JPH01320233A - Dies for press-molding glass - Google Patents
Dies for press-molding glassInfo
- Publication number
- JPH01320233A JPH01320233A JP15297088A JP15297088A JPH01320233A JP H01320233 A JPH01320233 A JP H01320233A JP 15297088 A JP15297088 A JP 15297088A JP 15297088 A JP15297088 A JP 15297088A JP H01320233 A JPH01320233 A JP H01320233A
- Authority
- JP
- Japan
- Prior art keywords
- glass
- mold
- intermediate layer
- press
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000011521 glass Substances 0.000 title claims abstract description 87
- 238000000465 moulding Methods 0.000 title claims abstract description 28
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 29
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 29
- 229910052581 Si3N4 Inorganic materials 0.000 claims abstract description 22
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 22
- 235000012239 silicon dioxide Nutrition 0.000 claims abstract description 10
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 8
- 239000000758 substrate Substances 0.000 claims description 31
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 28
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 28
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 20
- 238000004544 sputter deposition Methods 0.000 abstract description 20
- 238000005498 polishing Methods 0.000 abstract description 2
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 238000007733 ion plating Methods 0.000 abstract 1
- 238000003754 machining Methods 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 80
- 239000002585 base Substances 0.000 description 29
- 239000007789 gas Substances 0.000 description 27
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 16
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 15
- 238000000034 method Methods 0.000 description 13
- 239000000463 material Substances 0.000 description 9
- 150000002500 ions Chemical class 0.000 description 8
- 239000002994 raw material Substances 0.000 description 8
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 6
- 238000001771 vacuum deposition Methods 0.000 description 6
- 239000001257 hydrogen Substances 0.000 description 5
- 229910052739 hydrogen Inorganic materials 0.000 description 5
- 230000007704 transition Effects 0.000 description 5
- 230000007547 defect Effects 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- 230000009477 glass transition Effects 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 4
- VXEGSRKPIUDPQT-UHFFFAOYSA-N 4-[4-(4-methoxyphenyl)piperazin-1-yl]aniline Chemical compound C1=CC(OC)=CC=C1N1CCN(C=2C=CC(N)=CC=2)CC1 VXEGSRKPIUDPQT-UHFFFAOYSA-N 0.000 description 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- 239000012298 atmosphere Substances 0.000 description 3
- 238000005422 blasting Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000004927 fusion Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000035484 reaction time Effects 0.000 description 3
- 239000005049 silicon tetrachloride Substances 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Chemical compound [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 2
- 229930195733 hydrocarbon Natural products 0.000 description 2
- 150000002430 hydrocarbons Chemical class 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000004554 molding of glass Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- IATRAKWUXMZMIY-UHFFFAOYSA-N strontium oxide Chemical compound [O-2].[Sr+2] IATRAKWUXMZMIY-UHFFFAOYSA-N 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- 241000282326 Felis catus Species 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 229910000272 alkali metal oxide Inorganic materials 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 230000003712 anti-aging effect Effects 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910052810 boron oxide Inorganic materials 0.000 description 1
- BRPQOXSCLDDYGP-UHFFFAOYSA-N calcium oxide Chemical compound [O-2].[Ca+2] BRPQOXSCLDDYGP-UHFFFAOYSA-N 0.000 description 1
- 239000000292 calcium oxide Substances 0.000 description 1
- ODINCKMPIJJUCX-UHFFFAOYSA-N calcium oxide Inorganic materials [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 229910000464 lead oxide Inorganic materials 0.000 description 1
- HTUMBQDCCIXGCV-UHFFFAOYSA-N lead oxide Chemical compound [O-2].[Pb+2] HTUMBQDCCIXGCV-UHFFFAOYSA-N 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 239000005304 optical glass Substances 0.000 description 1
- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- 238000005477 sputtering target Methods 0.000 description 1
- 238000005482 strain hardening Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Landscapes
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
- Physical Vapour Deposition (AREA)
- Surface Treatment Of Glass (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、ガラスプレス成形用型に関し、特にプレス成
形後に研磨等の後加工を必要としない高精度のガラスプ
レス成形品を得るための成形型に関する。Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a mold for glass press molding, and in particular to a mold for obtaining a high-precision glass press molded product that does not require post-processing such as polishing after press molding. Regarding types.
[従来技術1
ガラスプレス成形品を得るための成形型として、被成形
ガラスのプレス温度よりもガラス転移温度の高いガラス
を基盤材料とする成形型が知られており、このようなガ
ラス製の成形型として、特開昭62−226825号公
報には、成形型への被成形ガラスの融着を防止するため
に、ガラス基盤上に例えば炭素膜からなる融肴防辻層を
設けたものが知られている。[Prior art 1] As a mold for obtaining a glass press-molded product, a mold whose base material is glass whose glass transition temperature is higher than the pressing temperature of the glass to be molded is known. As a mold, Japanese Patent Laid-Open No. 62-226825 discloses a mold in which a melt-proof layer made of, for example, a carbon film is provided on a glass substrate in order to prevent the glass to be formed from being fused to the mold. It is being
[発明が解決しようとする課題]
上記の特開昭62−226825号公報に記載のガラス
製の成形型において、@老防止層である炭素膜は真空蒸
着法、スパッタリング法、イオンブレーティング法等に
よりガラス基盤上にコーティングされているが、本発明
者らの研究の結果、ガラス基盤上に炭素層をコーティン
グした場合は、基盤に対する炭素膜の付着力が乏しく、
炭素膜が経時とともに刺部し、下記のような問題点が生
じることが明らかとなった。[Problems to be Solved by the Invention] In the glass mold described in JP-A No. 62-226825, the carbon film serving as the anti-aging layer can be formed by a vacuum deposition method, a sputtering method, an ion blating method, etc. However, as a result of research by the present inventors, when a carbon layer is coated on a glass substrate, the adhesion of the carbon film to the substrate is poor;
It has become clear that the carbon film develops prickles over time, causing the following problems.
