JPH0116511Y2 - - Google Patents

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Publication number
JPH0116511Y2
JPH0116511Y2 JP1983053186U JP5318683U JPH0116511Y2 JP H0116511 Y2 JPH0116511 Y2 JP H0116511Y2 JP 1983053186 U JP1983053186 U JP 1983053186U JP 5318683 U JP5318683 U JP 5318683U JP H0116511 Y2 JPH0116511 Y2 JP H0116511Y2
Authority
JP
Japan
Prior art keywords
heating coil
frequency heating
reaction tube
tube
fixation frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1983053186U
Other languages
Japanese (ja)
Other versions
JPS59158437U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5318683U priority Critical patent/JPS59158437U/en
Publication of JPS59158437U publication Critical patent/JPS59158437U/en
Application granted granted Critical
Publication of JPH0116511Y2 publication Critical patent/JPH0116511Y2/ja
Granted legal-status Critical Current

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  • Chemical Vapour Deposition (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【考案の詳細な説明】 (a) 考案の技術分野 本考案は半導体装置の製造工程においてシリコ
ン基板上に酸化膜などを気相成長によつて形成さ
せるための気相成長(CVD:Chemical Vapour
Deposition)装置に係り、特にコールドウオール
(Cold Wall)CVD装置のコイル構造に関する。
[Detailed explanation of the invention] (a) Technical field of the invention This invention is a chemical vapor deposition (CVD) method for forming an oxide film etc. on a silicon substrate by vapor phase growth in the manufacturing process of semiconductor devices.
The present invention relates to CVD equipment, particularly the coil structure of cold wall CVD equipment.

(b) 従来技術と問題点 半導体装置の製造工程において、第1図に示す
ごとく反応管1内に複数の円板カーボンサセプタ
ー2を配置し、該円板カーボンサセプタ2に処理
される基板(図示せず)を密着させて、前記反応
管1の外周に設けられた銅パイプよりなる高周波
加熱用コイル3によつて、前記サセプタ2の発熱
体を所定温度に加熱し、該サセプター2の両側に
保持された基板が所定温度に加熱され、反応管1
内の所望ガス熱分解によつて基板上に所望の被着
膜を形成するCVD装置がある。
(b) Prior Art and Problems In the manufacturing process of semiconductor devices, a plurality of disk carbon susceptors 2 are arranged in a reaction tube 1 as shown in FIG. (not shown), the heating element of the susceptor 2 is heated to a predetermined temperature by a high-frequency heating coil 3 made of a copper pipe provided on the outer periphery of the reaction tube 1. The held substrate is heated to a predetermined temperature, and the reaction tube 1
There is a CVD apparatus that forms a desired deposited film on a substrate by thermally decomposing a desired gas within the substrate.

尚前記銅パイプは銅パイプの中を流れる水流に
よつて冷却されている。かかる構造のいわゆるコ
ールドウオールCVD装置においてはホツトウオ
ール(Hot Wall)CVD装置のように反応管も同
時に所定温度に加熱される構造に比べて反応管1
の温度が低いため反応管1内壁に付着する被着膜
の成長が押えられ、管壁からの被着膜のはがれが
少ない特徴を有している。
Note that the copper pipe is cooled by a water flow flowing through the copper pipe. In a so-called cold wall CVD device having such a structure, compared to a structure in which the reaction tube is simultaneously heated to a predetermined temperature like a hot wall CVD device, the reaction tube 1 is heated to a predetermined temperature.
Since the temperature is low, the growth of the deposited film adhering to the inner wall of the reaction tube 1 is suppressed, and the deposited film is characterized by less peeling from the tube wall.

