JPH01143251A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH01143251A
JPH01143251A JP62300901A JP30090187A JPH01143251A JP H01143251 A JPH01143251 A JP H01143251A JP 62300901 A JP62300901 A JP 62300901A JP 30090187 A JP30090187 A JP 30090187A JP H01143251 A JPH01143251 A JP H01143251A
Authority
JP
Japan
Prior art keywords
wiring
clock
length
resistivity
flip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62300901A
Other languages
Japanese (ja)
Inventor
Masuo Yamazaki
益男 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62300901A priority Critical patent/JPH01143251A/en
Publication of JPH01143251A publication Critical patent/JPH01143251A/en
Pending legal-status Critical Current

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)

Abstract

PURPOSE:To reduce the discrepancy between the delay times of respective clock signal wirings and avoid the variation of the delay times of the clock signals by a method wherein the application length ratio of a high resistivity wiring whose unit length resistance is high and a low resistivity wiring whose unit length resistance is low is adjusted in accordance with the length of the clock signal wiring. CONSTITUTION:For a flip-flop 4 whose wiring length is long, the ratio of a low resistivity clock wiring 7 in the wiring is large and the length of the high resistivity clock wiring 6 is short. For flip-flop 5 whose wiring length is short, the ratio of a high resistivity clock wiring 9 in the wiring is large and the length of the low resistivity clock wiring 8 is short. By adjusting the wiring resistance like this, the variation of the delay times of the clock signals can be avoided. As the more low resistivity clock wiring is employed when the clock wiring is long and the more high resistivity clock wiring is employed when the wiring length is short, the variation of the delay time can be reduced easily and the operation of the flip-flop can be stabilized.

Description

【発明の詳細な説明】 ′産業上の利用分野〕 本発明は半導体装置に関し、特にクロック配線を有する
フリシブフロップなどの半導体装置に関する。
DETAILED DESCRIPTION OF THE INVENTION 'Industrial Application Field' The present invention relates to a semiconductor device, and particularly to a semiconductor device such as a frisible flop having a clock wiring.

〔従来の技術〕[Conventional technology]

従来、半導体装置内に収容された複数のフリップフロッ
プへ接続されるクロック配線は、第3図のように配置さ
れていた。すなわち、この半導体チップ1.の上にはフ
リップフロップ4,5およびクロック入力端子2が設け
られ、この入力端子2から各フリップフロップ4,5へ
共通りロック配線3と個別配線21〜24とにより接続
されていた。個別配線は、フリップフロップ4に対して
高抵抗率クロック配線21、低抵抗率クロック配線22
により、フリップフロップ5に対しては低抵抗率クロッ
ク配線23、低抵抗率クロック配線24により行われ、
それぞれの配線長が異なっていた。
Conventionally, clock wiring connected to a plurality of flip-flops housed in a semiconductor device has been arranged as shown in FIG. That is, this semiconductor chip 1. Flip-flops 4, 5 and a clock input terminal 2 are provided above the flip-flops 4, 5, and the input terminal 2 is connected to each flip-flop 4, 5 by a common lock wiring 3 and individual wirings 21-24. The individual wiring includes a high resistivity clock wiring 21 and a low resistivity clock wiring 22 for the flip-flop 4.
Accordingly, the low resistivity clock wiring 23 and the low resistivity clock wiring 24 are used for the flip-flop 5,
Each wire length was different.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来の半導体装置は、複数のフリップフロップ
へのクロック信号を分配するクロック配線長が違うなめ
に、クロック信号の遅延時間のバラツキが大きく、フリ
ップフロップの動作が不安定になるという欠点があった
The above-mentioned conventional semiconductor device has the disadvantage that the delay time of the clock signal varies widely due to the difference in the length of the clock wiring used to distribute the clock signal to the multiple flip-flops, making the operation of the flip-flops unstable. Ta.

