JPH02128098U - - Google Patents

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Publication number
JPH02128098U
JPH02128098U JP3613589U JP3613589U JPH02128098U JP H02128098 U JPH02128098 U JP H02128098U JP 3613589 U JP3613589 U JP 3613589U JP 3613589 U JP3613589 U JP 3613589U JP H02128098 U JPH02128098 U JP H02128098U
Authority
JP
Japan
Prior art keywords
hot air
grain
duct
furnace
drying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3613589U
Other languages
English (en)
Other versions
JPH0712871Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989036135U priority Critical patent/JPH0712871Y2/ja
Publication of JPH02128098U publication Critical patent/JPH02128098U/ja
Application granted granted Critical
Publication of JPH0712871Y2 publication Critical patent/JPH0712871Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Drying Of Solid Materials (AREA)

Description

【図面の簡単な説明】
第１図は本考案を実施した乾燥装置を示す一部
切欠正面図、第２図は同装置の横断平面図、第３
図は同装置の側面図、第４図は乾燥室内を示す一
部切欠拡大側面図、第５図は多孔両側壁を示す斜
視図である。 図中、Ａ……穀類乾燥装置、ａ……装置本体、
Ｂ……台車、１……乾燥室、２……熱風ダクト、
３……排出ダクト、４……穀類用流路、８……熱
風発生炉、９……送風機。

Claims (1)

  1. 【実用新案登録請求の範囲】 (1) 穀類の投入部を上部に有する乾燥室に対し
    て熱風発出炉と同炉から発生する熱風を炉内に送
    風させる送風機とを具設し、この乾燥室の内部に
    上記熱風発生炉からの熱風を吹出す熱風ダクトと
    、該熱風ダクトから吹出された熱風を排出する排
    出ダクトとを対向させて立設すると共に、該両ダ
    クト相互間に乾燥用熱風が横切る穀類用流路を形
    成し、前記投入部から投入した穀類をこの穀類用
    流路内を落下させながら乾燥させる穀類用乾燥装
    置において、前記熱風発生炉を装置の本体から取
    外し自在に設置した構造。 (2) 装置の本体を台車上にて構成した請求項１
    項記載の穀類乾燥装置。
JP1989036135U 1989-03-28 1989-03-28 穀類乾操装置 Expired - Lifetime JPH0712871Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989036135U JPH0712871Y2 (ja) 1989-03-28 1989-03-28 穀類乾操装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989036135U JPH0712871Y2 (ja) 1989-03-28 1989-03-28 穀類乾操装置

Publications (2)

Publication Number Publication Date
JPH02128098U true JPH02128098U (ja) 1990-10-22
JPH0712871Y2 JPH0712871Y2 (ja) 1995-03-29

Family

ID=31542107

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989036135U Expired - Lifetime JPH0712871Y2 (ja) 1989-03-28 1989-03-28 穀類乾操装置

Country Status (1)

Country Link
JP (1) JPH0712871Y2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015522150A (ja) * 2012-07-18 2015-08-03 李尚祐 室温乾燥システム

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
EP1509776A4 (en) 2002-05-23 2010-08-18 Cascade Microtech Inc PROBE TO TEST ANY TESTING EQUIPMENT
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
WO2005121824A2 (en) 2004-06-07 2005-12-22 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
JP4980903B2 (ja) 2004-07-07 2012-07-18 カスケード マイクロテック インコーポレイテッド 膜懸垂プローブを具えるプローブヘッド
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
DE202007018733U1 (de) 2006-06-09 2009-03-26 Cascade Microtech, Inc., Beaverton Messfühler für differentielle Signale mit integrierter Symmetrieschaltung
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4425753Y1 (ja) * 1965-11-22 1969-10-28
JPS6229090U (ja) * 1985-08-07 1987-02-21

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4425753Y1 (ja) * 1965-11-22 1969-10-28
JPS6229090U (ja) * 1985-08-07 1987-02-21

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015522150A (ja) * 2012-07-18 2015-08-03 李尚祐 室温乾燥システム

Also Published As

Publication number Publication date
JPH0712871Y2 (ja) 1995-03-29

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