ES2006502A6 - Procedimiento para fabricar dispositivos y dospositivos fabricados por el mismo - Google Patents
Procedimiento para fabricar dispositivos y dospositivos fabricados por el mismoInfo
- Publication number
- ES2006502A6 ES2006502A6 ES8701744A ES8701744A ES2006502A6 ES 2006502 A6 ES2006502 A6 ES 2006502A6 ES 8701744 A ES8701744 A ES 8701744A ES 8701744 A ES8701744 A ES 8701744A ES 2006502 A6 ES2006502 A6 ES 2006502A6
- Authority
- ES
- Spain
- Prior art keywords
- procedure
- substrate
- devices
- entities
- same
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
- H10P14/42—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials using a gas or vapour
- H10P14/43—Chemical deposition, e.g. chemical vapour deposition [CVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
- H10P14/42—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials using a gas or vapour
Landscapes
- Electrodes Of Semiconductors (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
SE DESCRIBE UN PROCEDIMIENTO PARA FABRICAR UN DISPOSITIVO, V.GR., UN DISPOSITIVO SEMICONDUCTOR, QUE INCLUYE LA FASE DE HACER REACCIONAR POR LO MENOS DOS ENTIDADES REACTIVAS PARA FORMAR UN MATERIAL CON CONTENIDO METALICO SOBRE UNA REGION O REGIONES DE UN SUSTRATO ELABORADO O SIN ELABORAR. ES PROPIO DEL METODO EL RECONOCIMIENTO QUE UNA DE LAS ENTIDADES REACTIVAS REACCIONARA FRECUENTEMENTE CON MATERIAL DEL SUSTRATO PARA PRODUCIR RESULTADOS ANTERIORMENTE NO RECONOCIDOS Y MUY INCONVENIENTES, C.GR., LA EROSION CASI COMPLETA DE COMPONENTES DE DISPOSITIVOS FABRICADOS CON ANTERIORIDAD. POR LO TANTO, Y SEGUN EL PROCEDIMIENTO DE LA INVENCION, SE EMPLEA CUALQUIERA DE UNA VARIEDAD DE TECNICAS PARA REDUCIR EL REGIMEN DE REACCION ENTRE EL MATERIAL DEL SUSTRATO Y LA ENTIDAD QUE REACCIONA CON ESTE MATERIAL, EVITANDO AL MISMO TIEMPO UNA REDUCCION SUSTANCIAL EN EL REGIMEN DE REACCION ENTRE LAS DOS ENTIDADES.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US87447586A | 1986-06-16 | 1986-06-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2006502A6 true ES2006502A6 (es) | 1989-05-01 |
Family
ID=25363874
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES8701744A Expired ES2006502A6 (es) | 1986-06-16 | 1987-06-12 | Procedimiento para fabricar dispositivos y dospositivos fabricados por el mismo |
Country Status (6)
| Country | Link |
|---|---|
| EP (1) | EP0268654A1 (es) |
| JP (1) | JPH0680682B2 (es) |
| KR (1) | KR920010125B1 (es) |
| CA (1) | CA1286798C (es) |
| ES (1) | ES2006502A6 (es) |
| WO (1) | WO1987007763A1 (es) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5814545A (en) * | 1995-10-02 | 1998-09-29 | Motorola, Inc. | Semiconductor device having a phosphorus doped PECVD film and a method of manufacture |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6050920A (ja) * | 1983-08-30 | 1985-03-22 | Toshiba Corp | 半導体装置の製造方法 |
| EP0178200A1 (en) * | 1984-09-10 | 1986-04-16 | FAIRCHILD CAMERA & INSTRUMENT CORPORATION | Method of control for chemical vapor deposition |
| EP0194950B1 (en) * | 1985-03-15 | 1992-05-27 | Fairchild Semiconductor Corporation | High temperature interconnect system for an integrated circuit |
-
1987
- 1987-05-27 EP EP87903799A patent/EP0268654A1/en not_active Ceased
- 1987-05-27 JP JP62503471A patent/JPH0680682B2/ja not_active Expired - Lifetime
- 1987-05-27 WO PCT/US1987/001230 patent/WO1987007763A1/en not_active Ceased
- 1987-05-27 KR KR1019880700174A patent/KR920010125B1/ko not_active Expired
- 1987-06-10 CA CA000539354A patent/CA1286798C/en not_active Expired - Fee Related
- 1987-06-12 ES ES8701744A patent/ES2006502A6/es not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0680682B2 (ja) | 1994-10-12 |
| EP0268654A1 (en) | 1988-06-01 |
| CA1286798C (en) | 1991-07-23 |
| KR880701458A (ko) | 1988-07-27 |
| JPS63503581A (ja) | 1988-12-22 |
| KR920010125B1 (ko) | 1992-11-16 |
| WO1987007763A1 (en) | 1987-12-17 |
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