ES2666474T3 - Elemento óptico holográfico con varios patrones de interferencia - Google Patents

Elemento óptico holográfico con varios patrones de interferencia Download PDF

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Publication number
ES2666474T3
ES2666474T3 ES03026493.1T ES03026493T ES2666474T3 ES 2666474 T3 ES2666474 T3 ES 2666474T3 ES 03026493 T ES03026493 T ES 03026493T ES 2666474 T3 ES2666474 T3 ES 2666474T3
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ES
Spain
Prior art keywords
optical element
holographic optical
interference patterns
light source
laser light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES03026493.1T
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English (en)
Inventor
Urs Peter Studer
Beda Käser
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zumbach Electronic AG
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Zumbach Electronic AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zumbach Electronic AG filed Critical Zumbach Electronic AG
Application granted granted Critical
Publication of ES2666474T3 publication Critical patent/ES2666474T3/es
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/32—Holograms used as optical elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)

Abstract

Elemento óptico holográfico (10, 10', 40) para la medición de la extensión y la posición de un objeto (20) con la ayuda de un rayo de luz (14') desviado que pasa sobre un rango angular determinado, el cual presenta en una sección un patrón de interferencia (25, 26, 27, 43, 44, 45) que de manera conocida de por sí se obtiene mediante la exposición simultánea a un frente de onda de referencia (14) en forma de abanico, procedente de una fuente de luz láser (1) monocromática coherente, y a un frente de onda paralelo, igualmente procedente de dicha fuente de luz láser monocromática coherente, que incide sobre el elemento en otro ángulo que el frente de onda de referencia (14), así como mediante el revelado subsiguiente, caracterizado porque el elemento óptico holográfico (10, 10', 40) posee al menos dos patrones de interferencia (25, 26, 27, 43, 44, 45) diferentes, asignados respectivamente a una sección (11, 12, 13, 41) y porque durante la exposición se empleó un número de frentes de onda parciales (15, 16, 17) paralelos, correspondiente al número de patrones de interferencia, que proceden de la misma fuente de luz láser (1) y que discurren de tal forma que en la prolongación virtual pasando por el elemento óptico holográfico (10, 10', 40) se cruzan en el centro de un campo de medición (18) después del elemento óptico holográfico (10, 10', 40).

Description

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Claims (1)

  1. imagen1
ES03026493.1T 2002-12-09 2003-11-21 Elemento óptico holográfico con varios patrones de interferencia Expired - Lifetime ES2666474T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP02027560A EP1429111A1 (de) 2002-12-09 2002-12-09 Holographisches optisches Element mit mehreren Interferenzmustern
EP02027560 2002-12-09

Publications (1)

Publication Number Publication Date
ES2666474T3 true ES2666474T3 (es) 2018-05-04

Family

ID=32319568

Family Applications (1)

Application Number Title Priority Date Filing Date
ES03026493.1T Expired - Lifetime ES2666474T3 (es) 2002-12-09 2003-11-21 Elemento óptico holográfico con varios patrones de interferencia

Country Status (4)

Country Link
US (2) US20040109209A1 (es)
EP (1) EP1429111A1 (es)
ES (1) ES2666474T3 (es)
ZA (1) ZA200309527B (es)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004049879A1 (de) * 2004-10-13 2006-04-20 Hauni Maschinenbau Ag Vorrichtung und Verfahren zum Messen des Durchmessers eines stabförmigen Gegenstandes insbesondere der Tabak verarbeitenden Industrie
KR101344028B1 (ko) * 2011-10-19 2013-12-24 한국표준과학연구원 레이저 주사방식에서 간섭을 이용한 미세패턴 제조장치 및 그 제조장치를 이용한 미세패턴 제조방법
CN104034273A (zh) * 2014-06-23 2014-09-10 苏州经贸职业技术学院 基于物联网技术的铜包钢线径测量监控装置及方法
CN104215189A (zh) * 2014-08-28 2014-12-17 昆山勃盛电子有限公司 一种电缆外径在线spc检测和数据采集方法
US10437071B2 (en) * 2015-10-12 2019-10-08 North Inc. Adjustable pupil distance wearable display
US10409076B2 (en) * 2015-10-12 2019-09-10 North Inc. Adjustable pupil distance wearable display

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4245882A (en) * 1977-11-04 1981-01-20 Environmental Research Institute Of Michigan Doubly modulated on-axis thick hologram optical element
AU535350B2 (en) * 1979-05-07 1984-03-15 Sony Corporation Inline hologram lens
US4455061A (en) * 1980-07-31 1984-06-19 The Regents Of The University Of Minnesota Multi-faceted holographic optical element and methods of making and using same
US4547037A (en) * 1980-10-16 1985-10-15 Regents Of The University Of Minnesota Holographic method for producing desired wavefront transformations
US4432597A (en) * 1980-12-15 1984-02-21 International Business Machines Corporation Transmissive holographic optical element on aberrating substrate
EP0093781B1 (en) * 1981-11-13 1987-03-11 Sony Corporation Method of manufacturing in-line hologram lens
US5018803A (en) * 1985-02-04 1991-05-28 Robotic Vision Systems, Inc. Three-dimensional volumetric sensor
CH674774A5 (es) * 1986-04-03 1990-07-13 Zumbach Electronic Ag
US5124815A (en) * 1986-11-04 1992-06-23 Kaiser Optical Systems Method for forming holographic optical elements free of secondary fringes
US4878718A (en) * 1986-12-05 1989-11-07 The United States Of America As Represented By The Secretary Of The Navy Method for holographic correction of beams of coherent light
US4930847A (en) * 1987-07-09 1990-06-05 Environmental Research Institute Of Michigan Multicolor holographic element and apparatus for head-up display applications
US5009502A (en) * 1989-04-20 1991-04-23 Hughes Aircraft Company System of holographic optical elements for testing laser range finders
US4960311A (en) * 1989-08-31 1990-10-02 Hughes Aircraft Company Holographic exposure system for computer generated holograms
US5121371A (en) * 1990-06-18 1992-06-09 Bernoulli Optical Systems Company Optical servo system for magnetic disk
US5117296A (en) * 1990-07-17 1992-05-26 Hoebing John L Apparatus and synthetic holography
CH683370A5 (de) * 1992-04-10 1994-02-28 Zumbach Electronic Ag Verfahren und Vorrichtung zur Messung der Abmessung eines Objekts.
US5422746A (en) * 1992-09-11 1995-06-06 Board Of Trustees Of The Leland Stanford Jr. University Single and multiple element holographic devices for high-efficiency beam correction
WO1998021629A2 (en) * 1996-11-15 1998-05-22 Diffraction, Ltd. In-line holographic mask for micromachining
DE19647613C2 (de) * 1996-11-18 1998-11-12 Laser Applikationan Gmbh Verfahren und Vorrichtung zur Messung der Dicke von unrunden länglichen und in Richtung ihrer Längsachse vorgeschobenen Werkstücken mit beliebiger und sich ändernder Winkellage

Also Published As

Publication number Publication date
EP1429111A1 (de) 2004-06-16
ZA200309527B (en) 2005-04-20
US20080186502A1 (en) 2008-08-07
US20040109209A1 (en) 2004-06-10
US7675631B2 (en) 2010-03-09

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