(2) 炭素膜の融着防止層としての機能を長期間に亘
って発揮することができず、成形型の寿命が短い。(2) The carbon film cannot function as a fusion prevention layer for a long period of time, and the life of the mold is short.
(へ) 成形型の型面に著しい肌荒れを生じ、形状精度
も損われるので、高面精度を有し、光学的にも欠陥のな
い所望のガラスプレス成形品を得ることができない。(f) Significant roughness occurs on the surface of the mold and the shape accuracy is impaired, making it impossible to obtain a desired glass press-molded product that has high surface accuracy and is optically free from defects.
従って本発明の課題は、基盤に対する炭素膜の付着力を
向上させて炭素膜の剥離を防止することにより、前記の
問題点(2)及び(ハ)を解消したガラスプレス成形用
型を提供することにある。Therefore, an object of the present invention is to provide a glass press molding mold that solves the problems (2) and (c) above by improving the adhesion of the carbon film to the base and preventing the carbon film from peeling off. There is a particular thing.
[課題を解決するための手段]
本発明は、上述の課題を解決するためになされたもので
あり、本発明のガラスプレス成形用型は、二酸化ケイ素
を主要成分とし、かつ製造されるべきガラスプレス成形
品の形状に対応する面形状を有でるガラス基盤と、該ガ
ラス基盤の前記面形状部分の上に少なくとも設けられた
炭化ケイ素及び/又は窒化ケイ素膜からなる中間層と、
該中間層の上に設けられた炭素膜からなる最上層とを含
むことを特徴とづる。[Means for Solving the Problems] The present invention has been made to solve the above-mentioned problems, and the glass press molding mold of the present invention has silicon dioxide as a main component, and the glass to be manufactured. a glass substrate having a surface shape corresponding to the shape of the press-formed product; an intermediate layer comprising a silicon carbide and/or silicon nitride film provided at least on the surface shape portion of the glass substrate;
and an uppermost layer made of a carbon film provided on the intermediate layer.
以下、本発明の詳細な説明する。The present invention will be explained in detail below.
本発明のガラスプレス成形用型は、基盤としてガラス基
盤を用いるものであり、該ガラス基盤は、■:二酸化ケ
イ素を主要成分とし、■:製造されるべきガラスプレス
成形品の形状に対応する面形状を有づるものである。The glass press molding mold of the present invention uses a glass base as a base, and the glass base has (1) silicon dioxide as a main component and (2) a surface corresponding to the shape of the glass press molded product to be manufactured. It has a shape.
先ず■の条件を満足するガラスの例としては、石英ガラ
ス又は47〜68重量%の二酸化ケイ素を第1成分とし
、更に6〜23重量%の酸化アルミニウムを第2成分と
して含むガラスが挙げられる。後者の二酸化ケイ素と酸
化アルミニウムとを必須成分として含むガラスは、必要
に応じて19重量%以下の酸化亜鉛、18重量%以下の
酸化マグネシウム及び13重量%以下の酸化ホウ素のう
ちの少なくとも1種を含有することができ、さらに酸化
カルシウム、酸化ストロンチウム、酸化バリウム、酸化
鉛、アルカリ金属酸化物、フッ素などの成分を少量含有
することができる。First, examples of glasses that satisfy the condition (2) include quartz glass or glass containing 47 to 68% by weight of silicon dioxide as a first component and further 6 to 23% by weight of aluminum oxide as a second component. The latter glass containing silicon dioxide and aluminum oxide as essential components may optionally contain at least one of 19% by weight or less of zinc oxide, 18% by weight or less of magnesium oxide, and 13% by weight or less of boron oxide. Furthermore, small amounts of components such as calcium oxide, strontium oxide, barium oxide, lead oxide, alkali metal oxides, and fluorine can be contained.
上述の石英ガラスのガラス転移温度は約1200℃、熱
膨張係数は5X10’/’Cであり、一方、上述の二酸
化ケイ素と酸化アルミニウムとを必須成分とするガラス
のガラス転移温度は600〜800℃、熱膨張係数は3
0X10’〜60X10’/”Cであって、両ガラスと
もにガラス転移温度が高く、熱膨張係数が小さいので、
ガラスプレス成形用型の基盤材料として好適である。The above-mentioned quartz glass has a glass transition temperature of about 1200°C and a thermal expansion coefficient of 5X10'/'C, while the above-mentioned glass containing silicon dioxide and aluminum oxide as essential components has a glass transition temperature of 600 to 800°C. , the coefficient of thermal expansion is 3
0X10' to 60X10'/''C, both glasses have high glass transition temperatures and low thermal expansion coefficients,
It is suitable as a base material for glass press molding molds.
