ID29561A - Perangkat deteksi cacat gambar dan metode deteksi cacat gambar - Google Patents
Perangkat deteksi cacat gambar dan metode deteksi cacat gambarInfo
- Publication number
- ID29561A ID29561A IDP20010019D ID20010019D ID29561A ID 29561 A ID29561 A ID 29561A ID P20010019 D IDP20010019 D ID P20010019D ID 20010019 D ID20010019 D ID 20010019D ID 29561 A ID29561 A ID 29561A
- Authority
- ID
- Indonesia
- Prior art keywords
- image
- disabled detection
- disabled
- detection methods
- detection devices
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000004092 | 2000-01-12 | ||
| JP2000107015A JP3583684B2 (ja) | 2000-01-12 | 2000-04-07 | 画像欠陥検出装置および画像欠陥検出方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ID29561A true ID29561A (id) | 2001-09-06 |
Family
ID=26583418
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IDP20010019D ID29561A (id) | 2000-01-12 | 2001-01-11 | Perangkat deteksi cacat gambar dan metode deteksi cacat gambar |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6683974B1 (id) |
| JP (1) | JP3583684B2 (id) |
| KR (1) | KR100396449B1 (id) |
| ID (1) | ID29561A (id) |
| MY (1) | MY127399A (id) |
| TW (1) | TW516308B (id) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW509796B (en) * | 2001-05-03 | 2002-11-11 | Ind Tech Res Inst | Detection method and system for multi-stage display module of LED |
| KR20030052216A (ko) * | 2001-12-20 | 2003-06-26 | (주)한비젼 | 산업용 머신 비전 시스템을 위한 방사학적, 기하학적 보정및 병렬 처리 구현를 위한 시스템 |
| KR100505365B1 (ko) * | 2003-07-03 | 2005-08-03 | 주식회사 한택 | 픽셀보간을 이용한 디스플레이 패널 검사 장치 및 방법 |
| WO2005026919A2 (en) * | 2003-09-11 | 2005-03-24 | Bradford Addison Clough | Acquisition and analysis of time location-specific image data |
| ITRM20050381A1 (it) * | 2005-07-18 | 2007-01-19 | Consiglio Nazionale Ricerche | Metodo e sistema automatico di ispezione visuale di una infrastruttura. |
| US8606013B2 (en) * | 2006-08-31 | 2013-12-10 | Glory Ltd. | Paper sheet identification device and paper sheet identification method |
| US8391585B2 (en) | 2006-12-28 | 2013-03-05 | Sharp Kabushiki Kaisha | Defect detecting device, defect detecting method, image sensor device, image sensor module, defect detecting program, and computer-readable recording medium |
| KR101296655B1 (ko) | 2007-11-01 | 2013-08-14 | 엘지디스플레이 주식회사 | 영상 표시 장치의 데이터 보상 회로 및 방법 |
| US20090268950A1 (en) * | 2008-04-29 | 2009-10-29 | Kuo Shun-Kun | Product-Quality Inspection System and Method thereof |
| JP5799516B2 (ja) * | 2011-02-03 | 2015-10-28 | セイコーエプソン株式会社 | ロボット装置、検査装置、検査プログラム、および検査方法 |
| KR101292048B1 (ko) * | 2011-11-24 | 2013-08-09 | 대한민국(국가기록원) | 디지털 영상의 스크래치 탐지방법 |
| TWI502549B (zh) * | 2012-02-20 | 2015-10-01 | Univ Nat Kaohsiung Applied Sci | 元件影像檢測方法及其系統 |
