FR3086797B1 - Circuit electronique comprenant des diodes - Google Patents
Circuit electronique comprenant des diodes Download PDFInfo
- Publication number
- FR3086797B1 FR3086797B1 FR1858874A FR1858874A FR3086797B1 FR 3086797 B1 FR3086797 B1 FR 3086797B1 FR 1858874 A FR1858874 A FR 1858874A FR 1858874 A FR1858874 A FR 1858874A FR 3086797 B1 FR3086797 B1 FR 3086797B1
- Authority
- FR
- France
- Prior art keywords
- electronic circuit
- circuit including
- including diodes
- electrode
- cavity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/201—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits
- H10D84/204—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits of combinations of diodes or capacitors or resistors
- H10D84/221—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits of combinations of diodes or capacitors or resistors of only diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/82—Heterojunctions
- H10D62/824—Heterojunctions comprising only Group III-V materials heterojunctions, e.g. GaN/AlGaN heterojunctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
- H10D62/8503—Nitride Group III-V materials, e.g. AlN or GaN
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/01—Manufacture or treatment
- H10D8/043—Manufacture or treatment of planar diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/01—Manufacture or treatment
- H10D8/051—Manufacture or treatment of Schottky diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/05—Manufacture or treatment characterised by using material-based technologies using Group III-V technology
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/201—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits
- H10D84/204—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits of combinations of diodes or capacitors or resistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/113—Isolations within a component, i.e. internal isolations
- H10D62/115—Dielectric isolations, e.g. air gaps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/411—PN diodes having planar bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/60—Schottky-barrier diodes
Landscapes
- Electrodes Of Semiconductors (AREA)
- Bipolar Integrated Circuits (AREA)
Abstract
La présente description concerne un Dispositif électronique (100) comprenant un empilement d'une diode Schottky (123) et d'une diode bipolaire (108), connectées en parallèle par une première électrode (126) située dans une première cavité (116) et une deuxième électrode (128) située dans une deuxième cavité (118).
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1858874A FR3086797B1 (fr) | 2018-09-27 | 2018-09-27 | Circuit electronique comprenant des diodes |
| US16/583,090 US11830873B2 (en) | 2018-09-27 | 2019-09-25 | Electronic circuit comprising diodes |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1858874A FR3086797B1 (fr) | 2018-09-27 | 2018-09-27 | Circuit electronique comprenant des diodes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR3086797A1 FR3086797A1 (fr) | 2020-04-03 |
| FR3086797B1 true FR3086797B1 (fr) | 2021-10-22 |
Family
ID=65494307
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR1858874A Active FR3086797B1 (fr) | 2018-09-27 | 2018-09-27 | Circuit electronique comprenant des diodes |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US11830873B2 (fr) |
| FR (1) | FR3086797B1 (fr) |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5181087A (en) * | 1986-02-28 | 1993-01-19 | Hitachi, Ltd. | Semiconductor device and method of producing the same |
| US6649477B2 (en) * | 2001-10-04 | 2003-11-18 | General Semiconductor, Inc. | Method for fabricating a power semiconductor device having a voltage sustaining layer with a terraced trench facilitating formation of floating islands |
| JP4487481B2 (ja) * | 2002-01-16 | 2010-06-23 | 富士電機システムズ株式会社 | 半導体装置およびその製造方法 |
| JP3494638B2 (ja) * | 2002-05-21 | 2004-02-09 | 沖電気工業株式会社 | 半導体装置及び半導体装置の製造方法 |
| JP4743631B2 (ja) * | 2006-10-23 | 2011-08-10 | 三洋電機株式会社 | 半導体装置及びその製造方法 |
| JP2009164158A (ja) * | 2007-12-28 | 2009-07-23 | Panasonic Corp | 半導体装置及びその製造方法 |
| US8492773B2 (en) * | 2010-04-23 | 2013-07-23 | Intersil Americas Inc. | Power devices with integrated protection devices: structures and methods |
| JP5460504B2 (ja) * | 2010-07-20 | 2014-04-02 | 次世代パワーデバイス技術研究組合 | 半導体装置 |
| JP2013013224A (ja) * | 2011-06-29 | 2013-01-17 | Sumitomo Electric Ind Ltd | 双方向スイッチ |
| US9281388B2 (en) * | 2011-07-15 | 2016-03-08 | Infineon Technologies Americas Corp. | Composite semiconductor device with a SOI substrate having an integrated diode |
| TWI521719B (zh) * | 2012-06-27 | 2016-02-11 | 財團法人工業技術研究院 | 雙凹溝槽式蕭基能障元件 |
| JP2015198175A (ja) * | 2014-04-01 | 2015-11-09 | 古河電気工業株式会社 | 窒化物半導体装置 |
| US9741711B2 (en) * | 2014-10-28 | 2017-08-22 | Semiconductor Components Industries, Llc | Cascode semiconductor device structure and method therefor |
| FR3043839B1 (fr) * | 2015-11-17 | 2018-04-06 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Diode a heterojonction ayant un courant de surcharge transitoire accru |
| FR3077160B1 (fr) * | 2018-01-19 | 2022-01-21 | Commissariat Energie Atomique | Dispositif optoelectronique comportant une grille et une cathode couplees l'une a l'autre |
-
2018
- 2018-09-27 FR FR1858874A patent/FR3086797B1/fr active Active
-
2019
- 2019-09-25 US US16/583,090 patent/US11830873B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US11830873B2 (en) | 2023-11-28 |
| FR3086797A1 (fr) | 2020-04-03 |
| US20200105749A1 (en) | 2020-04-02 |
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Year of fee payment: 2 |
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| PLSC | Publication of the preliminary search report |
Effective date: 20200403 |
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