JPH0250959A - Method and apparatus for forming thin film of rare earth metal - Google Patents
Method and apparatus for forming thin film of rare earth metalInfo
- Publication number
- JPH0250959A JPH0250959A JP19944988A JP19944988A JPH0250959A JP H0250959 A JPH0250959 A JP H0250959A JP 19944988 A JP19944988 A JP 19944988A JP 19944988 A JP19944988 A JP 19944988A JP H0250959 A JPH0250959 A JP H0250959A
- Authority
- JP
- Japan
- Prior art keywords
- vacuum
- rare earth
- torr
- target
- earth metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910052761 rare earth metal Inorganic materials 0.000 title claims abstract description 29
- 150000002910 rare earth metals Chemical class 0.000 title claims abstract description 29
- 239000010409 thin film Substances 0.000 title claims abstract description 21
- 238000000034 method Methods 0.000 title claims abstract description 15
- 239000000758 substrate Substances 0.000 claims abstract description 26
- 229910052751 metal Inorganic materials 0.000 claims abstract description 25
- 239000002184 metal Substances 0.000 claims abstract description 25
- 239000011261 inert gas Substances 0.000 claims abstract description 10
- 239000000956 alloy Substances 0.000 claims abstract description 5
- 229910045601 alloy Inorganic materials 0.000 claims abstract description 5
- 238000004544 sputter deposition Methods 0.000 claims description 14
- 238000001755 magnetron sputter deposition Methods 0.000 claims 2
- 230000015572 biosynthetic process Effects 0.000 abstract description 4
- 238000007599 discharging Methods 0.000 abstract description 3
- 230000005389 magnetism Effects 0.000 abstract description 2
- 230000006866 deterioration Effects 0.000 abstract 1
- 230000001105 regulatory effect Effects 0.000 abstract 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 10
- 239000010936 titanium Substances 0.000 description 10
- 229910052719 titanium Inorganic materials 0.000 description 10
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 8
- 229910052786 argon Inorganic materials 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- 239000010408 film Substances 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 229910052688 Gadolinium Inorganic materials 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910052692 Dysprosium Inorganic materials 0.000 description 2
- 229910052771 Terbium Inorganic materials 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 239000000498 cooling water Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000004453 electron probe microanalysis Methods 0.000 description 2
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 2
- 238000004949 mass spectrometry Methods 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 101100327917 Caenorhabditis elegans chup-1 gene Proteins 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- -1 Gd (gadolinium) Chemical class 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、希土類金属薄膜の製膜方法および製膜装置に
関する。更に詳しくは、スパッタリング法による希土類
金属薄膜の製膜方法および製膜装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method and apparatus for forming a rare earth metal thin film. More specifically, the present invention relates to a method and apparatus for forming a rare earth metal thin film using a sputtering method.
従来から、金属薄膜を製膜する方法の一つとして、スパ
ッタリンク法が用いられている。このスパッタリング法
においては、金属薄膜の製膜を開始する前に、スパッタ
リンク装置の真空チャンバ内の真空度を10−″Tor
rのオーダー、好ましくは1.0−7Torrのオーダ
ーの高真空度迄排気する必要がある。Conventionally, a sputter link method has been used as one of the methods for forming metal thin films. In this sputtering method, the degree of vacuum in the vacuum chamber of the sputter link apparatus is set to 10-'' Tor before starting the formation of the metal thin film.
It is necessary to evacuate to a high degree of vacuum on the order of r, preferably on the order of 1.0-7 Torr.
このような排気には、一般に油拡散ポンプ、クライオポ
ンプ、分子ターボポンプなどが用いられており、1.0
−7Torrのオーダーに迄排気するには、真空チャン
バの容積やポンプの能力にもよるが、一般には約2時間
程度を必要としている。For such evacuation, oil diffusion pumps, cryopumps, molecular turbo pumps, etc. are generally used.
Evacuation to the order of -7 Torr generally requires about 2 hours, although it depends on the volume of the vacuum chamber and the capacity of the pump.
そこで、数分間乃至10分間程度の排気で得られる10
−5Torr台でスパッタリング法による製膜を行なう
と、活性な希土類金属、例えばGd(ガドリニウム)、
Tb(テルビウム)、Dy(ジスプロシウム)などは、
そこに残存するわずかな量の残留酸素と結合してしまい
、純粋な希土類金属薄膜が得られなくなる。Therefore, 10
When film formation is performed by sputtering on a -5 Torr table, active rare earth metals, such as Gd (gadolinium),
Tb (terbium), Dy (dysprosium), etc.
