JPH0227643A - Stabilizing heat electric field radiation electron gun - Google Patents

Stabilizing heat electric field radiation electron gun

Info

Publication number
JPH0227643A
JPH0227643A JP63174888A JP17488888A JPH0227643A JP H0227643 A JPH0227643 A JP H0227643A JP 63174888 A JP63174888 A JP 63174888A JP 17488888 A JP17488888 A JP 17488888A JP H0227643 A JPH0227643 A JP H0227643A
Authority
JP
Japan
Prior art keywords
electric field
electron gun
tip
needle tip
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63174888A
Other languages
Japanese (ja)
Other versions
JPH0628142B2 (en
Inventor
Katsuyoshi Tsunoda
角田 勝義
Ryuzo Aihara
相原 龍三
Satoru Ikeda
悟 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Denka Co Ltd
Original Assignee
Jeol Ltd
Denki Kagaku Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Denki Kagaku Kogyo KK filed Critical Jeol Ltd
Priority to JP17488888A priority Critical patent/JPH0628142B2/en
Publication of JPH0227643A publication Critical patent/JPH0227643A/en
Publication of JPH0628142B2 publication Critical patent/JPH0628142B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/063Electron sources
    • H01J2237/06308Thermionic sources
    • H01J2237/06316Schottky emission

Landscapes

  • Electron Sources, Ion Sources (AREA)
  • Cold Cathode And The Manufacture (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、電子顕微鏡等に用いられる熱電界放射電子銃
の安定化方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for stabilizing a thermal field emission electron gun used in an electron microscope or the like.

〔従来の技術と課題〕[Conventional technology and issues]

軸方位が<100>方位のタングステン単結晶針状チッ
プの先端にジルコニウムと酸素とからなる被覆層を設け
た、いわゆるZr/W熱電界放射電子銃は熱陰極に比べ
てエネルギー幅が狭く、輝度が高く、寿命が長いという
特長をもっている。この樺な特性からZr/W熱電界放
射電子銃は電子顕微鏡をはじめとする各種電子ビーム応
用機器に使われている。
A so-called Zr/W thermal field emission electron gun, which has a coating layer made of zirconium and oxygen on the tip of a tungsten single crystal needle tip with an axial orientation of <100>, has a narrower energy width and lower brightness than a hot cathode. It has the characteristics of high energy consumption and long life. Because of this characteristic, Zr/W thermal field emission electron guns are used in various electron beam application equipment such as electron microscopes.

Zr/W熱電界放射電子銃の放射電流の安定性はその針
状チップ先端の形状によって左右される。
The stability of the emission current of a Zr/W thermal field emission electron gun depends on the shape of the tip of its needle tip.

第3図(A)に示す様に針状チップの先端に(100)
面の平坦部(以下、これをファセットと呼ぶ)が形成さ
れているとき、放射電流は極めて安定であるが、このフ
ァセット形状が崩れ、第3図(B)の様な単純な曲面形
状となった場合には第4図に示すような周期的な放射電
流の変動が生じる。Zr/W熱電界放射電子銃の最適な
動作温度は1800にとされている〔文献:エル ダブ
リュー スヮンソン アンド デイ タグル:アプリケ
ーシッンズ オブ サーフェス サイエンス(LJ、S
wans。
(100) at the tip of the needle tip as shown in Figure 3 (A).
When a flat part of the surface (hereinafter referred to as a facet) is formed, the radiation current is extremely stable, but this facet shape collapses and becomes a simple curved shape as shown in Figure 3 (B). In this case, periodic fluctuations in the radiation current as shown in FIG. 4 occur. The optimum operating temperature for a Zr/W thermal field emission electron gun is said to be 1800℃ [Reference: L.W. Swanson and Day Tag: Applications of Surface Science (LJ, S.
wans.

