JPH0225838U - - Google Patents

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Publication number
JPH0225838U
JPH0225838U JP10359888U JP10359888U JPH0225838U JP H0225838 U JPH0225838 U JP H0225838U JP 10359888 U JP10359888 U JP 10359888U JP 10359888 U JP10359888 U JP 10359888U JP H0225838 U JPH0225838 U JP H0225838U
Authority
JP
Japan
Prior art keywords
sample
ellipsometer
sample table
moving
measures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10359888U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10359888U priority Critical patent/JPH0225838U/ja
Publication of JPH0225838U publication Critical patent/JPH0225838U/ja
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案一実施例の概略構成図、第2図
は試料台の移動の例を示す図、第3図は試料の測
定点を示す図である。 1…He―Neレーザ、2…チヨツパ、3…ポ
ラライザ、4…λ/4板、5…アナライザ、6…
デイテクタ、7…試料台、8…試料、9…ステー
ジ駆動装置。
FIG. 1 is a schematic diagram of an embodiment of the present invention, FIG. 2 is a diagram showing an example of movement of a sample stage, and FIG. 3 is a diagram showing measurement points of a sample. 1... He-Ne laser, 2... Chipper, 3... Polarizer, 4... λ/4 plate, 5... Analyzer, 6...
Detector, 7... Sample stage, 8... Sample, 9... Stage drive device.

Claims (1)

【実用新案登録請求の範囲】 偏光を試料面に入射し、その反射光の偏光状態
を測定するエリプソメータにおいて、 試料を載置する試料台をその載置面と平行に移
動させる試料台移動手段を備えることを特徴とす
るエリプソメータ。
[Scope of Claim for Utility Model Registration] In an ellipsometer that makes polarized light incident on a sample surface and measures the polarization state of the reflected light, there is provided a sample table moving means for moving a sample table on which a sample is placed parallel to the mounting surface. An ellipsometer characterized by comprising:
JP10359888U 1988-08-04 1988-08-04 Pending JPH0225838U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10359888U JPH0225838U (en) 1988-08-04 1988-08-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10359888U JPH0225838U (en) 1988-08-04 1988-08-04

Publications (1)

Publication Number Publication Date
JPH0225838U true JPH0225838U (en) 1990-02-20

Family

ID=31334578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10359888U Pending JPH0225838U (en) 1988-08-04 1988-08-04

Country Status (1)

Country Link
JP (1) JPH0225838U (en)

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