JPH01237708A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH01237708A
JPH01237708A JP63066016A JP6601688A JPH01237708A JP H01237708 A JPH01237708 A JP H01237708A JP 63066016 A JP63066016 A JP 63066016A JP 6601688 A JP6601688 A JP 6601688A JP H01237708 A JPH01237708 A JP H01237708A
Authority
JP
Japan
Prior art keywords
voltage
semiconductor device
reference voltage
temperature
fluctuation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63066016A
Other languages
Japanese (ja)
Inventor
Hiroshi Noda
寛 野田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP63066016A priority Critical patent/JPH01237708A/en
Publication of JPH01237708A publication Critical patent/JPH01237708A/en
Pending legal-status Critical Current

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  • Bipolar Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)
  • Amplifiers (AREA)

Abstract

PURPOSE:To stabilize a semiconductor device to the fluctuation of a power source voltage, to fluctuate a current, which flows in an output side, to temperature fluctuation and to arbitrarily set a reference voltage with satisfactory accuracy by using a constant voltage source to utilize the band gap of the semiconductor device which is used for a semiconductor integrated circuit, etc. CONSTITUTION:A constant voltage circuit 7 to utilize the band gap of the semiconductor device is composed of a capacitor C for oscillation prevention, PNP transistors TrQ1 and TrQ2, NPN TrQ3-Q7 and resistors R1-R6 and a power source voltage VCC from a voltage source 1 is caused to be a low voltage and outputted to an output terminal 4. Then, a reference voltage Vref is outputted to a reference voltage terminal 6. An emitter area is adjusted so that the current density of the emitter parts of the TrQ6 and Q7 can be same and the voltage of both edges due to the current to flow to the resistor R5 is made constant according to the temperature changed. Then, regardless of the fluctuation of the power source voltage and temperature, the reference voltage Vref is arbitrarily set.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は半導体集積回路などに使用される半導体装置
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor device used in a semiconductor integrated circuit or the like.

〔従来の技術〕[Conventional technology]

第4図は、従来の定電流源を用いた場合の基準電圧に関
する半導体装置の回路図である。図において、(11は
電圧源、12!ハ電源電圧V(!Q、 )31はG N
 D 、 +41は出力端子VOUt 1. (Qj)
、(Q9)はnpnトランジスタ、(R5)、(R7)
、(R8)は抵抗である。
FIG. 4 is a circuit diagram of a semiconductor device regarding a reference voltage when a conventional constant current source is used. In the figure, (11 is a voltage source, 12!c power supply voltage V(!Q, )31 is G N
D, +41 is the output terminal VOUT1. (Qj)
, (Q9) are npn transistors, (R5), (R7)
, (R8) is a resistance.

次に動作について説明する。npn )ランジスタ(Q
8)、(Q9)のベース・エミッタ間電圧をそれぞれV
BP6. VBK9とし、抵抗(R9)、 (R8) 
、 (R5)を流れる電流をそれぞれX”+工8.工6
とし、npn )ランジスタ(Q、8)、(Q9)の逆
方向飽和電流を工eとするとき、エフ、工8は となる。但しVT −−、qは電気素曖、Rはポルツマ
ン定数、Tiケルビン温度である。npnトランジスタ
(Q、9 )のhlrE  が十分大きいとするとき、
Ia−15となる。よってVc c 、 VL)σT間
電圧Vは V=R5φ工6 となる。また0式は近似的に となる。
Next, the operation will be explained. npn ) transistor (Q
8), the voltage between the base and emitter of (Q9) is V.
BP6. VBK9, resistance (R9), (R8)
, the current flowing through (R5) is
When the reverse saturation current of npn transistors (Q, 8) and (Q9) is denoted by e, then F and f8 become as follows. However, VT --, q is an electric elementary vagueness, R is Portzmann's constant, and Ti Kelvin temperature. Assuming that hlrE of the npn transistor (Q, 9) is sufficiently large,
It becomes Ia-15. Therefore, the voltage V between Vcc and VL)σT becomes V=R5φ6. Also, the formula 0 becomes approximately.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来の半導体装I!1は以上のように構成されているの
でms電圧Macから0.1 Vなどのような小さな基
準電圧が必要な場合従来の方式では電源篭圧変切、温度
変動対して確度良く出力されず、したがって種度を同上
するとい9昧題があった。
Conventional semiconductor device I! 1 is configured as above, so when a small reference voltage such as 0.1 V from the ms voltage Mac is required, the conventional method does not output accurately against power supply voltage changes and temperature fluctuations. Therefore, there were nine questions regarding the degree of species.