n and D、Tuggle : Applicat
ions of 5urface 5cience)第
8巻(1981年)、185−196頁〕。しかしなが
ら、この温度においてファセット形状を維持するために
はかなり高い電界を印加する必要があり、このときの放
射全電流は100〜数100μAにも達し、エネルギー
幅は増大する0例えば測長機の様に、電子銃を放射全電
流が数10μA程度の低い領域で動作させる場合には、
そのように高い電界を印加することが困難であり、針状
チップ先端のファセット形状を維持することができず、
安定に動作させることが難しい。
n and D, Tuggle: Applicat
ions of 5 surface 5 science), Volume 8 (1981), pp. 185-196]. However, in order to maintain the facet shape at this temperature, it is necessary to apply a fairly high electric field, and the total emitted current at this time reaches 100 to several 100 μA, and the energy width increases. In addition, when operating the electron gun in a region where the total emitted current is as low as several tens of μA,
It is difficult to apply such a high electric field, and the facet shape of the tip of the needle tip cannot be maintained.
Difficult to operate stably.

本発明はこの樺な問題点を解決し、Zr/W熱電界放射
電子銃を安定にする方法を提供することを目的とする。
The present invention aims to solve this problem and provide a method for stabilizing a Zr/W thermal field emission electron gun.

〔課題を解決するための手段〕 本発明者らは上記目的を達成するために、熱電界放射電
子銃の動作条件と安定性の関係について種々検討を行な
った結果、以下に示す処理を行なえば、それほど高くな
い電界、すなわち放射全電流が数10μA程度の動作に
おいても長時間安定な放射電流を得ることができること
を見出し本発明に至った。
[Means for Solving the Problem] In order to achieve the above object, the present inventors have conducted various studies on the relationship between the operating conditions and stability of a thermal field emission electron gun, and have found that the following processing can be carried out. The inventors have discovered that a stable radiation current can be obtained for a long time even in operation in a not so high electric field, that is, the total radiation current is on the order of several tens of microamperes, leading to the present invention.

すなわち、本発明は軸方位が<100>方位のタングス
テン単結晶針状チップの先端にジルコニウムと酸素とか
らなる被覆層を設けた針状チップを備えた熱電界放射電
子銃を、下記第1工程と第2工程の順で処理することを
特徴とする熱電界放射電子銃の安定化方法である。
That is, the present invention provides a thermal field emission electron gun equipped with a tungsten single crystal needle tip whose axial direction is <100>, and a coating layer made of zirconium and oxygen provided at the tip of the needle tip. This is a method for stabilizing a thermal field emission electron gun, characterized in that the steps are performed in the following order:

第1工程−針状チップの温度を1750に以上1900
に未満とし、0.15 V/Å以上0.3V/Å未満の
電界を印加する。
1st step - Temperature of needle tip to 1750 or more than 1900
An electric field of 0.15 V/Å or more and less than 0.3 V/Å is applied.

第2工程−・−針状チップの温度を1600に以上17
00に未満とし、0.05V/Å以上0.15 V/Å
未満の電界を印加する。
2nd step--The temperature of the needle tip is set to 1600 or above 17
less than 0.00, and 0.05V/Å or more and 0.15V/Å
Apply an electric field of less than

以下、本発明について詳しく説明する。まず、第1工程
において曲面形状となった該陰極先端がファセット形状
に再生される。このときの電界は0.15V/Å以上0
.3V/Å未満である。ただし、電界は次の式で定義さ
れる。
The present invention will be explained in detail below. First, the cathode tip, which became curved in the first step, is regenerated into a facet shape. The electric field at this time is 0.15V/Å or more
.. It is less than 3V/Å. However, the electric field is defined by the following formula.

ここで、F:電界(V/入)、 Vex:引出し電圧(V)、 r:チップ先端の曲率半径(人)、 d:チップ先端と引出し電極間の距離 (入)である。Here, F: electric field (V/in), Vex: extraction voltage (V), r: radius of curvature of tip tip (human), d: Distance between tip tip and extraction electrode It is (enter).

