JPH01207923A - Venturi tube type silicon source vaporization device - Google Patents

Venturi tube type silicon source vaporization device

Info

Publication number
JPH01207923A
JPH01207923A JP3182788A JP3182788A JPH01207923A JP H01207923 A JPH01207923 A JP H01207923A JP 3182788 A JP3182788 A JP 3182788A JP 3182788 A JP3182788 A JP 3182788A JP H01207923 A JPH01207923 A JP H01207923A
Authority
JP
Japan
Prior art keywords
gas
silicon source
vaporization
liquid silicon
port
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3182788A
Other languages
Japanese (ja)
Inventor
Shinichi Kono
伸一 河野
Kouen Nakanishi
中西 宏円
Takahiro Miwa
三輪 隆宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP3182788A priority Critical patent/JPH01207923A/en
Publication of JPH01207923A publication Critical patent/JPH01207923A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/448Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
    • C23C16/4481Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)

Abstract

PURPOSE:To enable vaporization to be stable and to enable a flow rate of vaporization to be drastically increased by providing a gas supply port and gas discharge port and by providing a liquid silicon source suction port at the Venturi part to allow a liquid silicon source to be suctioned into supply gas and then to be vaporized. CONSTITUTION:A gas supply port 4 and a gas discharge port 5 are provided at one edge and the other edge of a Venturi tube 2, and a liquid silicon source suction port 6 is provided at one part of Venturi part 3. Then, carrier gas is sent from the gas supply port 2 with pressure and is converted into a high- speed gas flow in accordance with Bernoulli's theorem at the Ventuli part 3, and liquid silicon source is allowed to be absorbed from the liquid silicon source suction port 6 into this high-speed gas for vaporization within high-speed gas. It allows response on modifying the vaporization flow to be improved, the gas flow rate to be controlled rapidly, and a large flow rate to be transmitted.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、半導体製造工程で使用されるシリコン・ソー
スの気化装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a silicon source vaporization apparatus used in a semiconductor manufacturing process.

[従来の技術] 半導体製造工程で使用されるシリコン・ソースは気化し
難い上、大気に漏れないように保全するとともにエピタ
キシャルに用いる時の気体濃度を定常にコントロールし
、必要な量を能率良く供給出来るように気化を促進しな
ければならない。
[Conventional technology] Silicon sources used in semiconductor manufacturing processes are difficult to vaporize, and they must be preserved to prevent them from leaking into the atmosphere, and the gas concentration when used in epitaxial processes must be constantly controlled to efficiently supply the required amount. Vaporization must be promoted as much as possible.

従来は、タンク内に貯蔵した液体シリコン・ソースζこ
キャリアガスを吹込み、バブリングによりシリコン・ソ
ースの気化ガスを発生させていた。
Conventionally, carrier gas was blown into the liquid silicon source stored in a tank, and vaporized silicon source gas was generated by bubbling.

シリコン・ソースの気泡中への揮発効率は高くないから
、タンク・バブリングによる大量の気化には限界があり
、また気化熱による液温の低下の影響を受けて所要の気
化流量を安定に長時間確保することが難しい。シリコン
・ソースの気化ガス供給量に制限がある為、半導体製造
工程の生産性向上のネックとなっているのが現状である
Since the volatilization efficiency of silicon source into bubbles is not high, there is a limit to the ability to vaporize a large amount by tank bubbling, and it is difficult to maintain the required vaporization flow rate stably for a long period of time due to the influence of the drop in liquid temperature due to the heat of vaporization. Difficult to secure. Currently, there is a limit to the supply of vaporized gas for silicon sources, which is currently a bottleneck in improving the productivity of semiconductor manufacturing processes.

