IT1231300B - Processo di definizione e realizzazione di una regione attivadi dimensioni molto ridotte in uno strato di materiale semiconduttore - Google Patents
Processo di definizione e realizzazione di una regione attivadi dimensioni molto ridotte in uno strato di materiale semiconduttoreInfo
- Publication number
- IT1231300B IT1231300B IT8921281A IT2128189A IT1231300B IT 1231300 B IT1231300 B IT 1231300B IT 8921281 A IT8921281 A IT 8921281A IT 2128189 A IT2128189 A IT 2128189A IT 1231300 B IT1231300 B IT 1231300B
- Authority
- IT
- Italy
- Prior art keywords
- realization
- definition
- layer
- semiconductive material
- reduced dimensions
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/61—Formation of materials, e.g. in the shape of layers or pillars of insulating materials using masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
- H10P76/40—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising inorganic materials
- H10P76/408—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising inorganic materials characterised by their sizes, orientations, dispositions, behaviours or shapes
- H10P76/4085—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising inorganic materials characterised by their sizes, orientations, dispositions, behaviours or shapes characterised by the processes involved to create the masks
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/111—Narrow masking
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/942—Masking
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT8921281A IT1231300B (it) | 1989-07-24 | 1989-07-24 | Processo di definizione e realizzazione di una regione attivadi dimensioni molto ridotte in uno strato di materiale semiconduttore |
| EP19900201927 EP0410508A3 (en) | 1989-07-24 | 1990-07-14 | Process for defining and forming an active region of very limited dimensions in a semiconductor layer |
| JP2193196A JPH03141649A (ja) | 1989-07-24 | 1990-07-23 | 能動領域の形成方法 |
| KR1019900011158A KR910003750A (ko) | 1989-07-24 | 1990-07-23 | 초제한 크기의 활성 영역을 반도체층내에 정하여 형성하기 위한 방법 |
| US07/728,821 US5130272A (en) | 1989-07-24 | 1991-07-09 | Process for defining and forming an active region of very limited dimensions in a semiconductor layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT8921281A IT1231300B (it) | 1989-07-24 | 1989-07-24 | Processo di definizione e realizzazione di una regione attivadi dimensioni molto ridotte in uno strato di materiale semiconduttore |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| IT8921281A0 IT8921281A0 (it) | 1989-07-24 |
| IT1231300B true IT1231300B (it) | 1991-11-28 |
Family
ID=11179486
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT8921281A IT1231300B (it) | 1989-07-24 | 1989-07-24 | Processo di definizione e realizzazione di una regione attivadi dimensioni molto ridotte in uno strato di materiale semiconduttore |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5130272A (it) |
| EP (1) | EP0410508A3 (it) |
| JP (1) | JPH03141649A (it) |
| KR (1) | KR910003750A (it) |
| IT (1) | IT1231300B (it) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5716859A (en) * | 1995-12-22 | 1998-02-10 | The Whitaker Corporation | Method of fabricating a silicon BJT |
| US6214673B1 (en) * | 1999-07-09 | 2001-04-10 | Intersil Corporation | Process for forming vertical semiconductor device having increased source contact area |
| US6090691A (en) * | 1999-11-15 | 2000-07-18 | Chartered Semiconductor Manufacturing Ltd. | Method for forming a raised source and drain without using selective epitaxial growth |
| US20040258977A1 (en) * | 2003-01-24 | 2004-12-23 | Hydrogenics Corporation | Apparatus for and method of forming seals in fuel cells and fuel cell stacks |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3793721A (en) * | 1971-08-02 | 1974-02-26 | Texas Instruments Inc | Integrated circuit and method of fabrication |
| US4209349A (en) * | 1978-11-03 | 1980-06-24 | International Business Machines Corporation | Method for forming a narrow dimensioned mask opening on a silicon body utilizing reactive ion etching |
| US4503598A (en) * | 1982-05-20 | 1985-03-12 | Fairchild Camera & Instrument Corporation | Method of fabricating power MOSFET structure utilizing self-aligned diffusion and etching techniques |
| US4678537A (en) * | 1985-05-23 | 1987-07-07 | Sony Corporation | Method of manufacturing semiconductor devices |
| DE3688057T2 (de) * | 1986-01-10 | 1993-10-07 | Gen Electric | Halbleitervorrichtung und Methode zur Herstellung. |
| IT1204243B (it) * | 1986-03-06 | 1989-03-01 | Sgs Microelettronica Spa | Procedimento autoallineato per la fabbricazione di celle dmos di piccole dimensioni e dispositivi mos ottenuti mediante detto procedimento |
| US4716126A (en) * | 1986-06-05 | 1987-12-29 | Siliconix Incorporated | Fabrication of double diffused metal oxide semiconductor transistor |
| JPH0834311B2 (ja) * | 1987-06-10 | 1996-03-29 | 日本電装株式会社 | 半導体装置の製造方法 |
| US4818713A (en) * | 1987-10-20 | 1989-04-04 | American Telephone And Telegraph Company, At&T Bell Laboratories | Techniques useful in fabricating semiconductor devices having submicron features |
| US4960723A (en) * | 1989-03-30 | 1990-10-02 | Motorola, Inc. | Process for making a self aligned vertical field effect transistor having an improved source contact |
-
1989
- 1989-07-24 IT IT8921281A patent/IT1231300B/it active
-
1990
- 1990-07-14 EP EP19900201927 patent/EP0410508A3/en not_active Ceased
- 1990-07-23 KR KR1019900011158A patent/KR910003750A/ko not_active Withdrawn
- 1990-07-23 JP JP2193196A patent/JPH03141649A/ja active Pending
-
1991
- 1991-07-09 US US07/728,821 patent/US5130272A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| IT8921281A0 (it) | 1989-07-24 |
| JPH03141649A (ja) | 1991-06-17 |
| EP0410508A2 (en) | 1991-01-30 |
| KR910003750A (ko) | 1991-02-28 |
| US5130272A (en) | 1992-07-14 |
| EP0410508A3 (en) | 1991-11-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| TA | Fee payment date (situation as of event date), data collected since 19931001 |
Effective date: 19970730 |