電界が0.15V/入未満ではファセットを再生するこ
とができず、また、0.3V/Å以上では針状チップ先
端を破損するおそれがあるからである。なお、このとき
の針状チップの温度は1750に以上1900に未満で
なければならない。1750に未満ではファセットの再
生に過大な時間を必要とし、また1900に以上では該
陰極の破損を招きやすいからである。
This is because if the electric field is less than 0.15 V/A, the facets cannot be reproduced, and if the electric field is more than 0.3 V/A, there is a risk of damaging the tip of the needle tip. Note that the temperature of the needle tip at this time must be 1,750 or more and less than 1,900. If it is less than 1750, it will take too much time to regenerate the facets, and if it is more than 1900, the cathode is likely to be damaged.

第1工程により熱電界放射陰極先端のファセットの再生
を行なった後には、第2工程として、電界と該陰極の温
度を下げる。電界のみを下げた場合には再生させたファ
セット形状が維持されず、ふたたび曲面形状へと変化し
てしまうため、該陰極の温度を同時に下げることが重要
である。このときの温度は1600に以上1750に未
満の範囲で、また電界は0.05V/Å以上0.15V
/入未満の範囲において、所望の放射電流が得られるま
で、それぞれ下げれば良い。温度1750に以上、ある
いは電界0.05V/Å未満では、ファセット形状を維
持する効果が乏しく、また、温度1600に未満、ある
いは電界0.15V/Å以上では放射電流のノイズやエ
ネルギー幅が増大するからである。
After the facets at the tip of the thermal field emission cathode are regenerated in the first step, the electric field and the temperature of the cathode are lowered in the second step. If only the electric field is lowered, the regenerated facet shape will not be maintained and will change to a curved shape again, so it is important to lower the temperature of the cathode at the same time. At this time, the temperature is in the range of 1600 to 1750, and the electric field is 0.05V/Å to 0.15V.
It is only necessary to lower the radiation current in the range below 0.0000000000000000000000000000000 though the irradiation current is less than 100%, respectively. At a temperature of 1,750 or more or an electric field of less than 0.05 V/Å, the effect of maintaining the facet shape is poor, and at a temperature of less than 1,600 or an electric field of 0.15 V/Å or more, the noise and energy width of the emitted current increases. It is from.

なお、第2工程における電界も前記の式で定義される。Note that the electric field in the second step is also defined by the above equation.

この様にして熱電界放射電子銃を安定化することができ
、以後は長時間安定な放射電流を得ることができる。
In this way, the thermal field emission electron gun can be stabilized, and thereafter a stable radiation current can be obtained for a long time.

〔実施例〕〔Example〕

以下、本発明の実施例について説明する。第1図は実施
例の回路図である。針状チップ1には直径0.125閣
の<ioo>方位タングステン単結晶を用い、この先端
の曲率半径は0.4μmであった。針状チップは加熱用
フィラメント2に溶接により固定されている。
Examples of the present invention will be described below. FIG. 1 is a circuit diagram of an embodiment. A tungsten single crystal with an <ioo> orientation having a diameter of 0.125 mm was used for the needle tip 1, and the radius of curvature of the tip was 0.4 μm. The needle tip is fixed to the heating filament 2 by welding.

針状チップはサプレッサー3から0.25−突き出して
いる。加熱用フィラメントとサプレッサーは絶縁ベース
4を介して固定されている。針状チップの先端と引出し
電極5の表面の中心までの距離は0.35m5である。
The needle tip protrudes 0.25 mm from the suppressor 3. The heating filament and suppressor are fixed via an insulating base 4. The distance between the tip of the needle tip and the center of the surface of the extraction electrode 5 is 0.35 m5.

引出し電極から48−の間隔をおいて接地電極6を設け
、その先にファラディ・カップ7を備えている。
A ground electrode 6 is provided at a distance of 48- from the extraction electrode, and a Faraday cup 7 is provided at the tip of the ground electrode 6.

