FR3131630B1 - System on chip including a PVT sensor and corresponding PVT sensing method - Google Patents

System on chip including a PVT sensor and corresponding PVT sensing method Download PDF

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Publication number
FR3131630B1
FR3131630B1 FR2200018A FR2200018A FR3131630B1 FR 3131630 B1 FR3131630 B1 FR 3131630B1 FR 2200018 A FR2200018 A FR 2200018A FR 2200018 A FR2200018 A FR 2200018A FR 3131630 B1 FR3131630 B1 FR 3131630B1
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France
Prior art keywords
pvt
sensor
digital signal
patterned
sensing method
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FR2200018A
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English (en)
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FR3131630A1 (fr
Inventor
Riccardo Condorelli
Antonino Mondello
Michele Alessandro Carrano
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STMicroelectronics SRL
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STMicroelectronics SRL
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Priority to FR2200018A priority Critical patent/FR3131630B1/fr
Priority to US18/089,764 priority patent/US12411169B2/en
Priority to CN202211733839.7A priority patent/CN116430196B/zh
Publication of FR3131630A1 publication Critical patent/FR3131630A1/fr
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Publication of FR3131630B1 publication Critical patent/FR3131630B1/fr
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
    • G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
    • G06F21/75—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by inhibiting the analysis of circuitry or operation
    • G06F21/755—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by inhibiting the analysis of circuitry or operation with measures against power attack
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3173—Marginal testing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/3058—Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/3065—Monitoring arrangements determined by the means or processing involved in reporting the monitored data
    • G06F11/3072—Monitoring arrangements determined by the means or processing involved in reporting the monitored data where the reporting involves data filtering, e.g. pattern matching, time or event triggered, adaptive or policy-based reporting
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
    • G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Environmental & Geological Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Software Systems (AREA)
  • Computer Security & Cryptography (AREA)
  • Health & Medical Sciences (AREA)
  • Mathematical Physics (AREA)
  • Toxicology (AREA)
  • Quality & Reliability (AREA)
  • Computing Systems (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

Le système sur puce comprend un capteur de procédé-tension-température (SNS), ou capteur « PVT », comprenant un circuit de filtre (FLT) configuré pour engager un signal numérique à motif (PDS) et pour propager le signal numérique à motif d’une manière réagissant aux variations d’un matériau semi-conducteur (Smc), d’une tension d’alimentation de fonctionnement (Vdd) et d’une température de fonctionnement (Tmp) du système sur puce (SOC). Un circuit de comparaison numérique (CMP) est configuré pour comparer le signal numérique à motif engagé (PDSi) au signal numérique à motif propagé (PDSo), et pour générer un signal d’alerte (SV, HV) en cas de divergence entre les signaux numériques à motif comparés. Référence : Figure 1
FR2200018A 2022-01-03 2022-01-03 System on chip including a PVT sensor and corresponding PVT sensing method Active FR3131630B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR2200018A FR3131630B1 (fr) 2022-01-03 2022-01-03 System on chip including a PVT sensor and corresponding PVT sensing method
US18/089,764 US12411169B2 (en) 2022-01-03 2022-12-28 System on chip including a PVT sensor and corresponding PVT sensing method
CN202211733839.7A CN116430196B (zh) 2022-01-03 2022-12-30 包括pvt传感器的片上系统和对应pvt感测方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2200018A FR3131630B1 (fr) 2022-01-03 2022-01-03 System on chip including a PVT sensor and corresponding PVT sensing method
FR2200018 2022-01-03

Publications (2)

Publication Number Publication Date
FR3131630A1 FR3131630A1 (fr) 2023-07-07
FR3131630B1 true FR3131630B1 (fr) 2024-01-19

Family

ID=82100792

Family Applications (1)

Application Number Title Priority Date Filing Date
FR2200018A Active FR3131630B1 (fr) 2022-01-03 2022-01-03 System on chip including a PVT sensor and corresponding PVT sensing method

Country Status (3)

Country Link
US (1) US12411169B2 (fr)
CN (1) CN116430196B (fr)
FR (1) FR3131630B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3131630B1 (fr) * 2022-01-03 2024-01-19 St Microelectronics Srl System on chip including a PVT sensor and corresponding PVT sensing method

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5774403A (en) * 1997-06-12 1998-06-30 Hewlett-Packard PVT self aligning internal delay line and method of operation
KR100855980B1 (ko) 2007-02-16 2008-09-02 삼성전자주식회사 쉬프터와 가산기를 이용하여 지연 시간을 조절하는 지연고정 루프 및 클럭 지연 방법
CN102347762B (zh) 2010-07-30 2013-09-11 三星半导体(中国)研究开发有限公司 锁相环电路的锁定检测电路
US20130311792A1 (en) 2012-05-18 2013-11-21 Prahallada PONNATHOTA Voltage scaling architecture on system-on-chip platform
EP2701308A2 (fr) * 2012-08-21 2014-02-26 Nxp B.V. Circuit et procédé de filtrage de signaux transitoires
US9401799B2 (en) * 2014-08-04 2016-07-26 Stmicroelectronics S.R.L. Synchronization method, and corresponding device and integrated circuit
US10107855B1 (en) * 2014-11-07 2018-10-23 Xilinx, Inc. Electromagnetic verification of integrated circuits
US9520877B2 (en) * 2014-12-16 2016-12-13 Intel Corporation Apparatus and method for detecting or repairing minimum delay errors
US10310580B2 (en) * 2015-10-09 2019-06-04 Sandisk Technologies Llc Voltage level detection and analog circuit arrangements for memory systems
CN107231325B (zh) * 2016-03-25 2021-03-30 快捷半导体(苏州)有限公司 信号接收电路及方法、信号检测电路
US10243578B2 (en) 2017-02-23 2019-03-26 Qualcomm Incorporated Continuous-time delta-sigma ADC with scalable sampling rates and excess loop delay compensation
US10937509B1 (en) * 2019-08-28 2021-03-02 Mentor Graphics Corporation Voltage and temperature adaptive memory leakage reduction bias circuit
EP3855625B1 (fr) * 2020-01-27 2025-07-30 Stichting IMEC Nederland Boucle à verrouillage de phase entièrement numérique et son procédé de fonctionnement
FR3131630B1 (fr) * 2022-01-03 2024-01-19 St Microelectronics Srl System on chip including a PVT sensor and corresponding PVT sensing method
US11804825B1 (en) * 2022-05-31 2023-10-31 Keysight Technologies, Inc. System and method of compensating for voltage and temperature variations in communication link

Also Published As

Publication number Publication date
US20230213578A1 (en) 2023-07-06
CN116430196B (zh) 2026-02-24
FR3131630A1 (fr) 2023-07-07
CN116430196A (zh) 2023-07-14
US12411169B2 (en) 2025-09-09

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