JPH02260475A - Formation method of Josephson junction device - Google Patents
Formation method of Josephson junction deviceInfo
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- JPH02260475A JPH02260475A JP1078180A JP7818089A JPH02260475A JP H02260475 A JPH02260475 A JP H02260475A JP 1078180 A JP1078180 A JP 1078180A JP 7818089 A JP7818089 A JP 7818089A JP H02260475 A JPH02260475 A JP H02260475A
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- substrate
- thin film
- superconducting thin
- inorganic material
- josephson junction
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Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、論理回路、光スイッチング素f、情報記録デ
バイス等に用いられるジョセフソン接合素子の形成方法
に関するものである。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for forming a Josephson junction element used in logic circuits, optical switching elements f, information recording devices, and the like.
(従来の技術)
ジョセフソン接合の形式としてはポイントコンタクト型
、サンドイッチ型(StS型)、準平面型、ブリッジ型
等さまざまな形態が提案されている。なかでもブリッジ
型ジョセフソン接合素子は素Y−形態が単純な構造であ
るために、各社の金属超伝導薄膜およびB1PbBaO
超伝導薄膜において、ざまざまな形態の検討がなされて
きている。(Prior Art) Various types of Josephson junctions have been proposed, including point contact type, sandwich type (StS type), quasi-plane type, and bridge type. Among them, the bridge type Josephson junction device has a simple structure in the element Y-form, so it is difficult to use metal superconducting thin films and B1PbBaO
Various forms of superconducting thin films have been studied.
(Japn、 J、 Appl、 Phys、、 22
.544 (1983)、特開昭59−210678)
〔発明が解決しようとする課題〕
これらのブリッジ型シミ1セフソン接合素tは5括板全
面に超伝導薄膜を形成後、エツチング等によって所望の
ブリッジを形成するのが−・数的であった。しかしなが
ら近年発見されたセラミクス超伝導薄膜、たとえばYB
a2Cu、、07−δ6 ]]ミrllazCu、、0
.−δ0くδ< 1 ) 、 B15rCaCu系44
石ではその材料組成が複雑なこともあり、エツチングに
より、たとえばY、Ba、Cuなどのエツチング速度が
W、なるため、超伝導体の組成がエツチングにより変化
し、やすいという問題があった。このためエツチングに
より超伝導特性を示さなくなったり、パターンの結晶性
、再現性、均一性も良くないという欠点もあった。(Japn, J. Appl, Phys., 22
.. 544 (1983), Japanese Unexamined Patent Publication No. 59-210678) [Problem to be solved by the invention] These bridge-type stain 1 Sefson junction elements are made by forming a superconducting thin film on the entire surface of the five-layer plate, and then forming a desired bridge by etching or the like. It was numerical to form. However, recently discovered ceramic superconducting thin films, such as YB
a2Cu,,07-δ6]]mirllazCu,,0
.. -δ0kuδ<1), B15rCaCu system 44
Stone has a complex material composition, and the etching rate of Y, Ba, Cu, etc. becomes W, so there is a problem that the composition of the superconductor is easily changed by etching. For this reason, it has the disadvantage that it no longer exhibits superconducting properties due to etching, and the crystallinity, reproducibility, and uniformity of the pattern are also poor.
本発明は上記従来技術の問題点および課題に鑑みなされ
たものであり、新規なブリッジ形成方法により、情報記
録デバイス、各種論理回路等に有用なブリッジ型粒界シ
:lセフソン接合素子を形成しようとするものである。The present invention has been made in view of the above-mentioned problems and problems of the prior art, and attempts to form a bridge-type grain boundary Sefson junction element useful for information recording devices, various logic circuits, etc. using a new bridge forming method. That is.
(f1題を解決するための、11段)
本発明によれば、基板上に所望釘よりパターン化した無
機材料を形成後、該基板上に超伝導薄膜を成膜し、ジョ
セフソン接合素子を形成することにより、エツチング速
度程を経ることなく、再現性、結晶性、均一性を向上さ
せたジョセフソン接合を形成しうるものである。(11 steps to solve the f1 problem) According to the present invention, after forming an inorganic material patterned with a desired nail on a substrate, a superconducting thin film is formed on the substrate, and a Josephson junction element is formed. By forming this, a Josephson junction with improved reproducibility, crystallinity, and uniformity can be formed without increasing the etching rate.