| JP6152034B2 (ja) * | 2013-03-22 | 2017-06-21 | 株式会社Screenホールディングス | ラベリング方法、ラベリング装置および欠陥検査装置 |
| JP6486050B2 (ja) * | 2014-09-29 | 2019-03-20 | 株式会社Screenホールディングス | 検査装置および検査方法 |
| KR101659989B1 (ko) | 2014-12-10 | 2016-09-27 | 부산대학교 산학협력단 | 다차원 특징을 이용한 이상신호 분석장치 및 방법 |
| JP7185388B2 (ja) * | 2016-11-21 | 2022-12-07 | 日東電工株式会社 | 検査装置及び検査方法 |
| US10740901B2 (en) | 2018-12-17 | 2020-08-11 | Nvidia Corporation | Encoder regularization of a segmentation model |
| CN109741324B (zh) * | 2019-01-10 | 2020-12-04 | 惠科股份有限公司 | 一种检测方法、检测装置及终端设备 |
| US11200656B2 (en) * | 2019-01-11 | 2021-12-14 | Universal City Studios Llc | Drop detection systems and methods |
| CN115082444B (zh) * | 2022-07-25 | 2022-11-11 | 南通宏大实验仪器有限公司 | 一种基于图像处理的铜管焊缝缺陷检测方法及系统 |
| WO2024053108A1 (ja) * | 2022-09-09 | 2024-03-14 | 日本電信電話株式会社 | 画像処理装置、画像処理方法およびプログラム |
| CN115290663B (zh) * | 2022-09-30 | 2022-12-30 | 南通艾美瑞智能制造有限公司 | 基于光学检测的Mini LED晶圆外观缺陷检测方法 |
| CN115436384A (zh) * | 2022-11-07 | 2022-12-06 | 国网山东省电力公司荣成市供电公司 | 一种基于无人机图像的配电箱表面缺陷检测系统及方法 |
| WO2025054718A1 (en) * | 2023-09-15 | 2025-03-20 | Husky Injection Molding System Ltd. | Inspection system for molded articles and a method for inspecting molded articles |
| WO2025095074A1 (ja) * | 2023-10-31 | 2025-05-08 | ダイキン工業株式会社 | 評価方法及び評価装置 |
| CN117152158B (zh) * | 2023-11-01 | 2024-02-13 | 海门市缔绣家用纺织品有限公司 | 基于人工智能的纺织品疵点检测方法及系统 |
| CN118365644B (zh) * | 2024-06-19 | 2024-09-10 | 西安联瑞科技实业有限责任公司 | 一种基于图像处理的钢板喷砂不均检测方法 |
| CN121213561A (zh) * | 2025-11-27 | 2025-12-26 | 广州弘高科技股份有限公司 | 基于机器学习的电路板性能及缺陷自动检测系统及方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02234191A (ja) * | 1989-03-07 | 1990-09-17 | Nec Corp | 液晶パネル検査装置 |
| KR100189178B1 (ko) * | 1995-05-19 | 1999-06-01 | 오우라 히로시 | 패널 화질 검사 장치 및 화질 보정 방법 |
| JPH099303A (ja) | 1995-06-16 | 1997-01-10 | S I I R D Center:Kk | 画質検査装置 |
| JPH09329527A (ja) * | 1996-04-08 | 1997-12-22 | Advantest Corp | 画像処理方法および画像処理装置 |
-
2000
- 2000-04-07 JP JP2000107015A patent/JP3583684B2/ja not_active Expired - Fee Related
- 2000-11-16 US US09/712,942 patent/US6683974B1/en not_active Expired - Fee Related
- 2000-12-06 MY MYPI20005737A patent/MY127399A/en unknown
-
2001
- 2001-01-02 TW TW090100042A patent/TW516308B/zh not_active IP Right Cessation
- 2001-01-11 ID IDP20010019D patent/ID29561A/id unknown
- 2001-01-12 KR KR10-2001-0001907A patent/KR100396449B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2001264257A (ja) | 2001-09-26 |
| MY127399A (en) | 2006-11-30 |
| TW516308B (en) | 2003-01-01 |
| KR20010070527A (ko) | 2001-07-25 |
| JP3583684B2 (ja) | 2004-11-04 |
| KR100396449B1 (ko) | 2003-09-03 |
| US6683974B1 (en) | 2004-01-27 |
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