次に■の条件を満足するガラス基盤は、基盤材料である
ガラスを冷間加工することにより、製造されるべきガラ
スプレス成形品の形状に対応する面形状に仕上げること
により形成することができるが、上述の二酸化ケイ素と
酸化アルミニウムとを必須成分として含むガラスの場合
は、熱軟化したこのガラスを所定形状を有する型に入れ
てプレス成形することにより形成するのが好ましい。そ
の理由は、この方法によれば、高精度の加工を必要とす
る型はマスター型だけとなり、このマスター型を用いて
、所定形状を有する多数の基盤を容易に安価に製作でき
るからである。なお、基盤の全体を上述のガラスのプレ
ス成形により形成する必要はなく、型の成形面に対応す
る形状の部分のみを作製し、これを他の基盤部分(ガラ
ス製でも良く、ガラス以外の他の材料で構成されても良
い)と接合することによりガラス基盤を得ても良い。Next, a glass base that satisfies the condition (■) can be formed by cold working the base material glass to give it a surface shape that corresponds to the shape of the glass press-molded product to be manufactured. In the case of a glass containing the above-mentioned silicon dioxide and aluminum oxide as essential components, it is preferable to form the glass by placing the thermally softened glass in a mold having a predetermined shape and press-molding it. The reason for this is that according to this method, the only mold that requires high-precision processing is the master mold, and by using this master mold, a large number of bases having a predetermined shape can be easily manufactured at low cost. Note that it is not necessary to form the entire base by the above-mentioned press molding of glass; instead, only a portion of the shape that corresponds to the molding surface of the mold is manufactured, and this is used to form other base portions (which may be made of glass or other materials other than glass). A glass substrate may be obtained by bonding with a glass substrate (which may be composed of a material such as
本発明のガラスプレス成形用型は、ガラス基盤の前記面
形状部分の上に少なくとも炭化ケイ素及び/又は窒化ケ
イ素膜からなる中間層を設けたものである。ガラス基盤
上に設けられた炭化ケイ素及び/又は窒化ケイ素膜を中
間層と呼ぶのは、後述の如く、その上に、被成形ガラス
の融着防止のための、炭素膜からなる最上層が設けられ
るからである。本発明者らの検討によれば、この中間層
は、前記のガラス基盤と最上層との密着性を向上させて
最上層の剥離を防止し、その結果、り最上層が融着防止
層としての機能を長期間に亘って発揮でき、成形型の寿
命を長くすることができ、経済的である、
(へ)成形型の型面の最大面粗さが低く押えられ、かつ
形状精度が高く保たれるので、高面精度を有し、光学的
にも欠陥のない所望のガラスプレス成形品を得ることか
できる
等の技術的効果が得られることが明らかとなった。The glass press molding mold of the present invention has an intermediate layer made of at least silicon carbide and/or silicon nitride film on the surface-shaped portion of the glass base. The silicon carbide and/or silicon nitride film provided on the glass substrate is called an intermediate layer because, as will be described later, a top layer made of a carbon film is provided thereon to prevent the glass to be formed from fusing. This is because it will be done. According to the studies of the present inventors, this intermediate layer improves the adhesion between the glass substrate and the top layer and prevents the top layer from peeling, and as a result, the top layer acts as an anti-fusing layer. (f) The maximum surface roughness of the mold surface is kept low and the shape accuracy is high. It has become clear that, as a result, it is possible to obtain technical effects such as the ability to obtain a desired glass press-molded product with high surface precision and no optical defects.
この中間層は厚さが通常1μm以下であるのが好ましい
。The thickness of this intermediate layer is preferably 1 μm or less.
炭化ケイ素及び/又は窒化ケイ素膜からなるこの中間層
はスパッタリング法、イオンブレーティング法、プラズ
マCVD法、真空蒸着法などの成膜手段により形成され
る。This intermediate layer made of silicon carbide and/or silicon nitride film is formed by a film forming method such as sputtering method, ion blasting method, plasma CVD method, or vacuum evaporation method.
炭化ケイ素膜からなる中間層をスパッタリング法で形成
する場合には、基盤温度250〜600°C,RFパワ
ー密度3〜15W/ci、スパッタリング時真空度5X
10’〜5 x 10−1torrの範囲で下記の組み
合せのスパッタターゲットとスパッタガスを用いてスパ
ッタリングを行なうのが好ましい。When forming an intermediate layer made of a silicon carbide film by sputtering, the substrate temperature is 250 to 600°C, the RF power density is 3 to 15 W/ci, and the degree of vacuum during sputtering is 5X.
It is preferable to perform sputtering using the following combination of sputter target and sputter gas in the range of 10' to 5 x 10 -1 torr.
ターゲット ガス
組み合せ■ SiCAr又は(Ar+82)■(SiC
+C)Ar又は(Ar+)−12)■ S i
(CH4+ A r )また窒化ケイ素膜からなる
中間層をスパッタリング法で形成するには、基盤温度2
50〜600℃、RFパワー密度3〜15W/cat、
スパッタリング時真空度5 x 10’ 〜5 x 1
0−’torrの範囲で下記の組み合せのスパッタター
ゲットとスパッタガスを用いてスパッタリングするのが
好ましい。Target gas combination■ SiCARr or (Ar+82)■(SiC
+C)Ar or (Ar+)-12)■ S i
(CH4+ A r ) Furthermore, in order to form an intermediate layer made of a silicon nitride film by a sputtering method, the substrate temperature is 2.
50~600℃, RF power density 3~15W/cat,
Vacuum degree during sputtering: 5 x 10' to 5 x 1
It is preferable to perform sputtering using the following combinations of sputter targets and sputter gases in the range of 0-'torr.
ターゲット ガス
組み合せ■ 5i3Na Ar又は(Ar+N2)■
3i N2又は(Ar+N2 )炭化ケイ素
膜からなる中間層をイオンブレーティング法で形成する
場合には、3iインゴツトを電子ビームなどで溶解蒸発
させたのち、CH4ガス等の炭化水素ガス又は該炭化水
素ガスとArガスとの混合ガスからなり、真空度が10
−2torr程度のグロー放電させた雰囲気を通して活
性化させて、250〜600℃に加熱された基盤上に炭
化ケイ素膜をMIWAさせるのが好ましい。なお、前記
グロー放電の代りに、高周波などにより、ガスと蒸発金
属をイオン化しても良い。Target gas combination■ 5i3Na Ar or (Ar+N2)■
When forming an intermediate layer consisting of a 3i N2 or (Ar+N2) silicon carbide film by the ion blasting method, the 3i ingot is melted and evaporated with an electron beam or the like, and then a hydrocarbon gas such as CH4 gas or the hydrocarbon gas is used. and Ar gas, and the degree of vacuum is 10.
It is preferable to activate the silicon carbide film through a glow discharge atmosphere of about -2 torr and MIWA the silicon carbide film on the substrate heated to 250 to 600°C. Note that instead of the glow discharge, the gas and the evaporated metal may be ionized by high frequency or the like.