本発明の目的は、このような問題を解決し複数のフリッ
プフロップへのクロック配線長の違いによるクロック信
号の遅延時間のバラツキをなくすようにした半導体装置
を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a semiconductor device that solves such problems and eliminates variations in clock signal delay times due to differences in clock wiring lengths to a plurality of flip-flops.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の構成は、クロック入力端子から複数のクロック
信号配線により複数のフリップフロップが接続される回
路を含む半導体装置において、前記各クロ・ツク信号配
線が単位線長さ当りの抵抗値が高い高抵抗率配線とJi
′1位長さ当りの抵抗値が低い低抵抗率配線との使用比
率を各クロック信号配線の長さに対応して”AVするこ
とにより、これら各クロック信号配線の遅延時間のずれ
を少くしなことを特徴とする。
The configuration of the present invention provides a semiconductor device including a circuit in which a plurality of flip-flops are connected to a clock input terminal by a plurality of clock signal wirings, in which each of the clock signal wirings has a high resistance value per unit line length. Resistivity wiring and Ji
By AVing the usage ratio of low-resistivity wiring with a low resistance value per length in accordance with the length of each clock signal wiring, the deviation in delay time of each clock signal wiring can be reduced. It is characterized by

〔実施例〕〔Example〕

次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例の半導体装置の表面を上から
見た模式的レイアウト図である。半導体装置のチップ1
には外部からのクロック入力端子2、共通りロック配線
3.フリップクロップ4゜5、単位長さ当りの抵抗値が
高抵抗の高抵抗率クロック配線6,9.単位長さ当りの
抵抗値か低抵抗の低抵抗率クロック配線7,8が設けら
れている。
FIG. 1 is a schematic layout diagram of the surface of a semiconductor device according to an embodiment of the present invention viewed from above. Semiconductor device chip 1
external clock input terminal 2, common lock wiring 3. Flip crop 4°5, high resistivity clock wiring with high resistance value per unit length 6,9. Low resistivity clock wiring lines 7 and 8 having a low resistance value per unit length are provided.

クロック配線長が長くなるフリップフロップ4は、低抵
抗率クロック配線7の比率を多くして配線し、高抵抗率
クロック配線6を少なくする。また、クロック配線長が
短くなるフリップフロップ5は、高抵抗率クロック配線
9の比率を多くし、低抵抗率クロック配線8を短かくす
る。このようにして配線抵抗を調整することによりクロ
ンクイ8号の遅延時間のバラツキをなくすことができろ
Flip-flops 4 with longer clock wiring lengths are wired with a larger proportion of low-resistivity clock wirings 7 and fewer high-resistivity clock wirings 6. Furthermore, in the flip-flop 5 whose clock wiring length is shortened, the ratio of the high-resistivity clock wiring 9 is increased and the low-resistivity clock wiring 8 is shortened. By adjusting the wiring resistance in this way, it is possible to eliminate variations in the delay time of Klong Kui No. 8.

第2図は本発明の第2の実施例の半導体装置の表面を上
から見た模式的レイアウト図である。本実施例は、半導
体装置のチップ1上に2個のクロック入力端子12.1
3からフリップフロップ14に高抵抗率クロック配線1
5.17と低抵抗率クロック配線16.18とで接続し
ている。
FIG. 2 is a schematic layout diagram of the surface of a semiconductor device according to a second embodiment of the present invention, viewed from above. In this embodiment, two clock input terminals 12.1 are provided on a chip 1 of a semiconductor device.
High resistivity clock wiring 1 from 3 to flip-flop 14
5.17 and low resistivity clock wiring 16.18.

