
- substrate material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
- H10P14/42—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials using a gas or vapour
- H10P14/43—Chemical deposition, e.g. chemical vapour deposition [CVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
- H10P14/412—Deposition of metallic or metal-silicide materials
Landscapes
- Electrodes Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Abstract
METODO DE FABRICACION DE DISPOSITIVOS SEMICONDUCTORES. COMPRENDE LA ETAPA DE REACCIONAR AL MENOS DOS ENTIDADES REACTIVAS PARA FORMAR UN MATERIAL CONTENIENDO METAL SOBRE UNA REGION O REGIONES DE UN SUSTRATO PROCESADO O SIN PROCESAR. UN HECHO INHERENTE AL METODO ES EL RECONOCIMIENTO DE QUE UNA DE LAS ENTIDADES REACTIVAS REACCIONARA FRECUENTEMENTE CON EL MATERIAL DEL SUSTRATO PARA PRODUCIR RESULTADOS ALTAMENTE INDESEABLES, DESCONOCIDOS CON ANTERIORIDAD, POR EJEMPLO, LA EROSION CASI COMPLETA DE LOS COMPONENTES DE DISPOSITIVOS ANTERIORMENTE FABRICADOS. POR TANTO, SEGUN EL METODO DE LA INVENCION, SE EMPLEA CUALQUIERA DE DIVERSAS TECNICAS PARA REDUCIR LA VELOCIDAD DE REACCION ENTRE EL MATERIAL DEL SUSTRATO Y LA ENTIDAD QUE REACCIONA CON ESTE MATERIAL, AL TIEMPO QUE SE EVITA UNA REDUCCION SUSTANCIAL EN LA VELOCIDAD DE REACCION ENTRE LAS DOS ENTIDADES.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US25499988A | 1988-10-07 | 1988-10-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2015776A6 true ES2015776A6 (es) | 1990-09-01 |
Family
ID=22966407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES8902881A Expired - Lifetime ES2015776A6 (es) | 1988-10-07 | 1989-08-17 | Metodo de fabricacion de dispositivos semiconductores. |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0363065A3 (es) |
| JP (1) | JPH02170425A (es) |
| KR (1) | KR900007056A (es) |
| ES (1) | ES2015776A6 (es) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6057925A (ja) * | 1983-09-09 | 1985-04-03 | Matsushita Electronics Corp | シリコン上へのタングステン膜の形成方法 |
| US4629635A (en) * | 1984-03-16 | 1986-12-16 | Genus, Inc. | Process for depositing a low resistivity tungsten silicon composite film on a substrate |
| JPS6156412A (ja) * | 1984-08-28 | 1986-03-22 | Fujitsu Ltd | 半導体装置の製造方法 |
| JPS6250468A (ja) * | 1985-08-30 | 1987-03-05 | Hitachi Ltd | 薄膜のプラズマ気相成長方法 |
| US4766006A (en) * | 1986-05-15 | 1988-08-23 | Varian Associates, Inc. | Low pressure chemical vapor deposition of metal silicide |
| JP2592844B2 (ja) * | 1987-07-10 | 1997-03-19 | 株式会社東芝 | 高融点金属膜の形成方法 |
-
1989
- 1989-08-17 ES ES8902881A patent/ES2015776A6/es not_active Expired - Lifetime
- 1989-09-26 EP EP89309788A patent/EP0363065A3/en not_active Withdrawn
- 1989-10-05 KR KR1019890014309A patent/KR900007056A/ko not_active Withdrawn
- 1989-10-06 JP JP1260336A patent/JPH02170425A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| KR900007056A (ko) | 1990-05-09 |
| EP0363065A2 (en) | 1990-04-11 |
| JPH02170425A (ja) | 1990-07-02 |
| EP0363065A3 (en) | 1990-07-25 |
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