[発明が解決しようとする問題点] タンク・バブリングによるシリコン・ソースの気化・供
給方式は、気化熱による液温低下の影響が低効率の原因
となって、最大気化量30g/分、供給時間30分程度
に留っていたこれまでの水準を打破し、気化量の安定化
と気化流量の最大値を引上げる。
[Problems to be solved by the invention] In the vaporization and supply method of silicon source using tank bubbling, the effect of lowering the liquid temperature due to the heat of vaporization causes low efficiency, and the maximum vaporization amount is 30 g/min and the supply time is low. Breaking through the previous level of about 30 minutes, we will stabilize the amount of vaporization and raise the maximum value of the vaporization flow rate.

[問題を解決するための手段] 本発明は、ベンチュリー管の一端にガス供給口を他端に
ガス送出口を設けるとともに、ベンチュリ一部に液体シ
リコン・ソース吸引口を設け、供給ガス中に液体シリコ
ン・ソースを吸引気化させることを特徴とするベンチュ
リー管型シリコン・ソース気化装置であり、揮発力の弱
い液体シリコン・ソースをベンチュリ一部のガス膨張力
を利用して膨張気化させ、気化の安定を図ると同時に気
化効率の低下要因を排除し、気化流量を大幅に増大する
[Means for Solving the Problem] The present invention provides a gas supply port at one end of the Venturi tube and a gas delivery port at the other end, and also provides a liquid silicon source suction port in a part of the Venturi tube, so that liquid in the supplied gas is provided. This is a Venturi tube type silicon source vaporizer that is characterized by suctioning and vaporizing silicon source.It expands and vaporizes the weakly volatile liquid silicon source using the gas expansion force of the Venturi, thereby stabilizing the vaporization. At the same time, it eliminates the factors that reduce vaporization efficiency and significantly increases the vaporization flow rate.

[作用及び実施例] 第1図の本発明の一実施例において、気化装置lのベン
チュリー管2にそのガス供給口2からキャリアガスを圧
送し、ベンチュリ一部3でベルヌーイ原理に従う高速ガ
ス流に変換し、液体シリコン・ソース吸引口6からこの
高速ガス中に液体シリコン・ソースを吸引させ高速ガス
内で気化する。
[Operations and Examples] In an embodiment of the present invention shown in FIG. 1, a carrier gas is fed under pressure to a venturi pipe 2 of a vaporizer l from its gas supply port 2, and a venturi part 3 converts the carrier gas into a high-speed gas flow according to the Bernoulli principle. The liquid silicon source is sucked into this high-speed gas through the liquid silicon source suction port 6 and vaporized within the high-speed gas.

タンク7は液体シリコン・ソースを貯蔵する。ベンチュ
リー効果で高速化されたキャリアガスはタンク7から吸
引した液体シリコン・ソースの分子に気化エネルギーを
有効に与えることができる。
Tank 7 stores liquid silicon source. The carrier gas sped up by the Venturi effect can effectively impart vaporization energy to molecules of the liquid silicon source drawn from the tank 7.

気化シリコン・ソースを含んだキャリアガスはガス送出
口5から流出する。液体シリコン・ソースとして、5i
CI4.5iHCI3+加圧した5iH2CI2等が使
用可能で、キャリアガスとしてN2+ N2+ 02+
 F2+ CI2等が使用される。
The carrier gas containing the vaporized silicon source exits from the gas outlet 5. 5i as a liquid silicone source
CI4.5iHCI3+pressurized 5iH2CI2 etc. can be used, and N2+ N2+ 02+ as carrier gas
F2+ CI2 etc. are used.

ガス供給口4とガス送出口5の間の圧力バランスを制御
してガス発生量を安定化し、この安定を崩す要因がない
高速ガス系全体は、気化流量を変更する時のレスポンス
も良くガス流量の制御が素早いと同時に、大流量を送出
できる。シリコン・ソースガス供給能力は1000g/
分の気化量を60分供給する水準に達する。
The gas generation amount is stabilized by controlling the pressure balance between the gas supply port 4 and the gas delivery port 5, and the entire high-speed gas system, which has no factors that disrupt this stability, has a good response when changing the vaporization flow rate and the gas flow rate. can be quickly controlled and at the same time can deliver a large flow rate. Silicon source gas supply capacity is 1000g/
It reaches the level of supplying the amount of vaporized for 60 minutes.