しかしながら従来のコールドウオールCVD装
置の高周波加熱用コイル3構造は、図示したごと
く単に反応管1外周に露出した状態でコイル状に
設けられており、使用期間の間に前記高周波加熱
用コイル3が変形してゆがみ、このため反応管内
のサセプタ2の加熱状態に不均一な温度分布を生
じ、基板上の被着膜の成長に悪影響をおよぼすな
どの問題があり、更に前記高周波加熱用コイル3
が露出しているため安全上も危険な問題を生ずる
欠点があつた。
However, the structure of the high-frequency heating coil 3 of the conventional cold wall CVD apparatus is simply provided in the form of a coil in an exposed state on the outer periphery of the reaction tube 1 as shown in the figure, and the high-frequency heating coil 3 deforms during the period of use. This causes problems such as uneven temperature distribution in the heated state of the susceptor 2 in the reaction tube, which adversely affects the growth of the deposited film on the substrate.
It also had the disadvantage of being exposed, which caused a dangerous problem in terms of safety.

(c) 考案の目的 本考案の目的はかかる問題点に鑑みなされたも
のでコールドウオールCVD装置の高周波加熱用
コイルを支持固定して、該コイルのゆがみをなく
して均一な温度分布を可能にし、かつカバー管を
設けることによつて安全な高周波加熱用コイルの
構造を有するCVD装置の提供にある。
(c) Purpose of the invention The purpose of the invention is to support and fix the high-frequency heating coil of a cold wall CVD device, eliminate distortion of the coil, and enable uniform temperature distribution. Another object of the present invention is to provide a CVD device having a safe high-frequency heating coil structure by providing a cover tube.

(d) 考案の構成 この目的は本考案によれば高周波加熱用コイル
を表面に固定支持する絶縁体よりなる筒状支持固
定枠、該支持固定枠の外周を同心的にカバーする
絶縁管、及び支持固定枠内に同心的に装着された
反応管よりなることを特徴とする気相成長装置に
よつて達成される。
(d) Structure of the invention According to the invention, the purpose is to provide a cylindrical supporting and fixing frame made of an insulator that fixes and supports a high-frequency heating coil on its surface, an insulating tube that concentrically covers the outer periphery of the supporting and fixing frame, and This is achieved by a vapor phase growth apparatus characterized by a reaction tube mounted concentrically within a supporting fixed frame.

(e) 考案の実施例 以下本考案の実施例について図面を参照して説
明する。第2図は本考案の一実施例の要部断面図
第3図aは、本考案の高周波加熱用コイル構造の
斜視図、第3図bは、第3図aの一部拡大断面図
を示し、前図と同等の部分については同一符号を
付している。第2図において11は反応管、12
は絶縁体によつて形成された支持固定枠、13は
高周波加熱用コイル、14は反応管と同心円状の
絶縁管を示す。更に本考案の高周波加熱用コイル
構造について第3図a及びbを用いて説明すると
前記支持固定枠12はたとえば第3図aに図示し
たように6角形状の反応管に平行に絶縁体によつ
て形成されており、その外側にたとえば銅パイプ
による高周波加熱用コイル13が第3図bの拡大
図に示すように支持固定枠12の所定位置の溝1
5にそつて巻かれており、該高周波加熱用コイル
13は支持固定される。尚銅パイプは銅パイプの
中を流れる水流によつて冷却されている。支持固
定枠12にコイル状に巻かれた高周波加熱用コイ
ル13はその外側に反応管と同心円状の絶縁管1
4によつて図示したようにカバーされている。
(e) Embodiments of the invention Examples of the invention will be described below with reference to the drawings. FIG. 2 is a cross-sectional view of a main part of an embodiment of the present invention. FIG. 3 a is a perspective view of the high-frequency heating coil structure of the present invention, and FIG. 3 b is a partially enlarged cross-sectional view of FIG. 3 a. The same parts as in the previous figure are given the same reference numerals. In Fig. 2, 11 is a reaction tube, 12
Reference numeral 13 indicates a supporting and fixing frame formed of an insulator, 13 indicates a high-frequency heating coil, and 14 indicates an insulating tube concentric with the reaction tube. Further, the high-frequency heating coil structure of the present invention will be explained with reference to FIGS. 3a and 3b. For example, as shown in FIG. A high-frequency heating coil 13 made of, for example, a copper pipe is formed on the outside of the groove 1 at a predetermined position of the supporting and fixing frame 12, as shown in the enlarged view of FIG. 3b.
5, and the high frequency heating coil 13 is supported and fixed. The copper pipe is cooled by a stream of water flowing through the copper pipe. A high-frequency heating coil 13 wound around a supporting fixed frame 12 has an insulating tube 1 concentric with the reaction tube on the outside thereof.
4 as shown.