本発明におい”C,基板1−に所望によりパターン化さ
れて形成されている無機材料は、超伝導薄膜のネガパタ
ーンとなるものである。In the present invention, the inorganic material formed in a desired pattern on the substrate 1- is a negative pattern of the superconducting thin film.
すなわち、基板1−の無機材料」二と、詠無機材料が形
成されていない基板上に、同一条件下で超伝導薄膜を成
膜した場合、該薄膜の無機材料上の超伝導特性が基板上
の特性より悪い、つまりジョセフソン接合素子として動
作させた時に、無機材料−Fの超伝導薄膜が超伝導特性
をほとんど示さなくなるように該無機材料は作用する。In other words, if a superconducting thin film is formed under the same conditions on a substrate on which no inorganic material is formed, as on the inorganic material of substrate 1-2, the superconducting properties of the thin film on the inorganic material will be different from those on the substrate. In other words, the inorganic material acts so that the superconducting thin film of inorganic material -F hardly exhibits superconducting properties when operated as a Josephson junction element.
これは無機材料と超伝導薄膜間における原子の拡散、格
子のミスマツチ、結晶性の低下等によるが、この結果と
して基板上の超伝導薄膜より臨界温度が低いかあるいは
超伝導性を示さなくなる。したがって、この条件を満た
すものであれば無機材料の種類は限定されるものではな
いが、種々の金属、酸化物、窒化物等を例示することが
でき、好ましいものとしては、Al、^u、 5in2
.^1203. znQ、 AIN等を挙げることがで
きる。This is due to atomic diffusion, lattice mismatch, and decreased crystallinity between the inorganic material and the superconducting thin film, but as a result, the critical temperature is lower than that of the superconducting thin film on the substrate, or the superconducting thin film no longer exhibits superconductivity. Therefore, the type of inorganic material is not limited as long as it satisfies this condition, but various metals, oxides, nitrides, etc. can be exemplified, and preferable ones include Al, ^u, 5in2
.. ^1203. Examples include znQ and AIN.
該無機材料の形成方法としては、マスクを使った蒸着や
、レジストバターニング等により行なうことができ、こ
れらの方法によれば基板、Eの任5αの位置に形成可能
であり、所望のネガパターンを形成することができる。The inorganic material can be formed by vapor deposition using a mask, resist patterning, etc. According to these methods, it can be formed at any position 5α on the substrate E, and a desired negative pattern can be formed. can be formed.
又、無機材料パターンは、EBn光パターニング等によ
り1μ−以下のバターニングが可能であるので、各ジョ
セフソン接合間距離を極めて小さくすることかでき、接
合数を大きくすることが1可能で高集積化にも有利であ
る。尚、該無機材料の厚みとしては数十〜数千入程度で
よい。又無機材料パターンは所望の個数のジョセフソン
接合が得ら第1るように形成すればよいが、基板十に格
子状に配置することにより、容易に高感度の粒界ジョセ
フソン接合アレイも形成することができる。In addition, the inorganic material pattern can be patterned to a size of 1μ or less by EBn optical patterning, etc., so the distance between each Josephson junction can be made extremely small, and the number of junctions can be increased by 1, allowing for high integration. It is also advantageous for The thickness of the inorganic material may range from several tens to several thousand pieces. In addition, although the inorganic material pattern can be formed in such a way that a desired number of Josephson junctions can be obtained, it is also possible to easily form a grain boundary Josephson junction array with high sensitivity by arranging it in a lattice pattern on the substrate. can do.