2系統のクロック信号を使用するフリップフロップ14
はクロック入力端子12から低抵抗率クロック配線15
、高抵抗率クロック配線16により接続され、クロック
入力端子13から低抵抗率クロック配線17、高抵抗率
クロック配線18より接続される。クロック入力端子1
2からのクロック配線は、クロック入力端子13からに
比べて短いため、高抵抗率クロック配線15の比率を多
くして低抵抗率クロック配線16の使用比率を多くして
低抵抗率クロック配線17の使用を少なくして、クロッ
ク信号のタイミングを合わせている。
Flip-flop 14 that uses two systems of clock signals
is the low resistivity clock wiring 15 from the clock input terminal 12.
, are connected by high resistivity clock wiring 16, and are connected from clock input terminal 13 to low resistivity clock wiring 17 and high resistivity clock wiring 18. Clock input terminal 1
Since the clock wiring from 2 is shorter than that from the clock input terminal 13, the ratio of the high-resistivity clock wiring 15 is increased and the ratio of the low-resistivity clock wiring 16 is increased to increase the usage ratio of the low-resistivity clock wiring 17. The timing of the clock signal is adjusted by using less.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、複数のフリップフロップ
へのクロック配線の配線長の違いによる遅延時間のバラ
ツキを小さくするために、クロック配線長が長い場合に
は低抵抗率クロック配線を多く使用し、配線長が短かい
場合は、高抵抗率クロック配線を多く使用しているので
、容易に遅延時間のバラツキを小さくでき、フリップフ
ロップの動作を安定化することができる効果がある。
As explained above, the present invention uses many low-resistivity clock lines when the clock line length is long, in order to reduce the variation in delay time due to differences in the length of the clock lines to multiple flip-flops. When the wiring length is short, many high-resistivity clock wirings are used, so variations in delay time can be easily reduced and the operation of the flip-flop can be stabilized.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第1の実施例の半導体装置を表面から
見た模式的レイアウト図、第2図は本発明の第2の実施
例の同様なレイアウト図、第3図は従来の半導体装置を
表面から見た模式的レイアウト図である。 1・・・半導体装置のチップ、2,12.13・・外部
からのクロック入力端子、3・・・共通りロック配線、
4,5.14・・・フリップフロップ、6,9゜15.
17,21.24・・・高抵抗率クロック配線、7,8
,16,18,22.23・・・低抵抗率クロック配線
FIG. 1 is a schematic layout diagram of a semiconductor device according to a first embodiment of the present invention viewed from the surface, FIG. 2 is a similar layout diagram of a second embodiment of the present invention, and FIG. 3 is a diagram of a conventional semiconductor device. FIG. 2 is a schematic layout diagram of the device viewed from the front. 1... Semiconductor device chip, 2, 12.13... External clock input terminal, 3... Common lock wiring,
4,5.14...Flip-flop, 6,9°15.
17, 21. 24...High resistivity clock wiring, 7, 8
, 16, 18, 22. 23...Low resistivity clock wiring.

Claims (1)

【特許請求の範囲】[Claims]  クロック入力端子から複数のクロック信号配線により
複数のフリップフロップが接続される回路を含む半導体
装置において、前記各クロック信号配線が単位線長さ当
りの抵抗値が高い高抵抗率配線と単位長さ当りの抵抗値
が低い低抵抗率配線との使用比率を各クロック信号配線
の長さに対応して調整することにより、これら各クロッ
ク信号配線の遅延時間のずれを少くしたことを特徴とす
る半導体装置。
In a semiconductor device including a circuit in which a plurality of flip-flops are connected to a clock input terminal by a plurality of clock signal wirings, each of the clock signal wirings is connected to a high resistivity wiring having a high resistance value per unit line length. A semiconductor device characterized in that the difference in delay time of each of these clock signal wirings is reduced by adjusting the ratio of use of low resistivity wiring with a low resistance value in accordance with the length of each clock signal wiring. .
JP62300901A 1987-11-27 1987-11-27 Semiconductor device Pending JPH01143251A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62300901A JPH01143251A (en) 1987-11-27 1987-11-27 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62300901A JPH01143251A (en) 1987-11-27 1987-11-27 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH01143251A true JPH01143251A (en) 1989-06-05

Family

ID=17890490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62300901A Pending JPH01143251A (en) 1987-11-27 1987-11-27 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH01143251A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0766292A (en) * 1993-08-23 1995-03-10 Nec Corp Lsi wiring structure
US5896055A (en) * 1995-11-30 1999-04-20 Matsushita Electronic Industrial Co., Ltd. Clock distribution circuit with clock branch circuits connected to outgoing and return lines and outputting synchronized clock signals by summing time integrals of clock signals on the outgoing and return lines

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0766292A (en) * 1993-08-23 1995-03-10 Nec Corp Lsi wiring structure
US5896055A (en) * 1995-11-30 1999-04-20 Matsushita Electronic Industrial Co., Ltd. Clock distribution circuit with clock branch circuits connected to outgoing and return lines and outputting synchronized clock signals by summing time integrals of clock signals on the outgoing and return lines

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