JPH01128176U - - Google Patents
Info
- Publication number
- JPH01128176U JPH01128176U JP2484788U JP2484788U JPH01128176U JP H01128176 U JPH01128176 U JP H01128176U JP 2484788 U JP2484788 U JP 2484788U JP 2484788 U JP2484788 U JP 2484788U JP H01128176 U JPH01128176 U JP H01128176U
- Authority
- JP
- Japan
- Prior art keywords
- laser light
- wavelength
- potential distribution
- detection head
- material layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 5
- 239000003989 dielectric material Substances 0.000 claims 1
- 230000005684 electric field Effects 0.000 claims 1
- 238000010030 laminating Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Description
第１図は本考案の表面電位分布の検出装置に使
用される検出ヘツドにおける誘電体ミラーの構成
例を示す側面図、第２図は本考案の表面電位分布
の検出装置の応用例の説明に使用される記録媒体
と、前記の記録媒体から情報を読取る際に使用さ
れる検出ヘツドとを説明するための斜視図、第３
図は本考案の表面電位分布の検出装置の応用例と
して示す表示装置の斜視図、第４図及び第５図は
誘電体ミラーの従来構成を示す側面図、第６図及
び第７図は説明用の図表である。
ＤＭＬ……誘電体ミラー、ｎｓ……屈折率がｎ
ｓの基板、Ｅｔｒ……透明電極、ＰＭＬ……光変
調材層部材、ＲＨ……検出ヘツド、ＣＭＬ……記
録媒体、１……レーザ光源、２……偏光子、３…
…ビームエクスパンダ、４……ビームスプリツタ
、５……波長板、６……検光子、７……投影レン
ズ、Ｓ……スクリーン。
FIG. 1 is a side view showing an example of the configuration of a dielectric mirror in a detection head used in the surface potential distribution detection device of the present invention, and FIG. 2 is an illustration of an application example of the surface potential distribution detection device of the present invention. A third perspective view for explaining a recording medium used and a detection head used when reading information from the recording medium.
The figure is a perspective view of a display device shown as an application example of the surface potential distribution detection device of the present invention, FIGS. 4 and 5 are side views showing the conventional configuration of a dielectric mirror, and FIGS. 6 and 7 are explanations. This is a diagram for. DML...Dielectric mirror, ns...Refractive index is n
s substrate, Etr...transparent electrode, PML...light modulating material layer member, RH...detection head, CML...recording medium, 1...laser light source, 2...polarizer, 3...
...beam expander, 4...beam splitter, 5...wave plate, 6...analyzer, 7...projection lens, S...screen.
Claims (1)
て光の状態を変化させる光学部材と、誘電体ミラ
ーとの積層構造からなる検出ヘツドを前記した誘
電体ミラー側が検出の対象にされている表面電位
分布を有する被検出体に近接している態様で配置
して、前記した検出ヘツドにおける透明電極側か
らレーザ光を入射させるようにした表面電位分布
の検出装置において、入射されるレーザ光の波長
の１／４の膜厚で屈折率の高い物質層と入射され
るレーザ光の波長の１／４の膜厚で屈折率の低い
物質層とを順次交互に積層して構成されている誘
電体ミラーの最外層上に、入射されるレーザ光の
波長の１／２の整数倍の膜厚で電気抵抗率が高い
物質層を設けた構成の誘電体ミラーを備えている
検出ヘツドを使用してなる表面電位分布の検出装
置。 A detection head consisting of a laminated structure of a transparent electrode, an optical member that changes the state of light according to the intensity distribution of an applied electric field, and a dielectric mirror, and the dielectric mirror side is the surface to be detected. In a detection device for surface potential distribution, which is arranged in close proximity to an object to be detected having a potential distribution, and in which laser light is incident from the transparent electrode side of the detection head, the wavelength of the incident laser light is A dielectric material formed by sequentially laminating alternately layers of a material with a high refractive index and a material layer with a thickness of 1/4 of the wavelength of the incident laser light and a material layer with a low refractive index. Using a detection head equipped with a dielectric mirror, the outermost layer of the mirror is provided with a material layer having a thickness that is an integral multiple of 1/2 the wavelength of the incident laser light and has high electrical resistivity. A device for detecting surface potential distribution.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2484788U JPH0522867Y2 (en) | 1988-02-26 | 1988-02-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2484788U JPH0522867Y2 (en) | 1988-02-26 | 1988-02-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01128176U true JPH01128176U (en) | 1989-09-01 |
| JPH0522867Y2 JPH0522867Y2 (en) | 1993-06-11 |
Family
ID=31245053
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2484788U Expired - Lifetime JPH0522867Y2 (en) | 1988-02-26 | 1988-02-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0522867Y2 (en) |
-
1988
- 1988-02-26 JP JP2484788U patent/JPH0522867Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0522867Y2 (en) | 1993-06-11 |
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