JP4092753B2 - 走査型露光装置及び走査露光方法 - Google Patents

走査型露光装置及び走査露光方法 Download PDF

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Publication number
JP4092753B2
JP4092753B2 JP30938497A JP30938497A JP4092753B2 JP 4092753 B2 JP4092753 B2 JP 4092753B2 JP 30938497 A JP30938497 A JP 30938497A JP 30938497 A JP30938497 A JP 30938497A JP 4092753 B2 JP4092753 B2 JP 4092753B2
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Prior art keywords
scanning
projection optical
substrate
optical system
pattern
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Expired - Lifetime
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Japanese (ja)
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JPH11125912A (ja
JPH11125912A5 (2
Inventor
雅一 村上
正紀 加藤
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Nikon Corp
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Nikon Corp
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Priority to JP30938497A priority Critical patent/JP4092753B2/ja
Publication of JPH11125912A publication Critical patent/JPH11125912A/ja
Publication of JPH11125912A5 publication Critical patent/JPH11125912A5/ja
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70358Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP30938497A 1997-10-22 1997-10-22 走査型露光装置及び走査露光方法 Expired - Lifetime JP4092753B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30938497A JP4092753B2 (ja) 1997-10-22 1997-10-22 走査型露光装置及び走査露光方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30938497A JP4092753B2 (ja) 1997-10-22 1997-10-22 走査型露光装置及び走査露光方法

Publications (3)

Publication Number Publication Date
JPH11125912A JPH11125912A (ja) 1999-05-11
JPH11125912A5 JPH11125912A5 (2) 2005-10-27
JP4092753B2 true JP4092753B2 (ja) 2008-05-28

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JP30938497A Expired - Lifetime JP4092753B2 (ja) 1997-10-22 1997-10-22 走査型露光装置及び走査露光方法

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JP (1) JP4092753B2 (2)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6873400B2 (en) 2000-02-02 2005-03-29 Nikon Corporation Scanning exposure method and system
JP4617616B2 (ja) * 2001-07-11 2011-01-26 株式会社ニコン 露光装置及び露光方法
KR100564216B1 (ko) * 2003-10-11 2006-03-28 엘지.필립스 엘시디 주식회사 액정표시장치용 노광장치 및 그것을 사용한 노광방법
JP4773160B2 (ja) * 2005-08-24 2011-09-14 株式会社ブイ・テクノロジー 露光装置
US7518705B2 (en) * 2006-09-14 2009-04-14 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP5825470B2 (ja) * 2011-05-16 2015-12-02 株式会社ブイ・テクノロジー 露光装置及び遮光板

Also Published As

Publication number Publication date
JPH11125912A (ja) 1999-05-11

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