FR1134065A - Microscope à rayons x - Google Patents

Microscope à rayons x

Info

Publication number
FR1134065A
FR1134065A FR1134065DA FR1134065A FR 1134065 A FR1134065 A FR 1134065A FR 1134065D A FR1134065D A FR 1134065DA FR 1134065 A FR1134065 A FR 1134065A
Authority
FR
France
Prior art keywords
ray microscope
microscope
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Compagnie Francaise Thomson Houston SA
Original Assignee
Compagnie Francaise Thomson Houston SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Francaise Thomson Houston SA filed Critical Compagnie Francaise Thomson Houston SA
Application granted granted Critical
Publication of FR1134065A publication Critical patent/FR1134065A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR1134065D 1954-07-14 1955-07-07 Microscope à rayons x Expired FR1134065A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US443384A US2877353A (en) 1954-07-14 1954-07-14 X-ray microscope

Publications (1)

Publication Number Publication Date
FR1134065A true FR1134065A (fr) 1957-04-05

Family

ID=23760580

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1134065D Expired FR1134065A (fr) 1954-07-14 1955-07-07 Microscope à rayons x

Country Status (3)

Country Link
US (1) US2877353A (fr)
FR (1) FR1134065A (fr)
GB (1) GB780682A (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3149258A (en) * 1954-09-09 1964-09-15 Sheldon Edward Emanuel Electron microscope with an X-ray target
NL108506C (fr) * 1958-09-13
BE634510A (fr) * 1962-07-05
US3182175A (en) * 1962-09-24 1965-05-04 Nat Res Corp Electron beam heating device
US3333098A (en) * 1963-07-31 1967-07-25 Hitachi Ltd Aperture device for electron microscopes and the like
US3395279A (en) * 1964-11-30 1968-07-30 Phillips Petroleum Co Positioning device for a radiation shield having means for cooling said shield
US3374349A (en) * 1966-11-14 1968-03-19 Victor G. Macres Electron probe having a specific shortfocal length magnetic lens and light microscope
US3743845A (en) * 1972-02-07 1973-07-03 N Rabodzei Closed-circuit tv inspection x-ray microscope
GB1597841A (en) * 1977-01-19 1981-09-09 Nicolet Xrd Corp Electron beam focussing
US4521902A (en) * 1983-07-05 1985-06-04 Ridge, Inc. Microfocus X-ray system
US4979203A (en) * 1989-06-19 1990-12-18 Princeton X-Ray Laser X-ray laser microscope apparatus
JP2775949B2 (ja) * 1990-01-10 1998-07-16 株式会社ニコン Ｘ線光学素子保持枠
US9291578B2 (en) 2012-08-03 2016-03-22 David L. Adler X-ray photoemission microscope for integrated devices
US9129715B2 (en) 2012-09-05 2015-09-08 SVXR, Inc. High speed x-ray inspection microscope
EP4726764A1 (fr) * 2024-10-14 2026-04-15 Excillum AB Atténuation de rayonnement secondaire dans des sources de rayons x à impact d'électrons

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL53538C (fr) * 1937-02-18
US2418029A (en) * 1943-10-08 1947-03-25 Rca Corp Electron probe analysis employing X-ray spectrography
US2440640A (en) * 1946-11-27 1948-04-27 Research Corp Electron microanalyzer
US2569872A (en) * 1949-12-24 1951-10-02 Machlett Lab Inc Electron discharge tube

Also Published As

Publication number Publication date
GB780682A (en) 1957-08-07
US2877353A (en) 1959-03-10

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