IN2014CN03302A - - Google Patents

Info

Publication number
IN2014CN03302A
IN2014CN03302A IN3302CHN2014A IN2014CN03302A IN 2014CN03302 A IN2014CN03302 A IN 2014CN03302A IN 3302CHN2014 A IN3302CHN2014 A IN 3302CHN2014A IN 2014CN03302 A IN2014CN03302 A IN 2014CN03302A
Authority
IN
India
Prior art keywords
image
bulge
tire
inspected
dent
Prior art date
Application number
Other languages
English (en)
Inventor
Eiji Takahashi
Toshiyuki Tsuji
Masato Kannaka
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Publication of IN2014CN03302A publication Critical patent/IN2014CN03302A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00—Testing of vehicles
    • G01M17/007—Wheeled or endless-tracked vehicles
    • G01M17/02—Tyres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00—Testing of vehicles
    • G01M17/007—Wheeled or endless-tracked vehicles
    • G01M17/02—Tyres
    • G01M17/027—Tyres using light, e.g. infrared, ultraviolet or holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60C—VEHICLE TYRES; TYRE INFLATION; TYRE CHANGING; CONNECTING VALVES TO INFLATABLE ELASTIC BODIES IN GENERAL; DEVICES OR ARRANGEMENTS RELATED TO TYRES
    • B60C13/00—Tyre sidewalls; Protecting, decorating, marking, or the like, thereof
    • B60C13/003—Tyre sidewalls; Protecting, decorating, marking, or the like, thereof characterised by sidewall curvature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Quality & Reliability (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Tires In General (AREA)
  • Image Processing (AREA)
IN3302CHN2014 2011-11-07 2012-10-02 IN2014CN03302A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011243270A JP5726045B2 (ja) 2011-11-07 2011-11-07 タイヤ形状検査方法、及びタイヤ形状検査装置
PCT/JP2012/075484 WO2013069389A1 (fr) 2011-11-07 2012-10-02 Procédé d'inspection de forme de pneu et dispositif d'inspection de forme de pneu

Publications (1)

Publication Number Publication Date
IN2014CN03302A true IN2014CN03302A (fr) 2015-07-03

Family

ID=48289774

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3302CHN2014 IN2014CN03302A (fr) 2011-11-07 2012-10-02

Country Status (8)

