JPH0247064U - - Google Patents

Info

Publication number
JPH0247064U
JPH0247064U JP1988125795U JP12579588U JPH0247064U JP H0247064 U JPH0247064 U JP H0247064U JP 1988125795 U JP1988125795 U JP 1988125795U JP 12579588 U JP12579588 U JP 12579588U JP H0247064 U JPH0247064 U JP H0247064U
Authority
JP
Japan
Prior art keywords
light
state imaging
imaging device
solid
impurities
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1988125795U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988125795U priority Critical patent/JPH0247064U/ja
Publication of JPH0247064U publication Critical patent/JPH0247064U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の固体撮像装置の一例の要部を
模式的に示す断面図、第2図は不純物を導入した
ポリシリコン膜と不純物を導入しないポリシリコ
ン膜の透過率の波長依存性を示す特性図、第3図
は従来の固体撮像装置の一例の要部を模式的に示
す断面図である。 1……遮光膜、10……シリコン基板、11…
…受光部、14……垂直電荷転送部、16……転
送電極。
Fig. 1 is a cross-sectional view schematically showing the main part of an example of the solid-state imaging device of the present invention, and Fig. 2 shows the wavelength dependence of the transmittance of a polysilicon film with impurities introduced and a polysilicon film without impurities introduced. The characteristic diagram shown in FIG. 3 is a sectional view schematically showing a main part of an example of a conventional solid-state imaging device. 1... Light shielding film, 10... Silicon substrate, 11...
... Light receiving section, 14 ... Vertical charge transfer section, 16 ... Transfer electrode.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 受光部以外の装置表面を被覆する遮光膜を、不
純物を導入した半導体膜で形成したことを特徴と
する固体撮像装置。
A solid-state imaging device characterized in that a light-shielding film covering a surface of the device other than a light-receiving portion is formed of a semiconductor film into which impurities are introduced.
JP1988125795U 1988-09-27 1988-09-27 Pending JPH0247064U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988125795U JPH0247064U (en) 1988-09-27 1988-09-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988125795U JPH0247064U (en) 1988-09-27 1988-09-27

Publications (1)

Publication Number Publication Date
JPH0247064U true JPH0247064U (en) 1990-03-30

Family

ID=31376717

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988125795U Pending JPH0247064U (en) 1988-09-27 1988-09-27

Country Status (1)

Country Link
JP (1) JPH0247064U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002231913A (en) * 2001-01-30 2002-08-16 Hamamatsu Photonics Kk Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002231913A (en) * 2001-01-30 2002-08-16 Hamamatsu Photonics Kk Semiconductor device

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