JPH0216075U

JPH0216075U -

Info

Publication number: JPH0216075U
Application number: JP9386288U
Authority: JP
Priority date: 1988-07-15
Filing date: 1988-07-15
Publication date: 1990-02-01

Description

[Brief explanation of the drawing]

第１図は、この考案の一実施例を示す構成ブロ
ツク図、第２図は試験の第１段階の計測方法図、
第３図は、第２段階の計測方法図、第４図は試験
処理の流れ図、第５図は、実装プリント基板の回
路例である。図において、１は計算機部、２は定
電流電源部、３は電圧計測部、４は表示部、５は
２点プローブ部、６は切換スキヤナ部である。な
お、各図中同一符号は、同一又は相当部分を示す
。 Fig. 1 is a block diagram showing an embodiment of this invention, Fig. 2 is a measurement method diagram for the first stage of the test,
FIG. 3 is a diagram of the second-stage measurement method, FIG. 4 is a flowchart of the test process, and FIG. 5 is an example of the circuit of the mounted printed circuit board. In the figure, 1 is a computer section, 2 is a constant current power supply section, 3 is a voltage measurement section, 4 is a display section, 5 is a two-point probe section, and 6 is a switching scanner section. Note that the same reference numerals in each figure indicate the same or equivalent parts.

Claims

[Scope of utility model registration request]

A test device for diagnosing a defective location on a mounted printed circuit board is provided with a means for contacting a two-point probe having two probe points onto the pattern of the mounted printed circuit board, and a test device for diagnosing a defective location on a mounted printed circuit board. a constant current power supply unit that supplies a constant current to the pattern; a voltage measurement unit that measures the potential difference between the probes; a switching scanner unit that switches the connection between the constant current power supply unit, the voltage measurement unit, and the two-point probe; 1. A test device comprising: a computer section that processes information from the computer section; a program necessary for processing in the computer section; and a display section that displays the processed results.