FR2986356B1 - Dispositif de protection d'un circuit integre contre des attaques en face arriere - Google Patents

Dispositif de protection d'un circuit integre contre des attaques en face arriere

Info

Publication number
FR2986356B1
FR2986356B1 FR1250787A FR1250787A FR2986356B1 FR 2986356 B1 FR2986356 B1 FR 2986356B1 FR 1250787 A FR1250787 A FR 1250787A FR 1250787 A FR1250787 A FR 1250787A FR 2986356 B1 FR2986356 B1 FR 2986356B1
Authority
FR
France
Prior art keywords
protecting
integrated circuit
circuit against
against rear
side attacks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1250787A
Other languages
English (en)
Other versions
FR2986356A1 (fr
Inventor
Mathieu Lisart
Thierry Soude
Alexandre Sarafianos
Rosa Francesco La
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Rousset SAS
Original Assignee
STMicroelectronics Rousset SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Rousset SAS filed Critical STMicroelectronics Rousset SAS
Priority to FR1250787A priority Critical patent/FR2986356B1/fr
Priority to US13/750,790 priority patent/US8809858B2/en
Publication of FR2986356A1 publication Critical patent/FR2986356A1/fr
Application granted granted Critical
Publication of FR2986356B1 publication Critical patent/FR2986356B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00—Arrangements for protection of devices
    • H10W42/40—Arrangements for protection of devices protecting against tampering, e.g. unauthorised inspection or reverse engineering
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
    • G06F21/86—Secure or tamper-resistant housings
    • G06F21/87—Secure or tamper-resistant housings by means of encapsulation, e.g. for integrated circuits
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00—Arrangements for protection of devices
    • H10W42/40—Arrangements for protection of devices protecting against tampering, e.g. unauthorised inspection or reverse engineering
    • H10W42/405—Arrangements for protection of devices protecting against tampering, e.g. unauthorised inspection or reverse engineering using active circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Security & Cryptography (AREA)
  • Software Systems (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
FR1250787A 2012-01-27 2012-01-27 Dispositif de protection d'un circuit integre contre des attaques en face arriere Expired - Fee Related FR2986356B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1250787A FR2986356B1 (fr) 2012-01-27 2012-01-27 Dispositif de protection d'un circuit integre contre des attaques en face arriere
US13/750,790 US8809858B2 (en) 2012-01-27 2013-01-25 Device for protecting an integrated circuit against back side attacks

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1250787A FR2986356B1 (fr) 2012-01-27 2012-01-27 Dispositif de protection d'un circuit integre contre des attaques en face arriere

Publications (2)

Publication Number Publication Date
FR2986356A1 FR2986356A1 (fr) 2013-08-02
FR2986356B1 true FR2986356B1 (fr) 2014-02-28

Family

ID=46124461

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1250787A Expired - Fee Related FR2986356B1 (fr) 2012-01-27 2012-01-27 Dispositif de protection d'un circuit integre contre des attaques en face arriere

Country Status (2)

