IT1197523B - Processo per la fabbricazione di transistori ad effetto di campo a "gate" isolata con giunzioni aventi profondita' estremamente ridotta - Google Patents
Processo per la fabbricazione di transistori ad effetto di campo a "gate" isolata con giunzioni aventi profondita' estremamente ridottaInfo
- Publication number
- IT1197523B IT1197523B IT22182/86A IT2218286A IT1197523B IT 1197523 B IT1197523 B IT 1197523B IT 22182/86 A IT22182/86 A IT 22182/86A IT 2218286 A IT2218286 A IT 2218286A IT 1197523 B IT1197523 B IT 1197523B
- Authority
- IT
- Italy
- Prior art keywords
- joints
- isolated
- gate
- manufacture
- field
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
- H10D84/017—Manufacturing their source or drain regions, e.g. silicided source or drain regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/14—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase
- H10P32/1408—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers
- H10P32/1414—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers the applied layer being silicon, silicide or SIPOS, e.g. polysilicon or porous silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/17—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material
- H10P32/171—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material being group IV material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT22182/86A IT1197523B (it) | 1986-10-30 | 1986-10-30 | Processo per la fabbricazione di transistori ad effetto di campo a "gate" isolata con giunzioni aventi profondita' estremamente ridotta |
| EP87115933A EP0265958A3 (en) | 1986-10-30 | 1987-10-29 | Process of making insulated- gate field-effect transistors |
| JP62273600A JPS63117459A (ja) | 1986-10-30 | 1987-10-30 | 絶縁ゲート電界効果トランジスタの製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT22182/86A IT1197523B (it) | 1986-10-30 | 1986-10-30 | Processo per la fabbricazione di transistori ad effetto di campo a "gate" isolata con giunzioni aventi profondita' estremamente ridotta |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| IT8622182A0 IT8622182A0 (it) | 1986-10-30 |
| IT1197523B true IT1197523B (it) | 1988-11-30 |
Family
ID=11192707
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT22182/86A IT1197523B (it) | 1986-10-30 | 1986-10-30 | Processo per la fabbricazione di transistori ad effetto di campo a "gate" isolata con giunzioni aventi profondita' estremamente ridotta |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP0265958A3 (it) |
| JP (1) | JPS63117459A (it) |
| IT (1) | IT1197523B (it) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE59409300D1 (de) * | 1993-06-23 | 2000-05-31 | Siemens Ag | Verfahren zur Herstellung von einem Isolationsgraben in einem Substrat für Smart-Power-Technologien |
| JP2002368012A (ja) * | 2001-06-06 | 2002-12-20 | Rohm Co Ltd | 不純物拡散層の形成方法 |
| JP4933957B2 (ja) * | 2007-05-18 | 2012-05-16 | 住友ゴム工業株式会社 | スポンジたわし |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56160034A (en) * | 1980-05-14 | 1981-12-09 | Fujitsu Ltd | Impurity diffusion |
| CA1198226A (en) * | 1982-06-01 | 1985-12-17 | Eliezer Kinsbron | Method for manufacturing a semiconductor device |
| JPS6063961A (ja) * | 1983-08-30 | 1985-04-12 | Fujitsu Ltd | 半導体装置の製造方法 |
| IT1213192B (it) * | 1984-07-19 | 1989-12-14 | Ates Componenti Elettron | Processo per la fabbricazione di transistori ad effetto di campo agate isolato (igfet) ad elevata velocita' di risposta in circuiti integrati ad alta densita'. |
| IT1213234B (it) * | 1984-10-25 | 1989-12-14 | Sgs Thomson Microelectronics | Procedimento perfezionato per la fabbricazione di dispositivi a semiconduttore dmos. |
-
1986
- 1986-10-30 IT IT22182/86A patent/IT1197523B/it active
-
1987
- 1987-10-29 EP EP87115933A patent/EP0265958A3/en not_active Withdrawn
- 1987-10-30 JP JP62273600A patent/JPS63117459A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP0265958A3 (en) | 1989-09-27 |
| IT8622182A0 (it) | 1986-10-30 |
| EP0265958A2 (en) | 1988-05-04 |
| JPS63117459A (ja) | 1988-05-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| IT1209682B (it) | Processo per la fabbricazione mediante ricristallizzazione epitassiale di transistori ad effetto di campo a gate isolato con giunzioni a profondita' minima. | |
| IT1199374B (it) | Processo per la preparazione di pirido-imidazo-rifamicine | |
| IT1237799B (it) | Processo microbico per la produzione di antibiotici immunosoppressivi | |
| IT1202447B (it) | Procedimento per la produzione di benzina | |
| IT1225614B (it) | Processo per la fabbricazione di dispositivi integrati cmos con lunghezze di gate ridotte e drain leggermente drogato | |
| IT1156311B (it) | Processo per la preparazione di composti organici | |
| IT8423280A1 (it) | Processo per la sintesi di 2-metossi-6-bromo-naftalene | |
| IT1136581B (it) | Processo per la preparazione di solfuri organici | |
| IT1189976B (it) | Processo per la fabbricazione di transistori ad effetto di campo a "gate" isolato con giunzioni a profondita' nulla mediante planarizzazione | |
| IT8721493A0 (it) | Processo per la produzione di chetossime. | |
| BR8802699A (pt) | Processo para producao de composto silanico ou siloxanico | |
| IT1197523B (it) | Processo per la fabbricazione di transistori ad effetto di campo a "gate" isolata con giunzioni aventi profondita' estremamente ridotta | |
| ITRM910621A1 (it) | Procedimento per la fabbricazione di transistori con struttura gate -isolante -semiconduttore. | |
| FR2576902B1 (fr) | Procede de fabrication d'hydrogeno-silanes | |
| IT1199413B (it) | Processo per la preparazione di pirido-imidazo-rifamicine | |
| BR8702717A (pt) | Processo de formacao de composto | |
| IT1179025B (it) | Procedimento per la produzione di l'isoleucina | |
| IT8521201A0 (it) | Transistore mos a canale n con limitazione dell'effetto di perforazione (punch-through) erelativo processo di formazione. | |
| BR8700224A (pt) | Processo para producao de composto contendo carbonila | |
| IT1194171B (it) | Procedimento di produzione dell'aspartame | |
| IT8619943A1 (it) | Processo per la produzione di tricloromelammina | |
| IT1227126B (it) | Processo per la preparazione di composti penem. | |
| ITRM940253A0 (it) | "procedimento per la produzione di policarbonato". | |
| IT8521494A0 (it) | Processo per la produzione di para-chinoni. | |
| BR8702272A (pt) | Processo para producao de 2-oxazolidinona |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| TA | Fee payment date (situation as of event date), data collected since 19931001 |
Effective date: 19971030 |