上記したように無機材料のネガパターンを形成した後、
次に超伝導薄膜を作成すれば、簡単にジョセフソン接合
アレイを形成することができる。また、ジョセフソン接
合アレイにすることによってノーマル抵抗値R,、およ
び超伝導臨界電流値ICが大きくなり、素子に印加でき
る電[fV−rcHNを上げることが5丁能となる。After forming a negative pattern of inorganic material as described above,
Next, by creating a superconducting thin film, a Josephson junction array can be easily formed. Further, by forming a Josephson junction array, the normal resistance value R and the superconducting critical current value IC become large, and it becomes possible to increase the electric current [fV-rcHN that can be applied to the element].
また、成膜する超伝導薄膜は、粒界ジョセフソン接合を
形成しつる超伝導物質の薄膜であれば良く、代表的には
Y−Ba−Cu−0,B1−5r−(:a−Cu−0等
を用いることができるが、その化合物組成をA−B−C
−Dと表わすときAがLa、 Ce、 Pr、 Nd。Further, the superconducting thin film to be formed may be a thin film of a superconducting material that forms grain boundary Josephson junctions, typically Y-Ba-Cu-0, B1-5r-(:a-Cu -0 etc. can be used, but the compound composition is A-B-C
- When expressed as D, A is La, Ce, Pr, or Nd.
I’m、 SIa、 Se、 Eu、 Gd、 Tb、
Dy、 llo、 Er、 Tb、 Lu。I'm, SIa, Se, Eu, Gd, Tb,
Dy, llo, Er, Tb, Lu.
旧、 TlおよびYよりなる群より選ばれた一種以上の
元素:BがBa、 Ca、 SrおよびPbよりなる群
から選ばれた一種以上の元素;CがV 、 Ti、 C
r、 Mr、。One or more elements selected from the group consisting of Tl and Y: B is one or more elements selected from the group consisting of Ba, Ca, Sr and Pb; C is V, Ti, C
r, Mr.
Fe、 Ni、 co、 Ag、 CdおよびCuより
なる群から選ばれた一種以Fの元素;DかSおよびOよ
りなる群から選ばれた一種以」二の元素である超伝導物
質による薄膜は薄膜化が容易であるため本発明による形
成方法に好適である。A thin film made of a superconducting material consisting of one or more elements selected from the group consisting of Fe, Ni, co, Ag, Cd and Cu; one or more elements selected from the group consisting of D, S and O Since it is easy to form a thin film, it is suitable for the forming method according to the present invention.
基板上への超伝導薄膜の成膜方法としては、通常のスパ
ッタ法、電子ビーム加熱法、抵抗加熱法、MBE法、C
VD法、イオンビーム法等が通用できるが、無機材料上
と基板状とで同一条件tで成膜できるものか好まし・い
。超伝導薄膜の厚みどしては 100 N1.0000
人程度程度い。Methods for forming superconducting thin films on substrates include conventional sputtering, electron beam heating, resistance heating, MBE, C
A VD method, an ion beam method, etc. can be used, but it is preferable to use a method that can form a film under the same conditions t on the inorganic material and on the substrate. The thickness of the superconducting thin film is 100 N1.0000
About the size of a person.
尚、基板上に成膜された超伝導薄膜は必要に応じて熱処
理されるが、基板は超伝導薄膜との熱膨張係数の近いも
のを選ぶことでさらにその耐久性を向上させることもで
きる。Note that the superconducting thin film formed on the substrate is heat-treated if necessary, but its durability can be further improved by selecting a substrate with a coefficient of thermal expansion close to that of the superconducting thin film.
この様に本発明に係るブリッジ形成方法によオIば、超
伝導薄膜は基板上に成膜律エッナング等の処理を受けな
いため5得られるジョセフソン接合素−fは再現性、結
晶性、均・性の優れたものとすることができ、又エツチ
ング等によらず、無機材料によるパターン形成によるた
めEB露光バターニング等により極めて小さい接合間距
離で各シ、。As described above, according to the bridge forming method according to the present invention, since the superconducting thin film is not subjected to processing such as film-forming etching on the substrate, the Josephson junction element obtained has good reproducibility, crystallinity, It is possible to achieve excellent uniformity and properties, and since the pattern is formed using an inorganic material rather than etching, each bond can be formed with an extremely small distance between the joints by EB exposure patterning or the like.
