JPH01191237A - Automatic test system - Google Patents

Abstract

PURPOSE:To eliminate problems of acquisition of a tester, preparation of a test manual, or the like by running a margin value setting program with command supply to set a margin value for a test object and next performing the test. CONSTITUTION:In case of the voltage margin/clock margin test, it is sufficient if a command CALL TEST1 is inputted on a console CNS, and 1T3-TMP is read out from a disk DK by this command and is loaded into a memory MEM, and running is started to automatically perform the test, and results are printed out by a printer of the console. Though the test requires a long time, an operator gas results at the time of coming to office in the morning if supplying the command at the time of leaving office in the evening. Thus, since the test is preliminarily programmed, the test is free from erroneous operations and the number of testers (operators) is reduced, and the operator can easily perform the same test as manual operations though being not experienced.

Description

[Detailed Description of the Invention] [Summary] Regarding an automatic test method for the operating margin of the hardware of an information processing device, the margin test can be processed by software without passing through SvP, and the erroneous operation that occurs in manual operation can be avoided. With the aim of eliminating problems such as the need to secure testers and the need to prepare test manuals, in an automatic test method for the operating margin of the hardware of information processing equipment, margin values for each part of the information processing equipment are tested. Prepare a program to set and a program to cancel it, and by inputting a command, run the margin value setting program to set the margin value for the test object, then run the test program to perform the test, and then The setting canceling program is run to return the setting margin value to the normal value.

[Industrial application field]

The present invention relates to an automatic test method for the operating margin of hardware of an information processing device.

A maintenance test program (Test Maintenance Program) is used to test the hardware of information processing equipment.
There are operation confirmation tests using am (abbreviated as TMP) and operation margin tests such as voltage margin/clock margin.

A voltage margin test is performed by changing the power supply voltage of an information processing device within the upper/lower limit range and continuing it for a predetermined period of time to see if the operation is normal or abnormal.A clock margin test is performed by changing the power supply voltage of the information processing device within the upper/lower limit range, and checking whether the operation is normal or abnormal. This is done by making changes, and then continuing to do so for a predetermined period of time to see if the operation is normal or abnormal. These tests are conducted after the manufacturing of the information processing device is completed, and the results are recorded in the test report at the time of shipment.

[Conventional technology]

Voltage margin/clock margin testing is conventionally performed through a service processor (SVP). That is,
From the SVP, input a predetermined command manually,
Tests are conducted by setting voltage margin/clock margin values. The information processing device has a control system that receives the above-mentioned command and carries out the command, for example, if the power supply voltage is to be increased by 5% from the rated value, the power supply voltage is increased by 5%.

However, the following problems occur in this manual test using SVP. ■Problems occur due to incorrect operation. This causes unnecessary errors. ■It is necessary to secure a tester (operator). This goes against labor saving. ■It is necessary to prepare a test manual. Since the test guidelines must be disclosed in detail, the test manual requires a lot of content.

[Problem that the invention seeks to solve]

As mentioned above, manual voltage margin/clock margin testing through the service processor ('5VP) has problems such as the occurrence of operational errors, the need to secure a tester, and the need to prepare a test manual.

The present invention aims to solve the above problem by making it possible to process this automatically, especially by software without passing through SVP.

[Means for solving problems]

In the present invention, the test maintenance program (TMP)
The voltage margin/clock margin test, which was not within the test range, is set as one item of the TMP test, and the test is automatically executed.

Figure 1 shows how to set the voltage margin/clock margin value/
An outline of the program to be canceled is shown. This program is created using an assembler, and program-A sets the voltage margin/clock margin value, and program-B returns the voltage margin/clock margin value set in program A to the normal value. C5ECT (Sea Sect) 0. P is a control statement, MNTB (maintenance B) is a command statement for a diagnostic program, and AAAA is an information processing device (
CPU.

DCH) is set to a stopped state, BBBB is set to each CPU,
Set the voltage margin/clock margin value for each DCH (channel), and cccc puts the CPU and DCH in the start state. This completes Program-A. DDDD of program-B sets the CPU and DCH to a stopped state, and EEEE sets the voltage margin/
The clock margin value is set to a normal value to return to the normal state), and FFFF puts the CPU and DCH into the start state.

[Effect]

The test procedure using the above voltage margin/clock margin value setting program is explained in Figure 2.
At ■ in the figure, a normal operation test of the information processing device by TMP is performed, and after ■, a voltage margin/clock margin test is performed.