加熱用電源8より加熱用フィラメント2に通電すること
で針状チップlを加熱する。サプレッサー電源9により
サプレッサー3に一300vを印加する。なお、この実
施例においては電圧はすべて針状チップ1の電位を基準
にして表示する。
The needle tip 1 is heated by supplying electricity to the heating filament 2 from the heating power source 8. -300V is applied to the suppressor 3 by the suppressor power supply 9. In this embodiment, all voltages are expressed based on the potential of the needle tip 1.

また、引出し電極5には引出し電源10により引出し電
圧(Vex)が印加される。電流計11により放射全電
流(It)が測定され、電流計12によりプローブ電流
(Ip)が測定される。針状チップ1の温度は放射温度
計(図示せず)を用い、放射率を0.44として測定さ
れる。
Further, an extraction voltage (Vex) is applied to the extraction electrode 5 by an extraction power source 10 . The total radiation current (It) is measured by the ammeter 11, and the probe current (Ip) is measured by the ammeter 12. The temperature of the needle tip 1 is measured using a radiation thermometer (not shown) with an emissivity of 0.44.

以上の装置による実験結果を第2図のグラフに示す、動
作開始後80時間までは針状チップの温度1800K、
引出し電圧1.7kV、すなわち電界(F)が0.11
V/Åで動作させた。このとき放射全電流は35〜40
μAの範囲で、またプローブ電流は2〜6nAの範囲で
それぞれ周期的な変動をくり返した。(図中の(a)部
)。
The experimental results using the above device are shown in the graph of Figure 2.The temperature of the needle tip was 1800K until 80 hours after the start of operation.
The extraction voltage is 1.7kV, that is, the electric field (F) is 0.11
It was operated at V/Å. At this time, the total radiation current is 35 to 40
Periodic fluctuations were repeated in the range of μA and the probe current in the range of 2 to 6 nA. (Part (a) in the figure).

次に80〜100時間においては、前記第1工程の条件
として温度1800にで、引出し電圧3、OkV、すな
わち0.20 V/Åの電界を印加した。
Next, for 80 to 100 hours, as the conditions for the first step, the temperature was 1800, and an electric field of 3 OkV, that is, 0.20 V/Å, was applied.

90時間以後は放射電流は全電流が115μAで、プロ
ーブ電流が23nAで安定となった(図中の(b)部)
After 90 hours, the total emission current was 115 μA and the probe current was stable at 23 nA (part (b) in the figure).
.

そこで100時間以後、温度を1700Kに下げ、同時
に引出し電圧を1.7kV、すなわち電界を0.11V
/Åに下げて動作させた(第2工程、図中の(C)部)
、この状態で放射電流は極めて安定となり、これ以後少
な(とも1000時間安定な動作が維持されていること
を確認した。
Therefore, after 100 hours, the temperature was lowered to 1700K, and at the same time the extraction voltage was increased to 1.7kV, that is, the electric field was reduced to 0.11V.
/Å (second step, part (C) in the figure)
In this state, the radiation current became extremely stable, and after that, it was confirmed that stable operation was maintained for 1000 hours.

なお、本実施例では、サプレッサー電圧は一300■で
一定としたが、これを変えることによっても、熱電界放
射電子銃に印加される電界を調節することが可能である
In this embodiment, the suppressor voltage was kept constant at -300 Ω, but the electric field applied to the thermal field emission electron gun can also be adjusted by changing this.