窒化ケイ素膜からなる中間層をイオンブレーティング法
で形成するには、Siインゴットを電子ビームなどで溶
解蒸発させたのち、N2ガス又はN2ガスとArガスと
の混合ガスからなり、真空度がi o ’torr程度
のグロー放電させた雰囲気を通して活性化させて、25
0〜600℃に加熱された基盤上に窒化ケイ素膜を坩積
させるのが好ましい。なお、前記グロー放電の代りに、
高周波などにより、ガスと蒸発金属をイオン化しても良
い。To form an intermediate layer made of a silicon nitride film by the ion blating method, a Si ingot is melted and evaporated with an electron beam, and then a gas of N2 gas or a mixture of N2 gas and Ar gas is used, and the degree of vacuum is i. Activated through a glow discharge atmosphere of about o'torr,
Preferably, the silicon nitride film is bulk deposited on a substrate heated to 0-600°C. Note that instead of the glow discharge,
The gas and vaporized metal may be ionized by high frequency or the like.
炭化ケイ素膜からなる中間層をプラズマCVD法で形成
する場合には、DCプラズマCVD、RFプラズマCV
D、マイクロ波プラズマCVD等の方法が有効である。When forming an intermediate layer made of silicon carbide film by plasma CVD method, DC plasma CVD, RF plasma CV
D. Methods such as microwave plasma CVD are effective.
原料ガスとして四塩化ケイ素、プロパン、水素を用いて
、基盤温度700〜900℃、圧力0 、1〜300
torrの範囲で基盤上に炭化ケイ素膜を付着させるの
が好ましい。Using silicon tetrachloride, propane, and hydrogen as raw material gases, base temperature 700-900℃, pressure 0, 1-300℃
Preferably, the silicon carbide film is deposited on the substrate in the torr range.
窒化ケイ素膜からなる中間層をプラズマCVD法で形成
するには、同様にDCプラズマCVO。Similarly, DC plasma CVO is used to form an intermediate layer made of a silicon nitride film by plasma CVD.
RFプラズマCVD、マイクロ波プラズマCVD等の方
法が有効であり、原料ガスとして四塩化ケイ素、アンモ
ニア、水素を用いて、基盤温度700〜900℃、圧力
が0.1〜10torrの範囲で基盤上に窒化ケイ素膜
を付着させるのが好ましい。Methods such as RF plasma CVD and microwave plasma CVD are effective, and silicon tetrachloride, ammonia, and hydrogen are used as raw material gases to coat the substrate at a substrate temperature of 700 to 900°C and a pressure of 0.1 to 10 torr. Preferably, a silicon nitride film is deposited.
炭化ケイ素膜からなる中間層を真空蒸着法で形成する場
合には、10−4torr程度に真空排気されたチャン
バー内で回転している炭化ケイ素焼結体の外周面に接線
方向からCO2レーザ−ビームを104W/cd程度の
パワー密度で照射して、炭化ケイ素を蒸発させて対向し
た基盤に付着させるのが好ましい。なお、基盤温度は2
50〜600℃である。また、ルツボ内に炭化ケイ素焼
結体のタブレットを入れて電子ビームにより蒸発させて
、250〜600℃に加熱された基盤に付着させること
もできる。When forming an intermediate layer made of a silicon carbide film by a vacuum evaporation method, a CO2 laser beam is tangentially applied to the outer peripheral surface of a silicon carbide sintered body rotating in a chamber evacuated to about 10-4 torr. It is preferable to irradiate the silicon carbide with a power density of about 104 W/cd to vaporize the silicon carbide and attach it to the opposing substrate. In addition, the base temperature is 2
The temperature is 50-600°C. Alternatively, a tablet of silicon carbide sintered body may be placed in a crucible, evaporated by an electron beam, and attached to a substrate heated to 250 to 600°C.
窒化ケイ素膜からなる中間層を真空蒸着法で形成する場
合には、10−4torr程度に真空排気されたチャン
バー内で回転している窒化ケイ素焼結体の外周面に接線
方向からCO2レーザ−ビームを10’W/cm程度の
パワー密度で照射して、窒化ケイ素を蒸発させて対向し
た基盤に付着させるのが好ましい。なお基盤温度は25
0〜600℃である。また、ルツボ内に窒化ケイ素焼結
体のタブレットを入れて電子ビームにより蒸発させて2
50〜600℃に加熱された基盤に付着させることもで
きる。When forming an intermediate layer made of a silicon nitride film by a vacuum evaporation method, a CO2 laser beam is tangentially applied to the outer peripheral surface of a silicon nitride sintered body rotating in a chamber evacuated to about 10-4 torr. It is preferable to irradiate the silicon nitride with a power density of about 10'W/cm to vaporize the silicon nitride and deposit it on the opposing substrate. The base temperature is 25
The temperature is 0 to 600°C. In addition, a tablet of silicon nitride sintered body was placed in a crucible and evaporated with an electron beam.
It can also be applied to a substrate heated to 50-600°C.
なお炭化ケイ素と窒化ケイ素との混合物によって中間層
を形成しても良い。また中間層の一部を炭化ケイ素膜と
し、残りを窒化ケイ素膜とすることもできる。Note that the intermediate layer may be formed of a mixture of silicon carbide and silicon nitride. Further, part of the intermediate layer can be made of a silicon carbide film, and the rest can be made of a silicon nitride film.
本発明のガラスプレス成形用型は、上述の中間層の上に
、被成形ガラスの融着防止層としての炭素膜からなる最
上層が設けられている。この最上層は厚さが1μm以下
であるのが好ましい。In the glass press molding mold of the present invention, a top layer made of a carbon film is provided on the above-mentioned intermediate layer as a layer for preventing the fusion of glass to be formed. Preferably, this top layer has a thickness of 1 μm or less.