That is, in step ①, use Program-A to set the voltage margin/clock margin value to be tested, and in ◯, set the TMP
Perform a voltage margin/clock margin test using the conventional part. Since various voltage margin values and various clock margin values are set for each CPU and DCH and a margin test is performed, steps (1) and (2) are repeated. ■ indicates this.

(2) The following shows the recovery process. That is, in (2), program-B is used to set the voltage margin/clock margin to normal values, and in (2), the system is operated with those values to confirm normal operation.

By cataloging the test procedure shown in FIG. 2 in the TMP, automatic testing of the information processing device including voltage margin/clock margin testing can be realized.

〔Example〕

An example in which the present invention is applied to a DIPS-11/45E maintenance test program (IT3-TMP) is shown in FIGS. 3 and 4. IT3-TMP is DIPS ~ 11/45 E
This is a program that runs on a host, and has the configuration shown in FIG. That is, it includes a CPU test module, a MEM (memory) test module, a channel test module, and a system test module, and in the present invention, the voltage margin/clock margin value setting module (
Add programs -A and -B).

The catalog function of this maintenance test program IT3-TMP catalogs the test command group shown in FIG. °TESTI' at the upper left corner of FIG. 4 is the name of the catalog, and all the tests shown in FIG. 4 are performed by CALL TESTI. "TEST" is a command, and the one at the top of Figure 4 specifies the CPU test modules 1 to n in Figure 3. TESTcpu puoo causes the CPU test module to flow to the CPU of the PUQO board. 008 indicates to output the test results to the LP (line printer). T indicates the input position of the DSW, and Y (console DSW).

N (no DSW), etc. TEST ME month,
This also applies to TESTDCH. 'IOM' is 1
0 minutes, indicating that the test should be performed for 10 minutes. This is a normal test.

The next step, TEST ZZZ, is a step for setting margin values. (2) is a margin value setting, (2) is a test with that value, (2) is a margin value restoration, and (2) is a test (operation normality check) with that value, and this test ends with GEND.

The automatic test is executed by starting the above-mentioned catalog with the catalog starting command under IT3-TMP.

As shown in FIG. 5, the hardware of the information processing device includes a central processing unit CPU, a memory control unit MCU1 and a memory ME.
M, channel device CH, and service processor Sv
P, etc. An external storage device (disk) DK and console CNS are connected to the channel device CH, and maintenance test program IT3-TMP and the like are stored in the external storage device DK. To perform the voltage margin/clock margin test, use the command CALLTE on the console CNS.
All you have to do is enter ST 1, and this will allow you to access I from the disk DK.
T3-TMP is read and loaded into memory MEM;
The vehicle then starts running, the above tests are automatically performed, and the results are printed on the console's printer. The exam takes a long time, but if you enter the above command when you leave work in the evening, you can know the results when you get to work in the morning.

On the other hand, in the conventional method, the service processor SvP sets the voltage margin/clock margin value (A), then the console CNS instructs TMP driving (B), the information displayed on the console CNS display or the printer After looking at the test results published in
If it is K, operation A is performed on the next test object, then operation B is performed, and if the test result is not OK, an investigation is performed, and these steps are repeated.

〔Effect of the invention〕

The method of the present invention described above is expected to have the following effects.

■Since it is pre-programmed, there is no need to worry about erroneous operation.
■The number of testers (operators) required for manual operation tests can be reduced, and even experienced people can easily perform tests equivalent to manual operation.■This Q is for voltage margin/clock margin tests. It can also be used for other exams as well.

[Brief explanation of the drawing]

Fig. 1 is an explanatory diagram of the margin value setting/cancellation program provided in the present invention, Fig. 2 is an explanatory diagram showing the margin test procedure, Fig. 3 is a program configuration diagram showing an embodiment of the present invention, and Fig. 4 is the margin value setting/cancellation program. FIG. 5 is an explanatory diagram showing an example of a catalog for testing. FIG. 5 is an explanatory diagram showing the hardware configuration of an information processing apparatus. In Figure 1, program-A is a margin value setting program;
Program-B is a margin value cancellation program.

Claims (1)

[Scope of Claims] 1. In an automatic test method for operating margins of hardware of an information processing device, a program (program-A) for setting margin values for each part of the information processing device to be tested and a program for canceling the margin values. (Program-B) is prepared, and by inputting a command, the margin value setting program is run to set the margin value for the test object, then the test program is run to perform the test, and then the setting cancellation program is run. An automatic test method characterized in that the set margin value is returned to a normal value by running the vehicle. 2. The automatic test method according to claim 1, wherein the margin is a voltage margin/clock margin.