かかるように構成された本考案の高周波加熱用
コイル構造においては高周波加熱用コイル13は
支持固定枠12によつて固定されるため、該高周
波加熱用コイル13の変形ゆがみが防止され、更
に絶縁管14によるカバー管が設けられているた
め、安全上の問題も解決することができる。
In the high-frequency heating coil structure of the present invention configured as described above, the high-frequency heating coil 13 is fixed by the support and fixing frame 12, so deformation and distortion of the high-frequency heating coil 13 is prevented, and furthermore, the insulating tube 14, safety issues can also be solved.

(f) 考案の効果 以上説明したごとく本考案においては、コール
ドウオールCVD装置の高周波加熱用コイルを支
持固定して該コイルの変形ゆがみをなくし反応管
内の基板を均一に加熱することが可能となり品質
向上に効果があり、カバー管を設けることによつ
て安全上にも効果がある。
(f) Effect of the invention As explained above, in this invention, the high-frequency heating coil of the cold wall CVD equipment is supported and fixed, thereby eliminating deformation and distortion of the coil, making it possible to uniformly heat the substrate inside the reaction tube, and improving quality. This is effective for improving safety, and providing a cover pipe is also effective for safety.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来装置を説明するための模式的要部
平面図、第2図は本考案の一実施例の要部断面図
第3図aは本考案の高周波加熱用コイル構造の斜
視図、第3図bは第3図aの一部拡大断面図であ
る。 図において11は反応管、12は支持固定枠、
13は高周波加熱用コイル、14は絶縁管を示
す。
FIG. 1 is a schematic plan view of the main parts for explaining a conventional device, FIG. 2 is a sectional view of the main parts of an embodiment of the present invention, and FIG. 3a is a perspective view of the high-frequency heating coil structure of the present invention. FIG. 3b is a partially enlarged sectional view of FIG. 3a. In the figure, 11 is a reaction tube, 12 is a supporting fixed frame,
13 is a high-frequency heating coil, and 14 is an insulating tube.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 高周波加熱用コイルを表面に固定支持する絶縁
体よりなる筒状支持固定枠、該支持固定枠の外周
を同心的にカバーする絶縁管、及び支持固定枠内
に同心的に装着された反応管よりなることを特徴
とする気相成長装置。
A cylindrical support and fixation frame made of an insulator that fixedly supports the high-frequency heating coil on the surface, an insulating tube that concentrically covers the outer periphery of the support and fixation frame, and a reaction tube that is installed concentrically within the support and fixation frame. A vapor phase growth apparatus characterized by:
JP5318683U 1983-04-08 1983-04-08 Vapor phase growth equipment Granted JPS59158437U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5318683U JPS59158437U (en) 1983-04-08 1983-04-08 Vapor phase growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5318683U JPS59158437U (en) 1983-04-08 1983-04-08 Vapor phase growth equipment

Publications (2)

Publication Number Publication Date
JPS59158437U JPS59158437U (en) 1984-10-24
JPH0116511Y2 true JPH0116511Y2 (en) 1989-05-16

Family

ID=30183530

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5318683U Granted JPS59158437U (en) 1983-04-08 1983-04-08 Vapor phase growth equipment

Country Status (1)

Country Link
JP (1) JPS59158437U (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5443650Y2 (en) * 1974-03-14 1979-12-17
JPS6054919B2 (en) * 1976-08-06 1985-12-02 株式会社日立製作所 low pressure reactor

Also Published As

Publication number Publication date
JPS59158437U (en) 1984-10-24

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