It combines with the small amount of residual oxygen that remains there, making it impossible to obtain a pure rare earth metal thin film.
本発明は、スパッタリング法による希土類金属薄膜の製
膜に際し、純粋な希土類金属薄膜を製膜するのに必要な
1.0−7Torrオーダーの高真空度を比較的短時間
に形成させることを可能とする方法ならびにその装置を
提供することを目的としている。The present invention makes it possible to form a high degree of vacuum in the order of 1.0-7 Torr, which is necessary to form a pure rare earth metal thin film, in a relatively short time when forming a rare earth metal thin film using a sputtering method. The purpose of the present invention is to provide a method and apparatus for the same.
かかる本発明の目的は、マグネトロン型スパッタリング
装置の真空チャンバ内に、互いに対向位置関係にある希
土類金属主ターゲットと基板および該基板と対向位置関
係にない活性金属補助ターゲットをそれぞれ配置し、真
空チャンバ内k 10−5Torrのオーダー迄排気し
た後不活性ガスを1.(Y3Torrのオーダー迄遵入
し、前記補助ターゲラ1−を取付けた補助カソードに電
圧を印加して活性金属を放電させ、それにより10−7
Torrの高真空度を得た後、前記主ターゲットを搭載
した主カソードに電圧を印加し、前記基板面に希土類金
属またはその合金の簿膜を形成させることによって達成
される。The object of the present invention is to arrange a rare earth metal main target and a substrate facing each other in a vacuum chamber of a magnetron type sputtering apparatus, and an active metal auxiliary target not facing the substrate, respectively, and to After evacuation to the order of 10-5 Torr, inert gas was added to 1. (Up to the order of Y3 Torr, a voltage is applied to the auxiliary cathode to which the auxiliary targeter 1- is attached to discharge the active metal, thereby 10-7
After obtaining a high vacuum of Torr, voltage is applied to the main cathode on which the main target is mounted, thereby forming a thin film of rare earth metal or its alloy on the substrate surface.
図面の第1図は、本発明方法の実施に用いられる製膜装
置の一態様の概要図であり、マグネトロン型スパッタリ
ング装置の真空チャンバ]内には、希土類金属主ターゲ
ット2を搭載した主カン−1−3が下部側に、それと対
向する位置の」二部側には基板ホルダ4て保持された基
板5が、そしてこの基板の脇位置でチャンバ内壁側に向
いて活性金属補助ターゲラ1−6を取付けた補助カソー
ド7がそれぞれ設置されている。なお、主カソード3側
および補助カッ−1へ7側には、それぞれ主ターゲット
冷却水管8および補助ターゲノ]−冷却水管9が取付け
られており、基板ホルダ4はモータ■0によって回転せ
しめるようになっている。FIG. 1 of the drawings is a schematic diagram of one embodiment of a film forming apparatus used to carry out the method of the present invention, in which a main can carrying a rare earth metal main target 2 is installed in the vacuum chamber of the magnetron type sputtering apparatus. 1-3 is on the lower side, a substrate 5 held by a substrate holder 4 is on the second side of the opposite position, and an active metal auxiliary targeter 1-6 is placed on the side of the substrate facing the inner wall of the chamber. Auxiliary cathodes 7 with attached cathodes are respectively installed. A main target cooling water pipe 8 and an auxiliary target cooling water pipe 9 are attached to the main cathode 3 side and the auxiliary cup 1 to 7 side, respectively, and the substrate holder 4 is rotated by a motor 0. ing.
主ターケッ1〜となる希土類金属としては、前記した如
<Gd、Tb、 Dyなどの少くとも一種が、板状の金
属が単体または合金の状態で主カソード」二に搭載され
る。また、補助ターゲラ1−となる活性金属としては、
例えばチタン、クロム、ニオブ、タンタル、ジルコニウ
ムなどが、板状の単体金属の状態で補助カソードに取付
けられる。この補助カソードの向きは、基板と対向位置
関係になければ、チャンバ内壁側に向いていなくとも任
意の向きをとることができ、またその設置位置も基板ホ
ルダの脇位置に限定されない。As the rare earth metal serving as the main cathode 1, at least one of the above-described rare earth metals such as Gd, Tb, and Dy is mounted on the main cathode 2 in the form of a plate-shaped metal alone or in the form of an alloy. In addition, as the active metal that becomes the auxiliary targetera 1-,
For example, titanium, chromium, niobium, tantalum, zirconium, etc. are attached to the auxiliary cathode in the form of a single metal plate. The auxiliary cathode can be oriented in any direction as long as it is not facing the substrate, even if it is not facing the inner wall of the chamber, and its installation position is not limited to the side position of the substrate holder.