最上層を構成する炭素膜はスパッタリング法、プラズマ
CVD法、CVD法、真空蒸着法、イオンブレーティン
グ法等の手段により成膜される。The carbon film constituting the uppermost layer is formed by a sputtering method, a plasma CVD method, a CVD method, a vacuum evaporation method, an ion blating method, or the like.
炭素膜をスパッタリング法により形成する場合には、基
盤温度250〜600℃、RFパワー密度5〜15W/
cIi、スパッタリング時真空度5×10〜5 X 1
0−1torrの範囲でスパッタガスとしてArの如き
不活性ガスを、スパッタターゲットとしてグラファイト
を用いてスパッタリングするのが好ましい。When forming a carbon film by sputtering, the substrate temperature is 250 to 600°C, and the RF power density is 5 to 15 W/
cIi, degree of vacuum during sputtering 5 x 10 ~ 5 x 1
It is preferable to perform sputtering using an inert gas such as Ar as a sputtering gas in the range of 0-1 torr and using graphite as a sputtering target.
炭素膜をマイクロ波プラズマCVD法により形成する場
合には、基盤温度650〜i ooo℃、マイクロ波電
力200W〜IKW、ガス圧力10−2〜60Q to
rrの条着工に、原料ガスとしてメタンガスと水素ガス
を用いて成膜するのが好ましい。When forming a carbon film by the microwave plasma CVD method, the substrate temperature is 650 to 100°C, the microwave power is 200W to IKW, and the gas pressure is 10-2 to 60Q to
It is preferable to form a film using methane gas and hydrogen gas as raw material gases at the start of forming the rr strip.
炭素膜を真空蒸着法により形成する場合には、真空中で
炭素棒をアーク放電させて蒸発させ、蒸着するのが好ま
しい。When forming a carbon film by a vacuum evaporation method, it is preferable to evaporate the carbon rod by arc discharge in a vacuum.
炭素膜をイオンブレーティング法により形成する場合に
は、ベンゼンガスをイオン化するのが好ましい。When forming a carbon film by an ion blating method, it is preferable to ionize benzene gas.
ガラスプレス成形用型は、上型および下型並びにこれら
上、下型を滑動するように収納する案内型により基本的
に構成されるが、ガラス基盤、中間層および最上層によ
って構成すべきものは上型と下型であり、案内型は炭化
ケイ素焼結体等の通常の材料からなるものを用いても良
い。また、上型および下型の全体を三層構造とする必要
はなく、ガラス成形面のみを三層構造とすることもでき
る。A glass press molding mold basically consists of an upper mold, a lower mold, and a guide mold that slidably accommodates the upper and lower molds, but the upper mold is composed of a glass base, an intermediate layer, and a top layer. They are a mold and a lower mold, and the guide mold may be made of a normal material such as a silicon carbide sintered body. Further, it is not necessary that the entire upper mold and lower mold have a three-layer structure, and only the glass molding surface can have a three-layer structure.
また上型、下型のいずれか一方の中間層を炭化ケイ素膜
とし、他方の中間層を窒化ケイ素膜とすることもできる
。Further, the intermediate layer of either the upper mold or the lower mold may be a silicon carbide film, and the other intermediate layer may be a silicon nitride film.
[作用〕
本発明のガラスプレス成形用型はガラス基盤と、炭素膜
からなる最上層との間に、炭化ケイ素又は窒化ケイ素膜
からなる中間層を介在させたものであり、該中間層はガ
ラス基盤にも炭素膜からなる最上層にも親和性を有する
ので、ガラス基盤と炭素膜からなる最上層との密着性が
著しく向上する。[Function] The glass press molding mold of the present invention has an intermediate layer made of silicon carbide or silicon nitride film interposed between the glass base and the top layer made of carbon film, and the middle layer is made of glass. Since it has affinity for both the substrate and the top layer made of carbon film, the adhesion between the glass substrate and the top layer made of carbon film is significantly improved.
[実施例] 以下、本発明の詳細な説明する。[Example] The present invention will be explained in detail below.
実施例1
本発明の成形型を含むガラスプレス成形装置の一例を第
2図に示す。第2図において、成形型は上型1、下型2
及び案内型3で構成され、上型1及び下型2は案内型3
内に滑動するように収納されており、この上型1と下型
2との間に、成形されるべきガラス塊4がセットされる
。Example 1 An example of a glass press molding apparatus including a mold of the present invention is shown in FIG. In Figure 2, the molds are upper mold 1 and lower mold 2.
and a guide mold 3, and the upper mold 1 and the lower mold 2 are the guide mold 3.
A glass gob 4 to be molded is set between the upper mold 1 and the lower mold 2.
上型1および下型2は第1図に示すように、ガラス基盤
5の、製造されるべきガラスプレス成形品の形状に対応
する面形状部分の上に炭化ケイ素膜からなる中筒層6が
設けられ、この中間層6の上に、被成形ガラスの融着防
止層としての炭素膜からなる最上層7が設けられている
。ここに上記ガラス基盤5としては、原料組成が重量%
で5iO257,01AI20316.0、ZnO6,
0,MQO9,0,82037,0゜Na2O1,01
cao 1.0.BaO2,0、pbo i、o、
K2O1,oからなる、外径14.w、高さ約7umの
ガラス(転移温度690℃、熱膨張係数38x10−7
/’C)を精密加工して光学鏡面に仕上げたものを使用
した。またこの基盤5上の炭化ケイ素膜からなる中間層
6は下記条件でのスパッタリング法により形成され、そ
の膜厚は1000人であった。As shown in FIG. 1, the upper mold 1 and the lower mold 2 have a middle cylinder layer 6 made of a silicon carbide film on a surface shaped portion of a glass base 5 corresponding to the shape of the glass press-molded product to be manufactured. On this intermediate layer 6, a top layer 7 made of a carbon film is provided as a layer for preventing fusion of the glass to be formed. Here, as the glass substrate 5, the raw material composition is % by weight.