〔発明の効果〕〔Effect of the invention〕

本発明の方法によればそれまでは不安定であった熱電界
放射電子銃の機能を回復させ、長時間安定に動作させる
ことができる。
According to the method of the present invention, the function of the thermal field emission electron gun, which had been unstable up to that point, can be restored and the gun can be operated stably for a long period of time.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の方法を実施するための回路図である。 第2図は本発明の実施例を示すグラフである。第3図(
A) 、 (B)は針状チップ先端の斜視図であり、第
4図は放射電流の経時変化を示すグラフである。 符号 1−・針状チップ 2−加熱用フィラメント 3−サプレッサー 4−絶縁ベース 5−引出し電極 6−接地電極 7・−・ファラデイーカップ 8・・・加熱用電源 9−  サプレッサー電源 l〇−引出し電源 11−・電流計 12・−・電流計
FIG. 1 is a circuit diagram for implementing the method of the invention. FIG. 2 is a graph showing an embodiment of the present invention. Figure 3 (
A) and (B) are perspective views of the tip of the needle-like tip, and FIG. 4 is a graph showing changes in radiation current over time. Code 1 - Needle tip 2 - Heating filament 3 - Suppressor 4 - Insulating base 5 - Extraction electrode 6 - Grounding electrode 7 - Faraday cup 8 Heating power supply 9 - Suppressor power supply l〇 - Extraction power supply 11-・Ammeter 12・-・Ammeter

Claims (1)

【特許請求の範囲】 軸方位が<100>方位のタングステン単結晶針状チッ
プの先端にジルコニウムと酸素とからなる被覆層を設け
た針状チップを備えた熱電界放射電子銃を、下記第1工
程と第2工程の順で処理することを特徴とする熱電界放
射電子銃の安定化方法。 第1工程・・・針状チップの温度を1750K以上19
00K未満とし、0.15V/Å以上0.3V/Å未満
の電界を印加する。 第2工程・・・針状チップの温度を1600K以上17
50K未満とし、0.05V/Å以上0.15V/Å未
満の電界を印加する。
[Claims] A thermal field emission electron gun equipped with a tungsten single crystal needle tip whose axial direction is <100> oriented and a coating layer made of zirconium and oxygen provided at the tip thereof is provided by the following first method. 1. A method for stabilizing a thermal field emission electron gun, characterized in that a step and a second step are performed in this order. 1st step... Temperature of the needle tip is 1750K or higher19
00K and an electric field of 0.15 V/Å or more and less than 0.3 V/Å is applied. 2nd step...The temperature of the needle tip is 1600K or higher17
The temperature is less than 50K, and an electric field of 0.05 V/Å or more and less than 0.15 V/Å is applied.
JP17488888A 1988-07-15 1988-07-15 Stabilization method of thermal field emission electron gun Expired - Lifetime JPH0628142B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17488888A JPH0628142B2 (en) 1988-07-15 1988-07-15 Stabilization method of thermal field emission electron gun

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17488888A JPH0628142B2 (en) 1988-07-15 1988-07-15 Stabilization method of thermal field emission electron gun

Publications (2)

Publication Number Publication Date
JPH0227643A true JPH0227643A (en) 1990-01-30
JPH0628142B2 JPH0628142B2 (en) 1994-04-13

Family

ID=15986426

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17488888A Expired - Lifetime JPH0628142B2 (en) 1988-07-15 1988-07-15 Stabilization method of thermal field emission electron gun

Country Status (1)

Country Link
JP (1) JPH0628142B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5449968A (en) * 1992-06-24 1995-09-12 Denki Kagaku Kogyo Kabushiki Kaisha Thermal field emission cathode
US5616926A (en) * 1994-08-03 1997-04-01 Hitachi, Ltd. Schottky emission cathode and a method of stabilizing the same
JP2023093552A (en) * 2016-08-08 2023-07-04 エーエスエムエル ネザーランズ ビー.ブイ. Electron emitter and method of fabricating the same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5449968A (en) * 1992-06-24 1995-09-12 Denki Kagaku Kogyo Kabushiki Kaisha Thermal field emission cathode
US5616926A (en) * 1994-08-03 1997-04-01 Hitachi, Ltd. Schottky emission cathode and a method of stabilizing the same
JP2023093552A (en) * 2016-08-08 2023-07-04 エーエスエムエル ネザーランズ ビー.ブイ. Electron emitter and method of fabricating the same

Also Published As

Publication number Publication date
JPH0628142B2 (en) 1994-04-13

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