JPH023620Y2 - - Google Patents

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Publication number
JPH023620Y2
JPH023620Y2 JP1981147782U JP14778281U JPH023620Y2 JP H023620 Y2 JPH023620 Y2 JP H023620Y2 JP 1981147782 U JP1981147782 U JP 1981147782U JP 14778281 U JP14778281 U JP 14778281U JP H023620 Y2 JPH023620 Y2 JP H023620Y2
Authority
JP
Japan
Prior art keywords
substrate
container
epitaxial growth
solution
lid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981147782U
Other languages
Japanese (ja)
Other versions
JPS5853136U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1981147782U priority Critical patent/JPS5853136U/en
Publication of JPS5853136U publication Critical patent/JPS5853136U/en
Application granted granted Critical
Publication of JPH023620Y2 publication Critical patent/JPH023620Y2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【考案の詳細な説明】 本考案は液相エピタキシヤル成長装置に係り、
特に液相エピタキシヤル成長時に気相で種々の不
純物を添加することができ、かつ大きな面積の基
板を同時に処理できる液相エピタキシヤル成長装
置に関する。
[Detailed description of the invention] The present invention relates to a liquid phase epitaxial growth apparatus.
In particular, the present invention relates to a liquid phase epitaxial growth apparatus that can add various impurities in the vapor phase during liquid phase epitaxial growth and can simultaneously process large area substrates.

従来液相エピタキシヤル成長時に気相で不純物
を添加することができる液相エピタキシヤル成長
装置は第1図に示すように構成されている。基板
支持体11と、一体となつて溶液収容溜12及び
蓋体13をエピタキシヤル成長開始温度付近で、
相対的に移動させ、エピタキシヤル溶液14と基
板結晶15を接触させエピタキシヤル成長させる
もので、所要の不純物は気相より蓋体13に設け
られた多数の小孔16を介し添加するものであ
る。尚第1図で、aは溶液14と基板結晶15と
を接触させる前の状態を示し、bは溶液14と基
板結晶15とを接触させた後の状態を示してい
る。
A conventional liquid phase epitaxial growth apparatus capable of adding impurities in the vapor phase during liquid phase epitaxial growth is constructed as shown in FIG. The substrate support 11, together with the solution storage reservoir 12 and the lid 13, are heated near the epitaxial growth start temperature,
The epitaxial solution 14 and the substrate crystal 15 are brought into contact with each other by relative movement to cause epitaxial growth, and necessary impurities are added from the gas phase through a large number of small holes 16 provided in the lid 13. . In FIG. 1, a shows the state before the solution 14 and the substrate crystal 15 are brought into contact, and b shows the state after the solution 14 and the substrate crystal 15 are brought into contact.

この種の装置においては、多数の基板結晶15
を収容できるよう、基板支持台11を電気加熱炉
の軸方向温度分布の均一な部分の長さと同程度と
すると、蓋体13の一部は、温度分布の均一部外
に位置することとなり、この為基板支持台11の
長さ方向の温度分布の均一性が損われ、基板結晶
間で一様なエピタキシヤル成長が行われないとい
う難点があつた。更に、この種の成長装置を残留
不純物汚染の少ない石英等で構成した場合には、
長い距離を基板支持台11と蓋体13を相対的に
移動させる為、こわれ易いという取り扱い上の難
点があつた。
In this type of device, a large number of substrate crystals 15
If the length of the substrate support stand 11 is made to be approximately the same as the length of the uniform part of the axial temperature distribution of the electric heating furnace, a part of the lid body 13 will be located outside the uniform part of the temperature distribution. For this reason, the uniformity of the temperature distribution in the length direction of the substrate support 11 is impaired, resulting in the disadvantage that uniform epitaxial growth is not performed between the substrate crystals. Furthermore, if this type of growth apparatus is constructed of quartz or the like with little residual impurity contamination,
Since the substrate support 11 and the lid 13 are relatively moved over a long distance, there is a problem in handling that they are easily broken.

一方、第2図に示した同種の成長装置において
は、上記したような難点は除かれている。第2図
に示した装置においては、室温で予め基板結晶と
エピタキシヤル融液を接触させておく為、エピタ
キシヤル成長過程において、基板支持台21と蓋
体23を相対的に移動させることはなく、上記し
た難点は生じない。しかるに、この種の成長装置
では、室温において基板結晶とエピタキシヤル融
液14を接触させる為、基板結晶15表面或いは
融液14表面の酸化物被膜若しくは、有機物被膜
が充分除去できず、融液14と基板結晶15との
接触が不完全となり、良好なエピタキシヤル成長
が行われないという難点が生じてしまう。
On the other hand, in the same type of growth apparatus shown in FIG. 2, the above-mentioned difficulties are eliminated. In the apparatus shown in FIG. 2, the substrate crystal and the epitaxial melt are brought into contact with each other in advance at room temperature, so the substrate support 21 and the lid 23 are not moved relative to each other during the epitaxial growth process. , the above-mentioned difficulties do not arise. However, in this type of growth apparatus, since the substrate crystal and the epitaxial melt 14 are brought into contact with each other at room temperature, the oxide film or organic film on the surface of the substrate crystal 15 or the surface of the melt 14 cannot be sufficiently removed. The contact between the substrate crystal 15 and the substrate crystal 15 is incomplete, resulting in a problem that good epitaxial growth cannot be performed.

