JP5111791B2 - 低電圧検知リセット回路 - Google Patents
低電圧検知リセット回路 Download PDFInfo
- Publication number
- JP5111791B2 JP5111791B2 JP2006169832A JP2006169832A JP5111791B2 JP 5111791 B2 JP5111791 B2 JP 5111791B2 JP 2006169832 A JP2006169832 A JP 2006169832A JP 2006169832 A JP2006169832 A JP 2006169832A JP 5111791 B2 JP5111791 B2 JP 5111791B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- reset
- detection
- detection level
- low voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000001514 detection method Methods 0.000 title claims description 88
- 230000001419 dependent effect Effects 0.000 claims description 2
- 230000000630 rising effect Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 7
- 230000007423 decrease Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
- H03K3/356—Bistable circuits
- H03K3/356008—Bistable circuits ensuring a predetermined initial state when the supply voltage has been applied; storing the actual state when the supply voltage fails
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied
Landscapes
- Electronic Switches (AREA)
Description
11 第1の比較回路
12 PMOS
13 検知レベル設定回路
14 基準電圧発生回路
15 レジスタ
16 バスライン
23 NOR回路
30 パワーオンリセット回路
40 パルスストレッチャー回路
Claims (3)
- パワーオン時のみ動作し、電源電圧の立ち上がりに応じて第1のリセットパルスを出力するパワーオンリセット回路と、
電源電圧に応じた検知レベルを可変に設定可能な検知レベル設定回路と、電源電圧に依存しない基準電圧と前記検知レベルを比較して、前記検知レベルが前記基準電圧以下になった時に第2のリセットパルスを出力する比較回路と、この比較回路への電源電圧の供給を制御するスイッチと、を備える低電圧検知回路と、
前記第1のリセットパルスと前記第2のリセットパルスとの論理和をとることにより、マイクロコンピュータをリセット状態に設定するためのリセット信号を出力する論理和回路と、
前記第1のリセットパルスに応じて、前記スイッチをオンさせると共に前記検知レベルをデフォルト値に設定することにより、前記第1のリセットパルスによるリセット状態を継続するように前記第2のリセットパルスを出力させる制御回路と、を備えることを特徴とする低電圧検知リセット回路。 - 前記制御回路は、前記検知レベルをデフォルト値に設定した後に電源電圧が上昇して前記第2のリセットパルスによるリセット状態が解除されると、前記検知レベルを所望の値に設定することを特徴とする請求項1に記載の低電圧検知リセット回路。
- 前記第2のリセットパルスのパルス幅を広げるパルスストレッチャー回路を備えることを特徴とする請求項1又は請求項2に記載の低電圧検知リセット回路。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006169832A JP5111791B2 (ja) | 2006-06-20 | 2006-06-20 | 低電圧検知リセット回路 |
| CN200710126606XA CN101093988B (zh) | 2006-06-20 | 2007-06-18 | 低电压检测复位电路 |
| KR1020070059793A KR20070120894A (ko) | 2006-06-20 | 2007-06-19 | 저전압 검지 리세트 회로 |
| US11/812,510 US7453295B2 (en) | 2006-06-20 | 2007-06-19 | Low-voltage detection reset circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006169832A JP5111791B2 (ja) | 2006-06-20 | 2006-06-20 | 低電圧検知リセット回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008005000A JP2008005000A (ja) | 2008-01-10 |
| JP5111791B2 true JP5111791B2 (ja) | 2013-01-09 |
Family
ID=38948659
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006169832A Active JP5111791B2 (ja) | 2006-06-20 | 2006-06-20 | 低電圧検知リセット回路 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7453295B2 (ja) |
| JP (1) | JP5111791B2 (ja) |
| KR (1) | KR20070120894A (ja) |
| CN (1) | CN101093988B (ja) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3974631B2 (ja) * | 2005-03-02 | 2007-09-12 | 日東電工株式会社 | 光学フィルムおよびその製造方法、ならびに該光学フィルムを用いた画像表示装置 |
| JP2007233336A (ja) * | 2006-01-31 | 2007-09-13 | Toshiba Matsushita Display Technology Co Ltd | 液晶表示装置 |
| KR100802414B1 (ko) * | 2006-04-18 | 2008-02-13 | 강윤규 | 진동발생장치 |
| JP4415971B2 (ja) * | 2006-05-10 | 2010-02-17 | カシオ計算機株式会社 | 表示装置及びその製造方法 |