この発明は上記のような課題を解決するためになされた
もので、電源電圧変動、温度変動に関係なく種度艮く任
意に設定できる基準電圧を得ることができる半導体装置
を得ることを目的とする。
This invention was made in order to solve the above-mentioned problems, and its purpose is to obtain a semiconductor device that can obtain a reference voltage that can be arbitrarily set to a wide variety of degrees regardless of power supply voltage fluctuations and temperature fluctuations. do.

〔課題勿解決するための手段〕[Means to solve problems]

この発明rc Qる半導体装置は、従来のバンドギャッ
プを利用した定電圧源を用いることにより電源電圧変動
に対して安定化させるとともに、m度変動に対して出力
側に流れる′1流を変動させることVCよりvcc、v
ou’r 1sJ1x8Eを種度艮く安定化ζせたもの
である。
The rc semiconductor device of the present invention uses a constant voltage source that utilizes a conventional band gap to stabilize against fluctuations in power supply voltage, and also to vary the current flowing to the output side against fluctuations of m degrees. From VC, vcc, v
It is a highly stabilized version of our'r 1sJ1x8E.

〔作用〕 この発明における半導体装置は、バンドギャップを利用
した定電圧源を用いることにより、電源電圧変動及び温
度変動に対して安定した動作が可能となる。
[Function] By using a constant voltage source using a band gap, the semiconductor device according to the present invention can operate stably against power supply voltage fluctuations and temperature fluctuations.

〔実施例〕〔Example〕

以下、この発明の一実施例ケ図について説明する。第1
図は半導体装置の回路図である。図において、…は電圧
源、(21はtsttvcct atはGND、141
は出力端子(VOUt 1 、+51,161は基準電
圧端子(Vr@f)、 (71は従来のバンドギャップ
を利用した定電圧回路(qは発根防止コンデンサ、(Q
l+、 (Q2 )はI)!1pl’ランジスタ、(Q
3 )〜(Q、’F )はnpnトランジスタ% (R
6)〜(R6)は抵抗である。
Hereinafter, one embodiment of the present invention will be explained. 1st
The figure is a circuit diagram of a semiconductor device. In the figure, ... is a voltage source, (21 is tsttvcct at GND, 141
is the output terminal (VOUT1, +51,161 is the reference voltage terminal (Vr@f), (71 is the constant voltage circuit using the conventional band gap (q is the rooting prevention capacitor, (Q
l+, (Q2) is I)! 1pl' transistor, (Q
3) ~ (Q,'F) are npn transistor% (R
6) to (R6) are resistances.

次に動作について説明する。npn)ランジスタ(Q6
)、(Q?)のエミッタ部分の電流密度が同じになるよ
うV(エミッタ面積?O14整すると、基準電圧端子(
61は基準電圧端子151と同じ基準電圧Vr@tとな
る・また抵抗(R5)と抵抗(R6)は、同じ種類の抵
抗とする。
Next, the operation will be explained. npn) transistor (Q6
), (Q?) so that the current densities in the emitter parts of
61 is the same reference voltage Vr@t as the reference voltage terminal 151. Also, the resistor (R5) and the resistor (R6) are of the same type.

ここで、温度Ta W 2!i℃(常温)のときの抵抗
(R5)及び抵抗(R6)の抵抗値をR5,R6とし、
抵抗(R5)の両端に掛る電圧f Vl、 (R5)を
流れる電流?工とするとき Vl−R5−工= −a 7ref   −−−−−−
−−一−−−■vl ” VC!cVOut     
 −−−−−−−−−−−−■となる。次vc 6度’
raがΔTK変化したときの抵抗(R5)の両端に掛る
電圧を72.抵抗の温度係数rαとするとき抵抗(R5
)、及び抵抗(R6)の抵抗値はそれぞれR5(1+α
ΔT)、 R6(1+αJT)となりv2は となる。よって■、■より抵抗(R5)の両端に掛る電
圧Vは V ! Vi +=w V、請一定 となり、温度変動に対して一定の頭となる。
Here, the temperature Ta W 2! Let the resistance values of resistance (R5) and resistance (R6) at i°C (room temperature) be R5 and R6,
Voltage f Vl applied across resistor (R5), current flowing through (R5)? Vl-R5-engine=-a 7ref ------
−−1−−−■vl ” VC!cVOut
−−−−−−−−−−−■ becomes. Next vc 6 degrees'
The voltage applied across the resistor (R5) when ra changes by ΔTK is 72. When the temperature coefficient of resistance is rα, the resistance (R5
), and the resistance value of the resistor (R6) is R5(1+α
ΔT), R6 (1+αJT), and v2 becomes. Therefore, from ■ and ■, the voltage V applied across the resistor (R5) is V! Vi +=w V, which is constant, has a constant head against temperature fluctuations.