セフソン接合を形成でき、高感度の光スイツチング素子
、論理回路、情報記録デバイス等を作成することができ
る。Cefson junctions can be formed, and highly sensitive optical switching elements, logic circuits, information recording devices, etc. can be created.
尚、本発明における上記以外の構成については常法にし
たがって行なうことができる。It should be noted that configurations of the present invention other than those described above can be carried out according to conventional methods.
(実施例)
以下本発明を実施例によって、より11体的に説明する
。(Examples) The present invention will be explained in more detail below with reference to Examples.
実施例1
第1図、第2図に示す1程に従いジョセフソン接合素子
を形成した。まず昨結晶基板1(本例では、サファイア
(100)を用いた)七にバター=ニング材として無機
材料5i02を用いネガ形パターン2を作成した(第1
図)。Example 1 A Josephson junction element was formed according to step 1 shown in FIGS. 1 and 2. First, a negative pattern 2 was created using an inorganic material 5i02 as a buttering material on a crystal substrate 1 (in this example, sapphire (100) was used).
figure).
この基板上にY −11a −(: u −0をICB
法(クラスターイオンビーム法)で成膜した。この時の
成膜条件は、基板温度400℃、酸素分圧3 x lO
−’Torrで行い、蒸着材料としてY 、 Bad、
Cuをそれぞれ独立のクラスタ・−イオンガン「より
基板−1−7の組成が、Y :Ba:Cu=1 : 2
: 3になるように堆積速度を調節した。なお、Y用
のクラスターイオンガンの加速電圧は1にV、イオン化
電流は50mAとし、13aO用のクラスターイオンガ
ンの加速′電圧は05にV、イオン化電流は30mAと
し、Cu用の加速電圧は4 KV、イオン化’を流は2
00mAとした。なお堆積速度は200人/minで膜
厚は5000人だ2だ。ざらにこの基板を酸素雰囲気中
で940℃、1時間の熱処理を行い、超伝導薄1模3a
を作成した(第2図)。On this substrate, Y -11a -(: u -0 is ICB
The film was formed using the cluster ion beam method. The film forming conditions at this time were a substrate temperature of 400°C and an oxygen partial pressure of 3 x lO.
−'Torr, and the deposition materials were Y, Bad,
The composition of substrates 1-7 was Y:Ba:Cu=1:2 by using separate cluster ion guns.
: The deposition rate was adjusted to be 3. The acceleration voltage of the cluster ion gun for Y is 1 V, the ionization current is 50 mA, the acceleration voltage of the cluster ion gun for 13aO is 05 V, the ionization current is 30 mA, the acceleration voltage for Cu is 4 KV, Ionization flow is 2
It was set to 00mA. The deposition rate is 200 layers/min and the film thickness is 5000 layers. This substrate was roughly heat treated at 940°C for 1 hour in an oxygen atmosphere to form a superconducting thin 1 model 3a.
was created (Figure 2).
次に^U電極をつけて液体11eを用いて抵抗を測定1
ノだところサファイア1−のY−Ba−Cu−0薄1漠
3aは70にで抵抗0となり超伝導性を示したが、無機
材料(Si02) 2−hのY−Ha−(:u−0薄膜
3bは4にでも抵抗0にならず、超伝導性を示さず、ジ
ョセフソン接合が形成されていることが確認された。Next, attach the ^U electrode and measure the resistance using liquid 11e1
However, the Y-Ba-Cu-0 thin layer 3a of sapphire 1- exhibits superconductivity with zero resistance at 70, but the Y-Ha-(:u- It was confirmed that the resistance of the 0 thin film 3b did not become 0 even at 4, did not exhibit superconductivity, and that a Josephson junction was formed.
実施例2
Mg0 (100)基板上にマスクを利用したRFスパ
ッタ法でAl2O1パターン4を第3図に示す様に20
行20列作製した。そのn Al2O3パターン4の大
きさは7 It m 111とし、行間距@Aを3μm
に固定し、列間距離Bを0,5〜2μlと変化させBの
埴と応答周波数特性との関係を謳べた。Example 2 An Al2O1 pattern 4 was formed on a Mg0 (100) substrate by RF sputtering using a mask as shown in FIG.
