FR2397678A1 - Dispositif de test d'un systeme a microprocesseur - Google Patents

Dispositif de test d'un systeme a microprocesseur

Info

Publication number
FR2397678A1
FR2397678A1 FR7819807A FR7819807A FR2397678A1 FR 2397678 A1 FR2397678 A1 FR 2397678A1 FR 7819807 A FR7819807 A FR 7819807A FR 7819807 A FR7819807 A FR 7819807A FR 2397678 A1 FR2397678 A1 FR 2397678A1
Authority
FR
France
Prior art keywords
test
test device
microprocessor system
system test
microprocessor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7819807A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Trendar Corp
Original Assignee
Fluke Trendar Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fluke Trendar Corp filed Critical Fluke Trendar Corp
Publication of FR2397678A1 publication Critical patent/FR2397678A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

L'invention concerne le test de systèmes à microprocesseur. Le dispositif de test de l'invention comprend essentiellement un processeur de test 14, une interface 12, et un organe d'affichage 18, qui sont associés à une unité sous test 20, et éventuellement à une unité de référence 22. Ce dispositif a la possibilité de combiner en temps réel des séquences de test pseudo-aléatoires, et des séquences de test enregistrées préalablement. Application aux contrôles en fabrication de systèmes à microprocesseur.
FR7819807A 1977-07-15 1978-07-03 Dispositif de test d'un systeme a microprocesseur Withdrawn FR2397678A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/815,961 US4125763A (en) 1977-07-15 1977-07-15 Automatic tester for microprocessor board

Publications (1)

Publication Number Publication Date
FR2397678A1 true FR2397678A1 (fr) 1979-02-09

Family

ID=25219293

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7819807A Withdrawn FR2397678A1 (fr) 1977-07-15 1978-07-03 Dispositif de test d'un systeme a microprocesseur

Country Status (5)

Country Link
US (1) US4125763A (fr)
JP (1) JPS5421148A (fr)
DE (1) DE2812344A1 (fr)
FR (1) FR2397678A1 (fr)
GB (1) GB2001178B (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2422992A1 (fr) * 1978-04-13 1979-11-09 Ncr Co Appareil de test destine a tester des circuits numeriques