かかる製膜装置を用いての希土類金属薄膜の製膜は、次
のようにして行われる。A rare earth metal thin film is formed using such a film forming apparatus as follows.
まず、真空チャンバ内をロータリポンプを用いて10分
間程度排気口11から排気(粗引き)し、10−。First, the inside of the vacuum chamber is evacuated (roughly evacuated) from the exhaust port 11 for about 10 minutes using a rotary pump.
Torrオーダーの真空度とした後、油拡散ポンプとロ
ータリポンプとを併用して5分間程度排気(本引き)し
、10−5Torrオーダーとした。排気には、この他
分子ターボポンプやクライオポンプなども用いられる。After achieving a vacuum degree on the order of Torr, exhaustion (main evacuation) was performed for about 5 minutes using a combination of an oil diffusion pump and a rotary pump to obtain a degree of vacuum on the order of 10 −5 Torr. In addition, molecular turbo pumps and cryopumps are also used for exhaust.
次に、10−’Torrオーダーの真空度で、アルゴン
ガスによって代表される不活性ガスを、不活性ガス導入
管12から10−3Torrのオーダーになる迄導入し
、補助ターゲット用電源13から補助カソード7に電圧
を印加し、活性金属補助ターゲット6を放電させる。放
電条件としては、直流の場合印加電圧約200〜300
V、放電電流約0.5〜2人、放電時間約3〜10分間
が一般に用いられる。なお、この放電条件下での放電接
電源を切り、不活性ガス導入バルブ12′を閉じて真空
チャンバ内の真空度を測定すると、10”’Torrの
オーダーの高真空度が得られていることが確認された。Next, at a vacuum level on the order of 10-'Torr, an inert gas such as argon gas is introduced from the inert gas introduction pipe 12 until the vacuum level is on the order of 10-3 Torr, and the auxiliary cathode is supplied from the auxiliary target power source 13. A voltage is applied to 7 to discharge the active metal auxiliary target 6. As for the discharge conditions, in the case of DC, the applied voltage is about 200 to 300
V, a discharge current of about 0.5 to 2 people, and a discharge time of about 3 to 10 minutes are generally used. Note that when the discharge power supply is turned off under these discharge conditions, the inert gas introduction valve 12' is closed, and the degree of vacuum inside the vacuum chamber is measured, a high degree of vacuum on the order of 10'' Torr is obtained. was confirmed.
このようにして1.0−7Torrのオーダーの高真空
度が達成されたならば、その後は通常の方法に従って、
希土類金属のカラス板などの基質面へのスパッタリング
が行われる。この際、活性金属補助ターゲラ1〜の放電
も、同時に継続される。Once a high degree of vacuum on the order of 1.0-7 Torr has been achieved in this way, following the usual method,
Sputtering of rare earth metals onto a substrate surface such as a glass plate is performed. At this time, the discharge of the active metal auxiliary targeters 1~ is also continued at the same time.
即ち、主ターゲット用電源14から主カン−1−3に電
圧を印加し、希土類金属主ターゲット2を放電させる。That is, a voltage is applied from the main target power supply 14 to the main can 1-3, and the rare earth metal main target 2 is discharged.
このとき、シャッタ15を閉したままプリスパッタリン
グする。その後、シャッタを開いてスパッタリングを行
ない、基質面に希土類金属またはその合金の薄膜を形成
させる。放電条件は、直流の場合印加電圧約200〜6
00v、放電電流約1〜4A、放電時間約1〜5分間(
シャッタ閉じ)および約1〜30分間(シャッタ開け)
であり、このような放電条件に応じて膜厚の希土類金属
薄膜が基質面に形成される。At this time, pre-sputtering is performed with the shutter 15 closed. Thereafter, the shutter is opened and sputtering is performed to form a thin film of the rare earth metal or its alloy on the substrate surface. The discharge conditions are: in the case of DC, the applied voltage is approximately 200 to 6
00V, discharge current approximately 1-4A, discharge time approximately 1-5 minutes (
(shutter closed) and approximately 1 to 30 minutes (shutter open)
A rare earth metal thin film is formed on the substrate surface with a thickness depending on the discharge conditions.