Country Link
US (1) US9109974B2 (fr)
EP (1) EP2789970B1 (fr)
JP (1) JP5726045B2 (fr)
CN (1) CN104024792B (fr)
IN (1) IN2014CN03302A (fr)
PT (1) PT2789970T (fr)
TW (1) TWI475186B (fr)
WO (1) WO2013069389A1 (fr)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9361641B2 (en) * 2012-11-21 2016-06-07 Maciej Wisniewski System and method for tire inventory and promotion
US9110032B2 (en) * 2013-03-14 2015-08-18 Integro Technologies Corp. System and methods for inspecting tire wheel assemblies
JP5923054B2 (ja) * 2013-04-08 2016-05-24 株式会社神戸製鋼所 形状検査装置
JP6267481B2 (ja) * 2013-10-18 2018-01-24 リコーエレメックス株式会社 外観検査装置および外観検査方法
JP5775132B2 (ja) 2013-11-01 2015-09-09 株式会社ブリヂストン タイヤの検査装置
WO2015097635A1 (fr) * 2013-12-23 2015-07-02 Pirelli Tyre S.P.A. Procédé et appareil pour détecter les défauts sur les pneus dans un processus de production de pneus
JP5831592B2 (ja) * 2014-05-09 2015-12-09 横浜ゴム株式会社 タイヤのトリミング装置および方法
JP6159294B2 (ja) * 2014-06-02 2017-07-05 住友ゴム工業株式会社 タイヤのトレッド形状測定方法、及びそれに用いるトレッド形状測定装置
FR3022380A1 (fr) * 2014-06-13 2015-12-18 Michelin & Cie Procede de redressement d'image de pneumatiques
JP6289283B2 (ja) * 2014-06-20 2018-03-07 株式会社ブリヂストン 円環状回転体の表面形状データの補正方法、及び、円環状回転体の外観検査装置
JP6413630B2 (ja) * 2014-10-28 2018-10-31 株式会社ジェイテクト 赤外線応力測定方法および赤外線応力測定装置
KR102534392B1 (ko) 2014-12-22 2023-05-19 피렐리 타이어 소시에떼 퍼 아찌오니 생산라인에서 타이어를 제어하기 위한 기기
RU2640673C1 (ru) * 2014-12-22 2018-01-11 Пирелли Тайр С.П.А. Способ и устройство для детектирования дефектов на шинах в процессе производства шин
EP3237837B1 (fr) * 2014-12-22 2020-02-19 Pirelli Tyre S.p.A. Procédé et appareil pour contrôler des pneus dans une chaîne de production
JP6591762B2 (ja) * 2015-02-27 2019-10-16 三菱重工業株式会社 摩耗検査装置、摩耗検査方法及びプログラム
CN108337900B (zh) * 2015-06-30 2020-04-07 倍耐力轮胎股份公司 用于检测轮胎的表面上的缺陷的方法和设备
US10365084B2 (en) * 2016-02-12 2019-07-30 Bartell Machinery Systems, L.L.C. Bead measurement system
CN107121058B (zh) * 2016-02-25 2020-09-15 株式会社三丰 测量方法
JP6758765B2 (ja) * 2016-02-25 2020-09-23 株式会社ミツトヨ 測定方法および測定プログラム
CN107121084B (zh) 2016-02-25 2023-12-29 株式会社三丰 测量方法和测量程序
KR101802812B1 (ko) 2016-04-20 2017-11-29 주식회사 고영테크놀러지 물품의 외관 검사장치 및 이를 이용한 물품의 외관 검사방법
CN109344832B (zh) * 2018-09-03 2021-02-02 北京市商汤科技开发有限公司 图像处理方法及装置、电子设备和存储介质
CN109325930B (zh) * 2018-09-12 2021-09-28 苏州优纳科技有限公司 边界缺陷的检测方法、装置及检测设备
JP7018380B2 (ja) * 2018-11-30 2022-02-10 株式会社神戸製鋼所 タイヤ表面の画像表示方法およびその画像表示に用いる画像処理装置
JP6753553B1 (ja) * 2018-11-30 2020-09-09 Ｊｆｅスチール株式会社 表面欠陥検出方法、表面欠陥検出装置、鋼材の製造方法、鋼材の品質管理方法、鋼材の製造設備、表面欠陥判定モデルの生成方法、及び表面欠陥判定モデル
US11935222B2 (en) * 2018-12-13 2024-03-19 Uveye Ltd. Method of automatic tire inspection and system thereof
JP7220128B2 (ja) * 2019-06-21 2023-02-09 東洋ガラス株式会社 ガラスびんの検査方法及びガラスびんの製造方法
CN110766684B (zh) * 2019-10-30 2022-03-18 江南大学 一种基于机器视觉的定子表面缺陷检测系统及检测方法
CN113516608B (zh) * 2020-03-26 2024-03-26 合肥美亚光电技术股份有限公司 轮胎的缺陷检测方法和检测装置、轮胎检测设备
CN113554582B (zh) * 2020-04-22 2022-11-08 中国科学院长春光学精密机械与物理研究所 电子设备盖板上功能孔的缺陷检测方法、装置以及系统
CN112581463B (zh) * 2020-12-25 2024-02-27 北京百度网讯科技有限公司 图像缺陷的检测方法、装置、电子设备、存储介质及产品
JP7607503B2 (ja) * 2021-04-19 2024-12-27 三井化学株式会社 強化繊維束の解析方法および解析装置
CN115439476B (zh) * 2022-11-07 2023-03-14 成都博视广达科技有限责任公司 基于图像分析的丝印缺陷检测方法及装置
CN117249778B (zh) * 2023-11-20 2024-01-26 雷励(常州)智能科技有限公司 一种成型机用高容错率胎胚检测装置
CN118010739B (zh) * 2024-04-09 2024-07-09 钛玛科（北京）工业科技有限公司 基于棉线距离的漏金属检测方法、装置及设备
CN119086560B (zh) * 2024-08-20 2025-08-12 深圳市秋叶原实业有限公司 Hdmi高清线生产缺陷检测方法、装置、计算机设备及介质
CN119533335B (zh) * 2025-01-23 2025-04-18 成都煜恒科技有限公司 一种基于三维建模的轮盖检测方法及系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4910411A (en) * 1988-02-12 1990-03-20 Sumitumo Rubber Industries Apparatus for inspecting a side wall of a tire
US6381547B1 (en) * 2000-06-12 2002-04-30 Foster-Miller, Inc. Tire defect detection system and method
US6831996B1 (en) * 2001-09-24 2004-12-14 Oberg Industries Method for inspecting an automotive wheel and associated apparatus
JP4034168B2 (ja) * 2002-11-01 2008-01-16 株式会社ブリヂストン タイヤサイド部凹凸状態の検査方法及びその装置
JP4679073B2 (ja) 2004-05-18 2011-04-27 株式会社ブリヂストン タイヤ凹凸図形の検査方法、および、タイヤ凹凸図形検査装置
US7269997B2 (en) * 2004-06-03 2007-09-18 Snap-On Incorporated Non-contact method and system for tire analysis
JP5046688B2 (ja) 2007-03-08 2012-10-10 株式会社神戸製鋼所 タイヤ形状検出装置，タイヤ形状検出方法
PL2020594T3 (pl) * 2007-07-30 2014-08-29 Snap On Equip Srl Unico Socio Sposób i urządzenie do określania wymiarów geometrycznych koła pojazdu
EP2295930B1 (fr) * 2008-06-04 2014-01-01 Kabushiki Kaisha Kobe Seiko Sho Procédé et dispositif de contrôle de forme de pneus
JP5302701B2 (ja) * 2009-02-06 2013-10-02 株式会社神戸製鋼所 タイヤ形状検査方法，タイヤ形状検査装置
KR100998058B1 (ko) * 2008-07-03 2010-12-03 한국타이어 주식회사 타이어 균일성 분석 시스템 및 그 분석방법
US8712720B2 (en) * 2008-12-19 2014-04-29 Michelin Recherche at Technigue S.A. Filtering method for improving the data quality of geometric tire measurements
JP5371848B2 (ja) 2009-12-07 2013-12-18 株式会社神戸製鋼所 タイヤ形状検査方法、及びタイヤ形状検査装置

Also Published As

Publication number Publication date
JP2013096972A (ja) 2013-05-20
WO2013069389A1 (fr) 2013-05-16
US20140283591A1 (en) 2014-09-25
US9109974B2 (en) 2015-08-18
CN104024792A (zh) 2014-09-03
JP5726045B2 (ja) 2015-05-27
CN104024792B (zh) 2017-02-15
EP2789970A4 (fr) 2015-08-19
TW201333421A (zh) 2013-08-16
TWI475186B (zh) 2015-03-01
PT2789970T (pt) 2018-01-24
EP2789970B1 (fr) 2018-01-03
EP2789970A1 (fr) 2014-10-15

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