| KR100791542B1 (ko) * | 2006-10-31 | 2008-01-03 | 한국전력공사 | 중수로 원자력 발전소의 압력관 건전성 평가방법 |
| KR100811728B1 (ko) * | 2006-12-12 | 2008-03-11 | 담양군 | 기능성 대나무 판지의 제조방법 |
| KR100789727B1 (ko) * | 2007-02-28 | 2008-01-03 | 세메스 주식회사 | 평판 패널 세정 장치 |
| US8316158B1 (en) | 2007-03-12 | 2012-11-20 | Cypress Semiconductor Corporation | Configuration of programmable device using a DMA controller |
| KR100840929B1 (ko) * | 2007-04-20 | 2008-06-24 | 장성원 | 좌변기용 위생시트 보관함 |
| KR100811085B1 (ko) * | 2007-07-04 | 2008-03-07 | 조영자 | 버튼을 이용한 트렁크 열림 시스템 |
| TWM366112U (en) * | 2008-12-09 | 2009-10-01 | Richtek Technology Corp | A power management and control apparatus for resetting a latched protection in a power supply unit |
| JP5308298B2 (ja) | 2009-09-29 | 2013-10-09 | セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー | リセット回路 |
| US8493109B2 (en) | 2010-03-31 | 2013-07-23 | Qualcomm Incorporated | System and method to control a power on reset signal |
| JP5397309B2 (ja) * | 2010-04-28 | 2014-01-22 | ミツミ電機株式会社 | パワーオンリセット回路 |
| JP5584527B2 (ja) * | 2010-06-21 | 2014-09-03 | ルネサスエレクトロニクス株式会社 | 電圧検出システム及びその制御方法 |
| JP5852538B2 (ja) | 2012-09-26 | 2016-02-03 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| CN106982046B (zh) * | 2017-03-22 | 2020-08-04 | 中国电子产品可靠性与环境试验研究所 | 瞬态脉冲宽度展宽电路及方法 |
| CN108984330B (zh) * | 2018-05-31 | 2021-05-11 | 深圳市江波龙电子股份有限公司 | 一种控制存储设备的方法、装置及电子设备 |
| JP7135497B2 (ja) * | 2018-06-27 | 2022-09-13 | サンケン電気株式会社 | データ処理装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5164613A (en) * | 1990-09-28 | 1992-11-17 | Dallas Semiconductor Corporation | Reset monitor |
| JPH07198762A (ja) * | 1993-12-28 | 1995-08-01 | Fujitsu Ltd | 半導体集積回路装置 |
| JP3113516B2 (ja) * | 1994-09-26 | 2000-12-04 | 三洋電機株式会社 | リセットパルス発生回路 |
| JPH10105255A (ja) * | 1996-09-25 | 1998-04-24 | Toshiba Microelectron Corp | 低電圧検知回路 |
| US6304823B1 (en) * | 1998-09-16 | 2001-10-16 | Microchip Technology Incorporated | Microprocessor power supply system including a programmable power supply and a programmable brownout detector |
| JP2000207381A (ja) * | 1999-01-20 | 2000-07-28 | Mitsubishi Electric Corp | マイクロコンピュ―タのリセット装置 |
| JP2003032089A (ja) * | 2001-07-18 | 2003-01-31 | Matsushita Electric Ind Co Ltd | リセット機能内蔵マイクロコンピュータ |
| JP4201629B2 (ja) * | 2003-03-26 | 2008-12-24 | 三洋電機株式会社 | 誤書込み防止回路および該誤書込み防止回路を含む半導体装置 |
| US7221200B1 (en) * | 2004-03-24 | 2007-05-22 | Cypress Semiconductor Corp. | Programmable low voltage reset apparatus for multi-Vdd chips |
-
2006
- 2006-06-20 JP JP2006169832A patent/JP5111791B2/ja active Active
-
2007
- 2007-06-18 CN CN200710126606XA patent/CN101093988B/zh not_active Expired - Fee Related
- 2007-06-19 US US11/812,510 patent/US7453295B2/en active Active
- 2007-06-19 KR KR1020070059793A patent/KR20070120894A/ko not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| JP2008005000A (ja) | 2008-01-10 |
| KR20070120894A (ko) | 2007-12-26 |
| CN101093988A (zh) | 2007-12-26 |
| CN101093988B (zh) | 2010-06-23 |
| US7453295B2 (en) | 2008-11-18 |
| US20080012613A1 (en) | 2008-01-17 |
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