〔作用〕および〔発明の効果〕
マグネトロン型スパッタリング装置の真空チャンバ内に
活性金属ターゲラ1−を取付けたカソードを設置し、真
空チャンバ内を10−”Torrのオーダー迄排気した
後不活性ガスを10−3Torrのオーダー迄導入し、
この状態でカソードに電圧を印加して活性金属を放電さ
せることにより、真空チャンバ内の真空度を1.0−7
Torrのオーダーに迄比較的短時間で高真空化せしめ
ることができる。それに要する時間は、下記実施例およ
び第2図のグラフに示されるように、油拡散ポンプとロ
ータリポンプとの併用では本引きに120分間を要した
ものが、本発明では同一の真空度がわずか15分間で達
成される。[Operation] and [Effects of the Invention] A cathode equipped with an active metal targeter 1- is installed in a vacuum chamber of a magnetron type sputtering device, and after exhausting the inside of the vacuum chamber to the order of 10-” Torr, inert gas is evacuated to 10-” Torr. -Introduced up to the order of 3 Torr,
In this state, by applying a voltage to the cathode and discharging the active metal, the degree of vacuum in the vacuum chamber is reduced to 1.0-7.
It is possible to create a high vacuum in a relatively short time, up to the order of Torr. As shown in the example below and the graph in Figure 2, the time required for this process is 120 minutes when an oil diffusion pump and a rotary pump are used in combination, but with the present invention, the same degree of vacuum is only a short time. Achieved in 15 minutes.
このように、比較的短時間の内に高真空化が達成される
のは、真空チャンバ空間に飛散した活性金属がその空間
内の残留酸素や窒素などを捕獲するゲッターとして働く
ためと考えられ、また希土類金属の放電時に活性金属の
放電も同時に行われているものの、基質面に形成された
薄膜中にはEPMAや質量分析によって活性金属が検出
されず、希土類金属の純度や磁性を損うことなく、それ
の薄膜形成が行われる。The reason why high vacuum is achieved in a relatively short period of time is thought to be because the active metals scattered in the vacuum chamber space act as getters to capture residual oxygen, nitrogen, etc. in that space. Furthermore, although discharge of active metals occurs at the same time as discharge of rare earth metals, no active metals are detected in the thin film formed on the substrate surface by EPMA or mass spectrometry, which may impair the purity and magnetism of rare earth metals. Instead, thin film formation is performed.
次に、実施例について本発明を説明する。 Next, the present invention will be explained with reference to examples.
実施例
第1図に示された態様に従って、活性金属としてチタン
を用い、希土類金属たるGdのガラスプレート面へのス
パッタリングが行われた。EXAMPLE According to the embodiment shown in FIG. 1, titanium was used as the active metal, and Gd, which is a rare earth metal, was sputtered onto the surface of a glass plate.
まず、真空チャンバ内を、ロータリポンプを使って5
X 1.0−3Torrになる迄10分間排気(粗引き
)した後、ロータリポンプと油拡散ポンプを使用し、5
分間かけて5 X 10−” Torr迄排気(本引き
)した。First, inside the vacuum chamber, use a rotary pump to
After evacuation (rough evacuation) for 10 minutes until the pressure reaches 1.0-3 Torr, use a rotary pump and an oil diffusion pump to
The vacuum was evacuated to 5 x 10-'' Torr over a period of minutes.
この状態で本引きを続けると、8.OX 10−7To
rrの真空度に達する迄に120分間を要した。この状
態は、第2図のグラフに示されている。If you continue the main draw in this state, 8. OX 10-7To
It took 120 minutes to reach a vacuum degree of rr. This situation is illustrated in the graph of FIG.