本考案の目的は、上記したような難点の生じな
い、かつ多数の基板結晶を収容できる液相エピタ
キシヤル成長装置を提供することにある。
An object of the present invention is to provide a liquid phase epitaxial growth apparatus that does not have the above-mentioned difficulties and can accommodate a large number of substrate crystals.

本考案は、基板支持台と、上部に開口部を有す
る蓋体とを、相対的に固定し、基板支持台長及び
成長装置全体の長さを加熱炉の軸方向の均熱部長
と同程度にすることにより、均熱を損うことな
く、多数の基板結晶を収容することを可能とし、
かつ、エピタキシヤル溶液と基板結晶をエピタキ
シヤル成長開始温度付近で接触可能にならしめた
ことを特徴とするものである。
In the present invention, the substrate support table and the lid body having an opening at the top are fixed relatively to each other, and the length of the substrate support table and the length of the entire growth apparatus are approximately the same as the axial soaking section of the heating furnace. By making it possible to accommodate a large number of substrate crystals without compromising uniform heating,
The present invention is also characterized in that the epitaxial solution and the substrate crystal can come into contact at around the epitaxial growth start temperature.

以下、本考案の成長装置を図面を参照して説明
する。
Hereinafter, the growth apparatus of the present invention will be explained with reference to the drawings.

第3図及び第4図は、本考案の液相エピタキシ
ヤル成長装置の一実施例を概略的に示したもの
で、第3図及び第4図共にaは平面図、bはa図
のB−B′線で切断した時の断面図、cはa図の
C−C′線で切断した時の断面図である。この装置
は石英からなり、基板収容体31、スペーサー3
2、溶液蓋33及び溶液溜34そして溶液溜34
の底部に孔35aが設けられ、またスペーサ32
にも孔35bが設けられ、溶液溜34と基板収容
体31との相対的移動で孔35a,35b同志が
連結可能になつている。溶液蓋33には、多数の
開孔部36が設けられている。液相エピタキシヤ
ル成長を行う場合には、基板37、ガリウム溶液
38をそれぞれ所定の位置に入れ、溶液溜34を
第3図のように位置させ、溶液溜34の孔35a
とスペーサー32の孔35bとが一致(連結)し
ないようにした状態にし反応管の中に入れる。反
応管内を高純度水素ガスで置換した後加熱を開始
し、液相成長開始温度まで昇温させ、所定の時間
保温する。しかる後スライド棒39にて溶液溜3
4を移動させ、溶液溜34の孔35aとスペーサ
ー32の孔35bとが一致するようにし、溶液3
8を溶液蓋33と基板収容体31により区切られ
た空間に流し込む。所定時間経た後所定の降温速
度で所定温度冷却させ、液相エピタキシヤル層を
得る。この時雰囲気ガス中に微量の硫化水素及
び、アンモニアガスを混入させておくと、溶液蓋
33に設けられた多数の小孔36を介して溶液3
8に硫黄及び窒素が添加され、窒素ドープのn型
エピタキシヤル成長層が得られる。次に、所定時
間温度を保持し雰囲気ガス中への硫化水素添加を
止め、亜鉛蒸気の混入を開始する。しかる後、徐
冷を再開し、前述の窒素添加のn型エピタキシヤ
ル層上に窒素添加のp型エピタキシヤル層を成長
させる。
FIGS. 3 and 4 schematically show an embodiment of the liquid phase epitaxial growth apparatus of the present invention, in which a is a plan view and b is a top view of FIG. -C is a cross-sectional view taken along the line C-C' in figure a. This device is made of quartz, and includes a substrate container 31 and a spacer 3.
2. Solution lid 33, solution reservoir 34, and solution reservoir 34
A hole 35a is provided at the bottom of the spacer 32.
A hole 35b is also provided in the hole 35b, and the holes 35a and 35b can be connected to each other by relative movement of the solution reservoir 34 and the substrate container 31. The solution lid 33 is provided with a large number of openings 36 . When performing liquid phase epitaxial growth, the substrate 37 and the gallium solution 38 are placed in their respective predetermined positions, the solution reservoir 34 is positioned as shown in FIG. 3, and the hole 35a of the solution reservoir 34 is
and the hole 35b of the spacer 32 so that they do not match (connect), and then put into the reaction tube. After replacing the inside of the reaction tube with high-purity hydrogen gas, heating is started, the temperature is raised to the liquid phase growth starting temperature, and the temperature is kept for a predetermined period of time. After that, use the slide rod 39 to remove the solution reservoir 3.
4 so that the hole 35a of the solution reservoir 34 and the hole 35b of the spacer 32 match, and the solution 3
8 is poured into the space defined by the solution lid 33 and the substrate container 31. After a predetermined period of time, the mixture is cooled to a predetermined temperature at a predetermined cooling rate to obtain a liquid phase epitaxial layer. At this time, if a trace amount of hydrogen sulfide and ammonia gas are mixed into the atmospheric gas, the solution 3 will pass through the many small holes 36 provided in the solution lid 33.
Sulfur and nitrogen are added to 8 to obtain a nitrogen-doped n-type epitaxial growth layer. Next, the temperature is maintained for a predetermined period of time, the addition of hydrogen sulfide to the atmospheric gas is stopped, and the mixing of zinc vapor is started. Thereafter, slow cooling is restarted, and a nitrogen-doped p-type epitaxial layer is grown on the nitrogen-doped n-type epitaxial layer.

