JPH02124479A - 漏れ電流特性不良コンデンサの選別方法 - Google Patents

漏れ電流特性不良コンデンサの選別方法

Info

Publication number
JPH02124479A
JPH02124479A JP1218170A JP21817089A JPH02124479A JP H02124479 A JPH02124479 A JP H02124479A JP 1218170 A JP1218170 A JP 1218170A JP 21817089 A JP21817089 A JP 21817089A JP H02124479 A JPH02124479 A JP H02124479A
Authority
JP
Japan
Prior art keywords
capacitor
charging
measurement
capacitors
leakage current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1218170A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0243151B2 (da
Inventor
Yukio Harada
幸男 原田
Shiro Tanimoto
谷本　志郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CKD Corp
Original Assignee
CKD Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CKD Corp filed Critical CKD Corp
Priority to JP1218170A priority Critical patent/JPH02124479A/ja
Publication of JPH02124479A publication Critical patent/JPH02124479A/ja
Publication of JPH0243151B2 publication Critical patent/JPH0243151B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
JP1218170A 1989-08-24 1989-08-24 漏れ電流特性不良コンデンサの選別方法 Granted JPH02124479A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1218170A JPH02124479A (ja) 1989-08-24 1989-08-24 漏れ電流特性不良コンデンサの選別方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1218170A JPH02124479A (ja) 1989-08-24 1989-08-24 漏れ電流特性不良コンデンサの選別方法

Publications (2)

Publication Number Publication Date
JPH02124479A true JPH02124479A (ja) 1990-05-11
JPH0243151B2 JPH0243151B2 (da) 1990-09-27

Family

ID=16715724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1218170A Granted JPH02124479A (ja) 1989-08-24 1989-08-24 漏れ電流特性不良コンデンサの選別方法

Country Status (1)

Country Link
JP (1) JPH02124479A (da)

Also Published As

Publication number Publication date
JPH0243151B2 (da) 1990-09-27

Similar Documents

Publication Publication Date Title
US6556019B2 (en) Electronic battery tester
US5757192A (en) Method and apparatus for detecting a bad cell in a storage battery
EP0543316A1 (en) High frequency surge tester methods and apparatus
JP2760263B2 (ja) セラミックコンデンサの初期故障品のスクリーニング方法
JP4008173B2 (ja) 蓄電器の絶縁抵抗測定方法および絶縁抵抗測定装置
JP2001228226A (ja) バッテリーの劣化度判定装置及びバッテリーの劣化度判定装置における劣化度算出プログラムを記録した記録媒体
JP2003172757A (ja) 回路基板の絶縁検査装置及び絶縁検査方法
CN115166555A (zh) 一种电池大数据平台电池模块内阻异常识别方法及系统
JP2000228337A (ja) コンデンサの良否判別方法
CN114428216A (zh) 电池电流检测方法及装置、存储介质
JPH0243151B2 (da)
JPH0845538A (ja) 二次電池の絶縁検査装置
US6476617B1 (en) Method of sorting monolithic ceramic capacitors by measuring the insulation resistance thereof
JP2002313435A (ja) 電池の検査方法
JP2003107118A (ja) コンデンサの良否判定方法
JP3175654B2 (ja) コンデンサの測定端子接触検出方法
JP3040233B2 (ja) 半導体装置の検査方法
JP4650152B2 (ja) 電子部品の特性測定・選別方法および装置
JP3144224B2 (ja) セラミックコンデンサのスクリーニング方法
JP3807649B2 (ja) 積層セラミックコンデンサの選別方法
JPH10239368A (ja) コンデンサの測定端子接触検出方法および絶縁抵抗測定方法
JPH04267514A (ja) 電解コンデンサの製造方法
JP2972291B2 (ja) ダイオードの特性検査方法
JP4244791B2 (ja) コンデンサの良否判定方法および良否判定装置
JPH0714742A (ja) セラミック電子部品のスクリーニング方法