JPH0170863U - - Google Patents

Info

Publication number
JPH0170863U
JPH0170863U JP1987162826U JP16282687U JPH0170863U JP H0170863 U JPH0170863 U JP H0170863U JP 1987162826 U JP1987162826 U JP 1987162826U JP 16282687 U JP16282687 U JP 16282687U JP H0170863 U JPH0170863 U JP H0170863U
Authority
JP
Japan
Prior art keywords
suction port
vacuum
chamber
ion
processing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987162826U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987162826U priority Critical patent/JPH0170863U/ja
Publication of JPH0170863U publication Critical patent/JPH0170863U/ja
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、この考案の一実施例に係るイオン処
理装置を示す概略図である。第2図は、第1図中
のクライオポンプの概略構造の一例を示す縦断面
図である。第3図および第4図は、それぞれ、従
来のイオン処理装置の例を示す概略図である。 2……イオンビーム、3……処理室、4,5…
…真空予備室、21〜41……真空弁、60,7
0……クライオポンプ、601,701……主吸
入口、602,702……補助吸入口。
FIG. 1 is a schematic diagram showing an ion processing apparatus according to an embodiment of this invention. FIG. 2 is a vertical cross-sectional view showing an example of the schematic structure of the cryopump in FIG. 1. FIGS. 3 and 4 are schematic diagrams showing examples of conventional ion processing apparatuses, respectively. 2...Ion beam, 3...Processing chamber, 4, 5...
...Vacuum preliminary chamber, 21-41...Vacuum valve, 60,7
0...Cryopump, 601,701...Main suction port, 602,702...Auxiliary suction port.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 真空中で基板にイオンビームを照射して当該基
板を処理するための処理室に、真空弁を介して、
基板を大気側と処理室間で搬送するための真空予
備室を隣接させた構造のイオン処理装置において
、排気速度が相対的に大きい主吸入口と相対的に
小さい補助吸入口とを有し両吸入口から同時に真
空排気可能なクライオポンプを設けて、その主吸
入口側から前記処理室を、補助吸入口側から前記
真空予備室をそれぞれ真空排気できるようにした
ことを特徴とするイオン処理装置。
A processing chamber for processing the substrate by irradiating the substrate with an ion beam in a vacuum is provided through a vacuum valve.
In an ion processing apparatus with a structure in which a vacuum preliminary chamber for transporting substrates between the atmosphere side and a processing chamber is adjacent to each other, an ion processing apparatus having a main suction port with a relatively high pumping speed and an auxiliary suction port with a relatively small pumping speed. An ion processing apparatus characterized in that a cryopump capable of simultaneously evacuating suction ports is provided, and the processing chamber can be evacuated from the main suction port side, and the vacuum preparatory chamber can be evacuated from the auxiliary suction port side. .
JP1987162826U 1987-10-24 1987-10-24 Pending JPH0170863U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987162826U JPH0170863U (en) 1987-10-24 1987-10-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987162826U JPH0170863U (en) 1987-10-24 1987-10-24

Publications (1)

Publication Number Publication Date
JPH0170863U true JPH0170863U (en) 1989-05-11

Family

ID=31447009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987162826U Pending JPH0170863U (en) 1987-10-24 1987-10-24

Country Status (1)

Country Link
JP (1) JPH0170863U (en)

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