20 rows and columns were created. The size of the n Al2O3 pattern 4 is 7 It m 111, and the line distance @A is 3 μm.
was fixed, and the inter-row distance B was varied from 0.5 to 2 μl to express the relationship between the clay of B and the response frequency characteristics.
この基板J、にnl−5r−1:aJ:u−0焼結体タ
ーゲットを用いてマスクを用いたRFスパッタ法で成i
15! L/たところロ1−5r−1;a−Cu−0薄
膜が形成された。この時の成膜条件は、基板温度<10
0℃、 Arガス圧力0.5Pa 、スパッタパワー!
00Wで堆積速度50人101in、 !IQ厚は40
00人であった。This substrate J was formed by RF sputtering using a mask using a nl-5r-1:aJ:u-0 sintered target.
15! L/Takoro 1-5r-1; a-Cu-0 thin film was formed. The film forming conditions at this time are that the substrate temperature is <10
0℃, Ar gas pressure 0.5Pa, sputtering power!
Deposition speed of 50 people and 101 inches at 00W! IQ thickness is 40
There were 00 people.
さらにこの基板を酸素雰囲気中で850℃、1時間の熱
処理を行い、Tc=70にとなる超伝導薄11I25
aを作成したく第3図)。表1にBの変化による特性の
変化を示す。This substrate was further heat-treated at 850°C for 1 hour in an oxygen atmosphere to obtain a superconducting thin 11I25 with Tc=70.
Figure 3). Table 1 shows changes in characteristics due to changes in B.
なお、2μ1llX2μ■のウィークジャンクシ;1ン
部1個をもつ粒界ジョセフソン接合では、1c=0.2
mA 、 ItN= 0.9ΩでIcRm= 0.18
mVであり、本発月によりfeltN積を大巾に改善で
きた。In addition, in a grain boundary Josephson junction with a weak junction of 2μ1ll×2μ■, 1c=0.2
mA, IcRm=0.18 at ItN=0.9Ω
mV, and the feltN product could be greatly improved by this development.
(発明の効果)
以上説明したように単結晶基板上にあらかじめ無機材料
でネガ形のパターンを形成した後、超伝導薄膜を形成す
るため、ネガ形パターンを制御することによって、粒界
ジョセフソン接合索子アレイの1cItN禎を大きくす
ることができ、デバイス動作時の印加電圧を大きくする
ことができる。(Effects of the Invention) As explained above, in order to form a superconducting thin film after forming a negative pattern using an inorganic material on a single crystal substrate, grain boundary Josephson junctions can be formed by controlling the negative pattern. The 1cItN voltage of the cable array can be increased, and the voltage applied during device operation can be increased.
また、超伝導薄膜形成後のエツチング工程を必要としな
いため、素子の再現性、結晶性、均一・性を向上させる
ことができ、品質の良い素子をつくることができる。Furthermore, since an etching step after forming the superconducting thin film is not required, the reproducibility, crystallinity, uniformity, and properties of the device can be improved, and high-quality devices can be manufactured.