A:粗引き10分間
B:本引き5分間
C:本引き120分間
5 X 10−5Torr迄本引きした後、アルゴンガ
スを3、OX 10−3Torr迄遵入し、その状態で
補助力ソードに直流電源より500vの電圧を印加し、
チタン補助ターゲットを放電させた。このときの放電電
流は3Aであり、10分間放電させた後電源を切り、ア
ルゴンガス導入を止めて真空度を測定してみると、8、
OX 10−7Torrの値を示していた。即ち、前記
併用ポンプによる本引きだけでは120分間を要したも
のが、チタン金属を放電させることによりわずか15分
間で同一真空度に到達する。この状態も、第2図のグラ
フに示される。A: Rough pulling for 10 minutes B: Main pulling for 5 minutes C: Main pulling for 120 minutes After main pulling to 5 x 10-5 Torr, argon gas was introduced to 3,000 x 10-3 Torr, and in that state, the auxiliary power sword was Apply a voltage of 500v from a DC power supply,
A titanium auxiliary target was discharged. The discharge current at this time was 3A, and after 10 minutes of discharge, I turned off the power, stopped introducing argon gas, and measured the degree of vacuum.8.
It showed a value of OX 10-7 Torr. That is, although it took 120 minutes just by the main pump using the combined pump, the same degree of vacuum can be reached in just 15 minutes by discharging the titanium metal. This situation is also shown in the graph of FIG.
D:アルゴンガス導入
E:チタン放電10分間
F:チタン放電停止
G:チタン放電再開
チタン放電10分後、主カソードにも直流電源から60
0Vの電圧を印加し、放電電流4Aでガドリニウム主タ
ーゲットを放電させ、まず3分間シャッタを閉じたまま
プリスパッタリングした後、10分間シャッタを開いて
スパッタリングし、基板ホルダに取付けられたガラスプ
レート面に膜厚3μmのGd薄膜を形成させた。D: Argon gas introduced E: Titanium discharge for 10 minutes F: Titanium discharge stopped G: Titanium discharge resumed After 10 minutes of titanium discharge, the main cathode was also connected to the DC power supply at
A voltage of 0 V was applied and the gadolinium main target was discharged with a discharge current of 4 A. First, pre-sputtering was performed with the shutter closed for 3 minutes, then sputtering was performed with the shutter open for 10 minutes, and sputtering was performed on the surface of the glass plate attached to the substrate holder. A Gd thin film with a thickness of 3 μm was formed.
この間チタンも同時に放電させていたが、形成させたG
d薄膜中にはEPMAや質量分析によってもチタンは検
出されなかった。During this time, titanium was also discharged at the same time, but the formed G
d No titanium was detected in the thin film by EPMA or mass spectrometry.
第1図は、本発明方法の実施に用いられる製膜装置の一
態様の概要図である。また、第2図は、本発明方法によ
る高真空度化の到達時間を示すグラフである。
(符号の説明)
1・・・・・真空チャンバ
2・・・・・希土類金属主ターゲット
3・・・・・主カソード
4・・・・・基板ホルダ
5・・・・・基板
6・・・・・活性金属補助ターゲット
7・・・・・補助カソード
11・・・・・排気口
12・・・・・不活性ガス導入管
代理人 弁理士 吉 1)俊 夫FIG. 1 is a schematic diagram of one embodiment of a film forming apparatus used to implement the method of the present invention. Moreover, FIG. 2 is a graph showing the time required to achieve a high degree of vacuum according to the method of the present invention. (Explanation of symbols) 1...Vacuum chamber 2...Rare earth metal main target 3...Main cathode 4...Substrate holder 5...Substrate 6... ... Active metal auxiliary target 7 ... Auxiliary cathode 11 ... Exhaust port 12 ... Inert gas introduction management agent Patent attorney Yoshi 1) Toshio
Claims (1)
内に、互いに対向位置関係にある希土類金属主ターゲッ
トと基板および該基板と対向位置関係にない活性金属補
助ターゲットをそれぞれ配置し、真空チャンバ内を10
^−^5Torrのオーダー迄排気した後不活性ガスを
10^−^3Torrのオーダー迄導入し、前記補助タ
ーゲットを取付けた補助カソードに電圧を印加して活性
金属を放電させ、それにより10^−^7Torrの高
真空度を得た後、前記主ターゲットを搭載した主カソー
ドに電圧を印加し、前記基板面に希土類金属またはその
合金の薄膜を形成させることを特徴とする希土類金属薄
膜の製膜方法。 2、マグネトロン型スパッタリング装置の真空チャンバ
内に、希土類金属主ターゲットを搭載した主カソード、
該主ターゲットと対向位置の基板ホルダで保持された基
板および該基板ホルダの脇位置でチャンバ内壁側に向い
て活性金属補助ターゲットを取付けた補助カソードをそ
れぞれ設置すると共に、真空チャンバ壁に不活性ガス導
入管を取付けてなる希土類金属薄膜の製膜装置。 3、マグネトロン型スパッタリング装置の真空チャンバ
内に活性金属ターゲットを取付けたカソードを設置し、
真空チャンバ内を10^−^5Torrのオーダー迄排
気した後不活性ガスを10^−^3Torrのオーダー
迄導入し、この状態でカソードに電圧を印加して活性金
属を放電させることを特徴とする真空チャンバ内の真空
度を10^−^7Torrのオーダーに低下せしめる高
真空化方法。[Claims] 1. In a vacuum chamber of a magnetron type sputtering apparatus, a rare earth metal main target and a substrate are placed in a positional relationship that opposes each other, and an active metal auxiliary target that is not in a positional relationship that faces the substrate, respectively, and the vacuum chamber is inside 10