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DE2841073A1 (de) * 1978-09-21 1980-04-03 Ruhrtal Gmbh Schaltungsanordnung zur verarbeitung von elektrisch dargestellten informationen
US4236246A (en) * 1978-11-03 1980-11-25 Genrad, Inc. Method of and apparatus for testing electronic circuit assemblies and the like
US4222514A (en) * 1978-11-30 1980-09-16 Sperry Corporation Digital tester
JPS5853774B2 (ja) * 1978-12-29 1983-12-01 株式会社日立製作所 情報処理装置
US4271515A (en) * 1979-03-23 1981-06-02 John Fluke Mfg. Co., Inc. Universal analog and digital tester
JPS5618766A (en) * 1979-07-26 1981-02-21 Fujitsu Ltd Testing apparatus for logic circuit
JPS56500945A (fr) * 1979-07-27 1981-07-09
US4308615A (en) * 1979-09-17 1981-12-29 Honeywell Information Systems Inc. Microprocessor based maintenance system
US4380070A (en) * 1979-11-20 1983-04-12 Lockheed Corporation Automatic circuit identifier
US4339819A (en) * 1980-06-17 1982-07-13 Zehntel, Inc. Programmable sequence generator for in-circuit digital testing
US4500993A (en) * 1980-06-17 1985-02-19 Zehntel, Inc. In-circuit digital tester for testing microprocessor boards
CA1163721A (fr) * 1980-08-18 1984-03-13 Milan Slamka Appareil de verification dynamique en circuit de dispositifs electroniques numeriques
US4455654B1 (en) * 1981-06-05 1991-04-30 Test apparatus for electronic assemblies employing a microprocessor
US4397021A (en) * 1981-06-15 1983-08-02 Westinghouse Electric Corp. Multi-processor automatic test system
US4517661A (en) * 1981-07-16 1985-05-14 International Business Machines Corporation Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices
EP0088916B1 (fr) * 1982-03-15 1985-11-21 Siemens-Albis Aktiengesellschaft Circuit pour tester des dispositifs électriques, en particulier électroniques
JPS59500437A (ja) * 1982-03-30 1984-03-15 ロツキ−ド　コ−ポレ−シヨン 自動回路識別装置
US4565967A (en) * 1982-06-21 1986-01-21 Whirlpool Corporation Method and apparatus for testing microwave ovens
FR2531230A1 (fr) * 1982-07-27 1984-02-03 Rank Xerox Sa Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble
US4574354A (en) * 1982-11-19 1986-03-04 Tektronix, Inc. Method and apparatus for time-aligning data
US4551837A (en) * 1983-03-25 1985-11-05 International Telephone & Telegraph Corp. High speed operational recurring signature evaluator for digital equipment tester
JPS60105974A (ja) * 1983-11-14 1985-06-11 Nissan Motor Co Ltd 車両用制御装置の点検方法
EP0175995B1 (fr) * 1984-09-21 1990-01-03 Siemens Aktiengesellschaft Dispositif pour tester le fonctionnement des circuits intégrés
US4715034A (en) * 1985-03-04 1987-12-22 John Fluke Mfg. Co., Inc. Method of and system for fast functional testing of random access memories
US4706208A (en) * 1985-09-03 1987-11-10 American Telephone And Telegraph Company, At&T Bell Laboratories Technique for the operational life test of microprocessors
US4644265A (en) * 1985-09-03 1987-02-17 International Business Machines Corporation Noise reduction during testing of integrated circuit chips
JPH0750159B2 (ja) * 1985-10-11 1995-05-31 株式会社日立製作所 テストパタ−ン発生装置
DE3543699A1 (de) * 1985-12-11 1987-06-19 Rohde & Schwarz Verfahren zum pruefen der einzelnen bauelemente einer leiterplatte (in-circuit-test)
US4931723A (en) * 1985-12-18 1990-06-05 Schlumberger Technologies, Inc. Automatic test system having a "true tester-per-pin" architecture
US4713815A (en) * 1986-03-12 1987-12-15 International Business Machines Corp. Automatic fault location system for electronic devices
US4771428A (en) * 1986-04-10 1988-09-13 Cadic Inc. Circuit testing system
US4724378A (en) * 1986-07-22 1988-02-09 Tektronix, Inc. Calibrated automatic test system
US4853621A (en) * 1987-03-05 1989-08-01 Kouken Co., Ltd. Water resistance load system
US4855681A (en) * 1987-06-08 1989-08-08 International Business Machines Corporation Timing generator for generating a multiplicty of timing signals having selectable pulse positions
US4845712A (en) * 1987-11-30 1989-07-04 Tandem Computers Incorporated State machine checker
DE3821230A1 (de) * 1988-06-23 1989-12-28 Siemens Ag Testanordnung zur erzeugung von testmustern fuer den test von mikroprozessoren
US5047708A (en) * 1988-12-23 1991-09-10 Kondner Jr Robert L Apparatus for testing circuit boards
US5289116A (en) * 1990-05-31 1994-02-22 Hewlett Packard Company Apparatus and method for testing electronic devices
JPH0481675A (ja) * 1990-07-25 1992-03-16 Mitsubishi Electric Corp 半導体デバイステスト装置
US5243273A (en) * 1990-09-12 1993-09-07 Hewlett-Packard Company General purpose, reconfigurable system for processing serial bit streams
US5150048A (en) * 1990-09-12 1992-09-22 Hewlett-Packard Company General purpose, reconfigurable system for processing serial bit streams
US5410551A (en) * 1992-01-02 1995-04-25 Andahl Corporation Net verification method and apparatus
US5390325A (en) * 1992-12-23 1995-02-14 Taligent, Inc. Automated testing system
FR2745924B1 (fr) * 1996-03-07 1998-12-11 Bull Cp8 Circuit integre perfectionne et procede d'utilisation d'un tel circuit integre
US6240543B1 (en) * 1998-12-01 2001-05-29 Narpat Bhandari Integration of manufacturing test of multiple system on a chip without substantial simulation
DE50013051D1 (de) * 2000-04-14 2006-08-03 Tektronix Berlin Gmbh & Co Kg Verfahren und Vorrichtung zur Analyse von Daten
US7707319B2 (en) * 2000-09-18 2010-04-27 Rockwell Automation Technologies, Inc. Noninvasive testing of network interface error codes for safety network
US6842879B1 (en) 2000-11-21 2005-01-11 Unisys Corporation Methods and apparatus for facilitating the design of an adapter card of a computer system
JP2004524530A (ja) * 2001-03-13 2004-08-12 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 信頼性が改良された集積回路の試験装置
US20080046789A1 (en) * 2006-08-21 2008-02-21 Igor Arsovski Apparatus and method for testing memory devices and circuits in integrated circuits
CN112114245B (zh) * 2020-09-17 2022-12-13 深圳市拓普泰克技术股份有限公司 Pcba拼板测试方法、pcba测试装置及系统

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EXBK/75 *
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2422992A1 (fr) * 1978-04-13 1979-11-09 Ncr Co Appareil de test destine a tester des circuits numeriques

Also Published As

Publication number Publication date
GB2001178B (en) 1982-05-06
GB2001178A (en) 1979-01-24
JPS5421148A (en) 1979-02-17
DE2812344A1 (de) 1979-01-25
US4125763A (en) 1978-11-14

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Legal Events

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ST Notification of lapse