第1図は実施例1で作製したジョセフソン接合素fの作
成工程のうち、基板上に無機材料が形成されている構成
を示す模式平面図、゛第2図は実施例1の第1図の次工
程で超伝導薄膜が成膜されている構成を示す模式平面図
、第3図は実施例2において作製したジョセフソン接合
素子の構成を示す模式平面図(一部省略)である。
1:基板
2.4=無機材料
3a、 5a:超伝導薄膜
lb、 5b:非超伝導薄膜
A:行間距離
B:列間距離FIG. 1 is a schematic plan view showing a configuration in which an inorganic material is formed on a substrate in the manufacturing process of the Josephson junction element f manufactured in Example 1, and FIG. FIG. 3 is a schematic plan view (partially omitted) showing the structure of the Josephson junction element fabricated in Example 2. FIG. 1: Substrate 2.4 = Inorganic material 3a, 5a: Superconducting thin film lb, 5b: Non-superconducting thin film A: Inter-row distance B: Inter-column distance
Claims (1)
所望によりパターン化した無機材料を基板上に形成後、
該基板上に超伝導薄膜を成膜することを特徴とするジョ
セフソン接合素子の形成方法。 2、前記超伝導薄膜の化合物組成をA−B−C−Dと表
わすとき、AがLa、Ce、Pr、Nd、Pm、Sm、
Sc、Eu、Gd、Tb、Dy、Ho、Er、Tm、Y
b、Lu、Bi、TlおよびYよりなる群より選ばれた
一種以上の元素;BかBa、Ca、SrおよびPbより
なる群より選ばれた一種以上の元素;CがV、Ti、C
r、Mn、Fe、Ni、Co、Ag、CdおよびCuよ
りなる群から選ばれた一種以上の元素;DがSおよびO
よりなる群から選ばれた一種以上の元素である請求項1
に記載のジョセフソン接合素子の形成方法。 3、前記超伝導薄膜の成膜を、基板上に形成した前記無
機材料上および該無機材料が形成されていない基板上で
同一条件下で行ない、該無機材料上の超伝導薄膜の臨界
温度(超伝導転移温度)を該基板上の超伝導薄膜の臨界
温度より低いかあるいは超伝導状態を示さない範囲にす
ることを特徴とする請求項1に記載の形成方法。[Claims] 1. In manufacturing a bridge type Josephson junction device,
After forming the inorganic material patterned as desired on the substrate,
A method for forming a Josephson junction element, comprising forming a superconducting thin film on the substrate. 2. When the compound composition of the superconducting thin film is expressed as A-B-C-D, A is La, Ce, Pr, Nd, Pm, Sm,
Sc, Eu, Gd, Tb, Dy, Ho, Er, Tm, Y
one or more elements selected from the group consisting of b, Lu, Bi, Tl and Y; B or one or more elements selected from the group consisting of Ba, Ca, Sr and Pb; C is V, Ti, C
one or more elements selected from the group consisting of r, Mn, Fe, Ni, Co, Ag, Cd and Cu; D is S and O
Claim 1 is one or more elements selected from the group consisting of
A method for forming a Josephson junction device as described in . 3. The superconducting thin film is formed under the same conditions on the inorganic material formed on the substrate and on the substrate on which the inorganic material is not formed, and the critical temperature of the superconducting thin film on the inorganic material ( 2. The method according to claim 1, wherein the superconducting transition temperature is lower than the critical temperature of the superconducting thin film on the substrate or within a range in which no superconducting state is exhibited.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1078180A JP2798958B2 (en) | 1989-03-31 | 1989-03-31 | Method of forming Josephson junction device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1078180A JP2798958B2 (en) | 1989-03-31 | 1989-03-31 | Method of forming Josephson junction device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02260475A true JPH02260475A (en) | 1990-10-23 |
| JP2798958B2 JP2798958B2 (en) | 1998-09-17 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1078180A Expired - Fee Related JP2798958B2 (en) | 1989-03-31 | 1989-03-31 | Method of forming Josephson junction device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2798958B2 (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63306677A (en) * | 1987-06-08 | 1988-12-14 | Matsushita Electric Ind Co Ltd | Superconducting device and its manufacturing method |
| JPS6414977A (en) * | 1987-07-09 | 1989-01-19 | Matsushita Electric Industrial Co Ltd | Superconducting device and manufacture thereof |
| JPH0228384A (en) * | 1988-06-15 | 1990-01-30 | Shimadzu Corp | josephson junction element |
-
1989
- 1989-03-31 JP JP1078180A patent/JP2798958B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63306677A (en) * | 1987-06-08 | 1988-12-14 | Matsushita Electric Ind Co Ltd | Superconducting device and its manufacturing method |
| JPS6414977A (en) * | 1987-07-09 | 1989-01-19 | Matsushita Electric Industrial Co Ltd | Superconducting device and manufacture thereof |
| JPH0228384A (en) * | 1988-06-15 | 1990-01-30 | Shimadzu Corp | josephson junction element |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2798958B2 (en) | 1998-09-17 |
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