FR2665302B1 - Dispositif photodetecteur comportant des blocs de connexion. - Google Patents

Dispositif photodetecteur comportant des blocs de connexion.

Info

Publication number
FR2665302B1
FR2665302B1 FR9109662A FR9109662A FR2665302B1 FR 2665302 B1 FR2665302 B1 FR 2665302B1 FR 9109662 A FR9109662 A FR 9109662A FR 9109662 A FR9109662 A FR 9109662A FR 2665302 B1 FR2665302 B1 FR 2665302B1
Authority
FR
France
Prior art keywords
connection blocks
photodetector device
photodetector
blocks
connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9109662A
Other languages
English (en)
Other versions
FR2665302A1 (fr
Inventor
Yoshida Yasuaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of FR2665302A1 publication Critical patent/FR2665302A1/fr
Application granted granted Critical
Publication of FR2665302B1 publication Critical patent/FR2665302B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/809—Constructional details of image sensors of hybrid image sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/184—Infrared image sensors
    • H10F39/1843—Infrared image sensors of the hybrid type

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FR9109662A 1990-07-30 1991-07-30 Dispositif photodetecteur comportant des blocs de connexion. Expired - Fee Related FR2665302B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2201768A JPH0485961A (ja) 1990-07-30 1990-07-30 光検知装置

Publications (2)

Publication Number Publication Date
FR2665302A1 FR2665302A1 (fr) 1992-01-31
FR2665302B1 true FR2665302B1 (fr) 1994-01-28

Family

ID=16446622

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9109662A Expired - Fee Related FR2665302B1 (fr) 1990-07-30 1991-07-30 Dispositif photodetecteur comportant des blocs de connexion.

Country Status (3)

Country Link
JP (1) JPH0485961A (fr)
FR (1) FR2665302B1 (fr)
GB (1) GB2246662B (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2263980B (en) * 1992-02-07 1996-04-10 Marconi Gec Ltd Apparatus and method for testing bare dies
JPH06232234A (ja) * 1993-01-29 1994-08-19 Mitsubishi Electric Corp 光検知素子
US5596222A (en) * 1994-08-12 1997-01-21 The Charles Stark Draper Laboratory, Inc. Wafer of transducer chips
US5756395A (en) * 1995-08-18 1998-05-26 Lsi Logic Corporation Process for forming metal interconnect structures for use with integrated circuit devices to form integrated circuit structures
GB2340997A (en) * 1998-08-26 2000-03-01 Lsi Logic Corp Optoelectronic integrated circuit and method of testing
WO2003017372A1 (fr) * 2001-08-14 2003-02-27 Infineon Technologies Ag Systeme de photodiodes comprenant deux photodiodes
US20030049925A1 (en) 2001-09-10 2003-03-13 Layman Paul Arthur High-density inter-die interconnect structure
JP2007258199A (ja) * 2006-03-20 2007-10-04 Nec Electronics Corp 撮像素子
JPWO2008142968A1 (ja) * 2007-05-21 2010-08-05 株式会社島津製作所 撮像素子およびそれを備えた撮像装置
KR101004024B1 (ko) * 2009-12-29 2010-12-31 한국지질자원연구원 광센서를 이용한 비접촉식 낙석 감지 방법
WO2019160517A2 (fr) * 2018-02-15 2019-08-22 Aselsan Elektroni̇k Sanayi̇ Ve Ti̇caret Anoni̇m Şi̇rketi̇ Procédé d'amélioration du processus de liaison par puce retournée
US10727267B2 (en) * 2018-09-12 2020-07-28 Sensors Unlimited, Inc. Interconnect bump structures for photo detectors
JP7555697B2 (ja) * 2018-12-14 2024-09-25 キヤノン株式会社 光電変換装置、光電変換装置の製造方法、半導体装置の製造方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4709141A (en) * 1986-01-09 1987-11-24 Rockwell International Corporation Non-destructive testing of cooled detector arrays
WO1988000397A1 (fr) * 1986-06-26 1988-01-14 Santa Barbara Research Center Detecteur a bande de blocage d'impuretes a contact par l'arriere
US4943491A (en) * 1989-11-20 1990-07-24 Honeywell Inc. Structure for improving interconnect reliability of focal plane arrays

Also Published As

Publication number Publication date
JPH0485961A (ja) 1992-03-18
GB2246662B (en) 1994-08-24
FR2665302A1 (fr) 1992-01-31
GB2246662A (en) 1992-02-05
GB9026969D0 (en) 1991-01-30

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Legal Events

Date Code Title Description
D6 Patent endorsed licences of rights
ST Notification of lapse