5iO257,01AI20316.0, ZnO6,
0,MQO9,0,82037,0°Na2O1,01
cao 1.0. BaO2,0, pbo i,o,
Consisting of K2O1,o, outer diameter 14. w, glass with a height of about 7 um (transition temperature 690 °C, coefficient of thermal expansion 38 x 10-7
/'C) was precision processed and finished into an optical mirror surface. Further, an intermediate layer 6 made of a silicon carbide film on this substrate 5 was formed by a sputtering method under the following conditions, and the film thickness was 1000.
中間層6形成のためのスパッタリング法条性基!l!湿
度 300℃
RFパワー密度 5W/i
真空度 5 X 10−3torr
ターゲツト SiC
スパッタガス Ar
さらにこの中間層6上の最上層7は下記条件でのスパッ
タリング法により形成され、その膜厚は500人であっ
た。Sputtering method group for forming intermediate layer 6! l! Humidity: 300°C RF power density: 5 W/i Vacuum level: 5 x 10-3 torr Target: SiC Sputtering gas: Ar Furthermore, the top layer 7 on the intermediate layer 6 was formed by sputtering under the following conditions, and its film thickness was 500 mm. Ta.
最上層7形成のためのスパッタリング法条件基盤温度
300℃
RFパワー密度 9 W / cji
真空度 5 X 10−3torr
ターゲツト C
スパッタガス Ar
次に、上記3層構造からなる上型1及び下型2を用い、
また案内型3として炭化ケイ素焼結体をを用いて成形型
を構成し、該成形型を用いてガラスのプレス成形を以下
のように行なった。すなわち、上記成形型内に、被成形
ガラスとして、PbOを多量に含む光学ガラス5F15
<転移温度445℃、熱膨張係数82 X 10”7/
”C1屈折率nd 1.70)のガラス塊4を入れて、
支持棒9の上に支持台10を介して配置し、N2雰囲気
にして、石英管11の外周に巻き付けたヒーター12に
より、成形型と共にガラス塊4を加熱し、押し棒13を
下降させて、520℃で、50?(y/crn2の圧力
で30秒間プレスした。その後圧力を解き、得られたガ
ラスプレス成形品を、上型1および下型2と接触させた
状態のまま上記転移温度まで徐冷し、次いで室温付近ま
で急冷して、ガラスプレス成形品を成形型から取り出し
た。Sputtering method conditions for forming the top layer 7 Base temperature
300°C RF power density 9 W/cji Vacuum degree 5 X 10-3 torr Target C Sputtering gas Ar Next, using the upper mold 1 and lower mold 2 having the above three-layer structure,
Further, a mold was constructed using a silicon carbide sintered body as the guide mold 3, and glass was press-molded using the mold in the following manner. That is, optical glass 5F15 containing a large amount of PbO is placed in the mold as the glass to be molded.
<Transition temperature 445℃, coefficient of thermal expansion 82 x 10”7/
"C1 refractive index nd 1.70) glass lump 4 is put in,
Placed on the support rod 9 via the support stand 10, heated the glass gob 4 together with the mold by the heater 12 wrapped around the outer periphery of the quartz tube 11 in an N2 atmosphere, and lowered the push rod 13. At 520℃, 50? (Pressed for 30 seconds at a pressure of y/crn2. After that, the pressure was released, and the obtained glass press molded product was slowly cooled to the above transition temperature while in contact with the upper mold 1 and lower mold 2, and then at room temperature. The glass press-molded product was then rapidly cooled to a temperature close to that of the original temperature, and the glass press-molded product was taken out from the mold.
このガラスプレス成形品は上、下型の面形状がそのまま
転写され、高面粘度を有するレンズであり、型との融着
がなく、光学的にも欠陥は認められなかった。The surface shapes of the upper and lower molds were directly transferred to this glass press-molded product, and the lens had high surface viscosity, was not fused to the mold, and no optical defects were observed.
このような成形操作を続けたところ、500回位から最
上層にわずかに肌荒れが見られるようになったが、10
00回までは使用に耐え得ることが判明した。1000
回成形操作を行なった侵、酸素プラズマアッシング法に
より最上層の炭素膜を除去し、中間層の最表面層を逆ス
パツタリングした後、再び最上層を形成し、以後のプレ
ス成形に供した。When this molding operation was continued, a slight roughness appeared on the top layer after about 500 times, but after 10
It was found that it could withstand use up to 00 times. 1000
After repeated molding, the uppermost carbon film was removed by oxygen plasma ashing, and the outermost surface layer of the intermediate layer was reverse sputtered, and then the uppermost layer was formed again and used for subsequent press molding.
実施例2
基盤材料として、原料組成が重量%で5io257.0
、Al20312.0.ZnO10゜0、It/100
6.0、CaO10,0,PbO3,0からなるガラ
ス(転移温度730”C1熱膨張係数43x10’/℃
)を用い、このガラスが熱軟化しているときに、これを
所望の面形状を有する型に入れて、不活性ガス(N2)
雰囲気中でプレス温度850℃、プレス圧力!50 K
9 / c虞2で30秒間プレス成形して、上型1およ
び下型2のための基盤5を得た。Example 2 As a base material, the raw material composition is 5io257.0 in weight%
, Al20312.0. ZnO10゜0, It/100
Glass consisting of 6.0, CaO10,0, PbO3,0 (transition temperature 730"C1 thermal expansion coefficient 43x10'/℃
), and when the glass is thermally softened, it is placed in a mold with the desired surface shape and heated with inert gas (N2).
Press temperature 850℃ in atmosphere, press pressure! 50K
Press molding was performed for 30 seconds at 9/c 2 to obtain a base 5 for the upper mold 1 and the lower mold 2.