上記した実施例によれば、ガリウム溶液38及
び基板37の表面に付着した酸化物被膜或いは有
機物被膜は高温中で水素雰囲気にさらされる為、
充分に除去され、極めて良好なエピタキシヤル成
長が行われる。更にボート全体の長さが基板収容
体31の長さと等しい為、基板収容体31の長さ
を加熱炉の均熱長と同程度とすることができ、同
一の炉で基板37の収容能力を向上させることが
可能となる。
According to the embodiment described above, since the oxide film or organic film attached to the surface of the gallium solution 38 and the substrate 37 is exposed to a hydrogen atmosphere at high temperature,
Sufficient removal results in very good epitaxial growth. Furthermore, since the length of the entire boat is equal to the length of the substrate container 31, the length of the substrate container 31 can be made approximately the same as the soaking length of the heating furnace, and the storage capacity of the substrates 37 can be increased in the same furnace. It becomes possible to improve the performance.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図a,b、第2図は従来の液相エピタキシ
ヤル成長装置の概略断面図、第3図a,b,c及
び第4図a,b,cは本考案に基く液相エピタキ
シヤル成長装置の概略断面図である。 31……基板収容体、32……スペーサー、3
3……溶液蓋、34……溶液溜、35a及び35
b……孔、36……開孔部、37……基板、38
……ガリウム溶液、39……スライド棒。
Figures 1a, b, and 2 are schematic cross-sectional views of conventional liquid phase epitaxial growth equipment, and Figures 3 a, b, and c and Figures 4 a, b, and c are schematic cross-sectional views of liquid phase epitaxial growth equipment based on the present invention. FIG. 2 is a schematic cross-sectional view of a growth apparatus. 31...Substrate container, 32...Spacer, 3
3... Solution lid, 34... Solution reservoir, 35a and 35
b... Hole, 36... Opening part, 37... Substrate, 38
...Gallium solution, 39...Slide rod.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 複数の半導体基板を収容する基板収容体と、該
収容体の半導体基板直上に所定空間を介して設け
た複数の小孔を有する蓋体と、前記半導体基板直
上以外の底部に孔を設けた融液収容体と、該融液
収容体を、基板1枚を収容する基板収容体の長さ
より短かい距離移動してその収容体の孔からその
直下に設けた孔を介して前記空間部に融液を挿入
して前記半導体基板に接触させる手段と、前記蓋
体と複数の小孔から気相で不純物を添加する手段
とを具備した液相エピタキシヤル成長装置。
A substrate accommodating body for accommodating a plurality of semiconductor substrates, a lid body having a plurality of small holes formed directly above the semiconductor substrates of the accommodating body via a predetermined space, and a melting body having holes formed in a bottom part other than directly above the semiconductor substrates. The liquid container and the melt container are moved a distance shorter than the length of the substrate container that accommodates one substrate, and the melt is introduced into the space through a hole in the container and a hole provided directly below the substrate container. A liquid phase epitaxial growth apparatus comprising: means for inserting a liquid to contact the semiconductor substrate; and means for adding impurities in a vapor phase through the lid and a plurality of small holes.
JP1981147782U 1981-10-06 1981-10-06 Liquid phase epitaxial growth equipment Granted JPS5853136U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1981147782U JPS5853136U (en) 1981-10-06 1981-10-06 Liquid phase epitaxial growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981147782U JPS5853136U (en) 1981-10-06 1981-10-06 Liquid phase epitaxial growth equipment

Publications (2)

Publication Number Publication Date
JPS5853136U JPS5853136U (en) 1983-04-11
JPH023620Y2 true JPH023620Y2 (en) 1990-01-29

Family

ID=29940628

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1981147782U Granted JPS5853136U (en) 1981-10-06 1981-10-06 Liquid phase epitaxial growth equipment

Country Status (1)

Country Link
JP (1) JPS5853136U (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4939376A (en) * 1972-08-14 1974-04-12
JPS5639538A (en) * 1979-09-07 1981-04-15 Hitachi Ltd Pattern forming method
JPS5690573A (en) * 1979-12-24 1981-07-22 Toshiba Corp Liquid phase growing process for light emitting diode

Also Published As

Publication number Publication date
JPS5853136U (en) 1983-04-11

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