また、電源電圧Vcc 121の変動に関しては従来の
バンドギャップを利用した電圧源を使用しているのでV
refは一定となり電圧Vは一定となる。
In addition, regarding fluctuations in the power supply voltage Vcc 121, since a voltage source using a conventional band gap is used, Vcc
ref becomes constant and voltage V becomes constant.

なお%第2図はこの発明による他の実施例を示す回路図
である。第1図の実施例との相違点は、基準電圧が電源
電圧Vcc Illからであるのに対しG N D 1
31からになっている。すなわち、 npnトランジス
タ(Q7)のコレクタからカレントミラー回路を成すp
np )ランジスタ(QIO)、(Q、ll)をフトし
て抵抗(R5)がG N D+slに接続されている。
Incidentally, FIG. 2 is a circuit diagram showing another embodiment according to the present invention. The difference from the embodiment in FIG. 1 is that the reference voltage is from the power supply voltage Vcc Ill, whereas G N D 1
It starts from 31. In other words, the current mirror circuit is formed from the collector of the npn transistor (Q7).
np) A resistor (R5) is connected to GND+sl after removing the transistor (QIO) and (Q, ll).

このような構成にすることにより、上記実施列と同様の
効果を奏する。
By adopting such a configuration, the same effects as the above-mentioned implementation row can be achieved.

また、第3図のように構成することKより抵抗の温度係
数に関係したバイアス源としても利用できる。
Moreover, the structure shown in FIG. 3 can also be used as a bias source related to the temperature coefficient of resistance.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明VCよればバンドギャップを利
用した定電圧源音用いて構成したので電源電圧変動及び
温度変動に無関係VC精度艮〈任意に設定できる基準電
圧VOUTが得られる効果がある。
As described above, since the VC of the present invention is constructed using a constant voltage source using a band gap, the VC accuracy is independent of power supply voltage fluctuations and temperature fluctuations (the reference voltage VOUT can be set arbitrarily).

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例?示す半導体装置の回路図
、第2図及び第8図はこの発明の他の実施gA1を示す
半導体装置の回路図、第4図は従来の半導体装置を示す
回路図である。 図においてIl+は電圧源%(21は゛イ源電圧VQC
%・3)ばGND、141は出力端子(VOTTt) 
、+51 + 161は基$電圧端子(Vref) 、
+71は電圧回路、+c)はtri防止コンデンサ、し
)、(q、2)、(Qxo)、(Qxx)。 (Ql2)はpnpトランジスタ、(Q3)l(Q4)
I(Q5)l(Ql、(Qt)、(Qx3)、(ci、
x4)、(Qla)はnpn )ランジスタ、 (R1
>、(R2)r(R3)、 (R4ン、(R5)、(R
6)は抵抗である。 なお、図中、同一符号は同一、又は相当部分ケ示す。
Is Figure 1 an example of this invention? 2 and 8 are circuit diagrams of a semiconductor device showing another embodiment gA1 of the present invention, and FIG. 4 is a circuit diagram showing a conventional semiconductor device. In the figure, Il+ is the voltage source % (21 is the source voltage VQC
%・3) is GND, 141 is the output terminal (VOTTt)
, +51 + 161 is the base voltage terminal (Vref),
+71 is a voltage circuit, +c) is a tri prevention capacitor, (q, 2), (Qxo), (Qxx). (Ql2) is a pnp transistor, (Q3)l(Q4)
I(Q5)l(Ql, (Qt), (Qx3), (ci,
x4), (Qla) is npn) transistor, (R1
>, (R2)r(R3), (R4n, (R5), (R
6) is resistance. In the drawings, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims]  バンドギャップを利用した定電圧源の電流供給部のベ
ースと第1のトランジスタのベースが接続され、任意の
基準電圧を設定するための第1の抵抗が第1のトランジ
スタのエミッタとGND間に接続され、第1のトランジ
スタのコレクタと電源電圧間に第2の抵抗が接続された
回路構成を特徴とする半導体装置。
The base of the current supply part of the constant voltage source using a bandgap is connected to the base of the first transistor, and the first resistor for setting an arbitrary reference voltage is connected between the emitter of the first transistor and GND. A semiconductor device characterized by a circuit configuration in which a second resistor is connected between the collector of the first transistor and a power supply voltage.
JP63066016A 1988-03-17 1988-03-17 Semiconductor device Pending JPH01237708A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63066016A JPH01237708A (en) 1988-03-17 1988-03-17 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63066016A JPH01237708A (en) 1988-03-17 1988-03-17 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH01237708A true JPH01237708A (en) 1989-09-22

Family

ID=13303715

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63066016A Pending JPH01237708A (en) 1988-03-17 1988-03-17 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH01237708A (en)

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