次にこの基盤5上に、500人の炭化ケイ素膜からなる
中間層6を下記条件でのイオンブレーティング法により
成膜した。Next, on this substrate 5, an intermediate layer 6 consisting of a 500-layer silicon carbide film was formed by an ion blasting method under the following conditions.
中間層6形成のためのイオンブレーティング法色且
基盤温度 500℃
蒸発金属 3i
真空度 5 X 10−2torr
反応ガス CHa+Ar
電子ビーム 10KV、400〜450mAのパワー
さらに、この中間層6上に、1000人の炭素膜からな
る最上層7を下記条件でのマイクロ波プラズマCVD法
により成膜した。Ion Blating Method for Forming Intermediate Layer 6 Color and Substrate Temperature: 500°C Evaporated Metal: 3i Degree of Vacuum: 5 x 10-2 torr Reactive Gas: CHa + Ar Electron Beam: 10 KV, Power of 400 to 450 mA Further, on this intermediate layer 6, 1000 people The uppermost layer 7 consisting of a carbon film was formed by microwave plasma CVD under the following conditions.
最上層7形成のためのマイクロ被プラズマCVD法条件
基盤温度 700℃
原料ガス メタン+水素 100 cc/minメタン
濃度(CH4/CH4+H2)
8mo1%
マイクロ波パワー 500W
反応時間 90分間
得られた、基盤5、中間層6及び最上層7からなる上型
1及び下型2を用いて成形型を組み立て、ガラスのプレ
ス成形を実施した結果、3000回のプレス成形におい
ても成形型には変化が認められず、高面積度のガラスプ
レス成形品が得られた。Micro plasma CVD method conditions for forming the top layer 7 Base temperature: 700°C Raw material gas: Methane + hydrogen 100 cc/min Methane concentration (CH4/CH4 + H2): 8mo1% Microwave power: 500W Reaction time: 90 minutes As a result of assembling a mold using an upper mold 1 and a lower mold 2 consisting of an intermediate layer 6 and a top layer 7 and performing press molding of glass, no change was observed in the mold even after 3000 press moldings. A glass press molded product with a high area density was obtained.
実施例3
基盤材料として、石英ガラス(転移温度的1200℃)
を用い、これを冷間加工して、実施例1におけると同一
形状の基盤5を形成した。Example 3 As the base material, quartz glass (transition temperature: 1200°C)
This was cold-worked to form a base 5 having the same shape as in Example 1.
次にこの基盤5上に、3000人の窒化ケイ素膜からな
る中間層6を下記条件でのプラズマcvD法により成膜
した。Next, on this substrate 5, an intermediate layer 6 consisting of a 3000 silicon nitride film was formed by a plasma CVD method under the following conditions.
中間層6形成のためのプラズマCVD法条件原料ガス
四塩化ケイ素、窒素、水素
反応温度 800℃
反応時間 20分間
更にこの中間層6上に、3000人の炭素膜からなる最
上層7を下記条件でのマイクロ波プラズマCVD法によ
り成膜した。Plasma CVD method conditions raw material gas for forming the intermediate layer 6
Silicon tetrachloride, nitrogen, hydrogen Reaction temperature: 800° C. Reaction time: 20 minutes Further, on this intermediate layer 6, a top layer 7 consisting of a 3,000-layer carbon film was formed by microwave plasma CVD method under the following conditions.
最上層7形成のためのマイクロ被プラズマCVD法条件
基盤温度 900℃
原料ガス メタン+水素 150CC/Winメタン1
1度(CH4/CH4+H2)i51101%
マイクロ波パワー 550W
反応時間 40分間
得られた、基盤5、中間層6及び最上層7からなる」L
型1及び下型2を用いて成形型を組み立て、ガラスのプ
レス成形を実施した結果、実施例2と同様の結果が冑ら
れた。Micro plasma CVD method conditions for forming the top layer 7 Base temperature 900℃ Raw material gas Methane + hydrogen 150CC/Win methane 1
1 degree (CH4/CH4+H2) i51101% Microwave power 550W Reaction time 40 minutes Obtained "L" consisting of base 5, middle layer 6 and top layer 7
As a result of assembling a mold using mold 1 and lower mold 2 and press-molding glass, the same results as in Example 2 were obtained.
実施例4
基盤材料として石英ガラスを用い、実施例1と同様の条
件で中間層を形成し、実施例3と同様の最上層を形成し
た。ガラスのプレス成形を実施した結果、実施例2と同
様の結果が得られた。Example 4 Using quartz glass as the base material, an intermediate layer was formed under the same conditions as in Example 1, and an uppermost layer was formed in the same manner as in Example 3. As a result of press molding the glass, the same results as in Example 2 were obtained.
しR明の効果]
以上述べたように、本発明のガラスプレス成形用型は、
ガラス基盤と、炭素膜からなる最上層との密着性にすぐ
れているので、最上層の剥離が防止され、最上層の被成
形ガラスの@看防止層としての機能を長期間に亘って発
揮させることができ、成形型の寿命を長くすることがで
き経済的である。Effect of Light] As described above, the glass press molding mold of the present invention has the following effects:
The excellent adhesion between the glass base and the top layer made of carbon film prevents the top layer from peeling off, allowing the top layer to function as a prevention layer for glass to be formed over a long period of time. This makes it possible to prolong the life of the mold and is economical.
また成形型の型面の最大面粗さを低く抑え、かつ形状精
度を高く保つことができるので、高面精度を有し、光学
的にも欠陥のないガラスプレス成形品を得ることができ
る。Further, since the maximum surface roughness of the mold surface of the mold can be kept low and the shape accuracy can be kept high, it is possible to obtain a glass press-molded product that has high surface accuracy and is optically free from defects.