[発明の効果] 本発明は、ベンチュリ一部でベルヌーイ原理に従う高速
ガス流を作り、液体シリコン・ソースを高速ガス中に吸
引させ高速ガス内で液体シリコン・ソース分子に気化エ
ネルギーを有効に与えて気化するようにした高速ガス系
全体は、気化流量を変更する時のレスポンスも良くガス
流量の制御が素早いと同時に、大流量を送出てきる。
[Effects of the Invention] The present invention creates a high-speed gas flow in accordance with the Bernoulli principle in a part of the venturi, draws a liquid silicon source into the high-speed gas, and effectively imparts vaporization energy to the liquid silicon source molecules within the high-speed gas. The entire high-speed gas system that vaporizes has a good response when changing the vaporization flow rate, allowing quick control of the gas flow rate and delivering a large flow rate.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す気化装置の概要説明図
である。 1:気化装置     2:ペンチュリー管3:ペンチ
ュリ一部  4:ガス供給口5:ガス送出口    6
:液体シリコン・ソース吸引口 ア:タンク 出願人  東芝セラミックス株式会社
FIG. 1 is a schematic explanatory diagram of a vaporizer according to an embodiment of the present invention. 1: Vaporizer 2: Penturi tube 3: Penturi part 4: Gas supply port 5: Gas delivery port 6
:Liquid silicon source suction port A:Tank applicant Toshiba Ceramics Corporation

Claims (1)

【特許請求の範囲】[Claims] (1)ベンチュリー管の一端にガス供給口を他端にガス
送出口を設けるとともに、ベンチュリー部に液体シリコ
ン・ソース吸引口を設け、供給ガス中に液体シリコン・
ソースを吸引気化させることを特徴とするベンチュリー
管型シリコン・ソース気化装置
(1) A gas supply port is provided at one end of the venturi tube, a gas delivery port is provided at the other end, and a liquid silicon source suction port is provided in the venturi section, so that liquid silicon source is added to the supply gas.
Venturi tube type silicon source vaporization device characterized by suctioning and vaporizing the source
JP3182788A 1988-02-16 1988-02-16 Venturi tube type silicon source vaporization device Pending JPH01207923A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3182788A JPH01207923A (en) 1988-02-16 1988-02-16 Venturi tube type silicon source vaporization device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3182788A JPH01207923A (en) 1988-02-16 1988-02-16 Venturi tube type silicon source vaporization device

Publications (1)

Publication Number Publication Date
JPH01207923A true JPH01207923A (en) 1989-08-21

Family

ID=12341910

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3182788A Pending JPH01207923A (en) 1988-02-16 1988-02-16 Venturi tube type silicon source vaporization device

Country Status (1)

Country Link
JP (1) JPH01207923A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002068713A1 (en) * 2001-02-28 2002-09-06 Porter Instrument Company, Inc. Vaporizer
KR100853387B1 (en) * 2007-05-17 2008-08-21 두손산업 (주) Process liquid suction device in substrate manufacturing process
KR100967773B1 (en) * 2006-10-31 2010-07-05 에어 프로덕츠 앤드 케미칼스, 인코오포레이티드 Leak containment device for reactive gases
CN104091756A (en) * 2014-07-17 2014-10-08 上海华力微电子有限公司 Nozzle device of washing machine

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002068713A1 (en) * 2001-02-28 2002-09-06 Porter Instrument Company, Inc. Vaporizer
KR100967773B1 (en) * 2006-10-31 2010-07-05 에어 프로덕츠 앤드 케미칼스, 인코오포레이티드 Leak containment device for reactive gases
KR100853387B1 (en) * 2007-05-17 2008-08-21 두손산업 (주) Process liquid suction device in substrate manufacturing process
CN104091756A (en) * 2014-07-17 2014-10-08 上海华力微电子有限公司 Nozzle device of washing machine

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