After evacuation to the order of 5 Torr, inert gas was introduced to the order of 10^-^3 Torr, and a voltage was applied to the auxiliary cathode to which the auxiliary target was attached to discharge the active metal, thereby 10^- After obtaining a high degree of vacuum of ^7 Torr, a voltage is applied to the main cathode carrying the main target to form a thin film of the rare earth metal or its alloy on the substrate surface. Method. 2. A main cathode equipped with a rare earth metal main target in the vacuum chamber of the magnetron sputtering device;
A substrate held by a substrate holder at a position opposite to the main target, and an auxiliary cathode with an active metal auxiliary target attached facing the chamber inner wall at a position beside the substrate holder are installed, and an inert gas is applied to the vacuum chamber wall. Rare earth metal thin film forming equipment equipped with an inlet pipe. 3. Install a cathode with an active metal target in the vacuum chamber of a magnetron sputtering device,
The method is characterized in that after the inside of the vacuum chamber is evacuated to the order of 10^-^5 Torr, an inert gas is introduced to the order of 10^-^3 Torr, and in this state, a voltage is applied to the cathode to discharge the active metal. A high vacuum method that reduces the degree of vacuum in a vacuum chamber to the order of 10-7 Torr.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19944988A JPH0250959A (en) | 1988-08-10 | 1988-08-10 | Method and apparatus for forming thin film of rare earth metal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19944988A JPH0250959A (en) | 1988-08-10 | 1988-08-10 | Method and apparatus for forming thin film of rare earth metal |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0250959A true JPH0250959A (en) | 1990-02-20 |
Family
ID=16408001
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19944988A Pending JPH0250959A (en) | 1988-08-10 | 1988-08-10 | Method and apparatus for forming thin film of rare earth metal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0250959A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8367156B2 (en) | 2006-03-03 | 2013-02-05 | Canon Anelva Corporation | Method of manufacturing magnetoresistive device and apparatus for manufacturing the same |
| KR20220136402A (en) | 2020-04-01 | 2022-10-07 | 캐논 아네르바 가부시키가이샤 | Film-forming apparatus, control apparatus of film-forming apparatus, and film-forming method |
| US12438075B2 (en) | 2021-05-18 | 2025-10-07 | Canon Anelva Corporation | Method for manufacturing a laminated body |
-
1988
- 1988-08-10 JP JP19944988A patent/JPH0250959A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8367156B2 (en) | 2006-03-03 | 2013-02-05 | Canon Anelva Corporation | Method of manufacturing magnetoresistive device and apparatus for manufacturing the same |
| US10629804B2 (en) | 2006-03-03 | 2020-04-21 | Canon Anelva Corporation | Method of manufacturing magnetoresistive device |
| KR20220136402A (en) | 2020-04-01 | 2022-10-07 | 캐논 아네르바 가부시키가이샤 | Film-forming apparatus, control apparatus of film-forming apparatus, and film-forming method |
| KR20250036964A (en) | 2020-04-01 | 2025-03-14 | 캐논 아네르바 가부시키가이샤 | Film formation device, device for controlling film formation device, and film formation method |
| US12606904B2 (en) | 2020-04-01 | 2026-04-21 | Canon Anelva Corporation | Film forming apparatus, control apparatus for film forming appartus, and film forming method |
| US12438075B2 (en) | 2021-05-18 | 2025-10-07 | Canon Anelva Corporation | Method for manufacturing a laminated body |
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