第1図は、本発明のガラスプレス成形用型の部分図、第
2図は、本発明のガラスプレス成形用型を含むガラスプ
レス成形Qllの概略図である。
1・・・上型、2・・・下型、3・・・案内型、4・・
・ガラス塊、5・・・ガラス基盤、6・・・中間層、7
・・・最上層、9・・・支持棒、10・・・支持台、1
1・・・石英管、12・・・ヒーター、13・・・押し
棒、14・・・熱電対。FIG. 1 is a partial view of a glass press molding mold of the present invention, and FIG. 2 is a schematic diagram of a glass press molding Qll including the glass press molding mold of the present invention. 1... Upper mold, 2... Lower mold, 3... Guide mold, 4...
・Glass lump, 5... Glass base, 6... Intermediate layer, 7
...Top layer, 9...Support rod, 10...Support stand, 1
1...Quartz tube, 12...Heater, 13...Push rod, 14...Thermocouple.
Claims (1)
ガラスプレス成形品の形状に対応する面形状を有するガ
ラス基盤と、該ガラス基盤の前記面形状部分の上に少な
くとも設けられた炭化ケイ素及び/又は窒化ケイ素膜か
らなる中間層と、該中間層の上に設けられた炭素膜から
なる最上層とを含むことを特徴とするガラスプレス成形
用型。1. A glass substrate containing silicon dioxide as a main component and having a surface shape corresponding to the shape of the glass press molded product to be manufactured, and silicon carbide and/or silicon carbide provided at least on the surface shape portion of the glass substrate. Alternatively, a glass press molding mold comprising an intermediate layer made of a silicon nitride film and an uppermost layer made of a carbon film provided on the intermediate layer.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63152970A JP2616964B2 (en) | 1988-06-21 | 1988-06-21 | Glass press mold |
| US07/622,288 US5125949A (en) | 1988-06-21 | 1990-12-07 | Mold for producing glass articles |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63152970A JP2616964B2 (en) | 1988-06-21 | 1988-06-21 | Glass press mold |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8306179A Division JP2723497B2 (en) | 1996-11-18 | 1996-11-18 | Manufacturing method of glass mold base |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01320233A true JPH01320233A (en) | 1989-12-26 |
| JP2616964B2 JP2616964B2 (en) | 1997-06-04 |
Family
ID=15552127
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63152970A Expired - Lifetime JP2616964B2 (en) | 1988-06-21 | 1988-06-21 | Glass press mold |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2616964B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03126628A (en) * | 1989-10-13 | 1991-05-29 | Canon Inc | Method for forming optical element and production of optical element-forming die |
| US7220448B2 (en) | 2003-12-26 | 2007-05-22 | Asia Optical Co., Inc. | Glass molding die and renewing method thereof |
| JP2022107529A (en) * | 2021-01-08 | 2022-07-21 | Hoya株式会社 | Glass molding die for optical element molding, and method for producing optical element |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7125844B2 (en) | 2018-01-26 | 2022-08-25 | Hoya株式会社 | glass mold |
| JP7066533B2 (en) * | 2018-06-04 | 2022-05-13 | Hoya株式会社 | Glass lens molding mold |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63151628A (en) * | 1986-12-15 | 1988-06-24 | Canon Inc | Optical element mold |
-
1988
- 1988-06-21 JP JP63152970A patent/JP2616964B2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63151628A (en) * | 1986-12-15 | 1988-06-24 | Canon Inc | Optical element mold |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03126628A (en) * | 1989-10-13 | 1991-05-29 | Canon Inc | Method for forming optical element and production of optical element-forming die |
| US7220448B2 (en) | 2003-12-26 | 2007-05-22 | Asia Optical Co., Inc. | Glass molding die and renewing method thereof |
| US7591151B2 (en) | 2003-12-26 | 2009-09-22 | Asia Optical Co., Inc. | Glass molding die and renewing method thereof |
| JP2022107529A (en) * | 2021-01-08 | 2022-07-21 | Hoya株式会社 | Glass molding die for optical element molding, and method for producing optical element |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2616964B2 (en) | 1997-06-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5125949A (en) | Mold for producing glass articles | |
| JPH0461816B2 (en) | ||
| JP2651266B2 (en) | Glass blank for manufacturing optical element and method for manufacturing the same | |
| JP2616964B2 (en) | Glass press mold | |
| JPS6359971B2 (en) | ||
| WO2010074109A1 (en) | Material for forming optical element and process for producing same | |
| JPS62202824A (en) | Production of pressed lens | |
| JP2001335334A (en) | Optical element-forming mold | |
| JPH04154634A (en) | Mold for optical element formation and its production | |
| JP2785888B2 (en) | Mold for optical element molding | |
| JP3492005B2 (en) | Glass optical element molding method | |
| JPH0477322A (en) | Glass blank for optical element manufacturing | |
| JP3341520B2 (en) | Optical lens manufacturing method | |
| JP2505897B2 (en) | Mold for optical element molding | |
| JP2971226B2 (en) | Method for manufacturing glass optical element molding die | |
| JP2723497B2 (en) | Manufacturing method of glass mold base | |
| JPH0333022A (en) | Forming die for glass formed body | |
| JP3046184B2 (en) | Method for manufacturing glass optical element | |
| JP2612621B2 (en) | Mold for optical element molding | |
| JP2000351636A (en) | Glass optical element molding method | |
| JP2962905B2 (en) | Method for manufacturing glass optical element molding die | |
| JPH0717391B2 (en) | Optical glass element press molding method | |
| JPH01313336A (en) | Member of mold for forming optical element | |
| JPH0925130A (en) | Optical element molding die and method of manufacturing the same | |
| JPH0280330A (en) | Optical element molding method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080311 Year of fee payment: 11 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090311 Year of fee payment: 12 |
|
| EXPY | Cancellation because of completion of term | ||
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090311 Year of fee payment: 12 |