Country Link
US (1) US8809858B2 (fr)
FR (1) FR2986356B1 (fr)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2998419B1 (fr) * 2012-11-21 2015-01-16 St Microelectronics Rousset Protection d'un circuit integre contre des attaques
US9965652B2 (en) * 2014-08-06 2018-05-08 Maxim Integrated Products, Inc. Detecting and thwarting backside attacks on secured systems
FR3041814A1 (fr) * 2015-09-30 2017-03-31 Stmicroelectronics Rousset Circuit integre securise
FR3046293A1 (fr) 2015-12-29 2017-06-30 St Microelectronics Crolles 2 Sas Circuit integre et son procede de fabrication
FR3048103B1 (fr) 2016-02-22 2018-03-23 Stmicroelectronics (Rousset) Sas Procede de detection d'un amincissement du substrat semi-conducteur d'un circuit integre depuis sa face arriere et circuit integre correspondant
FR3050317A1 (fr) 2016-04-19 2017-10-20 Stmicroelectronics Rousset Puce electronique
CN106093744B (zh) * 2016-08-04 2019-03-05 中国科学院微电子研究所 一种热阻获取方法
US10250258B2 (en) * 2016-09-28 2019-04-02 Nxp B.V. Device and method for detecting semiconductor substrate thickness
FR3057087B1 (fr) 2016-09-30 2018-11-16 Stmicroelectronics (Rousset) Sas Puce electronique protegee
FR3057088A1 (fr) 2016-09-30 2018-04-06 Stmicroelectronics (Rousset) Sas Detecteur laser picosecondes
US9741671B1 (en) * 2016-11-10 2017-08-22 Nxp B.V. Semiconductor die with backside protection
CN110121858B (zh) * 2016-12-05 2023-03-03 密码研究公司 背侧安全屏蔽
FR3062952B1 (fr) 2017-02-13 2019-03-29 Stmicroelectronics (Crolles 2) Sas Condensateur de decouplage
US10204875B2 (en) * 2017-04-12 2019-02-12 The United States Of America, As Represented By The Secretary Of The Navy Systems and methods for inhibiting backend access to integrated circuits by integrating photon and electron sensing latch-up circuits
FR3074605B1 (fr) 2017-12-05 2020-01-17 Stmicroelectronics (Rousset) Sas Procede de detection d'un amincissement eventuel d'un substrat d'un circuit integre par sa face arriere, et dispositif associe
JP7290846B2 (ja) * 2017-12-15 2023-06-14 株式会社Scu 半導体装置
FR3077678B1 (fr) * 2018-02-07 2022-10-21 St Microelectronics Rousset Procede de detection d'une atteinte a l'integrite d'un substrat semi-conducteur d'un circuit integre depuis sa face arriere, et dispositif correspondant
FR3081240B1 (fr) * 2018-05-15 2021-08-06 St Microelectronics Rousset Puce electronique
FR3084520B1 (fr) 2018-07-25 2020-08-14 Stmicroelectronics Rousset Procede de protection d'un circuit integre, et dispositif correspondant
FR3084521B1 (fr) 2018-07-25 2020-08-14 Stmicroelectronics Rousset Procede de protection d'un module de circuit integre et dispositif correspondant
FR3084492A1 (fr) 2018-07-30 2020-01-31 Stmicroelectronics (Rousset) Sas Procede de detection d'une attaque par un faisceau de particules electriquement chargees sur un circuit integre, et circuit integre correspondant
FR3096175B1 (fr) 2019-05-13 2021-05-07 St Microelectronics Rousset Procédé de détection d’une atteinte éventuelle à l’intégrité d’un substrat semi-conducteur d’un circuit intégré depuis sa face arrière, et circuit intégré correspondant
FR3099259B1 (fr) 2019-07-24 2021-08-13 St Microelectronics Rousset Procédé de protection de données stockées dans une mémoire, et circuit intégré correspondant
US11171095B1 (en) 2020-04-22 2021-11-09 Globalfoundries U.S. Inc. Active attack prevention for secure integrated circuits using latchup sensitive diode circuit
US11121097B1 (en) 2020-05-22 2021-09-14 Globalfoundries U.S. Inc. Active x-ray attack prevention device
US11437329B2 (en) 2020-10-14 2022-09-06 Globalfoundries U.S. Inc. Anti-tamper x-ray blocking package
US11815717B2 (en) 2021-11-12 2023-11-14 Globalfoundries U.S. Inc. Photonic chip security structure
US12204144B2 (en) 2021-11-12 2025-01-21 Globalfoundries U.S. Inc. Bragg reflector for photonic chip security structure

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2828244B2 (ja) * 1995-09-26 1998-11-25 シャープ株式会社 受光素子
US6342401B1 (en) * 2001-01-29 2002-01-29 Hewlett-Packard Company Test structures for silicon etching
DE10140045B4 (de) * 2001-08-16 2006-05-04 Infineon Technologies Ag IC-Chip mit Schutzstruktur
DE10204875C1 (de) * 2002-02-06 2003-02-27 Infineon Technologies Ag IC-Chip mit Manipulationsschutz und Verfahren
US8143705B2 (en) * 2007-08-02 2012-03-27 Nxp B.V. Tamper-resistant semiconductor device and methods of manufacturing thereof
DE102007063229B4 (de) * 2007-12-31 2013-01-24 Advanced Micro Devices, Inc. Verfahren und Teststruktur zur Überwachung von Prozesseigenschaften für die Herstellung eingebetteter Halbleiterlegierungen in Drain/Source-Gebieten
US7847581B2 (en) * 2008-04-03 2010-12-07 Stmicroelectronics (Rousset) Sas Device for protecting an integrated circuit against a laser attack
FR2946775A1 (fr) * 2009-06-15 2010-12-17 St Microelectronics Rousset Dispositif de detection d'amincissement du substrat d'une puce de circuit integre
EP2369622B1 (fr) * 2010-03-24 2015-10-14 STMicroelectronics Rousset SAS Procédé et dispositif de contremesure contre une attaque par injection d'erreur dans un microcircuit électronique

Also Published As

Publication number Publication date
US8809858B2 (en) 2014-08-19
US20130193437A1 (en) 2013-08-01
FR2986356A1 (fr) 2013-08-02

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